ES529709A0 - Procedimiento y dispositivo para determinar la temperatura de una superficie caliente de un objeto - Google Patents
Procedimiento y dispositivo para determinar la temperatura de una superficie caliente de un objetoInfo
- Publication number
- ES529709A0 ES529709A0 ES529709A ES529709A ES529709A0 ES 529709 A0 ES529709 A0 ES 529709A0 ES 529709 A ES529709 A ES 529709A ES 529709 A ES529709 A ES 529709A ES 529709 A0 ES529709 A0 ES 529709A0
- Authority
- ES
- Spain
- Prior art keywords
- procedure
- temperature
- hot surface
- hot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
- G01K13/10—Thermometers specially adapted for specific purposes for measuring temperature within piled or stacked materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/465,951 US4579461A (en) | 1983-02-14 | 1983-02-14 | Dual sensor radiation pyrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
ES8501879A1 ES8501879A1 (es) | 1984-11-01 |
ES529709A0 true ES529709A0 (es) | 1984-11-01 |
Family
ID=23849833
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES529709A Granted ES529709A0 (es) | 1983-02-14 | 1984-02-14 | Procedimiento y dispositivo para determinar la temperatura de una superficie caliente de un objeto |
Country Status (7)
Country | Link |
---|---|
US (1) | US4579461A (es) |
EP (1) | EP0119724A2 (es) |
JP (1) | JPS59206726A (es) |
KR (1) | KR840009131A (es) |
BR (1) | BR8400606A (es) |
ES (1) | ES529709A0 (es) |
ZA (1) | ZA841081B (es) |
Families Citing this family (44)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DD253741A3 (de) * | 1985-07-30 | 1988-02-03 | Univ Dresden Tech | Verfahren zur beruehrungslosen temperaturmessung mit einem mehrkanalpyrometer |
DE3675130D1 (de) * | 1985-08-08 | 1990-11-29 | Rosemount Inc | Pyrometer zur temperaturmessung. |
US4764025A (en) * | 1985-08-08 | 1988-08-16 | Rosemount Inc. | Turbine blade temperature detecting pyrometer |
US4817020A (en) * | 1987-06-22 | 1989-03-28 | General Electric Company | Cooling rate determination apparatus for laser material processing |
US5473162A (en) * | 1987-10-26 | 1995-12-05 | Baylor University | Infrared emission detection of a gas |
US4881823A (en) * | 1988-03-29 | 1989-11-21 | Purdue Research Foundation | Radiation thermometry |
US5061084A (en) * | 1988-04-27 | 1991-10-29 | Ag Processing Technologies, Inc. | Pyrometer apparatus and method |
US4984902A (en) * | 1989-04-13 | 1991-01-15 | Peak Systems, Inc. | Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing |
US4969748A (en) * | 1989-04-13 | 1990-11-13 | Peak Systems, Inc. | Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing |
US5281243A (en) * | 1989-06-19 | 1994-01-25 | Texaco, Inc. | Temperature monitoring burner means and method |
US5310260A (en) * | 1990-04-10 | 1994-05-10 | Luxtron Corporation | Non-contact optical techniques for measuring surface conditions |
US5769540A (en) * | 1990-04-10 | 1998-06-23 | Luxtron Corporation | Non-contact optical techniques for measuring surface conditions |
US5154512A (en) * | 1990-04-10 | 1992-10-13 | Luxtron Corporation | Non-contact techniques for measuring temperature or radiation-heated objects |
US5094544A (en) * | 1990-10-19 | 1992-03-10 | Square D Company | Scanning infrared thermometer with DC offset and emissivity correction |
US5114242A (en) * | 1990-12-07 | 1992-05-19 | Ag Processing Technologies, Inc. | Bichannel radiation detection method |
US5165796A (en) * | 1990-12-07 | 1992-11-24 | Ag Processing Technologies, Inc. | Bichannel radiation detection apparatus |
US5086220A (en) * | 1991-02-05 | 1992-02-04 | The Babcock & Wilcox Company | Radiation imaging fiber optic temperature distribution monitor |
US5255286A (en) * | 1991-05-17 | 1993-10-19 | Texas Instruments Incorporated | Multi-point pyrometry with real-time surface emissivity compensation |
GB9113966D0 (en) * | 1991-06-28 | 1991-08-14 | Ferodo Ltd | Apparatus for temperature detection |
US5266792A (en) * | 1991-10-28 | 1993-11-30 | Simmonds Precision Products, Inc. | Temperature compensated optical detector |
US5314249A (en) * | 1991-11-19 | 1994-05-24 | Kawasaki Steel Corporation | Surface condition measurement apparatus |
US5326173A (en) * | 1993-01-11 | 1994-07-05 | Alcan International Limited | Apparatus and method for remote temperature measurement |
US5308161A (en) * | 1993-02-11 | 1994-05-03 | Quantum Logic Corporation | Pyrometer apparatus for use in rapid thermal processing of semiconductor wafers |
DE4305645C2 (de) * | 1993-02-24 | 1996-10-02 | Rwe Entsorgung Ag | Verfahren zur Ermittlung charakteristischer Eigenschaften von Radikale bildenden Prozessen, Verwendung des Verfahrens und Vorrichtung zur Durchführung des Verfahrens |
US5764684A (en) * | 1995-04-04 | 1998-06-09 | Exergen Corporation | Infrared thermocouple improvements |
US5690430A (en) * | 1996-03-15 | 1997-11-25 | Bethlehem Steel Corporation | Apparatus and method for measuring temperature and/or emissivity of steel strip during a coating process |
US5815410A (en) * | 1996-05-03 | 1998-09-29 | Raytek Subsidiary, Inc. | Ratio type infrared thermometer |
US6733173B1 (en) * | 1996-12-19 | 2004-05-11 | Diamond Power International, Inc. | Pyrometer for measuring the temperature of a gas component within a furnace |
FR2779520B1 (fr) * | 1998-06-09 | 2000-07-28 | Moulinex Sa | Capteur de temperature et appareil electromenager comportant un tel capteur |
US7121998B1 (en) * | 2004-06-08 | 2006-10-17 | Eurica Califorrniaa | Vented microcradle for prenidial incubator |
US20050276308A1 (en) * | 2004-06-10 | 2005-12-15 | Pint Charles S | Method and apparatus for measuring temperature and emissivity |
US7632012B2 (en) * | 2005-09-01 | 2009-12-15 | Siemens Energy, Inc. | Method of measuring in situ differential emissivity and temperature |
US7633066B2 (en) * | 2006-05-22 | 2009-12-15 | General Electric Company | Multiwavelength pyrometry systems |
US8254767B2 (en) | 2008-08-29 | 2012-08-28 | Applied Materials, Inc. | Method and apparatus for extended temperature pyrometry |
US8483991B2 (en) * | 2009-05-15 | 2013-07-09 | Fluke Corporation | Method and system for measuring thermal radiation to determine temperature and emissivity of an object |
US8790006B2 (en) * | 2009-11-30 | 2014-07-29 | General Electric Company | Multiwavelength thermometer |
JP6255713B2 (ja) * | 2013-05-14 | 2018-01-10 | 株式会社ジェイテクト | 光学非破壊検査方法及び光学非破壊検査装置 |
CN103243699B (zh) * | 2013-05-22 | 2015-12-23 | 国家电网公司 | 一种电缆周围土壤热参数测量用传感器 |
JP6570542B2 (ja) | 2014-01-16 | 2019-09-04 | ヒューレット−パッカード デベロップメント カンパニー エル.ピー.Hewlett‐Packard Development Company, L.P. | 三次元物体の生成 |
EP3626434A1 (en) | 2014-01-16 | 2020-03-25 | Hewlett-Packard Development Company, L.P. | Generating a three dimensional object |
JP6353547B2 (ja) | 2014-01-16 | 2018-07-04 | ヒューレット−パッカード デベロップメント カンパニー エル.ピー.Hewlett‐Packard Development Company, L.P. | 3次元物体の生成 |
CN106061714B (zh) * | 2014-01-16 | 2019-07-12 | 惠普发展公司,有限责任合伙企业 | 基于辐射率的温度确定 |
WO2016052417A1 (ja) * | 2014-09-29 | 2016-04-07 | 富士フイルム株式会社 | 赤外線画像取得装置及び赤外線画像取得方法 |
WO2020018168A1 (en) | 2018-07-16 | 2020-01-23 | Lawrence Livermore National Security, Llc | System and method for multi-channel pyrometer allowing non-contact temperature measurements down to 800 k on the microsecond scale |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2837917A (en) * | 1950-02-07 | 1958-06-10 | Leeds & Northrup Co | Radiation systems for measuring temperature |
US3433052A (en) * | 1965-07-26 | 1969-03-18 | Automation Ind Inc | Material tester |
US3539807A (en) * | 1968-04-04 | 1970-11-10 | Texas Instruments Inc | Temperature - emissivity separation and temperature independent radiometric analyzer |
US3610592A (en) * | 1969-07-29 | 1971-10-05 | United States Steel Corp | Method and apparatus for estimating errors in pyrometer readings |
GB1254998A (en) * | 1969-09-20 | 1971-11-24 | Siemens Ag | Colour pyrometers |
US3635088A (en) * | 1969-09-23 | 1972-01-18 | Pierre Poncet | Measure of the temperature of hot energy-radiating bodies |
JPS5234230B2 (es) * | 1971-12-27 | 1977-09-02 | ||
DE2405651B2 (de) * | 1974-02-04 | 1980-08-14 | Mannesmann Ag, 4000 Duesseldorf | Pyrometer |
US4172383A (en) * | 1977-04-04 | 1979-10-30 | Nippon Steel Corporation | Method and an apparatus for simultaneous measurement of both temperature and emissivity of a heated material |
US4272197A (en) * | 1978-01-03 | 1981-06-09 | Rca Corporation | Apparatus and method for measuring the ratio of two signals |
US4225230A (en) * | 1978-08-02 | 1980-09-30 | Vanzetti Infrared & Computer Systems Incorporated | Band-ratio radiometer |
-
1983
- 1983-02-14 US US06/465,951 patent/US4579461A/en not_active Expired - Fee Related
-
1984
- 1984-02-13 KR KR1019840000667A patent/KR840009131A/ko not_active Application Discontinuation
- 1984-02-13 EP EP84300892A patent/EP0119724A2/en not_active Withdrawn
- 1984-02-13 BR BR8400606A patent/BR8400606A/pt unknown
- 1984-02-13 JP JP59024936A patent/JPS59206726A/ja active Pending
- 1984-02-14 ZA ZA841081A patent/ZA841081B/xx unknown
- 1984-02-14 ES ES529709A patent/ES529709A0/es active Granted
Also Published As
Publication number | Publication date |
---|---|
US4579461A (en) | 1986-04-01 |
BR8400606A (pt) | 1984-09-18 |
JPS59206726A (ja) | 1984-11-22 |
ES8501879A1 (es) | 1984-11-01 |
EP0119724A2 (en) | 1984-09-26 |
KR840009131A (ko) | 1984-12-24 |
ZA841081B (en) | 1984-09-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FD1A | Patent lapsed |
Effective date: 20000201 |