JPS56106166A - Method for measuring sustaining voltage - Google Patents

Method for measuring sustaining voltage

Info

Publication number
JPS56106166A
JPS56106166A JP955380A JP955380A JPS56106166A JP S56106166 A JPS56106166 A JP S56106166A JP 955380 A JP955380 A JP 955380A JP 955380 A JP955380 A JP 955380A JP S56106166 A JPS56106166 A JP S56106166A
Authority
JP
Japan
Prior art keywords
voltage
input
transistor
measuring
sustaining voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP955380A
Other languages
Japanese (ja)
Inventor
Toru Komori
Hiroshi Kitamori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP955380A priority Critical patent/JPS56106166A/en
Publication of JPS56106166A publication Critical patent/JPS56106166A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To automatically decide whether a transistor is good or not by putting the TR into a saturated state then eliminating the application of an input voltage and measuring an output voltage and the transistor is turned OFF. CONSTITUTION:When an input is applied to an input terminal 12, the transistor to be measured and connected to a test circuit 11 goes ON, and its collector terminal (c) changes to a saturation potential. Next, the input voltage is changed to a low voltage and the voltage of the collector terminal (c) after a fixed time is measured. Whether the TR is good or not is decided from whether this voltage is above the specified sustaining voltage or not.
JP955380A 1980-01-29 1980-01-29 Method for measuring sustaining voltage Pending JPS56106166A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP955380A JPS56106166A (en) 1980-01-29 1980-01-29 Method for measuring sustaining voltage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP955380A JPS56106166A (en) 1980-01-29 1980-01-29 Method for measuring sustaining voltage

Publications (1)

Publication Number Publication Date
JPS56106166A true JPS56106166A (en) 1981-08-24

Family

ID=11723464

Family Applications (1)

Application Number Title Priority Date Filing Date
JP955380A Pending JPS56106166A (en) 1980-01-29 1980-01-29 Method for measuring sustaining voltage

Country Status (1)

Country Link
JP (1) JPS56106166A (en)

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