FR2333248A1 - Circuit de mesure de caracteristiques electriques de structures mos - Google Patents

Circuit de mesure de caracteristiques electriques de structures mos

Info

Publication number
FR2333248A1
FR2333248A1 FR7536429A FR7536429A FR2333248A1 FR 2333248 A1 FR2333248 A1 FR 2333248A1 FR 7536429 A FR7536429 A FR 7536429A FR 7536429 A FR7536429 A FR 7536429A FR 2333248 A1 FR2333248 A1 FR 2333248A1
Authority
FR
France
Prior art keywords
function
measurement circuit
automatic measurement
voltage threshold
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7536429A
Other languages
English (en)
Other versions
FR2333248B3 (fr
Inventor
Marie-Helene Comte
Claude Paul Henri Lerouge
Jean-Pierre Michel Pillou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Laboratoire Central de Telecommunications SA
Original Assignee
Laboratoire Central de Telecommunications SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Laboratoire Central de Telecommunications SA filed Critical Laboratoire Central de Telecommunications SA
Priority to FR7536429A priority Critical patent/FR2333248A1/fr
Publication of FR2333248A1 publication Critical patent/FR2333248A1/fr
Application granted granted Critical
Publication of FR2333248B3 publication Critical patent/FR2333248B3/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR7536429A 1975-11-28 1975-11-28 Circuit de mesure de caracteristiques electriques de structures mos Granted FR2333248A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7536429A FR2333248A1 (fr) 1975-11-28 1975-11-28 Circuit de mesure de caracteristiques electriques de structures mos

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7536429A FR2333248A1 (fr) 1975-11-28 1975-11-28 Circuit de mesure de caracteristiques electriques de structures mos

Publications (2)

Publication Number Publication Date
FR2333248A1 true FR2333248A1 (fr) 1977-06-24
FR2333248B3 FR2333248B3 (fr) 1978-09-01

Family

ID=9163026

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7536429A Granted FR2333248A1 (fr) 1975-11-28 1975-11-28 Circuit de mesure de caracteristiques electriques de structures mos

Country Status (1)

Country Link
FR (1) FR2333248A1 (fr)

Also Published As

Publication number Publication date
FR2333248B3 (fr) 1978-09-01

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