FI20090209A - Analysaattorin mittausikkunan sovitelma - Google Patents
Analysaattorin mittausikkunan sovitelma Download PDFInfo
- Publication number
- FI20090209A FI20090209A FI20090209A FI20090209A FI20090209A FI 20090209 A FI20090209 A FI 20090209A FI 20090209 A FI20090209 A FI 20090209A FI 20090209 A FI20090209 A FI 20090209A FI 20090209 A FI20090209 A FI 20090209A
- Authority
- FI
- Finland
- Prior art keywords
- array
- measurement window
- analyzer measurement
- analyzer
- window
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N37/00—Details not covered by any other group of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/317—Accessories, mechanical or electrical features windows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/635—Specific applications or type of materials fluids, granulates
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20090209A FI122507B (fi) | 2009-05-26 | 2009-05-26 | Analysaattorin mittausikkunan sovitelma |
| CA2761392A CA2761392C (en) | 2009-05-26 | 2010-05-24 | Arrangement of analyzer measuring window |
| US13/322,436 US8670524B2 (en) | 2009-05-26 | 2010-05-24 | Arrangement of analyzer measuring window |
| PCT/FI2010/050418 WO2010136647A1 (en) | 2009-05-26 | 2010-05-24 | Arrangement of analyzer measuring window |
| AU2010252922A AU2010252922B2 (en) | 2009-05-26 | 2010-05-24 | Arrangement of analyzer measuring window |
| CL2011002983A CL2011002983A1 (es) | 2009-05-26 | 2011-11-25 | Disposicion de ventana de medicion para un analizador de rayos x que contiene: una estructura de tapa (6) hecha de material ceramico, que define la abertura de medicion (7), una superficie de sellado (8) plana y tiene una seccion curva. |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20090209 | 2009-05-26 | ||
| FI20090209A FI122507B (fi) | 2009-05-26 | 2009-05-26 | Analysaattorin mittausikkunan sovitelma |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| FI20090209A0 FI20090209A0 (fi) | 2009-05-26 |
| FI20090209A true FI20090209A (fi) | 2010-11-27 |
| FI122507B FI122507B (fi) | 2012-02-29 |
Family
ID=40680675
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FI20090209A FI122507B (fi) | 2009-05-26 | 2009-05-26 | Analysaattorin mittausikkunan sovitelma |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8670524B2 (fi) |
| AU (1) | AU2010252922B2 (fi) |
| CA (1) | CA2761392C (fi) |
| CL (1) | CL2011002983A1 (fi) |
| FI (1) | FI122507B (fi) |
| WO (1) | WO2010136647A1 (fi) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9857289B2 (en) | 2015-03-13 | 2018-01-02 | Halliburton Energy Services, Inc. | Methods and systems for maintaining optical transparency during particle image acquisition |
| CN104698018B (zh) * | 2015-04-01 | 2017-06-20 | 北京矿冶研究总院 | 一种膜片自动更换结构 |
| CA3040514A1 (en) | 2016-10-20 | 2018-04-26 | Quantum Diamond Technologies Inc. | Methods and apparatus for magnetic particle analysis using wide-field diamond magnetic imaging |
| EP3559668B1 (en) | 2016-12-23 | 2023-07-19 | Quantum Diamond Technologies Inc. | Methods and apparatus for magnetic multi-bead assays |
| CA3070975A1 (en) | 2017-07-31 | 2019-02-07 | Colin B. CONNOLLY | Methods and apparatus for sample measurement |
| FI20215587A1 (fi) | 2018-10-19 | 2021-05-18 | Commw Scient Ind Res Org | Energiadispersiivinen röntgendiffraktioanalysaattori parannetulla heijastusgeometrialla |
| JP6982031B2 (ja) | 2019-07-18 | 2021-12-17 | 日本電子株式会社 | 蛍光ｘ線測定装置 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1415782A (fr) | 1964-09-18 | 1965-10-29 | Radiologie Cie Gle | Perfectionnements aux spectromètres |
| US3354308A (en) * | 1965-04-30 | 1967-11-21 | Philips Electronic Pharma | Apparatus with means to measure the characteristic X-ray emission from and the density of a material |
| GB1110284A (en) * | 1965-06-22 | 1968-04-18 | Nat Res Dev | Improvements in or relating to the continuous analysis of the solid component of a slurry |
| US3562535A (en) | 1969-02-14 | 1971-02-09 | Honeywell Inc | Radiation sensitive device for flow tube using moving fluid tight seal |
| FI77942C (fi) | 1986-06-02 | 1989-05-10 | Outokumpu Oy | Anordning foer stabilisering av maetningsgeometri i en analysator. |
| GB9616498D0 (en) * | 1996-08-06 | 1996-09-25 | Oxford Analytical Instr Ltd | Inspection cell |
| FI110819B (fi) | 1998-09-09 | 2003-03-31 | Outokumpu Oy | Analysaattorin mittausikkuna ja menetelmä sen asentamiseksi paikoilleen |
-
2009
- 2009-05-26 FI FI20090209A patent/FI122507B/fi active
-
2010
- 2010-05-24 WO PCT/FI2010/050418 patent/WO2010136647A1/en active Application Filing
- 2010-05-24 AU AU2010252922A patent/AU2010252922B2/en active Active
- 2010-05-24 CA CA2761392A patent/CA2761392C/en active Active
- 2010-05-24 US US13/322,436 patent/US8670524B2/en active Active
-
2011
- 2011-11-25 CL CL2011002983A patent/CL2011002983A1/es unknown
Also Published As
| Publication number | Publication date |
|---|---|
| US8670524B2 (en) | 2014-03-11 |
| CL2011002983A1 (es) | 2012-04-20 |
| CA2761392A1 (en) | 2010-12-02 |
| WO2010136647A1 (en) | 2010-12-02 |
| FI20090209A0 (fi) | 2009-05-26 |
| CA2761392C (en) | 2017-06-20 |
| AU2010252922B2 (en) | 2015-06-18 |
| FI122507B (fi) | 2012-02-29 |
| AU2010252922A1 (en) | 2011-12-01 |
| US20120093300A1 (en) | 2012-04-19 |
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