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1978-03-24 |
1979-10-19 |
Thomson Csf |
Systeme de controle d'un dessin inscrit sur un support plan
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1979-01-10 |
1985-02-12 |
Rca Corporation |
Automatic stripe width reader
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JPS55132904A
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1979-04-05 |
1980-10-16 |
Fuji Electric Co Ltd |
Shape inspection system
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JPS55142254A
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1979-04-25 |
1980-11-06 |
Hitachi Ltd |
Inspecting method for pattern of printed wiring board
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1979-08-23 |
1982-02-25 |
Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V., 5000 Köln |
Rißfortschritts-Meßeinrichtung
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1979-12-12 |
1983-08-11 |
Windmöller & Hölscher, 4540 Lengerich |
Verfahren zur Regelung der Foliendicke an einer Blasfolien-Extruderanlage
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1980-12-18 |
1985-07-04 |
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Process for inspecting and automatically classifying objects presenting configurations with dimensional tolerances and variable rejecting criteria depending on placement, apparatus and circuits therefor
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EP0054598B1
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1980-12-18 |
1985-04-03 |
International Business Machines Corporation |
Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles fixes et équipement de mise en oeuvre
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1981-03-02 |
1982-09-03 |
Atelier Outillage Orleanais Sa |
Procede pour controler des percages pratiques dans une piece, notamment une carte a circuits imprimes, et appareil pour la mise en oeuvre de ce procede
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1981-07-14 |
1986-10-29 |
Hitachi, Ltd. |
Pattern detection system
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1981-12-24 |
1984-03-29 |
Bayerische Motoren Werke AG, 8000 München |
Prüfverfahren für eine Schraubenverbindung und Vorrichtung zur Durchführung des Verfahrens
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1982-01-20 |
1990-03-20 |
The Boeing Company |
LWIR sensor system with improved clutter rejection
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1982-05-24 |
1985-02-19 |
Itek Corporation |
Printed circuit board defect detection of detecting maximum line width violations
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JPS5987607U
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1982-12-03 |
1984-06-13 |
日立電子エンジニアリング株式会社 |
相互比較方式パタ−ン検査機の位置合せ装置
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1983-05-24 |
1985-09-03 |
Automation Engineering, Inc. |
Circuit board inspection apparatus and method
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1983-08-08 |
1986-03-25 |
Itek Corporation |
System for printed circuit board defect detection
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1983-12-20 |
1985-12-03 |
At&T Technologies, Inc. |
Inspection scanning system
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1983-12-20 |
1986-07-15 |
At&T Technologies, Inc. |
Scanning sample, signal generation, data digitizing and retiming system
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1984-02-22 |
1985-12-03 |
Kla Instruments Corporation |
X-Y Stage for a patterned wafer automatic inspection system
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1984-02-22 |
1986-10-21 |
Kla Instruments Corporation |
Method and apparatus for automatic wafer inspection
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JPS60263807A
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1984-06-12 |
1985-12-27 |
Dainippon Screen Mfg Co Ltd |
プリント配線板のパタ−ン欠陥検査装置
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1984-10-30 |
1987-03-03 |
Kollmorgen Technologies, Corp. |
High speed optical inspection system
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JPS61213612A
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1985-03-19 |
1986-09-22 |
Hitachi Ltd |
プリント基板のパタ−ン検査装置
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1985-07-29 |
1989-11-14 |
French Limited Company - Centaure Robotique |
Automatic method of optically scanning a two-dimensional scene line-by-line and of electronically inspecting patterns therein by "shape-tracking"
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JPS62244611A
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1986-04-18 |
1987-10-26 |
Toshiba Mach Co Ltd |
プラスチツク筒状物成形用プラグ装置
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1989-01-23 |
1990-02-27 |
Zane Machine Co. |
Defrosting grid system testing apparatus
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1989-12-18 |
1992-06-23 |
Chromalloy Gas Turbine Corporation |
Five axis generated hole inspection system
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1990-11-12 |
1992-05-15 |
Axis Vision Sarl |
Machine d'inspection de composants assembles sur une carte electronique.
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1990-11-27 |
1996-05-29 |
大日本スクリーン製造株式会社 |
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1991-02-08 |
1992-11-17 |
Hopkins Manufacturing Corporation |
Headlight aiming apparatus and display
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1991-12-31 |
1994-08-02 |
Eastman Kodak Company |
Apparatus for mechanically dithering a CCD array
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1992-12-11 |
1994-07-19 |
Hopkins Manufacturing Corporation |
Method and apparatus for locating a specific location on a vehicle headlamp
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1993-04-28 |
1995-02-21 |
International Business Machines Corporation |
Method and apparatus for inspection of matched substrate heatsink and hat assemblies
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1994-09-02 |
1996-01-16 |
Hopkins Manufacturing Corporation |
Vehicle headlight aiming apparatus
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1994-12-19 |
1997-07-30 |
At & T Corp |
Device and method for illuminating transparent and semi-transparent materials
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1996-07-09 |
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Facility monitoring system with image memory and correlation
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2000-04-19 |
Dainippon Printing Co Ltd |
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Motorola, Inc. |
Circuit board panel test strip and associated method of assembly
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2001-01-09 |
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Apparatus and method for processing video data in automatic optical inspection
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1998-03-24 |
1999-10-08 |
Oki Electric Ind Co Ltd |
フォトマスク並びにその良否判定方法及び装置
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1998-07-15 |
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August Technology Corp. |
Automated wafer defect inspection system and a process of performing such inspection
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2004-12-15 |
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Adaptive tolerance reference inspection system
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2000-08-08 |
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System and method for defect identification and location using an optical indicia device
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Rytec Corporation |
Sensor and imaging system
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2000-12-15 |
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Ricoh Company, Ltd. |
Processing system and method using recomposable software
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2002-09-06 |
2004-03-29 |
Rytec Corporation |
Signal intensity range transformation apparatus and method
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2003-03-10 |
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Landrex Technologies Co., Ltd. |
Inspection window guard banding
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2005-08-05 |
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Portable covert license plate reader
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2008-07-22 |
2011-01-11 |
Seiko Epson Corporation |
Image capture and calibratiion
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2008-07-23 |
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Seiko Epson Corporation |
Fault detection of a printed dot-pattern bitmap
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2008-07-24 |
2012-09-18 |
Seiko Epson Corporation |
Image capture, alignment, and registration
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2008-10-13 |
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2008-11-21 |
2013-03-01 |
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三維形貌檢測裝置
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2008-11-21 |
2013-01-15 |
Industrial Technology Research Institute |
Three dimensional profile inspecting apparatus
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2010-09-27 |
2012-07-19 |
Viprotron Gmbh |
Verfahren und Vorrichtung zur Anzeige von automatisiert ermittelten Fehlerstellen
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2016-12-20 |
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Automated detection of potentially defective packaged radio-frequency modules
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2013-01-31 |
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厦门大学 |
一种悬挂式检测台
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2013-09-25 |
2014-01-01 |
华南理工大学 |
一种新型挠性电路板缺陷检测装置及方法
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