FR2292331A1 - Filtre de wien - Google Patents

Filtre de wien

Info

Publication number
FR2292331A1
FR2292331A1 FR7535798A FR7535798A FR2292331A1 FR 2292331 A1 FR2292331 A1 FR 2292331A1 FR 7535798 A FR7535798 A FR 7535798A FR 7535798 A FR7535798 A FR 7535798A FR 2292331 A1 FR2292331 A1 FR 2292331A1
Authority
FR
France
Prior art keywords
wien filter
wien
filter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7535798A
Other languages
English (en)
French (fr)
Other versions
FR2292331B1 (US20090177143A1-20090709-C00008.png
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of FR2292331A1 publication Critical patent/FR2292331A1/fr
Application granted granted Critical
Publication of FR2292331B1 publication Critical patent/FR2292331B1/fr
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
    • H01J49/286—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter
    • H01J49/288—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter using crossed electric and magnetic fields perpendicular to the beam, e.g. Wien filter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/466—Static spectrometers using crossed electric and magnetic fields perpendicular to the beam, e.g. Wien filter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
FR7535798A 1974-11-25 1975-11-24 Filtre de wien Granted FR2292331A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7415318A NL7415318A (nl) 1974-11-25 1974-11-25 Wienfilter.

Publications (2)

Publication Number Publication Date
FR2292331A1 true FR2292331A1 (fr) 1976-06-18
FR2292331B1 FR2292331B1 (US20090177143A1-20090709-C00008.png) 1979-06-01

Family

ID=19822525

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7535798A Granted FR2292331A1 (fr) 1974-11-25 1975-11-24 Filtre de wien

Country Status (6)

Country Link
US (1) US4019989A (US20090177143A1-20090709-C00008.png)
JP (1) JPS5177384A (US20090177143A1-20090709-C00008.png)
DE (1) DE2550668A1 (US20090177143A1-20090709-C00008.png)
FR (1) FR2292331A1 (US20090177143A1-20090709-C00008.png)
GB (1) GB1523458A (US20090177143A1-20090709-C00008.png)
NL (1) NL7415318A (US20090177143A1-20090709-C00008.png)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4287419A (en) * 1978-05-22 1981-09-01 The United States Of America As Represented By The United States Department Of Energy Strong focus space charge
US4315153A (en) * 1980-05-19 1982-02-09 Hughes Aircraft Company Focusing ExB mass separator for space-charge dominated ion beams
JPS57206173A (en) * 1981-06-15 1982-12-17 Nippon Telegr & Teleph Corp <Ntt> Focusing deflecting device for charged corpuscule beam
JPS58169856A (ja) * 1982-03-31 1983-10-06 Jeol Ltd 荷電粒子線装置
US4661712A (en) * 1985-05-28 1987-04-28 Varian Associates, Inc. Apparatus for scanning a high current ion beam with a constant angle of incidence
JPH06101318B2 (ja) * 1985-10-16 1994-12-12 株式会社日立製作所 イオンマイクロビ−ム装置
EP0236807A3 (de) * 1986-03-07 1990-05-16 Siemens Aktiengesellschaft Spektrometerobjektiv für die Korpuskularstrahl-Messtechnik
US4775789A (en) * 1986-03-19 1988-10-04 Albridge Jr Royal G Method and apparatus for producing neutral atomic and molecular beams
US4789787A (en) * 1987-05-27 1988-12-06 Microbeam Inc. Wien filter design
DE3813641A1 (de) * 1988-01-26 1989-08-03 Finnigan Mat Gmbh Doppelfokussierendes massenspektrometer und ms/ms-anordnung
EP0501257B1 (en) * 1991-02-22 1996-08-21 Shimadzu Corporation Ion scattering spectrometer
US5374913A (en) * 1991-12-13 1994-12-20 Houston Advanced Research Center Twin-bore flux pipe dipole magnet
JP3757371B2 (ja) * 1999-07-05 2006-03-22 日本電子株式会社 エネルギーフィルタ及びそれを用いた電子顕微鏡
US6815668B2 (en) * 1999-07-21 2004-11-09 The Charles Stark Draper Laboratory, Inc. Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry
US6806463B2 (en) 1999-07-21 2004-10-19 The Charles Stark Draper Laboratory, Inc. Micromachined field asymmetric ion mobility filter and detection system
US7005632B2 (en) * 2002-04-12 2006-02-28 Sionex Corporation Method and apparatus for control of mobility-based ion species identification
US6495823B1 (en) 1999-07-21 2002-12-17 The Charles Stark Draper Laboratory, Inc. Micromachined field asymmetric ion mobility filter and detection system
US6815669B1 (en) 1999-07-21 2004-11-09 The Charles Stark Draper Laboratory, Inc. Longitudinal field driven ion mobility filter and detection system
US7129482B2 (en) 1999-07-21 2006-10-31 Sionex Corporation Explosives detection using differential ion mobility spectrometry
US6690004B2 (en) 1999-07-21 2004-02-10 The Charles Stark Draper Laboratory, Inc. Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry
US7098449B1 (en) 1999-07-21 2006-08-29 The Charles Stark Draper Laboratory, Inc. Spectrometer chip assembly
EP1405065B1 (en) * 2001-06-30 2012-04-11 Dh Technologies Development Pte. Ltd. System for collection of data and identification of unknown ion species in an electric field
US7714284B2 (en) * 2001-06-30 2010-05-11 Sionex Corporation Methods and apparatus for enhanced sample identification based on combined analytical techniques
US7274015B2 (en) * 2001-08-08 2007-09-25 Sionex Corporation Capacitive discharge plasma ion source
US7091481B2 (en) 2001-08-08 2006-08-15 Sionex Corporation Method and apparatus for plasma generation
US6727496B2 (en) * 2001-08-14 2004-04-27 Sionex Corporation Pancake spectrometer
US7122794B1 (en) 2002-02-21 2006-10-17 Sionex Corporation Systems and methods for ion mobility control
DE10339346B8 (de) 2003-08-25 2006-04-13 Ion-Tof Gmbh Massenspektrometer und Flüssigmetall-Ionenquelle für ein solches Massenspektrometer
US7399959B2 (en) * 2004-12-03 2008-07-15 Sionex Corporation Method and apparatus for enhanced ion based sample filtering and detection
US7164139B1 (en) 2005-02-01 2007-01-16 Kla-Tencor Technologies Corporation Wien filter with reduced chromatic aberration
GB2441943A (en) 2005-07-26 2008-03-19 Sionex Corp Ultra compact ion mobility based analyzer system and method
US7402799B2 (en) * 2005-10-28 2008-07-22 Northrop Grumman Corporation MEMS mass spectrometer
US8217344B2 (en) 2007-02-01 2012-07-10 Dh Technologies Development Pte. Ltd. Differential mobility spectrometer pre-filter assembly for a mass spectrometer
WO2008115339A1 (en) * 2007-03-15 2008-09-25 White Nicholas R Open-ended electromagnetic corrector assembly and method for deflecting, focusing, and controlling the uniformity of a traveling ion beam
JP4977509B2 (ja) * 2007-03-26 2012-07-18 株式会社日立ハイテクノロジーズ 走査電子顕微鏡
US8835866B2 (en) * 2011-05-19 2014-09-16 Fei Company Method and structure for controlling magnetic field distributions in an ExB Wien filter
US8436317B1 (en) 2011-11-09 2013-05-07 Hermes-Microvision, Inc. Wien filter
JP6545053B2 (ja) * 2015-03-30 2019-07-17 東京エレクトロン株式会社 処理装置および処理方法、ならびにガスクラスター発生装置および発生方法
DE102020118567A1 (de) * 2019-11-27 2021-05-27 Huf Hülsbeck & Fürst Gmbh & Co. Kg Vorrichtung für ein Fahrzeug zur Kommunikation mit einem mobilen Gerät

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3816748A (en) * 1972-04-28 1974-06-11 Alpha Ind Inc Ion accelerator employing crossed-field selector

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
BRITISH JOURNAL OF APPLIED PHYSICS, VOL. 18, 1967 LETCHWORTH, GRANDE-BRETAGNE W.H.J. ANDERSEN: "OPTIMUM ADJUSTMENT AND CORRECTION OF THE WIEN FILTER" PAGES 1573-1579) *

Also Published As

Publication number Publication date
US4019989A (en) 1977-04-26
NL7415318A (nl) 1976-05-28
FR2292331B1 (US20090177143A1-20090709-C00008.png) 1979-06-01
DE2550668A1 (de) 1976-05-26
GB1523458A (en) 1978-08-31
JPS5177384A (US20090177143A1-20090709-C00008.png) 1976-07-05

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Legal Events

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