FR2273278A1 - - Google Patents
Info
- Publication number
- FR2273278A1 FR2273278A1 FR7507945A FR7507945A FR2273278A1 FR 2273278 A1 FR2273278 A1 FR 2273278A1 FR 7507945 A FR7507945 A FR 7507945A FR 7507945 A FR7507945 A FR 7507945A FR 2273278 A1 FR2273278 A1 FR 2273278A1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9006—Details, e.g. in the structure or functioning of sensors
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2426270A DE2426270C3 (de) | 1974-05-29 | 1974-05-29 | WirbelstromprUfspulenanordnung |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2273278A1 true FR2273278A1 (US20080094685A1-20080424-C00004.png) | 1975-12-26 |
| FR2273278B1 FR2273278B1 (US20080094685A1-20080424-C00004.png) | 1980-04-04 |
Family
ID=5916918
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7507945A Expired FR2273278B1 (US20080094685A1-20080424-C00004.png) | 1974-05-29 | 1975-03-13 |
Country Status (5)
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2487969A1 (fr) * | 1980-07-31 | 1982-02-05 | Mo Energeticheskij Institut | Capteur a courants de foucault destine a des dispositifs d'essais non destructifs pour des alesages et des tubes et son procede de fabrication |
| WO1986002456A1 (en) * | 1984-10-19 | 1986-04-24 | Thorburn Technics (International) Limited | Electromagnetic inspection |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53147745U (US20080094685A1-20080424-C00004.png) * | 1977-04-25 | 1978-11-21 | ||
| EP0055050B1 (en) * | 1980-12-09 | 1985-04-03 | Matsushita Electric Industrial Co., Ltd. | Lamination-wound chip coil and method for manufacturing the same |
| US4593245A (en) * | 1983-12-12 | 1986-06-03 | General Electric Company | Eddy current method for detecting a flaw in semi-conductive material |
| GB2186372A (en) * | 1986-02-03 | 1987-08-12 | Atomic Energy Authority Uk | Eddy current testing |
| RU2040788C1 (ru) * | 1993-04-29 | 1995-07-25 | Товарищество с ограниченной ответственностью "Интрон Плюс" | Вихретоковый датчик для неразрушающего контроля металлизации отверстий и трубок и способ его изготовления |
| US7310039B1 (en) * | 2001-11-30 | 2007-12-18 | Silicon Laboratories Inc. | Surface inductor |
| GB2389909A (en) * | 2002-06-22 | 2003-12-24 | Hocking Ndt Ltd | Inductively coupled eddy current probe |
| US7352269B2 (en) | 2002-12-13 | 2008-04-01 | Volterra Semiconductor Corporation | Method for making magnetic components with N-phase coupling, and related inductor structures |
| US7498920B2 (en) | 2002-12-13 | 2009-03-03 | Volterra Semiconductor Corporation | Method for making magnetic components with N-phase coupling, and related inductor structures |
| US8237530B2 (en) * | 2009-08-10 | 2012-08-07 | Volterra Semiconductor Corporation | Coupled inductor with improved leakage inductance control |
| US8299885B2 (en) | 2002-12-13 | 2012-10-30 | Volterra Semiconductor Corporation | Method for making magnetic components with M-phase coupling, and related inductor structures |
| US7898379B1 (en) | 2002-12-13 | 2011-03-01 | Volterra Semiconductor Corporation | Method for making magnetic components with N-phase coupling, and related inductor structures |
| US7965165B2 (en) * | 2002-12-13 | 2011-06-21 | Volterra Semiconductor Corporation | Method for making magnetic components with M-phase coupling, and related inductor structures |
| US8102233B2 (en) * | 2009-08-10 | 2012-01-24 | Volterra Semiconductor Corporation | Coupled inductor with improved leakage inductance control |
| US20040257072A1 (en) * | 2003-06-19 | 2004-12-23 | Rock Samson | Dual-sensitivity eddy current test probe |
| JP2006200913A (ja) * | 2005-01-18 | 2006-08-03 | Tokyo Electric Power Services Co Ltd | 中空金属体の減肉検出装置 |
| US8638187B2 (en) | 2009-07-22 | 2014-01-28 | Volterra Semiconductor Corporation | Low profile inductors for high density circuit boards |
| US8040212B2 (en) * | 2009-07-22 | 2011-10-18 | Volterra Semiconductor Corporation | Low profile inductors for high density circuit boards |
| US8299882B2 (en) | 2009-07-22 | 2012-10-30 | Volterra Semiconductor Corporation | Low profile inductors for high density circuit boards |
| US9019063B2 (en) | 2009-08-10 | 2015-04-28 | Volterra Semiconductor Corporation | Coupled inductor with improved leakage inductance control |
| US8648664B2 (en) | 2011-09-30 | 2014-02-11 | Silicon Laboratories Inc. | Mutual inductance circuits |
| DE102013222523A1 (de) * | 2013-11-06 | 2015-05-07 | Magnetische Prüfanlagen Gmbh | Wirbelstromsonde und Wirbelstrom-Prüfgerät |
| USD742059S1 (en) * | 2014-02-28 | 2015-10-27 | Leeo, Inc. | Nightlight and air sensor |
| USD741728S1 (en) * | 2014-02-28 | 2015-10-27 | Leeo, Inc. | Nightlight and air sensor |
| USD741539S1 (en) * | 2014-02-28 | 2015-10-20 | Leeo, Inc. | Nightlight and air sensor |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2542057A (en) * | 1948-05-06 | 1951-02-20 | Matthew J Relis | Method and apparatus for measuring the conductivity of an electrolyte |
| US3135914A (en) * | 1959-09-04 | 1964-06-02 | Magnetic Analysis Corp | Multi-frequency testing method and apparatus for selectively detecting flaws at different depths |
| GB1005815A (en) * | 1960-10-14 | 1965-09-29 | Gkn Group Services Ltd | Improvements relating to methods of and apparatus for the detection of flaws |
| GB991890A (en) * | 1960-12-21 | 1965-05-12 | British Non Ferrous Metals Res | Improvements relating to search coil assemblies for eddy current testing |
| US3504276A (en) * | 1967-04-19 | 1970-03-31 | American Mach & Foundry | Printed circuit coils for use in magnetic flux leakage flow detection |
| US3465274A (en) * | 1967-10-23 | 1969-09-02 | American Mach & Foundry | Search coil arrangement |
| US3523241A (en) * | 1968-11-26 | 1970-08-04 | American Mach & Foundry | Flexible search shoe |
-
1974
- 1974-05-29 DE DE2426270A patent/DE2426270C3/de not_active Expired
-
1975
- 1975-02-18 GB GB686575A patent/GB1458794A/en not_active Expired
- 1975-03-12 US US05/557,639 patent/US3988665A/en not_active Expired - Lifetime
- 1975-03-13 FR FR7507945A patent/FR2273278B1/fr not_active Expired
- 1975-05-29 JP JP50064779A patent/JPS513286A/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2487969A1 (fr) * | 1980-07-31 | 1982-02-05 | Mo Energeticheskij Institut | Capteur a courants de foucault destine a des dispositifs d'essais non destructifs pour des alesages et des tubes et son procede de fabrication |
| WO1986002456A1 (en) * | 1984-10-19 | 1986-04-24 | Thorburn Technics (International) Limited | Electromagnetic inspection |
Also Published As
| Publication number | Publication date |
|---|---|
| DE2426270B2 (de) | 1977-08-25 |
| DE2426270A1 (de) | 1975-12-11 |
| DE2426270C3 (de) | 1978-04-27 |
| JPS513286A (US20080094685A1-20080424-C00004.png) | 1976-01-12 |
| FR2273278B1 (US20080094685A1-20080424-C00004.png) | 1980-04-04 |
| GB1458794A (en) | 1976-12-15 |
| US3988665A (en) | 1976-10-26 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |