FI20001774L - Lähetinvastaanottimen testaaminen - Google Patents

Lähetinvastaanottimen testaaminen Download PDF

Info

Publication number
FI20001774L
FI20001774L FI20001774A FI20001774A FI20001774L FI 20001774 L FI20001774 L FI 20001774L FI 20001774 A FI20001774 A FI 20001774A FI 20001774 A FI20001774 A FI 20001774A FI 20001774 L FI20001774 L FI 20001774L
Authority
FI
Finland
Prior art keywords
transceiver
testing
Prior art date
Application number
FI20001774A
Other languages
English (en)
Swedish (sv)
Other versions
FI20001774A7 (fi
FI20001774A0 (fi
Inventor
Markku Henriksson
Original Assignee
Nokia Networks Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nokia Networks Oy filed Critical Nokia Networks Oy
Priority to FI20001774A priority Critical patent/FI20001774A7/fi
Publication of FI20001774A0 publication Critical patent/FI20001774A0/fi
Priority to AU2001282185A priority patent/AU2001282185A1/en
Priority to US10/344,098 priority patent/US6940263B2/en
Priority to PCT/FI2001/000704 priority patent/WO2002013427A1/en
Publication of FI20001774L publication Critical patent/FI20001774L/fi
Publication of FI20001774A7 publication Critical patent/FI20001774A7/fi

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
    • H04B1/40—Circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • H04B17/19—Self-testing arrangements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/201—Monitoring; Testing of receivers for measurement of specific parameters of the receiver or components thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Transceivers (AREA)
FI20001774A 2000-08-10 2000-08-10 Lähetinvastaanottimen testaaminen FI20001774A7 (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20001774A FI20001774A7 (fi) 2000-08-10 2000-08-10 Lähetinvastaanottimen testaaminen
AU2001282185A AU2001282185A1 (en) 2000-08-10 2001-08-09 Testing a transceiver
US10/344,098 US6940263B2 (en) 2000-08-10 2001-08-09 Testing a transceiver
PCT/FI2001/000704 WO2002013427A1 (en) 2000-08-10 2001-08-09 Testing a transceiver

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20001774A FI20001774A7 (fi) 2000-08-10 2000-08-10 Lähetinvastaanottimen testaaminen

Publications (3)

Publication Number Publication Date
FI20001774A0 FI20001774A0 (fi) 2000-08-10
FI20001774L true FI20001774L (fi) 2002-02-11
FI20001774A7 FI20001774A7 (fi) 2002-02-11

Family

ID=8558871

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20001774A FI20001774A7 (fi) 2000-08-10 2000-08-10 Lähetinvastaanottimen testaaminen

Country Status (4)

Country Link
US (1) US6940263B2 (fi)
AU (1) AU2001282185A1 (fi)
FI (1) FI20001774A7 (fi)
WO (1) WO2002013427A1 (fi)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040093142A (ko) * 2002-03-14 2004-11-04 코닌클리케 필립스 일렉트로닉스 엔.브이. 홈 내 수신기 시스템
US7236778B2 (en) * 2002-09-10 2007-06-26 Northrop Grumman Corporation System and method for testing transceivers
EP1573941A1 (en) * 2002-12-11 2005-09-14 Koninklijke Philips Electronics N.V. Integrated circuit comprising a transmission channel with an integrated independent tester.
US20050046430A1 (en) * 2003-09-03 2005-03-03 Jouko Kinnunen RF testing method and arrangement
US20050070268A1 (en) * 2003-09-30 2005-03-31 Juha Hakkinen Method of testing RF circuit, and arrangement
US7421254B2 (en) * 2003-10-23 2008-09-02 Broadcom Corporation High linearity, high efficiency power amplifier with DSP assisted linearity optimization
KR100547747B1 (ko) * 2003-10-28 2006-01-31 삼성전자주식회사 성능 자가 진단 기능을 가지는 이동통신 단말과 그의 진단방법
US7634239B2 (en) * 2004-03-29 2009-12-15 Aeroflex High Speed Test Solutions, Inc Generator for agile frequency signals
US8385910B2 (en) * 2004-05-20 2013-02-26 Qualcomm Incorporated Systems and methods for testing signal processing control
US7344043B2 (en) * 2005-01-14 2008-03-18 Bradford Company Partition assembly made with multiple ply partitions
US7564893B2 (en) * 2005-03-22 2009-07-21 Agilent Technologies, Inc. Test system and method for parallel modulation error measurement of transceivers
US7379716B2 (en) 2005-03-24 2008-05-27 University Of Florida Research Foundation, Inc. Embedded IC test circuits and methods
US7394278B1 (en) * 2005-07-05 2008-07-01 Marvell International Ltd. Methods and apparatus for integrated circuit loopback testing
US20070086349A1 (en) * 2005-10-18 2007-04-19 Arcadyan Technology Corporation Network apparatus, method of self-testing network connectivity, and method of analyzing frequency spectrum
CN101317426B (zh) * 2005-12-15 2011-05-18 松下电器产业株式会社 网络机器验证装置
US20080051038A1 (en) * 2006-06-15 2008-02-28 Dan Hindson Radio loop-back
US7634236B2 (en) * 2006-11-15 2009-12-15 Northrop Grumman Corporation Controlled signal-to-noise ratio generator circuit
JP4489083B2 (ja) * 2007-01-16 2010-06-23 株式会社東芝 無線機
EP2273705A1 (fr) * 2009-07-06 2011-01-12 EM Microelectronic-Marin SA Procédé de test de fonctionnement d'un circuit émetteur-récepteur de signaux
US10116399B2 (en) * 2010-12-22 2018-10-30 Snaptrack, Inc. Circuit arrangement for RF loopback
US9059879B2 (en) * 2011-07-08 2015-06-16 Infineon Technologies Ag Test signal generation and application in receivers
TWI707553B (zh) * 2019-09-09 2020-10-11 瑞昱半導體股份有限公司 射頻電路
CN112491436B (zh) * 2019-09-12 2022-04-26 瑞昱半导体股份有限公司 射频电路

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4048564A (en) * 1976-01-26 1977-09-13 Gleeson Jr Thomas Paul Transceiver test device
JPS6031368B2 (ja) * 1978-08-23 1985-07-22 富士通株式会社 帯域炉波器
JPH063886B2 (ja) * 1988-06-14 1994-01-12 富士通株式会社 折り返し試験機
US4940950A (en) * 1988-08-12 1990-07-10 Tel-Instrument Electronics Corporation Frequency synthesis method and apparatus using approximation to provide closely spaced discrete frequencies over a wide range with rapid acquisition
US5307029A (en) * 1992-07-10 1994-04-26 Hughes Aircraft Company Method and apparatus for generating multiple frequency tones using a digital frequency divider
FI109740B (fi) * 1993-06-11 2002-09-30 Nokia Corp Menetelmä lähetinvastaanotinyksikön testaamiseksi sekä aikajakoisen radiojärjestelmän tukiasema
KR960038686A (ko) * 1995-04-13 1996-11-21 김광호 단일 주파수에 의한 신호 송수신회로
US5751114A (en) * 1996-05-24 1998-05-12 International Business Machines Corporation Apparatus, method and article of manufacture for carrier frequency compensation in a FM radio transmitter
US5835850A (en) 1996-08-12 1998-11-10 At&T Corp Self-testing transceiver
US6061575A (en) * 1996-11-06 2000-05-09 Ericsson Inc. Frequency synthesizer circuit for mobile stations
JPH10170275A (ja) * 1996-12-13 1998-06-26 Toyota Central Res & Dev Lab Inc 振動型角速度センサ
US6208621B1 (en) * 1997-12-16 2001-03-27 Lsi Logic Corporation Apparatus and method for testing the ability of a pair of serial data transceivers to transmit serial data at one frequency and to receive serial data at another frequency
JP3464147B2 (ja) 1998-06-17 2003-11-05 三菱電機株式会社 送受信機
US6028850A (en) * 1998-07-10 2000-02-22 Hyundai Electronics America, Inc. Wireless transceiver and frequency plan
GB9916904D0 (en) * 1999-07-19 1999-09-22 Cambridge Silicon Radio Ltd Testing response of a radio transceiver
US7555263B1 (en) * 1999-10-21 2009-06-30 Broadcom Corporation Adaptive radio transceiver
US6987966B1 (en) * 1999-10-21 2006-01-17 Broadcom Corporation Adaptive radio transceiver with polyphase calibration

Also Published As

Publication number Publication date
FI20001774A7 (fi) 2002-02-11
WO2002013427A1 (en) 2002-02-14
FI20001774A0 (fi) 2000-08-10
US20040037353A1 (en) 2004-02-26
AU2001282185A1 (en) 2002-02-18
US6940263B2 (en) 2005-09-06

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