FR2326030B1 - - Google Patents

Info

Publication number
FR2326030B1
FR2326030B1 FR7628344A FR7628344A FR2326030B1 FR 2326030 B1 FR2326030 B1 FR 2326030B1 FR 7628344 A FR7628344 A FR 7628344A FR 7628344 A FR7628344 A FR 7628344A FR 2326030 B1 FR2326030 B1 FR 2326030B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7628344A
Other languages
French (fr)
Other versions
FR2326030A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Original Assignee
Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Jena GmbH filed Critical Carl Zeiss Jena GmbH
Publication of FR2326030A1 publication Critical patent/FR2326030A1/fr
Application granted granted Critical
Publication of FR2326030B1 publication Critical patent/FR2326030B1/fr
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7628344A 1975-09-24 1976-09-21 Microscope electronique a balayage pour le controle de structures d'objets Granted FR2326030A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD18851275A DD124091A1 (ru) 1975-09-24 1975-09-24

Publications (2)

Publication Number Publication Date
FR2326030A1 FR2326030A1 (fr) 1977-04-22
FR2326030B1 true FR2326030B1 (ru) 1982-03-19

Family

ID=5501778

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7628344A Granted FR2326030A1 (fr) 1975-09-24 1976-09-21 Microscope electronique a balayage pour le controle de structures d'objets

Country Status (5)

Country Link
DD (1) DD124091A1 (ru)
DE (1) DE2635356C2 (ru)
FR (1) FR2326030A1 (ru)
GB (1) GB1532862A (ru)
SU (1) SU1191980A1 (ru)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU534811B2 (en) * 1979-07-03 1984-02-16 Unisearch Limited Atmospheric scanning electron microscope
JPS5795056A (en) * 1980-12-05 1982-06-12 Hitachi Ltd Appearance inspecting process
JPS59112217A (ja) * 1982-11-29 1984-06-28 Toshiba Corp 寸法測定方法
JPS59163506A (ja) * 1983-03-09 1984-09-14 Hitachi Ltd 電子ビ−ム測長装置
ATE70914T1 (de) * 1984-03-20 1992-01-15 Vickers Plc Verfahren zum praezisionsmessen mittels eines abtastelelektronenmikroskops.
US4677296A (en) * 1984-09-24 1987-06-30 Siemens Aktiengesellschaft Apparatus and method for measuring lengths in a scanning particle microscope
DE3802598C1 (ru) * 1988-01-29 1989-04-13 Karl Heinz 3057 Neustadt De Stellmann

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3876879A (en) * 1973-11-09 1975-04-08 Calspan Corp Method and apparatus for determining surface characteristics incorporating a scanning electron microscope

Also Published As

Publication number Publication date
SU1191980A1 (ru) 1985-11-15
FR2326030A1 (fr) 1977-04-22
DE2635356C2 (de) 1984-08-16
DD124091A1 (ru) 1977-02-02
DE2635356A1 (de) 1977-04-07
GB1532862A (en) 1978-11-22

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Legal Events

Date Code Title Description
ST Notification of lapse