FR1502280A - Interféromètre optique - Google Patents

Interféromètre optique

Info

Publication number
FR1502280A
FR1502280A FR84861A FR84861A FR1502280A FR 1502280 A FR1502280 A FR 1502280A FR 84861 A FR84861 A FR 84861A FR 84861 A FR84861 A FR 84861A FR 1502280 A FR1502280 A FR 1502280A
Authority
FR
France
Prior art keywords
optical interferometer
interferometer
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR84861A
Other languages
English (en)
French (fr)
Inventor
H De Lang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of FR1502280A publication Critical patent/FR1502280A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02097—Self-interferometers
    • G01B9/02098—Shearing interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
FR84861A 1965-11-24 1966-11-24 Interféromètre optique Expired FR1502280A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL6515207A NL6515207A (enrdf_load_stackoverflow) 1965-11-24 1965-11-24

Publications (1)

Publication Number Publication Date
FR1502280A true FR1502280A (fr) 1967-11-18

Family

ID=19794724

Family Applications (1)

Application Number Title Priority Date Filing Date
FR84861A Expired FR1502280A (fr) 1965-11-24 1966-11-24 Interféromètre optique

Country Status (7)

Country Link
BE (1) BE690100A (enrdf_load_stackoverflow)
CH (1) CH470651A (enrdf_load_stackoverflow)
DE (1) DE1497539A1 (enrdf_load_stackoverflow)
FR (1) FR1502280A (enrdf_load_stackoverflow)
GB (1) GB1138225A (enrdf_load_stackoverflow)
NL (1) NL6515207A (enrdf_load_stackoverflow)
SE (1) SE332721B (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4647196A (en) * 1981-01-20 1987-03-03 Hitachi Metals, Ltd. Surface flaw detection method

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2082403A5 (enrdf_load_stackoverflow) * 1970-03-13 1971-12-10 Thomson Csf
DE3031961C2 (de) * 1980-08-25 1985-02-07 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Interferometrische Einrichtung zur Messung physikalischer Größen
US5872629A (en) * 1997-06-23 1999-02-16 Charles Evans & Associates Analytical depth monitor utilizing differential interferometric analysis
CN116448243B (zh) * 2023-06-19 2023-09-22 中国工程物理研究院激光聚变研究中心 一种基于交叉偏振波的三维光场自参考测量装置及方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4647196A (en) * 1981-01-20 1987-03-03 Hitachi Metals, Ltd. Surface flaw detection method

Also Published As

Publication number Publication date
SE332721B (enrdf_load_stackoverflow) 1971-02-15
GB1138225A (en) 1968-12-27
BE690100A (enrdf_load_stackoverflow) 1967-05-23
CH470651A (de) 1969-03-31
DE1497539A1 (de) 1969-03-27
NL6515207A (enrdf_load_stackoverflow) 1967-05-25
DE1497539B2 (enrdf_load_stackoverflow) 1975-07-03

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