FI20045426A0 - Elektronisen laitteen elektronisen piirin karakterisointi - Google Patents

Elektronisen laitteen elektronisen piirin karakterisointi

Info

Publication number
FI20045426A0
FI20045426A0 FI20045426A FI20045426A FI20045426A0 FI 20045426 A0 FI20045426 A0 FI 20045426A0 FI 20045426 A FI20045426 A FI 20045426A FI 20045426 A FI20045426 A FI 20045426A FI 20045426 A0 FI20045426 A0 FI 20045426A0
Authority
FI
Finland
Prior art keywords
characterization
electronic
electronic device
electronic circuit
circuit
Prior art date
Application number
FI20045426A
Other languages
English (en)
Swedish (sv)
Other versions
FI119079B (fi
FI20045426A (fi
Inventor
Mikko Kursula
Heikki Vartiovaara
Original Assignee
Elektrobit Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elektrobit Oy filed Critical Elektrobit Oy
Priority to FI20045426A priority Critical patent/FI119079B/fi
Publication of FI20045426A0 publication Critical patent/FI20045426A0/fi
Priority to EP05100512A priority patent/EP1533624A1/en
Priority to PCT/FI2005/050399 priority patent/WO2006048512A1/en
Priority to US11/667,092 priority patent/US20070290691A1/en
Publication of FI20045426A publication Critical patent/FI20045426A/fi
Application granted granted Critical
Publication of FI119079B publication Critical patent/FI119079B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
FI20045426A 2004-11-08 2004-11-08 Sähkölaitteen sähköisen piirin karakterisointi FI119079B (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20045426A FI119079B (fi) 2004-11-08 2004-11-08 Sähkölaitteen sähköisen piirin karakterisointi
EP05100512A EP1533624A1 (en) 2004-11-08 2005-01-27 Characterization of electric circuit of electric device
PCT/FI2005/050399 WO2006048512A1 (en) 2004-11-08 2005-11-07 Characterization of electric circuit of electric device
US11/667,092 US20070290691A1 (en) 2004-11-08 2005-11-07 Characterization of Electric Circuit of Electric Device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20045426A FI119079B (fi) 2004-11-08 2004-11-08 Sähkölaitteen sähköisen piirin karakterisointi
FI20045426 2004-11-08

Publications (3)

Publication Number Publication Date
FI20045426A0 true FI20045426A0 (fi) 2004-11-08
FI20045426A FI20045426A (fi) 2006-05-09
FI119079B FI119079B (fi) 2008-07-15

Family

ID=33515309

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20045426A FI119079B (fi) 2004-11-08 2004-11-08 Sähkölaitteen sähköisen piirin karakterisointi

Country Status (4)

Country Link
US (1) US20070290691A1 (fi)
EP (1) EP1533624A1 (fi)
FI (1) FI119079B (fi)
WO (1) WO2006048512A1 (fi)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201116299D0 (en) 2011-09-21 2011-11-02 Aker Subsea Ltd Condition monitoring employing cross-correlation
RU2496115C1 (ru) * 2012-03-11 2013-10-20 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Самарский государственный технический университет" Способ диагностирования электрических цепей, содержащих активное сопротивление и индуктивность
EP2736178A1 (en) * 2012-11-27 2014-05-28 ST-Ericsson SA NFC reader transmission signal pre-distortion
EP2735994B1 (en) * 2012-11-27 2015-02-18 ST-Ericsson SA Near field communication method of detection of a tag presence by a tag reader
FI126901B (fi) * 2014-09-12 2017-07-31 Enics Ag Menetelmä ja järjestelmä elektronisen yksikön testaamiseksi
EP3422029B1 (de) 2017-06-28 2022-08-31 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und verfahren zur frequenzcharakterisierung eines elektronischen systems

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19846870C1 (de) * 1998-10-12 2001-01-25 Peter Peyerl Verfahren zur Bestimmung der Impulsantwort eines breitbandigen linearen Systems und Meßanordnung zur Durchführung des Verfahrens
US6236371B1 (en) * 1999-07-26 2001-05-22 Harris Corporation System and method for testing antenna frequency response
WO2001069778A2 (de) * 2000-03-16 2001-09-20 Rohde & Schwarz Gmbh & Co. Kg Verfahren zur bestimmung von parametern eines n-tors
US6622103B1 (en) * 2000-06-20 2003-09-16 Formfactor, Inc. System for calibrating timing of an integrated circuit wafer tester
US20020094785A1 (en) * 2000-07-18 2002-07-18 Deats Bradley W. Portable device used to measure passive intermodulation in radio frequency communication systems
US6587019B2 (en) * 2001-04-11 2003-07-01 Eni Technology, Inc. Dual directional harmonics dissipation system
US7031687B2 (en) * 2001-04-18 2006-04-18 Nokia Corporation Balanced circuit arrangement and method for linearizing such an arrangement
EP1296149B1 (en) * 2001-09-24 2006-08-02 Agilent Technologies, Inc. (a Delaware corporation) Characterizing non-linear behavior
US6813589B2 (en) * 2001-11-29 2004-11-02 Wavecrest Corporation Method and apparatus for determining system response characteristics
US6982558B2 (en) * 2003-01-09 2006-01-03 Pass & Seymour, Inc. Electric circuit test device

Also Published As

Publication number Publication date
EP1533624A1 (en) 2005-05-25
FI119079B (fi) 2008-07-15
FI20045426A (fi) 2006-05-09
WO2006048512A1 (en) 2006-05-11
US20070290691A1 (en) 2007-12-20

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Legal Events

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PC Transfer of assignment of patent

Owner name: ELEKTROBIT TESTING OY

Free format text: ELEKTROBIT TESTING OY

PC Transfer of assignment of patent

Owner name: ELEKTROBIT SYSTEM TEST OY

Free format text: ELEKTROBIT SYSTEM TEST OY