FI121540B - Förfarande för förskjutande av molekylstrukturer med höga aspektförhållanden - Google Patents

Förfarande för förskjutande av molekylstrukturer med höga aspektförhållanden Download PDF

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Publication number
FI121540B
FI121540B FI20060227A FI20060227A FI121540B FI 121540 B FI121540 B FI 121540B FI 20060227 A FI20060227 A FI 20060227A FI 20060227 A FI20060227 A FI 20060227A FI 121540 B FI121540 B FI 121540B
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FI
Finland
Prior art keywords
harm
structures
bundled
harm structures
cnts
Prior art date
Application number
FI20060227A
Other languages
English (en)
Finnish (fi)
Other versions
FI20060227A (sv
FI20060227A0 (sv
Inventor
Esko Kauppinen
David Gonzalez
Albert Nasibulin
David Brown
Original Assignee
Canatu Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canatu Oy filed Critical Canatu Oy
Publication of FI20060227A0 publication Critical patent/FI20060227A0/sv
Priority to FI20060227A priority Critical patent/FI121540B/sv
Priority to CN200780008320XA priority patent/CN101400597B/zh
Priority to EP07712601.9A priority patent/EP1991497B8/en
Priority to US12/281,868 priority patent/US8871295B2/en
Priority to ES07712602.7T priority patent/ES2627659T3/es
Priority to PCT/FI2007/000059 priority patent/WO2007101906A1/en
Priority to US12/281,888 priority patent/US8951602B2/en
Priority to JP2008557776A priority patent/JP5247476B2/ja
Priority to KR1020087024493A priority patent/KR101424676B1/ko
Priority to JP2008557777A priority patent/JP5554501B2/ja
Priority to PCT/FI2007/000060 priority patent/WO2007101907A1/en
Priority to CN2007800083303A priority patent/CN101400598B/zh
Priority to EP07712602.7A priority patent/EP1991498B1/en
Priority to ES07712601.9T priority patent/ES2658071T3/es
Publication of FI20060227A publication Critical patent/FI20060227A/sv
Priority to KR1020087024492A priority patent/KR101476288B1/ko
Application granted granted Critical
Publication of FI121540B publication Critical patent/FI121540B/sv
Priority to US14/588,870 priority patent/US9776206B2/en

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    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/15Nano-sized carbon materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D1/00Processes for applying liquids or other fluent materials
    • B05D1/02Processes for applying liquids or other fluent materials performed by spraying
    • B05D1/04Processes for applying liquids or other fluent materials performed by spraying involving the use of an electrostatic field
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82BNANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
    • B82B3/00Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/15Nano-sized carbon materials
    • C01B32/152Fullerenes
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/15Nano-sized carbon materials
    • C01B32/158Carbon nanotubes
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/15Nano-sized carbon materials
    • C01B32/158Carbon nanotubes
    • C01B32/168After-treatment
    • C01B32/174Derivatisation; Solubilisation; Dispersion in solvents
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K99/00Subject matter not provided for in other groups of this subclass
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00Nanotechnology for materials or surface science, e.g. nanocomposites
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/70Nanostructure
    • Y10S977/734Fullerenes, i.e. graphene-based structures, such as nanohorns, nanococoons, nanoscrolls or fullerene-like structures, e.g. WS2 or MoS2 chalcogenide nanotubes, planar C3N4, etc.
    • Y10S977/742Carbon nanotubes, CNTs
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/84Manufacture, treatment, or detection of nanostructure
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/84Manufacture, treatment, or detection of nanostructure
    • Y10S977/842Manufacture, treatment, or detection of nanostructure for carbon nanotubes or fullerenes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/84Manufacture, treatment, or detection of nanostructure
    • Y10S977/842Manufacture, treatment, or detection of nanostructure for carbon nanotubes or fullerenes
    • Y10S977/845Purification or separation of fullerenes or nanotubes

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Composite Materials (AREA)
  • Carbon And Carbon Compounds (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)

Claims (11)

1. Förfarande för förskjutande av molekyl-strukturer med höga aspektiörhällanden (HARM-strukturer), kännetecknat av att förfarandet omfattar 5 användande av elektrisk eller elektrostatisk kraft tili dispersion som innehäller en eller flera HARM-strukturer som finns i knippen eller är enskilda, vil-ken kraft förskjuter HARM-strukturer som finns i knippen baserade pä den spontana reserveringen av de HARM-10 strukturer som finns i knippen jämfört med de enskilda HARM-strukturernas elektriska neutralitet, för att vä-sentligt kunna atskilja de HARM-strukturer som finns i knippen och är enskilda.
2. Förfarande enligt patentkrav 1, känneteck-15 nat av att förfarandet dessutom omfattar avlagring av en eller flera HARM-strukturer i separeringen av gas-, vätske- och/eller fast ämne och/eller i matrisen och/eller pä ytan som lager, monster och/eller struk-tur. 20
3. Förfarande enligt nägot av patentkraven 1 - 2, kännetecknat av att en HARM-struktur som finns i knippen och/eller är enskild lagras.
4. Förfarande enligt nägot av patentkraven 1 - 3, kännetecknat av att HARM-strukturer som finns i 25 knippen och är enskilda lagras.
5. Förfarande enligt nägot av patentkraven 1 - 4, kännetecknat av att HARM-strukturen omfattar na-norör, kolnanorör, kolnanorör som funktionaliserats med fulleren, bornitridnanorör, nanostav som innehäl- 30 ler koi, nanorör som innehäller fosfor, bor, kväve och/eller silikon, träd och/eller vilket som heist annat rör, en rörliknande stav och/eller band och/eller vilken som heist annan molekylstruktur med höga aspektiörhällanden som finns i enskild- eller knipp-35 form.
6. Förfarande enligt nägot av patentkraven 1 - 5, kännetecknat av att HARM-strukturen är positivt, negativt eller neutralt reserverad.
7. Förfarande enligt nägot av patentkraven 1 5 - 6, kännetecknat av att förfarandet dessutom omfattar tillägg av ett eller flera reagerande ämnen, tillsats-ämnen, beläggningsmaterial, funktionaliserande material, ytaktiva ämnen och/eller legeringsämnen tili en eller flera HARM-strukturer.
8. Användning av förfarandet enligt nägot av patentkraven 1 - 7 i en fortlöpande eller periodisk process för att producera, separera, bearbeta, lagra och/eller processa vidare en eller flera HARM-strukturer .
9. Användning av förfarandet enligt nägot av patentkraven 1 - 7 i framställningen av funktionellt material.
10. Användning av förfarandet enligt nägot av patentkraven 1 - 7 i framställningen av en tjock eller 20 tunn hinna, linje, ledning, mönster, lagrad och/eller tredimensionell struktur.
11. Användning av förfarandet enligt nägot av patentkraven 1 - 7 i framställningen av apparaten. 25
FI20060227A 2006-03-08 2006-03-08 Förfarande för förskjutande av molekylstrukturer med höga aspektförhållanden FI121540B (sv)

Priority Applications (16)

Application Number Priority Date Filing Date Title
FI20060227A FI121540B (sv) 2006-03-08 2006-03-08 Förfarande för förskjutande av molekylstrukturer med höga aspektförhållanden
KR1020087024493A KR101424676B1 (ko) 2006-03-08 2007-03-07 고 종횡비 분자 구조들의 증착 방법
PCT/FI2007/000060 WO2007101907A1 (en) 2006-03-08 2007-03-07 Method for separating high aspect ratio molecular structures
US12/281,868 US8871295B2 (en) 2006-03-08 2007-03-07 Method for separating high aspect ratio molecular structures
ES07712602.7T ES2627659T3 (es) 2006-03-08 2007-03-07 Procedimiento para la separación de estructuras moleculares de relación de aspecto elevada
PCT/FI2007/000059 WO2007101906A1 (en) 2006-03-08 2007-03-07 Method for depositing high aspect ratio molecular structures
US12/281,888 US8951602B2 (en) 2006-03-08 2007-03-07 Method for depositing high aspect ratio molecular structures
JP2008557776A JP5247476B2 (ja) 2006-03-08 2007-03-07 高アスペクト比構造の堆積方法
CN200780008320XA CN101400597B (zh) 2006-03-08 2007-03-07 用于分离高纵横比分子结构的方法
JP2008557777A JP5554501B2 (ja) 2006-03-08 2007-03-07 高アスペクト比構造の分離方法
EP07712601.9A EP1991497B8 (en) 2006-03-08 2007-03-07 Method for depositing high aspect ratio molecular structures
CN2007800083303A CN101400598B (zh) 2006-03-08 2007-03-07 用于沉积高纵横比分子结构的方法
EP07712602.7A EP1991498B1 (en) 2006-03-08 2007-03-07 Method for separating high aspect ratio molecular structures
ES07712601.9T ES2658071T3 (es) 2006-03-08 2007-03-07 Procedimiento para el depósito de estructuras moleculares con una relación entre dimensiones elevada
KR1020087024492A KR101476288B1 (ko) 2006-03-08 2008-10-07 고 종횡비 분자 구조들의 분리 방법
US14/588,870 US9776206B2 (en) 2006-03-08 2015-01-02 Method for depositing high aspect ratio molecular structures

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20060227A FI121540B (sv) 2006-03-08 2006-03-08 Förfarande för förskjutande av molekylstrukturer med höga aspektförhållanden
FI20060227 2006-03-08

Publications (3)

Publication Number Publication Date
FI20060227A0 FI20060227A0 (sv) 2006-03-08
FI20060227A FI20060227A (sv) 2007-09-09
FI121540B true FI121540B (sv) 2010-12-31

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Family Applications (1)

Application Number Title Priority Date Filing Date
FI20060227A FI121540B (sv) 2006-03-08 2006-03-08 Förfarande för förskjutande av molekylstrukturer med höga aspektförhållanden

Country Status (8)

Country Link
US (3) US8951602B2 (sv)
EP (2) EP1991498B1 (sv)
JP (2) JP5554501B2 (sv)
KR (2) KR101424676B1 (sv)
CN (2) CN101400598B (sv)
ES (2) ES2627659T3 (sv)
FI (1) FI121540B (sv)
WO (2) WO2007101906A1 (sv)

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Publication number Publication date
WO2007101907A1 (en) 2007-09-13
US8951602B2 (en) 2015-02-10
KR101476288B1 (ko) 2014-12-24
US20150209823A1 (en) 2015-07-30
FI20060227A (sv) 2007-09-09
US8871295B2 (en) 2014-10-28
EP1991498B1 (en) 2017-03-08
EP1991497B8 (en) 2017-12-20
EP1991498A1 (en) 2008-11-19
JP2009533227A (ja) 2009-09-17
KR20080113224A (ko) 2008-12-29
CN101400597A (zh) 2009-04-01
EP1991498A4 (en) 2014-01-15
CN101400598B (zh) 2012-07-18
JP5554501B2 (ja) 2014-07-23
FI20060227A0 (sv) 2006-03-08
ES2658071T3 (es) 2018-03-08
EP1991497B1 (en) 2017-11-01
KR20080112274A (ko) 2008-12-24
JP5247476B2 (ja) 2013-07-24
KR101424676B1 (ko) 2014-08-01
EP1991497A1 (en) 2008-11-19
CN101400597B (zh) 2012-07-25
US9776206B2 (en) 2017-10-03
WO2007101906A1 (en) 2007-09-13
JP2009528971A (ja) 2009-08-13
EP1991497A4 (en) 2014-01-22
CN101400598A (zh) 2009-04-01
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US20090304945A1 (en) 2009-12-10
US20090280238A1 (en) 2009-11-12

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