ES8607546A1 - Perfeccionamientos en los aparatos de radiacion nuclear y metodo correspondiente - Google Patents

Perfeccionamientos en los aparatos de radiacion nuclear y metodo correspondiente

Info

Publication number
ES8607546A1
ES8607546A1 ES531211A ES531211A ES8607546A1 ES 8607546 A1 ES8607546 A1 ES 8607546A1 ES 531211 A ES531211 A ES 531211A ES 531211 A ES531211 A ES 531211A ES 8607546 A1 ES8607546 A1 ES 8607546A1
Authority
ES
Spain
Prior art keywords
radiation scatter
density
determined
pavement
underlying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES531211A
Other languages
English (en)
Spanish (es)
Other versions
ES531211A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Troxler Electronic Laboratories Inc
Original Assignee
Troxler Electronic Laboratories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Laboratories Inc filed Critical Troxler Electronic Laboratories Inc
Publication of ES531211A0 publication Critical patent/ES531211A0/es
Publication of ES8607546A1 publication Critical patent/ES8607546A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
ES531211A 1983-03-22 1984-03-22 Perfeccionamientos en los aparatos de radiacion nuclear y metodo correspondiente Expired ES8607546A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method

Publications (2)

Publication Number Publication Date
ES531211A0 ES531211A0 (es) 1986-06-01
ES8607546A1 true ES8607546A1 (es) 1986-06-01

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
ES531211A Expired ES8607546A1 (es) 1983-03-22 1984-03-22 Perfeccionamientos en los aparatos de radiacion nuclear y metodo correspondiente

Country Status (11)

Country Link
US (1) US4525854A (ref)
EP (1) EP0120676B1 (ref)
JP (1) JPS59218941A (ref)
AT (1) ATE40750T1 (ref)
AU (1) AU557007B2 (ref)
CA (1) CA1219970A (ref)
DE (1) DE3476698D1 (ref)
ES (1) ES8607546A1 (ref)
IL (1) IL71299A (ref)
NZ (1) NZ207628A (ref)
ZA (1) ZA842056B (ref)

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US4641030A (en) * 1984-12-13 1987-02-03 Troxler Electronic Laboratories, Inc. Apparatus and method for directly measuring the density of a thin layer
DE3679819D1 (de) * 1986-05-06 1991-07-18 Siemens Ag Anordnung und verfahren zur ermittelung der berechtigung von personen durch ueberpruefen ihrer fingerabdruecke.
US4979197A (en) * 1986-05-22 1990-12-18 Troxler Electronic Laboratories, Inc. Nuclear radiation apparatus and method for dynamically measuring density of test materials during compaction
AU586762B2 (en) * 1986-12-25 1989-07-20 Institut Gornogo Dela Imeni A.A. Skochinskogo Monitoring hidden coal-rock interface
US4766319A (en) * 1987-02-12 1988-08-23 Troxler Electronic Laboratories, Inc. Portable nuclear moisture-density gauge with low activity nuclear sources
AU630933B2 (en) * 1987-03-31 1992-11-12 Adaptive Technologies Inc. Thickness/density measuring apparatus
FR2629914B1 (fr) * 1988-04-06 1991-09-06 Aerospatiale Procede et dispositif pour determiner la masse volumique d'un volume elementaire de matiere
GB9417419D0 (en) 1994-08-30 1994-10-19 Mackenzie Innes Method of measuring film thickness and monitoring liquid flow using backscattered x-rays and gamma-rays
GB2323440A (en) * 1997-03-17 1998-09-23 Johnson & Johnson Medical Measuring thickness of a layer within a body
US6207462B1 (en) 1998-03-20 2001-03-27 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
US6190917B1 (en) 1998-03-20 2001-02-20 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
US6320933B1 (en) * 1998-11-30 2001-11-20 American Science And Engineering, Inc. Multiple scatter system for threat identification
CA2363419C (en) 1999-03-03 2008-01-22 Troxler Electronic Laboratories, Inc. Improved thin layer nuclear density gauge
US6284986B1 (en) * 1999-03-15 2001-09-04 Seh America, Inc. Method of determining the thickness of a layer on a silicon substrate
US6492641B1 (en) * 2000-06-29 2002-12-10 Troxler Electronic Laboratories, Inc. Apparatus and method for gamma-ray determination of bulk density of samples
US6567498B1 (en) 2002-01-10 2003-05-20 Troxler Electronic Laboratories, Inc. Low activity nuclear density gauge
EP1357382A1 (en) * 2002-04-26 2003-10-29 Rijksuniversiteit te Groningen Method and system for determining a property of a pavement by measuring natural gamma radiation
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US6995667B2 (en) * 2002-12-23 2006-02-07 Instrotek, Inc. Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
RU2444723C2 (ru) * 2004-04-09 2012-03-10 Эмерикэн Сайэнс Энд Энджиниэринг, Инк. Устройство и способ досмотра объектов
US7809109B2 (en) 2004-04-09 2010-10-05 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
US7581446B2 (en) 2005-08-30 2009-09-01 Troxler Electronic Laboratories, Inc. Methods, systems, and computer program products for determining a property of construction material
US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
KR20090015929A (ko) * 2006-04-21 2009-02-12 아메리칸 사이언스 앤 엔지니어링, 인크. 다수의 시준된 빔과 개별 공급원의 배열체를 이용한 수화물및 사람에 대한 ｘ-레이 이미지화
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
RU2448342C2 (ru) * 2006-08-11 2012-04-20 Эмерикэн Сайэнс Энд Энджиниэринг, Инк. Система контроля объекта (варианты)
US8995619B2 (en) 2010-03-14 2015-03-31 Rapiscan Systems, Inc. Personnel screening system
US8638904B2 (en) 2010-03-14 2014-01-28 Rapiscan Systems, Inc. Personnel screening system
US8576982B2 (en) 2008-02-01 2013-11-05 Rapiscan Systems, Inc. Personnel screening system
WO2009089172A2 (en) 2008-01-04 2009-07-16 Troxler Electronic Laboratories, Inc. Nuclear gauges and methods of configuration and calibration of nuclear gauges
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
BR112012002166B1 (pt) * 2009-07-29 2019-07-30 American Science And Engineering, Inc. Sistema de inspeção para inspecionar um objeto
CN102893341A (zh) 2010-03-14 2013-01-23 拉皮斯坎系统股份有限公司 波束形成装置
PL3252506T3 (pl) 2011-02-08 2021-05-31 Rapiscan Systems, Inc. Tajny nadzór przy użyciu wykrywania multimodalnego
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
PL3242315T3 (pl) 2012-02-03 2024-02-19 Rapiscan Systems, Inc. Rentgenowski układ inspekcyjny do skanowania obiektu
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
PL2952068T3 (pl) 2013-01-31 2021-07-26 Rapiscan Systems, Inc. Przenośny system kontroli bezpieczeństwa
US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
US9891314B2 (en) 2014-03-07 2018-02-13 Rapiscan Systems, Inc. Ultra wide band detectors
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
WO2016012799A1 (en) 2014-07-24 2016-01-28 Johnson Matthey Public Limited Company Apparatus for determining thickness of lining layer
CA2968865A1 (en) 2014-11-25 2016-06-02 Rapiscan Systems, Inc. Intelligent security management system
EP3271709B1 (en) 2015-03-20 2022-09-21 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
US10720300B2 (en) 2016-09-30 2020-07-21 American Science And Engineering, Inc. X-ray source for 2D scanning beam imaging
SK8449Y1 (sk) * 2018-05-11 2019-05-06 Fulop Marko Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
US10830911B2 (en) 2018-06-20 2020-11-10 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
WO2020160106A1 (en) * 2019-01-30 2020-08-06 Ndc Technologies Inc. Radiation-based thickness gauge
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
JP2022137873A (ja) * 2021-03-09 2022-09-22 東芝Ｉｔコントロールシステム株式会社 放射線検査装置
GB2624599A (en) 2021-10-01 2024-05-22 Rapiscan Holdings Inc Methods and systems for the concurrent generation of multiple substantially similar X-ray beams
US12385854B2 (en) 2022-07-26 2025-08-12 Rapiscan Holdings, Inc. Methods and systems for performing on-the-fly automatic calibration adjustments of X-ray inspection systems

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2781453A (en) * 1953-02-11 1957-02-12 Univ Cornell Methods and apparatus for determination of characteristics of matter in a surface layer
US2997586A (en) * 1955-08-16 1961-08-22 Serge A Scherbatskoy Gamma ray testing
US2943202A (en) * 1956-01-26 1960-06-28 Curtiss Wright Corp Apparatus for measuring wall thickness or density by radiation detection
US3148279A (en) * 1961-05-04 1964-09-08 Western Electric Co Radiation method of measuring sheath thickness and eccentricity
US3202822A (en) * 1961-11-13 1965-08-24 Phillips Petroleum Co Method of determining density utilizing a gamma ray source and a pair of detectors
US3497691A (en) * 1967-06-30 1970-02-24 Ohmart Corp Dual mode fluorescence and backscatter coating thickness measuring gauge
US3840746A (en) * 1971-12-13 1974-10-08 Applied Invention Corp Gamma ray density probe utilizing a pair of gamma ray sources and a gamma ray detector
JPS5222553B2 (ref) * 1973-02-20 1977-06-17
US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
US4297575A (en) * 1979-08-13 1981-10-27 Halliburton Company Simultaneous gamma ray measurement of formation bulk density and casing thickness

Also Published As

Publication number Publication date
AU2598684A (en) 1984-09-27
US4525854A (en) 1985-06-25
ZA842056B (en) 1984-10-31
ES531211A0 (es) 1986-06-01
EP0120676A3 (en) 1985-06-12
IL71299A0 (en) 1984-06-29
DE3476698D1 (en) 1989-03-16
EP0120676A2 (en) 1984-10-03
NZ207628A (en) 1988-02-29
IL71299A (en) 1988-11-15
ATE40750T1 (de) 1989-02-15
JPS59218941A (ja) 1984-12-10
EP0120676B1 (en) 1989-02-08
CA1219970A (en) 1987-03-31
JPH0247697B2 (ref) 1990-10-22
AU557007B2 (en) 1986-11-27

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 20051210