FI914182A0 - Maetningsfoerfarande foer magnetfaelt, maetningsapparat foer magnetfaelt, visningsfoerfarande foer magnetfaelt och visningsapparat foer magnetfaelt. - Google Patents

Maetningsfoerfarande foer magnetfaelt, maetningsapparat foer magnetfaelt, visningsfoerfarande foer magnetfaelt och visningsapparat foer magnetfaelt.

Info

Publication number
FI914182A0
FI914182A0 FI914182A FI914182A FI914182A0 FI 914182 A0 FI914182 A0 FI 914182A0 FI 914182 A FI914182 A FI 914182A FI 914182 A FI914182 A FI 914182A FI 914182 A0 FI914182 A0 FI 914182A0
Authority
FI
Finland
Prior art keywords
magnetfaelt
foer
visningsfoerfarande
visningsapparat
maetningsfoerfarande
Prior art date
Application number
FI914182A
Other languages
English (en)
Other versions
FI914182A (fi
Inventor
Tomoaki Ueda
Original Assignee
Daikin Ind Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daikin Ind Ltd filed Critical Daikin Ind Ltd
Publication of FI914182A0 publication Critical patent/FI914182A0/fi
Publication of FI914182A publication Critical patent/FI914182A/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/10—Plotting field distribution ; Measuring field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/842—Measuring and testing
    • Y10S505/843—Electrical
    • Y10S505/845—Magnetometer
    • Y10S505/846—Magnetometer using superconductive quantum interference device, i.e. squid

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
  • Complex Calculations (AREA)
FI914182A 1990-09-07 1991-09-04 Maetningsfoerfarande foer magnetfaelt, maetningsapparat foer magnetfaelt, visningsfoerfarande foer magnetfaelt och visningsapparat foer magnetfaelt. FI914182A (fi)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2237962A JPH07104403B2 (ja) 1990-09-07 1990-09-07 磁場測定方法、およびその装置

Publications (2)

Publication Number Publication Date
FI914182A0 true FI914182A0 (fi) 1991-09-04
FI914182A FI914182A (fi) 1992-03-08

Family

ID=17023047

Family Applications (1)

Application Number Title Priority Date Filing Date
FI914182A FI914182A (fi) 1990-09-07 1991-09-04 Maetningsfoerfarande foer magnetfaelt, maetningsapparat foer magnetfaelt, visningsfoerfarande foer magnetfaelt och visningsapparat foer magnetfaelt.

Country Status (5)

Country Link
US (1) US5204624A (fi)
EP (1) EP0474229B1 (fi)
JP (1) JPH07104403B2 (fi)
DE (1) DE69115176T2 (fi)
FI (1) FI914182A (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3204542B2 (ja) * 1992-07-24 2001-09-04 株式会社東芝 磁場源測定装置
FR2699287B1 (fr) * 1992-12-14 1995-01-06 Commissariat Energie Atomique Procédé et dispositif de cartographie magnétique.
JPH0824234A (ja) * 1994-07-14 1996-01-30 Nec Corp 脳内活動源推定装置
DE19808985B4 (de) 1997-03-07 2012-06-14 Hitachi, Ltd. Verfahren und Vorrichtung zur Biomagnetfeld-Messung
WO2000021288A1 (fr) 1998-10-01 2000-04-13 Matsushita Electric Industrial Co., Ltd. Equipement de conversion de signal d'image
JP3518502B2 (ja) * 2000-10-19 2004-04-12 株式会社日立製作所 生体磁場計測装置
JP2002355229A (ja) * 2001-05-31 2002-12-10 Japan Science & Technology Corp 磁界解析方法および電流分布可視化装置
FR2902197B1 (fr) * 2006-06-07 2008-07-25 Univ Bretagne Occidentale Etab Procede de localisation d'un objet magnetique, produit programme d'ordinateur, moyen de stockage et dispositif de localisation correspondants
JP5461224B2 (ja) * 2010-02-23 2014-04-02 日本電信電話株式会社 補間装置、補間方法およびプログラム
US10677612B2 (en) * 2017-08-07 2020-06-09 The Boeing Company Large surface magnetic field sensor array
JP6687228B1 (ja) * 2019-03-29 2020-04-22 三菱電機株式会社 交流回転電機の制御装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5324242A (en) * 1976-08-18 1978-03-06 Armco Steel Corp Method and device for interpolating discontinuous data value
US4263593A (en) * 1979-08-20 1981-04-21 Tektronix, Inc. Display interpolator employing a transversal filter for a digital oscilloscope
US4417591A (en) * 1980-12-31 1983-11-29 Braintech, Inc. Apparatus and method for topographic display of multichannel EEG data
JPS59105573A (ja) * 1982-12-10 1984-06-18 Fujitsu Ltd 磁束計
US4611348A (en) * 1984-11-26 1986-09-09 General Electric Company Apparatus for altering the spatial characteristics of a digital image by polynomial interpretation using sets of arithmetic processors
DE3515199A1 (de) * 1985-04-26 1986-11-06 Siemens AG, 1000 Berlin und 8000 München Vorrichtung zur messung schwacher magnetfelder mit mehreren gradiometern
JP2647401B2 (ja) * 1987-12-26 1997-08-27 キヤノン株式会社 画像データの補間方法
FR2626092B1 (fr) * 1988-01-19 1990-06-29 Inst Nat Sante Rech Med Procede et dispositif de cartographie cerebrale par methode d'interpolation
EP0359864B1 (de) * 1988-09-23 1993-12-01 Siemens Aktiengesellschaft Einrichtung und Verfahren zur Messung von schwachen, orts- und zeitabhängigen Magnetfeldern
JPH02180243A (ja) * 1988-12-29 1990-07-13 Shimadzu Corp 医用計測装置
US4977896A (en) * 1989-05-26 1990-12-18 Biomagnetic Technologies, Inc. Analysis of biological signals using data from arrays of sensors

Also Published As

Publication number Publication date
JPH07104403B2 (ja) 1995-11-13
DE69115176T2 (de) 1996-05-15
DE69115176D1 (de) 1996-01-18
FI914182A (fi) 1992-03-08
EP0474229A2 (en) 1992-03-11
EP0474229B1 (en) 1995-12-06
JPH04116481A (ja) 1992-04-16
US5204624A (en) 1993-04-20
EP0474229A3 (en) 1992-12-23

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