FR1508599A - Dispositifs et procédés d'essai de circuits - Google Patents

Dispositifs et procédés d'essai de circuits

Info

Publication number
FR1508599A
FR1508599A FR8283A FR06008283A FR1508599A FR 1508599 A FR1508599 A FR 1508599A FR 8283 A FR8283 A FR 8283A FR 06008283 A FR06008283 A FR 06008283A FR 1508599 A FR1508599 A FR 1508599A
Authority
FR
France
Prior art keywords
methods
testing devices
circuit testing
circuit
devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8283A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of FR1508599A publication Critical patent/FR1508599A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0286—Programmable, customizable or modifiable circuits
    • H05K1/029—Programmable, customizable or modifiable circuits having a programmable lay-out, i.e. adapted for choosing between a few possibilities
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/14—Structural association of two or more printed circuits
    • H05K1/147—Structural association of two or more printed circuits at least one of the printed circuits being bent or folded, e.g. by using a flexible printed circuit
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007—Types of components
    • H05K2201/10212—Programmable component
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/07—Treatments involving liquids, e.g. plating, rinsing
    • H05K2203/0736—Methods for applying liquids, e.g. spraying
    • H05K2203/074—Features related to the fluid pressure
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/36—Assembling printed circuits with other printed circuits
    • H05K3/361—Assembling flexible printed circuits with other printed circuits
    • H05K3/365—Assembling flexible printed circuits with other printed circuits by abutting, i.e. without alloying process
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)
FR8283A 1966-01-14 1967-01-11 Dispositifs et procédés d'essai de circuits Expired FR1508599A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US52079166A 1966-01-14 1966-01-14

Publications (1)

Publication Number Publication Date
FR1508599A true FR1508599A (fr) 1968-01-05

Family

ID=24074076

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8283A Expired FR1508599A (fr) 1966-01-14 1967-01-11 Dispositifs et procédés d'essai de circuits

Country Status (4)

Country Link
US (1) US3493858A (fr)
DE (1) DE1640504A1 (fr)
FR (1) FR1508599A (fr)
GB (1) GB1104090A (fr)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3641972A (en) * 1970-09-29 1972-02-15 Collins Radio Co Probe assembly
US3777260A (en) * 1972-12-14 1973-12-04 Ibm Grid for making electrical contact
US3911361A (en) * 1974-06-28 1975-10-07 Ibm Coaxial array space transformer
US4209745A (en) * 1978-06-12 1980-06-24 Everett/Charles, Inc. Interchangeable test head for loaded test member
US4232262A (en) * 1978-10-12 1980-11-04 Emo George C Connector contact terminal contamination probe
US4636722A (en) * 1984-05-21 1987-01-13 Probe-Rite, Inc. High density probe-head with isolated and shielded transmission lines
GB2174816A (en) * 1985-05-01 1986-11-12 Vinten Circuit Engineering Testing printed circuit boards
EP0259163A3 (fr) * 1986-09-05 1989-07-12 Tektronix, Inc. Sonde de tranches semi-conductrices
US4812745A (en) * 1987-05-29 1989-03-14 Teradyne, Inc. Probe for testing electronic components
US5172053A (en) * 1989-02-24 1992-12-15 Tokyo Electron Limited Prober apparatus
JPH07123133B2 (ja) * 1990-08-13 1995-12-25 株式会社東芝 フィルムキャリア構造
US5189363A (en) * 1990-09-14 1993-02-23 Ibm Corporation Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester
EP0508707A1 (fr) * 1991-04-12 1992-10-14 Texas Instruments Incorporated Système d'essai de circuit sur le wafer
KR100248571B1 (ko) * 1992-08-31 2000-03-15 히가시 데쓰로 프로우브 장치
US6246247B1 (en) * 1994-11-15 2001-06-12 Formfactor, Inc. Probe card assembly and kit, and methods of using same
US20020053734A1 (en) * 1993-11-16 2002-05-09 Formfactor, Inc. Probe card assembly and kit, and methods of making same
US5736850A (en) * 1995-09-11 1998-04-07 Teradyne, Inc. Configurable probe card for automatic test equipment
US7034563B1 (en) * 2005-01-26 2006-04-25 Ahbee 2, L.P., A California Limited Partnership Apparatus for measuring of thin dielectric layer properties on semiconductor wafers with contact self aligning electrodes
US10794933B1 (en) 2013-03-15 2020-10-06 Johnstech International Corporation Integrated circuit contact test apparatus with and method of construction
US11002760B1 (en) 2017-02-06 2021-05-11 Johnstech International Corporation High isolation housing for testing integrated circuits
JP6975650B2 (ja) * 2018-01-18 2021-12-01 株式会社荏原製作所 検査用基板を用いる電流測定モジュールおよび検査用基板

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2622125A (en) * 1948-09-20 1952-12-16 Houston Oil Field Mat Co Inc Expansible coil for testing material
US2954521A (en) * 1958-04-23 1960-09-27 Technical Electronics Corp Air-actuated electrical contact probe
GB917893A (en) * 1960-06-13 1963-02-06 Sun Printers Ltd An improved means for measuring recesses in an electrically conductive surface
US3238455A (en) * 1962-04-18 1966-03-01 Sylvania Electric Prod Magazine for supporting a plurality of electrical devices and apparatus for making electrical contact to devices supported therein
US3344351A (en) * 1963-06-03 1967-09-26 Gen Instrument Corp Testing apparatus for a sequence of transistors and the like having a condition responsive marker
US3405361A (en) * 1964-01-08 1968-10-08 Signetics Corp Fluid actuable multi-point microprobe for semiconductors
US3345567A (en) * 1964-02-26 1967-10-03 Kulicke And Soffa Mfg Company Multipoint probe apparatus for electrically testing multiple surface points within small zones
US3319166A (en) * 1964-07-21 1967-05-09 Westinghouse Electric Corp Fixture for securing and electrically testing an electronic component in flat package with coplanar leads

Also Published As

Publication number Publication date
GB1104090A (en) 1968-02-21
US3493858A (en) 1970-02-03
DE1640504A1 (de) 1970-10-22

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