CH470651A - Optisches Interferometer mit einem optischen Element, welches das von einer Quelle herrührende Strahlungsbündel in räumlich getrennte Teilbundel teilt - Google Patents

Optisches Interferometer mit einem optischen Element, welches das von einer Quelle herrührende Strahlungsbündel in räumlich getrennte Teilbundel teilt

Info

Publication number
CH470651A
CH470651A CH1664366A CH1664366A CH470651A CH 470651 A CH470651 A CH 470651A CH 1664366 A CH1664366 A CH 1664366A CH 1664366 A CH1664366 A CH 1664366A CH 470651 A CH470651 A CH 470651A
Authority
CH
Switzerland
Prior art keywords
divides
source
radiation beam
spatially separated
partial beams
Prior art date
Application number
CH1664366A
Other languages
German (de)
English (en)
Inventor
Lang Hendrik De
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of CH470651A publication Critical patent/CH470651A/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02097—Self-interferometers
    • G01B9/02098—Shearing interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
CH1664366A 1965-11-24 1966-11-21 Optisches Interferometer mit einem optischen Element, welches das von einer Quelle herrührende Strahlungsbündel in räumlich getrennte Teilbundel teilt CH470651A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL6515207A NL6515207A (enrdf_load_stackoverflow) 1965-11-24 1965-11-24

Publications (1)

Publication Number Publication Date
CH470651A true CH470651A (de) 1969-03-31

Family

ID=19794724

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1664366A CH470651A (de) 1965-11-24 1966-11-21 Optisches Interferometer mit einem optischen Element, welches das von einer Quelle herrührende Strahlungsbündel in räumlich getrennte Teilbundel teilt

Country Status (7)

Country Link
BE (1) BE690100A (enrdf_load_stackoverflow)
CH (1) CH470651A (enrdf_load_stackoverflow)
DE (1) DE1497539A1 (enrdf_load_stackoverflow)
FR (1) FR1502280A (enrdf_load_stackoverflow)
GB (1) GB1138225A (enrdf_load_stackoverflow)
NL (1) NL6515207A (enrdf_load_stackoverflow)
SE (1) SE332721B (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2082403A5 (enrdf_load_stackoverflow) * 1970-03-13 1971-12-10 Thomson Csf
DE3031961C2 (de) * 1980-08-25 1985-02-07 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Interferometrische Einrichtung zur Messung physikalischer Größen
US4647196A (en) * 1981-01-20 1987-03-03 Hitachi Metals, Ltd. Surface flaw detection method
US5872629A (en) * 1997-06-23 1999-02-16 Charles Evans & Associates Analytical depth monitor utilizing differential interferometric analysis
CN116448243B (zh) * 2023-06-19 2023-09-22 中国工程物理研究院激光聚变研究中心 一种基于交叉偏振波的三维光场自参考测量装置及方法

Also Published As

Publication number Publication date
SE332721B (enrdf_load_stackoverflow) 1971-02-15
GB1138225A (en) 1968-12-27
BE690100A (enrdf_load_stackoverflow) 1967-05-23
DE1497539A1 (de) 1969-03-27
FR1502280A (fr) 1967-11-18
NL6515207A (enrdf_load_stackoverflow) 1967-05-25
DE1497539B2 (enrdf_load_stackoverflow) 1975-07-03

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Legal Events

Date Code Title Description
PL Patent ceased