JP4489083B2 - 無線機 - Google Patents
無線機 Download PDFInfo
- Publication number
- JP4489083B2 JP4489083B2 JP2007007250A JP2007007250A JP4489083B2 JP 4489083 B2 JP4489083 B2 JP 4489083B2 JP 2007007250 A JP2007007250 A JP 2007007250A JP 2007007250 A JP2007007250 A JP 2007007250A JP 4489083 B2 JP4489083 B2 JP 4489083B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- frequency
- circuit
- test
- outputs
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
- H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
- H04B1/40—Circuits
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/15—Performance testing
- H04B17/19—Self-testing arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
- G01R31/2841—Signal generators
Description
2 送信回路
3、4 ミキサ
5 テスト部
6 スイッチ
Claims (2)
- 第1の周波数の第1電気信号を生成し出力する第1の発振器と、
第2の周波数の第2電気信号を生成し出力する第2の発振器と、
前記第1電気信号及び前記第2電気信号が与えられ、いずれか一方を出力するスイッチと、
テスト信号を出力するテスト信号発生部と、
前記テスト信号及び前記スイッチを介して前記第2電気信号が与えられ、前記テスト信号を前記第2の周波数で直交変換し、前記第2の周波数の変調信号として出力する直交変調器と、
前記変調信号を増幅して出力する第1の増幅器と、
前記第1の増幅器から出力される前記変調信号が与えられ、増幅して出力する第2の増幅器と、
前記第2の増幅器から出力される変調信号及び前記第2電気信号が与えられ、前記第2の周波数で前記変調信号を直交変換し、復調信号として出力する直交復調器と、
前記復調信号と前記テスト信号とが与えられ、前記直交変調器又は前記直交復調器の少なくともいずれか一方の特性を解析する解析部と、
を備えることを特徴とする無線機。 - 第1の周波数の第1電気信号を生成し出力する第1の発振器と、
第2の周波数の第2電気信号を生成し出力する第2の発振器と、
前記第1電気信号及び前記第2電気信号が与えられ、いずれか一方を出力するスイッチと、
テスト信号を出力するテスト信号発生部と、
前記テスト信号及び前記第1電気信号が与えられ、前記テスト信号を前記第1の周波数で直交変換し、前記第1の周波数の変調信号として出力する直交変調器と、
前記変調信号を増幅して出力する第1の増幅器と、
前記第1の増幅器から出力される前記変調信号が与えられ、増幅して出力する第2の増幅器と、
前記第2の増幅器から出力される変調信号及び前記スイッチを介して前記第1電気信号が与えられ、前記第1の周波数で前記変調信号を直交変換し、復調信号として出力する直交復調器と、
前記復調信号と前記テスト信号とが与えられ、前記直交変調器又は前記直交復調器の少なくともいずれか一方の特性を解析する解析部と、
を備えることを特徴とする無線機。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007007250A JP4489083B2 (ja) | 2007-01-16 | 2007-01-16 | 無線機 |
US12/013,560 US20080182523A1 (en) | 2007-01-16 | 2008-01-14 | Radio |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007007250A JP4489083B2 (ja) | 2007-01-16 | 2007-01-16 | 無線機 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008177680A JP2008177680A (ja) | 2008-07-31 |
JP4489083B2 true JP4489083B2 (ja) | 2010-06-23 |
Family
ID=39668540
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007007250A Expired - Fee Related JP4489083B2 (ja) | 2007-01-16 | 2007-01-16 | 無線機 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20080182523A1 (ja) |
JP (1) | JP4489083B2 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2273705A1 (fr) * | 2009-07-06 | 2011-01-12 | EM Microelectronic-Marin SA | Procédé de test de fonctionnement d'un circuit émetteur-récepteur de signaux |
JP5589696B2 (ja) * | 2010-09-09 | 2014-09-17 | 富士通株式会社 | 変換回路、調整方法、調整システムおよび製造方法 |
JP6334451B2 (ja) * | 2015-03-31 | 2018-05-30 | 株式会社東芝 | 無線装置、折り返し試験装置、折り返し試験方法 |
JP6563716B2 (ja) * | 2015-07-01 | 2019-08-21 | 株式会社東芝 | 電気車制御装置 |
US10505645B2 (en) | 2017-05-23 | 2019-12-10 | Renesas Electronics Corporation | Wireless communication device and determination method |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3248785B2 (ja) * | 1992-12-14 | 2002-01-21 | 富士通株式会社 | 折り返し試験可能な無線式送受信装置 |
FI109740B (fi) * | 1993-06-11 | 2002-09-30 | Nokia Corp | Menetelmä lähetinvastaanotinyksikön testaamiseksi sekä aikajakoisen radiojärjestelmän tukiasema |
FI98259C (fi) * | 1995-06-16 | 1997-05-12 | Nokia Telecommunications Oy | Menetelmä ja laitteisto testisilmukan muodostamiseksi radioaseman toiminnan valvontaan |
US6006112A (en) * | 1997-11-26 | 1999-12-21 | Lucent Technologies, Inc. | Transceiver with RF loopback and downlink frequency scanning |
JP2926574B1 (ja) * | 1998-03-18 | 1999-07-28 | 福島日本電気株式会社 | 高周波折り返し送受信回路と該回路を含む送受信無線装置 |
FI107096B (fi) * | 1999-06-03 | 2001-05-31 | Nokia Networks Oy | Lähetin-vastaanottimen testaus |
GB9916904D0 (en) * | 1999-07-19 | 1999-09-22 | Cambridge Silicon Radio Ltd | Testing response of a radio transceiver |
FI20001774A (fi) * | 2000-08-10 | 2002-02-11 | Nokia Networks Oy | Lähetinvastaanottimen testaaminen |
GB2390495A (en) * | 2002-07-05 | 2004-01-07 | Motorola Inc | Calibration of a transmitter or receiver in a transceiver wherein transmitter signals may be detected via the receiver or a separate detection arrangement |
US7340280B2 (en) * | 2004-02-26 | 2008-03-04 | Nokia Corporation | Method of configuring base station, and base station |
EP1598140A1 (de) * | 2004-05-19 | 2005-11-23 | Synova S.A. | Laserbearbeitung eines Werkstücks |
US7379716B2 (en) * | 2005-03-24 | 2008-05-27 | University Of Florida Research Foundation, Inc. | Embedded IC test circuits and methods |
US7477875B2 (en) * | 2005-07-26 | 2009-01-13 | Texas Instruments Incorporated | Built in loop back self test in design or on test board for transceivers |
US20080051038A1 (en) * | 2006-06-15 | 2008-02-28 | Dan Hindson | Radio loop-back |
-
2007
- 2007-01-16 JP JP2007007250A patent/JP4489083B2/ja not_active Expired - Fee Related
-
2008
- 2008-01-14 US US12/013,560 patent/US20080182523A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
JP2008177680A (ja) | 2008-07-31 |
US20080182523A1 (en) | 2008-07-31 |
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