FR1235119A - Microscopes électroniques pourvus de dispositifs d'examen des objets - Google Patents

Microscopes électroniques pourvus de dispositifs d'examen des objets

Info

Publication number
FR1235119A
FR1235119A FR804963A FR804963A FR1235119A FR 1235119 A FR1235119 A FR 1235119A FR 804963 A FR804963 A FR 804963A FR 804963 A FR804963 A FR 804963A FR 1235119 A FR1235119 A FR 1235119A
Authority
FR
France
Prior art keywords
fitted
devices
electron microscopes
examining objects
examining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR804963A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of FR1235119A publication Critical patent/FR1235119A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
FR804963A 1958-09-13 1959-09-11 Microscopes électroniques pourvus de dispositifs d'examen des objets Expired FR1235119A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL231361 1958-09-13

Publications (1)

Publication Number Publication Date
FR1235119A true FR1235119A (fr) 1960-07-01

Family

ID=19751346

Family Applications (1)

Application Number Title Priority Date Filing Date
FR804963A Expired FR1235119A (fr) 1958-09-13 1959-09-11 Microscopes électroniques pourvus de dispositifs d'examen des objets

Country Status (6)

Country Link
US (1) US3124680A (fr)
CH (1) CH379656A (fr)
DE (1) DE1152766B (fr)
FR (1) FR1235119A (fr)
GB (1) GB927845A (fr)
NL (2) NL108507C (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1215832B (de) * 1963-04-19 1966-05-05 Max Planck Gesellschaft An der Pumpe arbeitender Korpuskularstrahlapparat, insbesondere Elektronenmikroskop, mit einer den Objekttraeger aufnehmenden, aus zwei gegeneinander waermeisolierten Patronenteilen bestehenden Objektpatrone
DE1202915B (de) * 1963-09-09 1965-10-14 Siemens Ag An der Pumpe arbeitender Korpuskularstrahl-apparat, insbesondere Elektronenmikroskop, mit einer den Objekttraeger aufnehmenden und mit einer Tiefkuehlvorrichtung in Verbindung stehenden Objektpatrone
US3973125A (en) * 1965-09-16 1976-08-03 Siemens Aktiengesellschaft Corpuscular-ray apparatus with a cryogenically cooled specimen space
US3489896A (en) * 1966-11-01 1970-01-13 Ashland Oil Inc Alignment tool or device for cooling blade
DE1614163B1 (de) * 1967-05-31 1970-10-15 Max Planck Gesellschaft Korpuskularstrahlgeraet,insbesondere Elektronenmikroskop,mit einem Praeparathalter
DE1614165B1 (de) * 1967-06-02 1970-09-24 Max Planck Gesellschaft Korpuskularstrahlgeraet,insbesondere Elektronenmikroskop,mit einer Objektraumkuehlung
FR2087652A5 (fr) * 1970-05-27 1971-12-31 Onera (Off Nat Aerospatiale)
NL7906633A (nl) * 1979-09-05 1981-03-09 Philips Nv Anti-contaminatie diafragma voor elektronen- straalapparaat.
JPH01110204A (ja) * 1987-10-23 1989-04-26 Jeol Ltd 電子顕微鏡用走査トンネル顕微鏡
US4833330A (en) * 1987-11-03 1989-05-23 Gatan Inc. Anticontaminator for transmission electron microscopes
US10269533B2 (en) * 2013-09-20 2019-04-23 Hitachi High-Technologies Corporation Anti-contamination trap, and vacuum application device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE659092C (de) * 1934-12-12 1938-04-25 Ernst Ruska Dr Ing Einschleusvorrichtung fuer an der Pumpe betriebene Korpuskularstrahlapparate
CH236120A (de) * 1942-04-29 1945-01-15 Fides Gmbh Verfahren zur Untersuchung eines Objektes in einem Korpuskularstrahlapparat.
BE455526A (fr) * 1943-03-04
NL198831A (fr) * 1954-07-14
US2826701A (en) * 1954-09-01 1958-03-11 Gen Electric Low temperature chamber for electronoptics instruments

Also Published As

Publication number Publication date
GB927845A (en) 1963-06-06
NL108507C (fr)
NL231361A (fr)
DE1152766B (de) 1963-08-14
CH379656A (de) 1964-07-15
US3124680A (en) 1964-03-10

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