FR2166390A1 - - Google Patents

Info

Publication number
FR2166390A1
FR2166390A1 FR7247204A FR7247204A FR2166390A1 FR 2166390 A1 FR2166390 A1 FR 2166390A1 FR 7247204 A FR7247204 A FR 7247204A FR 7247204 A FR7247204 A FR 7247204A FR 2166390 A1 FR2166390 A1 FR 2166390A1
Authority
FR
France
Prior art keywords
photo
disc
cell
interference
scanned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7247204A
Other languages
French (fr)
Other versions
FR2166390B1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2166390A1 publication Critical patent/FR2166390A1/fr
Application granted granted Critical
Publication of FR2166390B1 publication Critical patent/FR2166390B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9506—Optical discs

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

1406470 Photo-electric apparatus INTERNATIONAL BUSINESS MACHINES CORP 20 Dec 1972 [4 Jan 1972] 58903/72 Heading G1A In an apparatus for monitoring irregularities on a periodically structured surface 8 in which a laser beam is scanned - from 2a to 2c - periodically across the surface to produce an interference pattern at a photo-cell assembly 9, the intensity of at least one order of interference is sensed. A laser beam is scanned across the surface 8, e.g. of a magnetic storage disc, by an oscillating mirror 5. For a disc of acceptable quality the machine markings on the disc will have a regular, periodic structure, Fig.2 (not shown) and the disc will hence act as a reflection grating. The assembly 9 is positioned such that the -1, 0, +1 orders of interference fall on photo-cells 12, 10, 11 respectively. A photo-cell 14 monitors scattered light, while photo-cell 13 receives the ¢ order of interference. For a regular surface structure the output from photo-cell 13 will be steady and relatively low, Fig.4, left (not shown). However, irregularities in the machine cut, Fig.3 (not shown) will produce a varying, relatively high output from photo-cell 13, Fig.4 right. The scattered light level output from photo-cell 14 will also be greater in the latter case. The entire disc surface is scanned either by rotating the disc or by rotating the optical system about the disc.
FR7247204A 1972-01-04 1972-12-26 Expired FR2166390B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19722200222 DE2200222A1 (en) 1972-01-04 1972-01-04 DEVICE FOR DETERMINING THE SURFACE QUALITY

Publications (2)

Publication Number Publication Date
FR2166390A1 true FR2166390A1 (en) 1973-08-17
FR2166390B1 FR2166390B1 (en) 1974-01-04

Family

ID=5832302

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7247204A Expired FR2166390B1 (en) 1972-01-04 1972-12-26

Country Status (5)

Country Link
JP (1) JPS4879663A (en)
CA (1) CA1017139A (en)
DE (1) DE2200222A1 (en)
FR (1) FR2166390B1 (en)
GB (1) GB1406470A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2353107A1 (en) * 1976-05-28 1977-12-23 Rca Corp SURFACE FAULT DETECTION SYSTEM, ESPECIALLY OF THE SURFACE OF A DISC FACE
FR2353111A1 (en) * 1976-05-28 1977-12-23 Rca Corp SYSTEM FOR TRACKING FAULTS
EP0123929A2 (en) * 1983-04-22 1984-11-07 Erwin Sick GmbH Optik-Elektronik Device for the detection of faults
EP0152165A2 (en) * 1984-01-10 1985-08-21 Victor Company Of Japan, Limited Defect inspecting apparatus for inspecting defects in optical type disc

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5168412A (en) * 1989-06-28 1992-12-01 Toan Doan Surface interference detector
KR102286356B1 (en) 2016-10-26 2021-08-04 보드 오브 리전츠, 더 유니버시티 오브 텍사스 시스템 High-Throughput, High-Resolution Optical Techniques for Reflective and Transmissive Nanophoton Devices

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2353107A1 (en) * 1976-05-28 1977-12-23 Rca Corp SURFACE FAULT DETECTION SYSTEM, ESPECIALLY OF THE SURFACE OF A DISC FACE
FR2353111A1 (en) * 1976-05-28 1977-12-23 Rca Corp SYSTEM FOR TRACKING FAULTS
EP0123929A2 (en) * 1983-04-22 1984-11-07 Erwin Sick GmbH Optik-Elektronik Device for the detection of faults
EP0123929A3 (en) * 1983-04-22 1985-12-04 Erwin Sick Gmbh Optik-Elektronik Device for the detection of faults
EP0152165A2 (en) * 1984-01-10 1985-08-21 Victor Company Of Japan, Limited Defect inspecting apparatus for inspecting defects in optical type disc
EP0152165A3 (en) * 1984-01-10 1986-06-04 Victor Company Of Japan, Limited Defect inspecting apparatus for inspecting defects in optical type disc

Also Published As

Publication number Publication date
JPS4879663A (en) 1973-10-25
CA1017139A (en) 1977-09-13
DE2200222A1 (en) 1973-07-12
FR2166390B1 (en) 1974-01-04
GB1406470A (en) 1975-09-17

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Legal Events

Date Code Title Description
ST Notification of lapse