ES8501879A1 - Procedimiento y dispositivo para determinar la temperatura de una superficie caliente de un objeto - Google Patents

Procedimiento y dispositivo para determinar la temperatura de una superficie caliente de un objeto

Info

Publication number
ES8501879A1
ES8501879A1 ES529709A ES529709A ES8501879A1 ES 8501879 A1 ES8501879 A1 ES 8501879A1 ES 529709 A ES529709 A ES 529709A ES 529709 A ES529709 A ES 529709A ES 8501879 A1 ES8501879 A1 ES 8501879A1
Authority
ES
Spain
Prior art keywords
temperature
dual sensor
radiation pyrometer
radiation
sensor radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES529709A
Other languages
English (en)
Other versions
ES529709A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
USS Engineers and Consultants Inc
Original Assignee
USS Engineers and Consultants Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by USS Engineers and Consultants Inc filed Critical USS Engineers and Consultants Inc
Publication of ES529709A0 publication Critical patent/ES529709A0/es
Publication of ES8501879A1 publication Critical patent/ES8501879A1/es
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K13/00Thermometers specially adapted for specific purposes
    • G01K13/10Thermometers specially adapted for specific purposes for measuring temperature within piled or stacked materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/60Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PROCEDIMIENTO Y DISPOSITIVO PARA DETERMINAR LA TEMPERATURA DE UNA SUPERFICIE CALIENTE DE UN OBJETO.CONSISTE EN: A) COLOCAR UN PRIMER SENSOR (2) DE RADIACION INFRARROJA PARA RECIBIR RADIACION EMITIDA Y REFLEJADA DE LA SUPERFICIE Y PROPORCIONAR UNA PRIMERA SEN/AL (8) INDICATIVA DE LA TEMPERATURA; B) COLOCAR UN SEGUNDO SENSOR (4) DE RADIACION INFRARROJA, QUE TIENE UNA RESPUESTA A LONGITUDES DE HONDA DE RADIACION EMITIDA Y REFLEJADA DE LA SUPERFICIE Y PROPORCIONAR UNA SEGUNDA SEN/AL (14) INDICATIVA DE LA TEMPERATURA; C) DERIVAR UNA PRIMERA SEN/AL (28) AJUSTADA DE LA SEGUNDA SEN/AL (14) CON LA RADIACION EMITIDA Y REFLEJADA QUE SE SUPONE ESTA A LA MISMA TEMPERATURA; D) COMBINAR LA PRIMERA SEN/AL Y LA PRIMERA SEN/AL AJUSTADA (28) PARA PROPORCIONAR UN FACTOR DE AJUSTE.
ES529709A 1983-02-14 1984-02-14 Procedimiento y dispositivo para determinar la temperatura de una superficie caliente de un objeto Expired ES8501879A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/465,951 US4579461A (en) 1983-02-14 1983-02-14 Dual sensor radiation pyrometer

Publications (2)

Publication Number Publication Date
ES529709A0 ES529709A0 (es) 1984-11-01
ES8501879A1 true ES8501879A1 (es) 1984-11-01

Family

ID=23849833

Family Applications (1)

Application Number Title Priority Date Filing Date
ES529709A Expired ES8501879A1 (es) 1983-02-14 1984-02-14 Procedimiento y dispositivo para determinar la temperatura de una superficie caliente de un objeto

Country Status (7)

Country Link
US (1) US4579461A (es)
EP (1) EP0119724A2 (es)
JP (1) JPS59206726A (es)
KR (1) KR840009131A (es)
BR (1) BR8400606A (es)
ES (1) ES8501879A1 (es)
ZA (1) ZA841081B (es)

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US4764025A (en) * 1985-08-08 1988-08-16 Rosemount Inc. Turbine blade temperature detecting pyrometer
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US5473162A (en) * 1987-10-26 1995-12-05 Baylor University Infrared emission detection of a gas
US4881823A (en) * 1988-03-29 1989-11-21 Purdue Research Foundation Radiation thermometry
US5061084A (en) * 1988-04-27 1991-10-29 Ag Processing Technologies, Inc. Pyrometer apparatus and method
US4969748A (en) * 1989-04-13 1990-11-13 Peak Systems, Inc. Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing
US4984902A (en) * 1989-04-13 1991-01-15 Peak Systems, Inc. Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing
US5281243A (en) * 1989-06-19 1994-01-25 Texaco, Inc. Temperature monitoring burner means and method
US5769540A (en) * 1990-04-10 1998-06-23 Luxtron Corporation Non-contact optical techniques for measuring surface conditions
US5310260A (en) * 1990-04-10 1994-05-10 Luxtron Corporation Non-contact optical techniques for measuring surface conditions
US5154512A (en) * 1990-04-10 1992-10-13 Luxtron Corporation Non-contact techniques for measuring temperature or radiation-heated objects
US5094544A (en) * 1990-10-19 1992-03-10 Square D Company Scanning infrared thermometer with DC offset and emissivity correction
US5114242A (en) * 1990-12-07 1992-05-19 Ag Processing Technologies, Inc. Bichannel radiation detection method
US5165796A (en) * 1990-12-07 1992-11-24 Ag Processing Technologies, Inc. Bichannel radiation detection apparatus
US5086220A (en) * 1991-02-05 1992-02-04 The Babcock & Wilcox Company Radiation imaging fiber optic temperature distribution monitor
US5255286A (en) * 1991-05-17 1993-10-19 Texas Instruments Incorporated Multi-point pyrometry with real-time surface emissivity compensation
GB9113966D0 (en) * 1991-06-28 1991-08-14 Ferodo Ltd Apparatus for temperature detection
US5266792A (en) * 1991-10-28 1993-11-30 Simmonds Precision Products, Inc. Temperature compensated optical detector
US5314249A (en) * 1991-11-19 1994-05-24 Kawasaki Steel Corporation Surface condition measurement apparatus
US5326173A (en) * 1993-01-11 1994-07-05 Alcan International Limited Apparatus and method for remote temperature measurement
US5308161A (en) * 1993-02-11 1994-05-03 Quantum Logic Corporation Pyrometer apparatus for use in rapid thermal processing of semiconductor wafers
DE4305645C2 (de) * 1993-02-24 1996-10-02 Rwe Entsorgung Ag Verfahren zur Ermittlung charakteristischer Eigenschaften von Radikale bildenden Prozessen, Verwendung des Verfahrens und Vorrichtung zur Durchführung des Verfahrens
US5764684A (en) * 1995-04-04 1998-06-09 Exergen Corporation Infrared thermocouple improvements
US5690430A (en) * 1996-03-15 1997-11-25 Bethlehem Steel Corporation Apparatus and method for measuring temperature and/or emissivity of steel strip during a coating process
US5815410A (en) * 1996-05-03 1998-09-29 Raytek Subsidiary, Inc. Ratio type infrared thermometer
US6733173B1 (en) * 1996-12-19 2004-05-11 Diamond Power International, Inc. Pyrometer for measuring the temperature of a gas component within a furnace
FR2779520B1 (fr) * 1998-06-09 2000-07-28 Moulinex Sa Capteur de temperature et appareil electromenager comportant un tel capteur
US7121998B1 (en) 2004-06-08 2006-10-17 Eurica Califorrniaa Vented microcradle for prenidial incubator
US20050276308A1 (en) * 2004-06-10 2005-12-15 Pint Charles S Method and apparatus for measuring temperature and emissivity
US7632012B2 (en) * 2005-09-01 2009-12-15 Siemens Energy, Inc. Method of measuring in situ differential emissivity and temperature
US7633066B2 (en) * 2006-05-22 2009-12-15 General Electric Company Multiwavelength pyrometry systems
US8254767B2 (en) 2008-08-29 2012-08-28 Applied Materials, Inc. Method and apparatus for extended temperature pyrometry
US8483991B2 (en) * 2009-05-15 2013-07-09 Fluke Corporation Method and system for measuring thermal radiation to determine temperature and emissivity of an object
US8790006B2 (en) * 2009-11-30 2014-07-29 General Electric Company Multiwavelength thermometer
JP6255713B2 (ja) * 2013-05-14 2018-01-10 株式会社ジェイテクト 光学非破壊検査方法及び光学非破壊検査装置
CN103243699B (zh) * 2013-05-22 2015-12-23 国家电网公司 一种电缆周围土壤热参数测量用传感器
US10252474B2 (en) * 2014-01-16 2019-04-09 Hewlett-Packard Development Company, L.P. Temperature determination based on emissivity
WO2015108546A2 (en) 2014-01-16 2015-07-23 Hewlett-Packard Development Company, L.P. Generating three-dimensional objects
US10889059B2 (en) 2014-01-16 2021-01-12 Hewlett-Packard Development Company, L.P. Generating three-dimensional objects
WO2015106816A1 (en) 2014-01-16 2015-07-23 Hewlett-Packard Development Company, L.P. Generating a three-dimensional object
WO2016052417A1 (ja) * 2014-09-29 2016-04-07 富士フイルム株式会社 赤外線画像取得装置及び赤外線画像取得方法
WO2020018168A1 (en) * 2018-07-16 2020-01-23 Lawrence Livermore National Security, Llc System and method for multi-channel pyrometer allowing non-contact temperature measurements down to 800 k on the microsecond scale

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US2837917A (en) * 1950-02-07 1958-06-10 Leeds & Northrup Co Radiation systems for measuring temperature
US3433052A (en) * 1965-07-26 1969-03-18 Automation Ind Inc Material tester
US3539807A (en) * 1968-04-04 1970-11-10 Texas Instruments Inc Temperature - emissivity separation and temperature independent radiometric analyzer
US3610592A (en) * 1969-07-29 1971-10-05 United States Steel Corp Method and apparatus for estimating errors in pyrometer readings
GB1254998A (en) * 1969-09-20 1971-11-24 Siemens Ag Colour pyrometers
US3635088A (en) * 1969-09-23 1972-01-18 Pierre Poncet Measure of the temperature of hot energy-radiating bodies
JPS5234230B2 (es) * 1971-12-27 1977-09-02
DE2405651B2 (de) * 1974-02-04 1980-08-14 Mannesmann Ag, 4000 Duesseldorf Pyrometer
US4172383A (en) * 1977-04-04 1979-10-30 Nippon Steel Corporation Method and an apparatus for simultaneous measurement of both temperature and emissivity of a heated material
US4272197A (en) * 1978-01-03 1981-06-09 Rca Corporation Apparatus and method for measuring the ratio of two signals
US4225230A (en) * 1978-08-02 1980-09-30 Vanzetti Infrared & Computer Systems Incorporated Band-ratio radiometer

Also Published As

Publication number Publication date
US4579461A (en) 1986-04-01
EP0119724A2 (en) 1984-09-26
ES529709A0 (es) 1984-11-01
BR8400606A (pt) 1984-09-18
ZA841081B (en) 1984-09-26
JPS59206726A (ja) 1984-11-22
KR840009131A (ko) 1984-12-24

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 20000201