FI940458A0 - Menetelmä ja laite metallilla päällystetyn sähköjohtimen poikkipinnan suhteen säätämiseksi - Google Patents

Menetelmä ja laite metallilla päällystetyn sähköjohtimen poikkipinnan suhteen säätämiseksi

Info

Publication number
FI940458A0
FI940458A0 FI940458A FI940458A FI940458A0 FI 940458 A0 FI940458 A0 FI 940458A0 FI 940458 A FI940458 A FI 940458A FI 940458 A FI940458 A FI 940458A FI 940458 A0 FI940458 A0 FI 940458A0
Authority
FI
Finland
Prior art keywords
adjusting
metal
cross
sectional area
electrical conductor
Prior art date
Application number
FI940458A
Other languages
English (en)
Swedish (sv)
Other versions
FI940458A (fi
Inventor
Akira Mikumo
Kenichi Takahashi
Masanobu Koganeya
Original Assignee
Sumitomo Electric Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries filed Critical Sumitomo Electric Industries
Publication of FI940458A0 publication Critical patent/FI940458A0/fi
Publication of FI940458A publication Critical patent/FI940458A/fi

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F3/00—Electrolytic etching or polishing
    • C25F3/16—Polishing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/002—Constructional details of contacts for gauges actuating one or more contacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00—Superconducting devices
    • H10N60/01—Manufacture or treatment
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00—Superconducting devices
    • H10N60/01—Manufacture or treatment
    • H10N60/0268—Manufacture or treatment of devices comprising copper oxide
    • H10N60/0801—Processes peculiar to the manufacture or treatment of filaments or composite wires

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Metallurgy (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Materials Engineering (AREA)
  • Wire Processing (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
FI940458A 1993-02-01 1994-01-31 Menetelmä ja laite metallilla päällystetyn sähköjohtimen poikkipinnan suhteen säätämiseksi FI940458A (fi)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP1473493 1993-02-01
JP6973493 1993-03-29
JP00414794A JP3922728B2 (ja) 1993-02-01 1994-01-19 金属被覆超電導線の製造方法および電解研磨装置

Publications (2)

Publication Number Publication Date
FI940458A0 true FI940458A0 (fi) 1994-01-31
FI940458A FI940458A (fi) 1994-08-02

Family

ID=27276137

Family Applications (1)

Application Number Title Priority Date Filing Date
FI940458A FI940458A (fi) 1993-02-01 1994-01-31 Menetelmä ja laite metallilla päällystetyn sähköjohtimen poikkipinnan suhteen säätämiseksi

Country Status (4)

Country Link
US (3) US5507924A (fi)
JP (1) JP3922728B2 (fi)
FI (1) FI940458A (fi)
FR (2) FR2703461B1 (fi)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT405060B (de) * 1996-04-12 1999-05-25 Andritz Patentverwaltung Verfahren und vorrichtung zur elektrolytischen behandlung von durchlaufendem gut
JP3171131B2 (ja) * 1997-02-25 2001-05-28 住友電気工業株式会社 超電導線の臨界電流値を測定する方法および装置
WO2001056128A2 (en) * 2000-01-20 2001-08-02 American Superconductor Corporation Pre-treatments for the encapsulation of superconducting composites
DE10007567C2 (de) * 2000-02-18 2003-08-07 Graf & Co Ag Verfahren und Vorrichtung zum Herstellen eines Drahtes
KR100371310B1 (ko) * 2000-10-05 2003-02-07 한국과학기술원 전류밀도 제어를 이용한 전해가공방법
US7554317B2 (en) * 2004-09-24 2009-06-30 Superpower, Inc. Critical current testing techniques for superconducting conductors
CN100487823C (zh) * 2005-06-17 2009-05-13 中国科学院电工研究所 高温超导电缆绕制机及电缆绕制方法
US7541213B2 (en) * 2006-07-21 2009-06-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US8305096B2 (en) * 2006-10-30 2012-11-06 Hewlett-Packard Development Company, L.P. Apparatus and method for measuring and monitoring layer properties in web-based processes
JP6395102B2 (ja) * 2014-07-24 2018-09-26 住友電気工業株式会社 超電導線材の臨界電流測定装置
DE102014014781A1 (de) * 2014-10-10 2016-04-14 Burster Cable Measurement Gmbh Verfahren und Vorrichtung zum Bestimmen des spezifischen Längenwiderstandes einer mehrdrähtigen Leitung
CN104635056B (zh) * 2015-02-06 2017-10-27 华南理工大学 一种用于计算三芯电缆中间接头压接管接触电阻的方法
KR101690299B1 (ko) * 2016-07-21 2016-12-27 (주)삼원산업사 산화물층이 형성된 알루미늄 전선 제조방법
RU194245U1 (ru) * 2019-05-27 2019-12-04 ФЕДЕРАЛЬНОЕ ГОСУДАРСТВЕННОЕ КАЗЕННОЕ ВОЕННОЕ ОБРАЗОВАТЕЛЬНОЕ УЧРЕЖДЕНИЕ ВЫСШЕГО ОБРАЗОВАНИЯ Военная академия Ракетных войск стратегического назначения имени Петра Великого МИНИСТЕРСТВА ОБОРОНЫ РОССИЙСКОЙ ФЕДЕРАЦИИ Установка для измерения площади поперечного сечения нетокопроводящих жгутов волокон микропластика полимерных материалов
US20210102309A1 (en) * 2019-10-08 2021-04-08 Lake Region Manufacturing, Inc. Electropolishing of mp35n wire for fatigue life improvement of an implantable lead
CN110823747B (zh) * 2019-10-30 2022-02-22 西部超导材料科技股份有限公司 一种通过质量-电阻法测量wic镶嵌超导线铜超比方法
CN112432587A (zh) * 2020-09-22 2021-03-02 国网江西省电力有限公司电力科学研究院 整盘电缆导体的长度截面判定方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2008046A (en) * 1931-11-18 1935-07-16 Trojan Powder Co Method for the testing of detonating fuse
US2725352A (en) * 1950-07-21 1955-11-29 Western Electric Co Methods of and apparatus for dissolving surface projections, electropolishing and passivating metallic tapes
US2725354A (en) * 1951-10-18 1955-11-29 Western Electric Co Methods of and apparatus for electropolishing metallic articles
GB726133A (en) * 1952-10-09 1955-03-16 Metro Cutanit Ltd Improvements relating to the electrolytic treatment of metal wire and the like
US2854626A (en) * 1954-12-31 1958-09-30 Davidson Martin Plating thickness indicator
US3630864A (en) * 1967-06-19 1971-12-28 Tokyo Shibaura Electric Co Method and apparatus for continuous electrolytic polishing of fine metal wires
NL7008274A (fi) * 1970-06-06 1971-12-08
US3740324A (en) * 1971-01-29 1973-06-19 Hughes Aircraft Co Magnetic wire electropolishing process improvement
US3936738A (en) * 1974-01-02 1976-02-03 Drexelbrook Controls, Inc. Method of and apparatus for measuring the amount of coating material applied to substrates
US4300094A (en) * 1978-04-27 1981-11-10 Micro Sensors, Inc. Finish measuring method and apparatus
SU876808A1 (ru) * 1979-11-29 1981-10-30 Харьковский Государственный Педагогический Институт Им.Г.С.Сковороды Раствор дл электрохимического полировани изделий из ниоби
US4287033A (en) * 1980-04-14 1981-09-01 Calspan Corporation Electrochemical method for removing metallic sheaths
DE3041552A1 (de) * 1980-11-04 1982-10-07 Siemens AG, 1000 Berlin und 8000 München Messanordnung zum zerstoerungsfreien ermitteln der dicke einer metallischen oberflaechenschicht
US4667149A (en) * 1983-05-31 1987-05-19 American Telephone And Telegraph Company, At&T Bell Laboratories Precision nondestructive testing of metals
GB8333355D0 (en) * 1983-12-14 1984-01-18 Rolls Royce Metallic coating layer thickness
FR2609333B1 (fr) * 1987-01-06 1991-07-19 Pechiney Aluminium Dispositif de controle au defile de la continuite d'un revetement metallique sur un fil metallique de nature differente
DE69012596T3 (de) * 1989-01-26 2005-08-11 Sumitomo Electric Industries, Ltd. Oxidischer supraleitender Draht
CA2078335A1 (en) * 1991-01-16 1992-07-17 The Furukawa Electric Co., Ltd. Method of and device for continuous processing of wire rod
US5160589A (en) * 1991-06-13 1992-11-03 Michelangelo Gionfriddo Procedure for the reduction of the cross-section of a wire

Also Published As

Publication number Publication date
US5779864A (en) 1998-07-14
JP3922728B2 (ja) 2007-05-30
US5602488A (en) 1997-02-11
FI940458A (fi) 1994-08-02
FR2703461A1 (fr) 1994-10-07
JPH06337202A (ja) 1994-12-06
FR2706615B1 (fr) 1998-02-06
US5507924A (en) 1996-04-16
FR2703461B1 (fr) 1996-01-26
FR2706615A1 (fr) 1994-12-23

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