FI113704B - Menetelmä piianturin valmistamiseksi sekä piianturi - Google Patents

Menetelmä piianturin valmistamiseksi sekä piianturi Download PDF

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Publication number
FI113704B
FI113704B FI20010582A FI20010582A FI113704B FI 113704 B FI113704 B FI 113704B FI 20010582 A FI20010582 A FI 20010582A FI 20010582 A FI20010582 A FI 20010582A FI 113704 B FI113704 B FI 113704B
Authority
FI
Finland
Prior art keywords
spring
etching
crystal
silicon
plane
Prior art date
Application number
FI20010582A
Other languages
English (en)
Finnish (fi)
Swedish (sv)
Other versions
FI20010582A (fi
FI20010582A0 (fi
Inventor
Heikki Kuisma
Risto Mutikainen
Juha Lahdenperae
Original Assignee
Vti Technologies Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vti Technologies Oy filed Critical Vti Technologies Oy
Publication of FI20010582A0 publication Critical patent/FI20010582A0/fi
Priority to FI20010582A priority Critical patent/FI113704B/fi
Priority to EP02704788A priority patent/EP1390765A1/en
Priority to US10/472,465 priority patent/US6998059B2/en
Priority to CNA028104455A priority patent/CN1511259A/zh
Priority to JP2002579819A priority patent/JP2004531884A/ja
Priority to PCT/FI2002/000241 priority patent/WO2002082100A1/en
Priority to KR10-2003-7012232A priority patent/KR20040008143A/ko
Publication of FI20010582A publication Critical patent/FI20010582A/fi
Application granted granted Critical
Publication of FI113704B publication Critical patent/FI113704B/fi
Priority to US11/225,210 priority patent/US20060046329A1/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00134—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems comprising flexible or deformable structures
    • B81C1/00182—Arrangements of deformable or non-deformable structures, e.g. membrane and cavity for use in a transducer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/0802—Details
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2201/00—Specific applications of microelectromechanical systems
    • B81B2201/02—Sensors
    • B81B2201/0228—Inertial sensors
    • B81B2201/0235—Accelerometers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2201/00—Manufacture or treatment of microstructural devices or systems
    • B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
    • B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
    • B81C2201/0128—Processes for removing material
    • B81C2201/013—Etching
    • B81C2201/0132—Dry etching, i.e. plasma etching, barrel etching, reactive ion etching [RIE], sputter etching or ion milling
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2201/00—Manufacture or treatment of microstructural devices or systems
    • B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
    • B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
    • B81C2201/0128—Processes for removing material
    • B81C2201/013—Etching
    • B81C2201/0133—Wet etching
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
    • G01P2015/0808—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate
    • G01P2015/0811—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass
    • G01P2015/0817—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass for pivoting movement of the mass, e.g. in-plane pendulum

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Micromachines (AREA)
  • Pressure Sensors (AREA)
  • Weting (AREA)
  • Drying Of Semiconductors (AREA)
FI20010582A 2001-03-21 2001-03-21 Menetelmä piianturin valmistamiseksi sekä piianturi FI113704B (fi)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FI20010582A FI113704B (fi) 2001-03-21 2001-03-21 Menetelmä piianturin valmistamiseksi sekä piianturi
JP2002579819A JP2004531884A (ja) 2001-03-21 2002-03-21 シリコンセンサの製造方法及びシリコンセンサ
US10/472,465 US6998059B2 (en) 2001-03-21 2002-03-21 Method for manufacturing a silicon sensor and a silicon sensor
CNA028104455A CN1511259A (zh) 2001-03-21 2002-03-21 制造硅传感器的方法以及硅传感器
EP02704788A EP1390765A1 (en) 2001-03-21 2002-03-21 Method for manufacturing a silicon sensor and a silicon sensor
PCT/FI2002/000241 WO2002082100A1 (en) 2001-03-21 2002-03-21 Method for manufacturing a silicon sensor and a silicon sensor
KR10-2003-7012232A KR20040008143A (ko) 2001-03-21 2002-03-21 실리콘 센서 및 그의 제조 방법
US11/225,210 US20060046329A1 (en) 2001-03-21 2005-09-14 Method for manufacturing a silicon sensor and a silicon sensor

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20010582A FI113704B (fi) 2001-03-21 2001-03-21 Menetelmä piianturin valmistamiseksi sekä piianturi
FI20010582 2001-03-21

Publications (3)

Publication Number Publication Date
FI20010582A0 FI20010582A0 (fi) 2001-03-21
FI20010582A FI20010582A (fi) 2002-09-22
FI113704B true FI113704B (fi) 2004-05-31

Family

ID=8560806

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20010582A FI113704B (fi) 2001-03-21 2001-03-21 Menetelmä piianturin valmistamiseksi sekä piianturi

Country Status (7)

Country Link
US (2) US6998059B2 (ko)
EP (1) EP1390765A1 (ko)
JP (1) JP2004531884A (ko)
KR (1) KR20040008143A (ko)
CN (1) CN1511259A (ko)
FI (1) FI113704B (ko)
WO (1) WO2002082100A1 (ko)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6939475B2 (en) * 2001-08-31 2005-09-06 Daishinku Corporation Etching method, etched product formed by the same, and piezoelectric vibration device, method for producing the same
JP2005033173A (ja) * 2003-06-16 2005-02-03 Renesas Technology Corp 半導体集積回路装置の製造方法
JP4540467B2 (ja) * 2004-12-22 2010-09-08 Ｏｋｉセミコンダクタ株式会社 加速度センサの構造及びその製造方法
FI116544B (fi) * 2004-12-31 2005-12-15 Vti Technologies Oy Värähtelevä mikromekaaninen kulmanopeusanturi
EP1783094A1 (en) * 2005-11-04 2007-05-09 Infineon Technologies SensoNor AS Excitation in micromechanical devices
US7279114B1 (en) * 2006-05-08 2007-10-09 Macronix International Co., Ltd. Method for stabilizing etching performance
DE102006052630A1 (de) * 2006-10-19 2008-04-24 Robert Bosch Gmbh Mikromechanisches Bauelement mit monolithisch integrierter Schaltung und Verfahren zur Herstellung eines Bauelements
DE102008041757B4 (de) * 2008-09-02 2019-01-03 Robert Bosch Gmbh Herstellungsverfahren für eine Rotationssensorvorrichtung und Rotationssensorvorrichtung
DE102014200380A1 (de) * 2014-01-13 2015-07-16 Robert Bosch Gmbh Herstellungsverfahren für ein mikromechanisches Bauteil und mikromechanisches Bauteil
US10777839B2 (en) * 2014-03-28 2020-09-15 Infineon Technologies Ag Method for forming a battery element, a battery element and a battery
CN106871885A (zh) * 2015-12-10 2017-06-20 上海矽睿科技有限公司 用于mems传感器的折叠弹簧组以及mems传感器

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4922756A (en) * 1988-06-20 1990-05-08 Triton Technologies, Inc. Micro-machined accelerometer
US4975390A (en) * 1986-12-18 1990-12-04 Nippondenso Co. Ltd. Method of fabricating a semiconductor pressure sensor
US5484073A (en) * 1994-03-28 1996-01-16 I/O Sensors, Inc. Method for fabricating suspension members for micromachined sensors
US5834864A (en) 1995-09-13 1998-11-10 Hewlett Packard Company Magnetic micro-mover
DE19603829A1 (de) * 1996-02-02 1997-08-07 Daimler Benz Ag Verfahren zur Herstellung von mikromechanischen Strukturen aus Silizium
JP3301334B2 (ja) 1997-01-31 2002-07-15 三菱電機株式会社 センサ素子及びその製造方法
FR2763694B1 (fr) * 1997-05-23 1999-07-30 Sextant Avionique Micro-accelerometre a resonateur capacitif
EP1312943A1 (en) * 2001-11-14 2003-05-21 STMicroelectronics S.r.l. Method for the manufacture of electromagnetic radiation reflecting devices

Also Published As

Publication number Publication date
WO2002082100A1 (en) 2002-10-17
US6998059B2 (en) 2006-02-14
FI20010582A (fi) 2002-09-22
FI20010582A0 (fi) 2001-03-21
US20040074301A1 (en) 2004-04-22
CN1511259A (zh) 2004-07-07
EP1390765A1 (en) 2004-02-25
JP2004531884A (ja) 2004-10-14
US20060046329A1 (en) 2006-03-02
KR20040008143A (ko) 2004-01-28

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Owner name: MURATA ELECTRONICS OY

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