FR2298083A1 - Distance measurement between two points of structure - involves using sensor with graduations at intervals and cursor making electrical contact - Google Patents
Distance measurement between two points of structure - involves using sensor with graduations at intervals and cursor making electrical contactInfo
- Publication number
- FR2298083A1 FR2298083A1 FR7501625A FR7501625A FR2298083A1 FR 2298083 A1 FR2298083 A1 FR 2298083A1 FR 7501625 A FR7501625 A FR 7501625A FR 7501625 A FR7501625 A FR 7501625A FR 2298083 A1 FR2298083 A1 FR 2298083A1
- Authority
- FR
- France
- Prior art keywords
- points
- graduations
- cursor
- sensor
- intervals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
The apparatus measures the distance between two points of a structure with a view to detecting structural deformation. It includes a sensor with two sensitive elements which are linked respectively to these two points. The first element has an area comprising alternating portions, called graduations (18), which are electrically conducting, and electrically insulating portions, called intervals (19). The second element comprises an electrically conducting component called the cursor (21). Part of the cursor may be moved against the area of the first element. It is always in contact with at least one graduation. The graduations and the cursor are connected to a detecton apparatus (29) which deduces the distance between the two points of the structure.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7501625A FR2298083A1 (en) | 1975-01-20 | 1975-01-20 | Distance measurement between two points of structure - involves using sensor with graduations at intervals and cursor making electrical contact |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7501625A FR2298083A1 (en) | 1975-01-20 | 1975-01-20 | Distance measurement between two points of structure - involves using sensor with graduations at intervals and cursor making electrical contact |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2298083A1 true FR2298083A1 (en) | 1976-08-13 |
FR2298083B1 FR2298083B1 (en) | 1979-10-12 |
Family
ID=9150038
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7501625A Granted FR2298083A1 (en) | 1975-01-20 | 1975-01-20 | Distance measurement between two points of structure - involves using sensor with graduations at intervals and cursor making electrical contact |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2298083A1 (en) |
-
1975
- 1975-01-20 FR FR7501625A patent/FR2298083A1/en active Granted
Also Published As
Publication number | Publication date |
---|---|
FR2298083B1 (en) | 1979-10-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5786002A (en) | Contact detection probe | |
JPS5263358A (en) | Contact detection probe | |
EP0252697A3 (en) | Semiconductor wafer temperature measuring device and method | |
GB1385977A (en) | Electrical measurement apparatus | |
GB1086034A (en) | Method of determining resistivity | |
FR2406835A1 (en) | Length measuring machine contact sensing probe - has sensing circuit monitoring probe vibrations generated by transducer in contact element | |
FR2298083A1 (en) | Distance measurement between two points of structure - involves using sensor with graduations at intervals and cursor making electrical contact | |
FR2273257A1 (en) | Sensor for surfaces of objects - has surface electrode and measurement electrodes connected to integral elastic film | |
FR2438271A1 (en) | Device for detection of specific gas - comprises two probes of variable conductance, one of pure nickel oxide one of doped or non-stoichiometric nickel oxide | |
FR2279095A1 (en) | Heat transfer coefficient measuring procedure - uses electrical traces, measure of power dissipated | |
CH614526A5 (en) | Apparatus for measuring the distance between the surface of an electrically conductive medium and a reference point and for measuring the temperature of the medium | |
JPS548465A (en) | Etching method | |
JPS57114866A (en) | Measuring device of semiconductor device | |
JPS55147301A (en) | Micrometer with short circuit | |
SU555326A1 (en) | Capacitive transducer | |
EP0840132A3 (en) | A device for detecting and indicating potential differences between two bodies | |
FR2368010A1 (en) | Electric transducer for inclination measurement - has ball moving over printed circuit inside drum to connect two conductive paths | |
JPS57106804A (en) | Measuring device for thickness of film | |
JPS5248384A (en) | Surface temperature measuring portion | |
SU144313A1 (en) | Ferritic magnetostriction method | |
JPS57114811A (en) | Contact type encoder for measurement device | |
JPS5365670A (en) | Measurement device for semiconductor probe | |
JPS56133842A (en) | Device for measuring characteristics of semiconductor element | |
JPS5768046A (en) | Probe card | |
JPS5416183A (en) | Probe card |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |