FI114657B - Menetelmä Fabry-Perot-interfometrin peilien välimatkan jänniteriippuvuuden selvittämiseksi - Google Patents

Menetelmä Fabry-Perot-interfometrin peilien välimatkan jänniteriippuvuuden selvittämiseksi

Info

Publication number
FI114657B
FI114657B FI20030430A FI20030430A FI114657B FI 114657 B FI114657 B FI 114657B FI 20030430 A FI20030430 A FI 20030430A FI 20030430 A FI20030430 A FI 20030430A FI 114657 B FI114657 B FI 114657B
Authority
FI
Finland
Prior art keywords
perot
fabry
mirrors
determining
distance
Prior art date
Application number
FI20030430A
Other languages
English (en)
Swedish (sv)
Other versions
FI20030430A0 (fi
FI20030430A (fi
Inventor
Marko Jalonen
Niina Hakkarainen
Matti Kokki
Original Assignee
Vaisala Oyj
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vaisala Oyj filed Critical Vaisala Oyj
Priority to FI20030430A priority Critical patent/FI114657B/fi
Publication of FI20030430A0 publication Critical patent/FI20030430A0/fi
Priority to US10/548,596 priority patent/US7187178B2/en
Priority to JP2006505624A priority patent/JP4970031B2/ja
Priority to EP04722880.4A priority patent/EP1606597B1/en
Priority to PCT/FI2004/000165 priority patent/WO2004085979A1/en
Publication of FI20030430A publication Critical patent/FI20030430A/fi
Application granted granted Critical
Publication of FI114657B publication Critical patent/FI114657B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
FI20030430A 2003-03-24 2003-03-24 Menetelmä Fabry-Perot-interfometrin peilien välimatkan jänniteriippuvuuden selvittämiseksi FI114657B (fi)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FI20030430A FI114657B (fi) 2003-03-24 2003-03-24 Menetelmä Fabry-Perot-interfometrin peilien välimatkan jänniteriippuvuuden selvittämiseksi
US10/548,596 US7187178B2 (en) 2003-03-24 2004-03-24 Method for determining the voltage sensitivity of the distance between the mirrors of a fabry-perot interferometer
JP2006505624A JP4970031B2 (ja) 2003-03-24 2004-03-24 ファブリペロー干渉計のミラー間の距離の電圧感度を決定する方法
EP04722880.4A EP1606597B1 (en) 2003-03-24 2004-03-24 Method for determining the voltage sensitivity of the distance between the mirrors of a fabry-perot interferometer
PCT/FI2004/000165 WO2004085979A1 (en) 2003-03-24 2004-03-24 Method for determining the voltage sensitivity of the distance between the mirrors of a fabry-perot interferometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20030430A FI114657B (fi) 2003-03-24 2003-03-24 Menetelmä Fabry-Perot-interfometrin peilien välimatkan jänniteriippuvuuden selvittämiseksi

Publications (3)

Publication Number Publication Date
FI20030430A0 FI20030430A0 (fi) 2003-03-24
FI20030430A FI20030430A (fi) 2004-09-25
FI114657B true FI114657B (fi) 2004-11-30

Family

ID=8565852

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20030430A FI114657B (fi) 2003-03-24 2003-03-24 Menetelmä Fabry-Perot-interfometrin peilien välimatkan jänniteriippuvuuden selvittämiseksi

Country Status (5)

Country Link
US (1) US7187178B2 (fi)
EP (1) EP1606597B1 (fi)
JP (1) JP4970031B2 (fi)
FI (1) FI114657B (fi)
WO (1) WO2004085979A1 (fi)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9927299B2 (en) 2015-12-15 2018-03-27 Trutag Technologies, Inc. Spectral reading using synchronized LED sources
DE102017207186A1 (de) * 2017-04-28 2018-10-31 Robert Bosch Gmbh Verfahren und Vorrichtung zum Kalibrieren eines Mikrospektrometermoduls

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4685325A (en) * 1986-02-03 1987-08-11 Aluminum Company Of America Measurement of gas content in molten metal using a constant current source
DE3911473A1 (de) * 1989-04-08 1990-10-11 Kerner Anna Wellenlaengenstabilisierung
US5218426A (en) * 1991-07-01 1993-06-08 The United States Of America As Represented By The Secretary Of Commerce Highly accurate in-situ determination of the refractivity of an ambient atmosphere
FI96450C (fi) * 1993-01-13 1996-06-25 Vaisala Oy Yksikanavainen kaasun pitoisuuden mittausmenetelmä ja -laitteisto
US5550373A (en) * 1994-12-30 1996-08-27 Honeywell Inc. Fabry-Perot micro filter-detector
FI103216B (fi) * 1995-07-07 1999-05-14 Vaisala Oyj Menetelmä NDIR-mittalaitteen lyhyen Fabry-Perot interferometrin ohjaam iseksi
JPH1082740A (ja) * 1996-09-06 1998-03-31 Shimadzu Corp 赤外線式ガス分析計
JPH11248934A (ja) * 1998-03-03 1999-09-17 Yokogawa Electric Corp 多層膜干渉フィルタおよびそれを用いた赤外線ガス分析計
FR2776771B1 (fr) * 1998-03-24 2000-05-26 Schlumberger Ind Sa Procede d'etalonnage en longueur d'onde d'un dispositif de filtrage d'un rayonnement electromagnetique
US6813291B2 (en) * 1998-06-26 2004-11-02 Coretek Inc Tunable fabry-perot filter and tunable vertical cavity surface emitting laser
JP2001311687A (ja) * 2000-04-28 2001-11-09 Shimadzu Corp 赤外線ガス分析計
JP2002055049A (ja) * 2000-08-14 2002-02-20 Horiba Ltd 連続測定装置
JP2002071562A (ja) * 2000-09-04 2002-03-08 Yokogawa Electric Corp 赤外分光測定装置
US6580516B1 (en) * 2000-11-01 2003-06-17 Agilent Technologies, Inc. Tunable Fabry Perot microelectromechanical resonator adapted for optical filters and lasers with reduced optical power-dependent tuning
US6842256B2 (en) * 2001-11-15 2005-01-11 Zygo Corporation Compensating for effects of variations in gas refractivity in interferometers
US6842254B2 (en) * 2002-10-16 2005-01-11 Fiso Technologies Inc. System and method for measuring an optical path difference in a sensing interferometer

Also Published As

Publication number Publication date
WO2004085979A1 (en) 2004-10-07
FI20030430A0 (fi) 2003-03-24
US7187178B2 (en) 2007-03-06
EP1606597B1 (en) 2014-05-07
FI20030430A (fi) 2004-09-25
EP1606597A1 (en) 2005-12-21
US20060164095A1 (en) 2006-07-27
JP2006523304A (ja) 2006-10-12
JP4970031B2 (ja) 2012-07-04

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