FR2102327A1 - - Google Patents

Info

Publication number
FR2102327A1
FR2102327A1 FR7129909A FR7129909A FR2102327A1 FR 2102327 A1 FR2102327 A1 FR 2102327A1 FR 7129909 A FR7129909 A FR 7129909A FR 7129909 A FR7129909 A FR 7129909A FR 2102327 A1 FR2102327 A1 FR 2102327A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7129909A
Other languages
French (fr)
Other versions
FR2102327B1 (OSRAM
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Corp
Original Assignee
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Corp filed Critical Siemens Corp
Publication of FR2102327A1 publication Critical patent/FR2102327A1/fr
Application granted granted Critical
Publication of FR2102327B1 publication Critical patent/FR2102327B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H10P74/235
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2637Circuits therefor for testing other individual devices
    • H10P14/47
    • H10P14/6309
    • H10P14/6324
    • H10P50/613

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Weting (AREA)
FR7129909A 1970-08-18 1971-08-17 Expired FR2102327B1 (OSRAM)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2041035A DE2041035C2 (de) 1970-08-18 1970-08-18 Verfahren zum gleichzeitigen elektrolytischen in bezug auf die Sperrfähigkeit selektiven Behandeln von mehreren in einer gemeinsamen Halbleiterscheibe erzeugten gleichen Halbleiterbauelementen

Publications (2)

Publication Number Publication Date
FR2102327A1 true FR2102327A1 (OSRAM) 1972-04-07
FR2102327B1 FR2102327B1 (OSRAM) 1977-03-18

Family

ID=5780094

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7129909A Expired FR2102327B1 (OSRAM) 1970-08-18 1971-08-17

Country Status (10)

Country Link
US (1) US3738917A (OSRAM)
JP (1) JPS579217B1 (OSRAM)
AT (1) AT337779B (OSRAM)
CA (1) CA932880A (OSRAM)
CH (1) CH524827A (OSRAM)
DE (1) DE2041035C2 (OSRAM)
FR (1) FR2102327B1 (OSRAM)
GB (1) GB1332586A (OSRAM)
NL (1) NL7111385A (OSRAM)
SE (1) SE376685B (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022189711A1 (fr) 2021-03-10 2022-09-15 Psa Automobiles Sa Procédé de gestion du fonctionnement d'une interface homme-machine d'un appareillage de gestion du fonctionnement d'un vitrage adaptatif d'un véhicule automobile, système et véhicule automobile associés

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2207012C2 (de) * 1972-02-15 1985-10-31 Siemens AG, 1000 Berlin und 8000 München Verfahren zur Kontaktierung von Halbleiterbauelementen
US3987538A (en) * 1973-12-26 1976-10-26 Texas Instruments Incorporated Method of making devices having closely spaced electrodes
US4080721A (en) * 1975-06-30 1978-03-28 International Business Machines Corporation Fabrication of semiconductor device
US4125440A (en) * 1977-07-25 1978-11-14 International Business Machines Corporation Method for non-destructive testing of semiconductor articles
US4306951A (en) * 1980-05-30 1981-12-22 International Business Machines Corporation Electrochemical etching process for semiconductors

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1432035A (fr) * 1964-03-30 1966-03-18 Gen Electric Perfectionnements aux méthodes de contrôle de semiconducteurs

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
NEANT *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022189711A1 (fr) 2021-03-10 2022-09-15 Psa Automobiles Sa Procédé de gestion du fonctionnement d'une interface homme-machine d'un appareillage de gestion du fonctionnement d'un vitrage adaptatif d'un véhicule automobile, système et véhicule automobile associés

Also Published As

Publication number Publication date
DE2041035A1 (de) 1972-02-24
US3738917A (en) 1973-06-12
DE2041035C2 (de) 1982-10-28
CA932880A (en) 1973-08-28
CH524827A (de) 1972-06-30
FR2102327B1 (OSRAM) 1977-03-18
JPS579217B1 (OSRAM) 1982-02-20
SE376685B (OSRAM) 1975-06-02
NL7111385A (OSRAM) 1972-02-22
GB1332586A (en) 1973-10-03
ATA658871A (de) 1976-11-15
AT337779B (de) 1977-07-25

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Legal Events

Date Code Title Description
ST Notification of lapse