FI20105110A - Refraktometri - Google Patents

Refraktometri Download PDF

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Publication number
FI20105110A
FI20105110A FI20105110A FI20105110A FI20105110A FI 20105110 A FI20105110 A FI 20105110A FI 20105110 A FI20105110 A FI 20105110A FI 20105110 A FI20105110 A FI 20105110A FI 20105110 A FI20105110 A FI 20105110A
Authority
FI
Finland
Prior art keywords
refractometer
Prior art date
Application number
FI20105110A
Other languages
English (en)
Swedish (sv)
Other versions
FI124951B (fi
FI20105110A0 (fi
Inventor
Jan Kaahre
Original Assignee
Jan Kaahre
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jan Kaahre filed Critical Jan Kaahre
Priority to FI20105110A priority Critical patent/FI124951B/fi
Publication of FI20105110A0 publication Critical patent/FI20105110A0/fi
Priority to JP2011018053A priority patent/JP5910805B2/ja
Priority to DE102011000456.4A priority patent/DE102011000456B4/de
Priority to US13/021,234 priority patent/US8760640B2/en
Publication of FI20105110A publication Critical patent/FI20105110A/fi
Application granted granted Critical
Publication of FI124951B publication Critical patent/FI124951B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N21/431—Dip refractometers, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
FI20105110A 2010-02-05 2010-02-05 Optinen järjestelmä FI124951B (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20105110A FI124951B (fi) 2010-02-05 2010-02-05 Optinen järjestelmä
JP2011018053A JP5910805B2 (ja) 2010-02-05 2011-01-31 光学システム
DE102011000456.4A DE102011000456B4 (de) 2010-02-05 2011-02-02 Messkopf, optisches System, Verfahren sowie Software-Produkt zur Messungdes Brechungsindex eines Mediums
US13/021,234 US8760640B2 (en) 2010-02-05 2011-02-04 Optical system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20105110 2010-02-05
FI20105110A FI124951B (fi) 2010-02-05 2010-02-05 Optinen järjestelmä

Publications (3)

Publication Number Publication Date
FI20105110A0 FI20105110A0 (fi) 2010-02-05
FI20105110A true FI20105110A (fi) 2011-08-06
FI124951B FI124951B (fi) 2015-04-15

Family

ID=41727659

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20105110A FI124951B (fi) 2010-02-05 2010-02-05 Optinen järjestelmä

Country Status (4)

Country Link
US (1) US8760640B2 (fi)
JP (1) JP5910805B2 (fi)
DE (1) DE102011000456B4 (fi)
FI (1) FI124951B (fi)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9194798B2 (en) * 2012-03-13 2015-11-24 Ut-Battelle, Llc Imaging based refractometer for hyperspectral refractive index detection
US9194799B2 (en) * 2012-03-13 2015-11-24 Ut-Battelle, Llc Imaging based refractometers
DE102012102983A1 (de) * 2012-04-05 2013-10-10 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zum Bestimmen eines kritischen Winkels eines Anregungslichtstrahls
US8692985B1 (en) * 2012-11-19 2014-04-08 J.A. Woollam Co., Inc. Method of determining refractive index of prism shaped material
DE102015106795A1 (de) 2015-04-30 2016-11-03 Anton Paar Optotec Gmbh Wellenlängenkalibration für Refraktometer
JP6791081B2 (ja) * 2017-09-26 2020-11-25 株式会社島津製作所 屈折率測定装置及び屈折率測定方法
US10386232B2 (en) * 2017-12-15 2019-08-20 Horiba Instruments Incorporated Compact spectroscopic optical instrument
CN111007037A (zh) * 2019-11-23 2020-04-14 成都佳鑫德科技有限公司 一种基于光学器件的液体浓度测量装置、计算机设备及计算机可读存储介质
FI20206374A1 (fi) * 2020-12-28 2022-06-29 Kxs Tech Oy Refraktometri
DE102021116991A1 (de) 2021-07-01 2023-01-05 Hochschule Düsseldorf Körperschaft des öffentlichen Rechts Verfahren und Vorrichtung zum Bestimmen frequenzabhängiger Brechungsindizes

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4306805A (en) * 1979-06-04 1981-12-22 Arrington James R Refractometric device
JPS6111637A (ja) * 1984-06-27 1986-01-20 Nec Corp 液体センサ
JPH0652238B2 (ja) * 1988-02-03 1994-07-06 株式会社フジクラ 流体屈折計およびこれを用いた流体密度計
DE3831346A1 (de) * 1988-09-15 1990-04-05 Zeiss Carl Fa Refraktometer mit brechzahlabhaengiger aperturteilung
US5042893A (en) * 1990-11-09 1991-08-27 Hewlett-Packard Company Direct mount coupling to a spectrophotometer
FI96451C (fi) * 1993-09-07 1996-06-25 Janesko Oy Refraktometri
JPH10318919A (ja) * 1997-05-19 1998-12-04 Nippon Soken Inc 屈折率測定装置
US6496636B1 (en) * 1997-06-13 2002-12-17 Mark Stephen Braiman Support planar and tapered quasi-planar germanium waveguides for infrared evanescent-wave sensing
US6070093A (en) * 1997-12-02 2000-05-30 Abbott Laboratories Multiplex sensor and method of use
US6538727B2 (en) * 2000-04-17 2003-03-25 Paul H. Nicholas Electronic device for distinguishing sugar sweetened beverages from artificially sweetened ones
JP2003315268A (ja) * 2002-04-19 2003-11-06 Mitsubishi Electric Corp 粉塵検出装置
JP4213441B2 (ja) * 2002-09-20 2009-01-21 シャープ株式会社 トナー飛散量検出装置および画像形成装置
US20050151975A1 (en) * 2004-01-14 2005-07-14 Ivan Melnyk Fabry-perot fiber optic sensing device and method
JP4851330B2 (ja) * 2004-07-02 2012-01-11 古河電気工業株式会社 光給電型センシングシステム
JP4911606B2 (ja) 2007-03-08 2012-04-04 倉敷紡績株式会社 全反射減衰型光学プローブおよびそれを用いた水溶液分光測定装置
JP2011511292A (ja) 2008-02-01 2011-04-07 レア ライト インコーポレイテッド 近臨界反射分光測定のための方法、デバイス、及びキット
US7619725B1 (en) 2008-05-12 2009-11-17 Sealite Engineering, Inc. Optically amplified critical wavelength refractometer
GB2460305B (en) 2008-11-11 2010-06-16 Univ Montfort Determining the particle size distribution of a suspension

Also Published As

Publication number Publication date
FI124951B (fi) 2015-04-15
US20110194109A1 (en) 2011-08-11
DE102011000456B4 (de) 2022-01-27
US8760640B2 (en) 2014-06-24
JP2011164102A (ja) 2011-08-25
JP5910805B2 (ja) 2016-04-27
FI20105110A0 (fi) 2010-02-05
DE102011000456A1 (de) 2011-08-11

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