FR2321229A1 - Procede et appareillage pour controle automatique de graphisme - Google Patents

Procede et appareillage pour controle automatique de graphisme

Info

Publication number
FR2321229A1
FR2321229A1 FR7525234A FR7525234A FR2321229A1 FR 2321229 A1 FR2321229 A1 FR 2321229A1 FR 7525234 A FR7525234 A FR 7525234A FR 7525234 A FR7525234 A FR 7525234A FR 2321229 A1 FR2321229 A1 FR 2321229A1
Authority
FR
France
Prior art keywords
graphic control
automatic graphic
automatic
control
graphic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7525234A
Other languages
English (en)
Other versions
FR2321229B1 (fr
Inventor
Gilles Billet
Jean Blottiau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel CIT SA
Original Assignee
Alcatel CIT SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel CIT SA filed Critical Alcatel CIT SA
Priority to FR7525234A priority Critical patent/FR2321229A1/fr
Priority to BE1007532A priority patent/BE844695A/fr
Priority to CH974476A priority patent/CH609820A5/xx
Priority to DE19762635563 priority patent/DE2635563A1/de
Priority to GB33071/76A priority patent/GB1515206A/en
Priority to IT26183/76A priority patent/IT1067798B/it
Priority to SE7608971A priority patent/SE412470B/xx
Priority to IE1782/76A priority patent/IE43287B1/en
Priority to US05/713,964 priority patent/US4185298A/en
Priority to NL7609069A priority patent/NL7609069A/xx
Priority to JP51096179A priority patent/JPS5223365A/ja
Publication of FR2321229A1 publication Critical patent/FR2321229A1/fr
Application granted granted Critical
Publication of FR2321229B1 publication Critical patent/FR2321229B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
FR7525234A 1975-08-13 1975-08-13 Procede et appareillage pour controle automatique de graphisme Granted FR2321229A1 (fr)

Priority Applications (11)

Application Number Priority Date Filing Date Title
FR7525234A FR2321229A1 (fr) 1975-08-13 1975-08-13 Procede et appareillage pour controle automatique de graphisme
BE1007532A BE844695A (fr) 1975-08-13 1976-07-30 Procede et appareillage pour controle automatique de graphisme
CH974476A CH609820A5 (fr) 1975-08-13 1976-07-30
DE19762635563 DE2635563A1 (de) 1975-08-13 1976-08-06 Verfahren und vorrichtung zum automatischen vergleich zweier bilder
GB33071/76A GB1515206A (en) 1975-08-13 1976-08-09 Process and apparatus for the automatic inspection of patterns
IT26183/76A IT1067798B (it) 1975-08-13 1976-08-10 Procedimento ed apparecchiatura per il controllo automatico della grafia
SE7608971A SE412470B (sv) 1975-08-13 1976-08-11 Sett och anordning for automatisk provning av monster pa tryckta kretskort
IE1782/76A IE43287B1 (en) 1975-08-13 1976-08-12 Process and apparatus for the automatic inspection of patterns on printed circuit boards
US05/713,964 US4185298A (en) 1975-08-13 1976-08-12 Process and apparatus for the automatic inspection of patterns
NL7609069A NL7609069A (nl) 1975-08-13 1976-08-13 Werkwijze en inrichting voor het automatisch controleren van lijnen.
JP51096179A JPS5223365A (en) 1975-08-13 1976-08-13 Method of and apparatus for automatically inspecting pattern of print circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7525234A FR2321229A1 (fr) 1975-08-13 1975-08-13 Procede et appareillage pour controle automatique de graphisme

Publications (2)

Publication Number Publication Date
FR2321229A1 true FR2321229A1 (fr) 1977-03-11
FR2321229B1 FR2321229B1 (fr) 1980-02-08

Family

ID=9159057

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7525234A Granted FR2321229A1 (fr) 1975-08-13 1975-08-13 Procede et appareillage pour controle automatique de graphisme

Country Status (11)

Country Link
US (1) US4185298A (fr)
JP (1) JPS5223365A (fr)
BE (1) BE844695A (fr)
CH (1) CH609820A5 (fr)
DE (1) DE2635563A1 (fr)
FR (1) FR2321229A1 (fr)
GB (1) GB1515206A (fr)
IE (1) IE43287B1 (fr)
IT (1) IT1067798B (fr)
NL (1) NL7609069A (fr)
SE (1) SE412470B (fr)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0004505A2 (fr) * 1978-03-24 1979-10-03 Thomson-Csf Appareil de contrôle d'un dessin inscrit sur un support plan
FR2455423A1 (fr) * 1979-04-25 1980-11-21 Hitachi Ltd Appareil pour verifier les plaques de circuit imprime
EP0054598A1 (fr) * 1980-12-18 1982-06-30 International Business Machines Corporation Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles fixes et équipement de mise en oeuvre
FR2500925A1 (fr) * 1981-03-02 1982-09-03 Atelier Outillage Orleanais Sa Procede pour controler des percages pratiques dans une piece, notamment une carte a circuits imprimes, et appareil pour la mise en oeuvre de ce procede
EP0126492A2 (fr) * 1983-05-24 1984-11-28 Automation Engineering, Inc. Appareil et méthode pour l'inspection des plaquettes de circuits imprimés
FR2669180A1 (fr) * 1990-11-12 1992-05-15 Axis Vision Sarl Machine d'inspection de composants assembles sur une carte electronique.
EP0488031A2 (fr) * 1990-11-27 1992-06-03 Dainippon Screen Mfg. Co., Ltd. Méthode et dispositif pour inspecter un circuit imprimé

Families Citing this family (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4498779A (en) * 1979-01-10 1985-02-12 Rca Corporation Automatic stripe width reader
JPS55132904A (en) * 1979-04-05 1980-10-16 Fuji Electric Co Ltd Shape inspection system
DE2934038C2 (de) * 1979-08-23 1982-02-25 Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V., 5000 Köln Rißfortschritts-Meßeinrichtung
DE2950003C2 (de) * 1979-12-12 1983-08-11 Windmöller & Hölscher, 4540 Lengerich Verfahren zur Regelung der Foliendicke an einer Blasfolien-Extruderanlage
EP0054596B1 (fr) * 1980-12-18 1985-05-29 International Business Machines Corporation Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles et des critères de rejet variables selon l'emplacement, équipement et circuits de mise en oeuvre
EP0070017B1 (fr) * 1981-07-14 1986-10-29 Hitachi, Ltd. Système de reconnaissance de dessins
DE3151265C2 (de) * 1981-12-24 1984-03-29 Bayerische Motoren Werke AG, 8000 München Prüfverfahren für eine Schraubenverbindung und Vorrichtung zur Durchführung des Verfahrens
US4910401A (en) * 1982-01-20 1990-03-20 The Boeing Company LWIR sensor system with improved clutter rejection
US4500202A (en) * 1982-05-24 1985-02-19 Itek Corporation Printed circuit board defect detection of detecting maximum line width violations
JPS5987607U (ja) * 1982-12-03 1984-06-13 日立電子エンジニアリング株式会社 相互比較方式パタ−ン検査機の位置合せ装置
US4578810A (en) * 1983-08-08 1986-03-25 Itek Corporation System for printed circuit board defect detection
US4600951A (en) * 1983-12-20 1986-07-15 At&T Technologies, Inc. Scanning sample, signal generation, data digitizing and retiming system
US4556903A (en) * 1983-12-20 1985-12-03 At&T Technologies, Inc. Inspection scanning system
US4556317A (en) * 1984-02-22 1985-12-03 Kla Instruments Corporation X-Y Stage for a patterned wafer automatic inspection system
US4618938A (en) * 1984-02-22 1986-10-21 Kla Instruments Corporation Method and apparatus for automatic wafer inspection
JPS60263807A (ja) * 1984-06-12 1985-12-27 Dainippon Screen Mfg Co Ltd プリント配線板のパタ−ン欠陥検査装置
US4648053A (en) * 1984-10-30 1987-03-03 Kollmorgen Technologies, Corp. High speed optical inspection system
JPS61213612A (ja) * 1985-03-19 1986-09-22 Hitachi Ltd プリント基板のパタ−ン検査装置
US4881269A (en) * 1985-07-29 1989-11-14 French Limited Company - Centaure Robotique Automatic method of optically scanning a two-dimensional scene line-by-line and of electronically inspecting patterns therein by "shape-tracking"
JPS62244611A (ja) * 1986-04-18 1987-10-26 Toshiba Mach Co Ltd プラスチツク筒状物成形用プラグ装置
US4905261A (en) * 1989-01-23 1990-02-27 Zane Machine Co. Defrosting grid system testing apparatus
US5125035A (en) * 1989-12-18 1992-06-23 Chromalloy Gas Turbine Corporation Five axis generated hole inspection system
US5164785A (en) * 1991-02-08 1992-11-17 Hopkins Manufacturing Corporation Headlight aiming apparatus and display
US5335091A (en) * 1991-12-31 1994-08-02 Eastman Kodak Company Apparatus for mechanically dithering a CCD array
US5331393A (en) * 1992-12-11 1994-07-19 Hopkins Manufacturing Corporation Method and apparatus for locating a specific location on a vehicle headlamp
US5392360A (en) * 1993-04-28 1995-02-21 International Business Machines Corporation Method and apparatus for inspection of matched substrate heatsink and hat assemblies
US5485265A (en) * 1994-09-02 1996-01-16 Hopkins Manufacturing Corporation Vehicle headlight aiming apparatus
EP0718624A3 (fr) * 1994-12-19 1997-07-30 At & T Corp Procédé et appareil pour l'illumination des matériaux translucides ou semitransparents
US5831669A (en) * 1996-07-09 1998-11-03 Ericsson Inc Facility monitoring system with image memory and correlation
US6366358B1 (en) * 1996-10-09 2002-04-02 Dai Nippon Printing Co., Ltd. Method and apparatus for detecting stripe defects of printed matter
US6158119A (en) * 1997-07-14 2000-12-12 Motorola, Inc. Circuit board panel test strip and associated method of assembly
US6173071B1 (en) * 1997-12-16 2001-01-09 Harold Wasserman Apparatus and method for processing video data in automatic optical inspection
JPH11271959A (ja) * 1998-03-24 1999-10-08 Oki Electric Ind Co Ltd フォトマスク並びにその良否判定方法及び装置
US6324298B1 (en) * 1998-07-15 2001-11-27 August Technology Corp. Automated wafer defect inspection system and a process of performing such inspection
IL133313A (en) * 1999-12-05 2004-12-15 Orbotech Ltd Adaptive tolerance reference inspection system
US7034930B1 (en) * 2000-08-08 2006-04-25 Advanced Micro Devices, Inc. System and method for defect identification and location using an optical indicia device
AU2001290608A1 (en) * 2000-08-31 2002-03-13 Rytec Corporation Sensor and imaging system
US7562350B2 (en) * 2000-12-15 2009-07-14 Ricoh Company, Ltd. Processing system and method using recomposable software
US7321699B2 (en) * 2002-09-06 2008-01-22 Rytec Corporation Signal intensity range transformation apparatus and method
US7233871B2 (en) * 2003-03-10 2007-06-19 Landrex Technologies Co., Ltd. Inspection window guard banding
US7504965B1 (en) 2005-08-05 2009-03-17 Elsag North America, Llc Portable covert license plate reader
US7869645B2 (en) * 2008-07-22 2011-01-11 Seiko Epson Corporation Image capture and calibratiion
US8090184B2 (en) * 2008-07-23 2012-01-03 Seiko Epson Corporation Fault detection of a printed dot-pattern bitmap
US8269836B2 (en) * 2008-07-24 2012-09-18 Seiko Epson Corporation Image capture, alignment, and registration
KR101251372B1 (ko) * 2008-10-13 2013-04-05 주식회사 고영테크놀러지 3차원형상 측정방법
USRE43925E1 (en) * 2008-11-21 2013-01-15 Industrial Technology Research Institute Three dimensional profile inspecting apparatus
TWI387721B (zh) * 2008-11-21 2013-03-01 Ind Tech Res Inst 三維形貌檢測裝置
DE102010037788B4 (de) 2010-09-27 2012-07-19 Viprotron Gmbh Verfahren und Vorrichtung zur Anzeige von automatisiert ermittelten Fehlerstellen
US9355444B2 (en) * 2012-09-28 2016-05-31 Skyworks Solutions, Inc. Systems and methods for processing packaged radio-frequency modules identified as being potentially defective
CN103149150B (zh) * 2013-01-31 2015-07-01 厦门大学 一种悬挂式检测台
CN103487442A (zh) * 2013-09-25 2014-01-01 华南理工大学 一种新型挠性电路板缺陷检测装置及方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3339076A (en) * 1964-01-13 1967-08-29 Univ Minnesota Dual differential densitometer
NL7409850A (nl) * 1974-07-22 1976-01-26 Philips Nv Werkwijze en inrichting voor het testen van een tweedimensionaal patroon.

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0004505A2 (fr) * 1978-03-24 1979-10-03 Thomson-Csf Appareil de contrôle d'un dessin inscrit sur un support plan
FR2420796A1 (fr) * 1978-03-24 1979-10-19 Thomson Csf Systeme de controle d'un dessin inscrit sur un support plan
EP0004505A3 (en) * 1978-03-24 1979-10-31 "Thomson-Csf"- Scpi System for checking a pattern on a flat base
FR2455423A1 (fr) * 1979-04-25 1980-11-21 Hitachi Ltd Appareil pour verifier les plaques de circuit imprime
EP0054598A1 (fr) * 1980-12-18 1982-06-30 International Business Machines Corporation Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles fixes et équipement de mise en oeuvre
FR2500925A1 (fr) * 1981-03-02 1982-09-03 Atelier Outillage Orleanais Sa Procede pour controler des percages pratiques dans une piece, notamment une carte a circuits imprimes, et appareil pour la mise en oeuvre de ce procede
EP0126492A2 (fr) * 1983-05-24 1984-11-28 Automation Engineering, Inc. Appareil et méthode pour l'inspection des plaquettes de circuits imprimés
EP0126492A3 (fr) * 1983-05-24 1985-09-11 Automation Engineering, Inc. Appareil et méthode pour l'inspection des plaquettes de circuits imprimés
FR2669180A1 (fr) * 1990-11-12 1992-05-15 Axis Vision Sarl Machine d'inspection de composants assembles sur une carte electronique.
EP0488031A2 (fr) * 1990-11-27 1992-06-03 Dainippon Screen Mfg. Co., Ltd. Méthode et dispositif pour inspecter un circuit imprimé
EP0488031A3 (en) * 1990-11-27 1992-10-07 Dainippon Screen Mfg. Co., Ltd. Method of and apparatus for inspecting a printed circuit board
US5408538A (en) * 1990-11-27 1995-04-18 Dainippon Screen Mfg. Co., Ltd. Method of and apparatus for inspecting the minimum annular width of a land on a printed circuit board

Also Published As

Publication number Publication date
NL7609069A (nl) 1977-02-15
IE43287B1 (en) 1981-01-28
IT1067798B (it) 1985-03-16
DE2635563A1 (de) 1977-03-03
SE412470B (sv) 1980-03-03
US4185298A (en) 1980-01-22
GB1515206A (en) 1978-06-21
BE844695A (fr) 1977-01-31
SE7608971L (sv) 1977-02-14
FR2321229B1 (fr) 1980-02-08
IE43287L (en) 1977-02-13
CH609820A5 (fr) 1979-03-15
JPS5223365A (en) 1977-02-22

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Legal Events

Date Code Title Description
ST Notification of lapse