ES8104640A1 - Perfeccionamientos en detectores de ionizacion acumulativa - Google Patents

Perfeccionamientos en detectores de ionizacion acumulativa

Info

Publication number
ES8104640A1
ES8104640A1 ES494006A ES494006A ES8104640A1 ES 8104640 A1 ES8104640 A1 ES 8104640A1 ES 494006 A ES494006 A ES 494006A ES 494006 A ES494006 A ES 494006A ES 8104640 A1 ES8104640 A1 ES 8104640A1
Authority
ES
Spain
Prior art keywords
pair
layer
heterojunctions
bandgap
sequence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES494006A
Other languages
English (en)
Other versions
ES494006A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of ES8104640A1 publication Critical patent/ES8104640A1/es
Publication of ES494006A0 publication Critical patent/ES494006A0/es
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/109—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PN heterojunction type
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/107—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes
    • H01L31/1075—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes in which the active layers, e.g. absorption or multiplication layers, form an heterostructure, e.g. SAM structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/111—Devices sensitive to infrared, visible or ultraviolet radiation characterised by at least three potential barriers, e.g. photothyristors

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Light Receiving Elements (AREA)

Abstract

FOTODETECTORES DE IONIZACION ACUMULATIVA. COMPRENDE UNA PLURALIDAD DE CAPAS SEMICONDUCTORAS (10, 11, 12, 13, 14, 15) DE TIPO DE CONDUCTIVIDAD ALTERNATIVAMENTE OPUESTO. LAS HETEROUNIONES (1.1; 1.2; 1.3) EN LAS ETAPAS AMPLIFICADORAS, ESTAN FORMADAS POR LAS CAPAS P Y N (10 Y 11; 12 Y 13; 14 Y 15) Y LAS HETEROUNIONES (1.4 Y 1.5) FORMADAS ENTRE LAS CAPAS N Y P (11 Y 12; 13 Y 14). AL APLICAR TENSION A LOS ELECTRODOS (21, 22, 23), FABRICADOS SOBRE LAS CAPAS P (10, 12, 14), SE PROPORCIONA POLARIDAD DIRECTA A LAS HETEROUNIONES (1.4; 1.5) Y POLARIDAD INVERSA A LAS HETEROUNIONES (1.1; 1.2; 1.3) Y SIRVEN PARA SEPARAR LAS LAGUNAS ACUMULADAS EN LAS TRAMPAS DEL DISPOSITIVO (1); ESTA SEPARACION DE LAGUNAS AYUDA TAMBIEN A MEJORAR EL TIEMPO DE RESPUESTA DEL DISPOSITIVO (1).
ES494006A 1979-08-06 1980-08-05 Perfeccionamientos en detectores de ionizacion acumulativa Granted ES494006A0 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/064,040 US4250516A (en) 1979-08-06 1979-08-06 Multistage avalanche photodetector

Publications (2)

Publication Number Publication Date
ES8104640A1 true ES8104640A1 (es) 1981-04-16
ES494006A0 ES494006A0 (es) 1981-04-16

Family

ID=22053169

Family Applications (1)

Application Number Title Priority Date Filing Date
ES494006A Granted ES494006A0 (es) 1979-08-06 1980-08-05 Perfeccionamientos en detectores de ionizacion acumulativa

Country Status (5)

Country Link
US (1) US4250516A (es)
EP (1) EP0023723A3 (es)
JP (1) JPS56500990A (es)
ES (1) ES494006A0 (es)
WO (1) WO1981000488A1 (es)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56165473A (en) * 1980-05-24 1981-12-19 Semiconductor Res Found Semiconductor pickup device
US4486765A (en) * 1981-12-07 1984-12-04 At&T Bell Laboratories Avalanche photodetector including means for separating electrons and holes
US4476477A (en) * 1982-02-23 1984-10-09 At&T Bell Laboratories Graded bandgap multilayer avalanche photodetector with energy step backs
JPS5984589A (ja) * 1982-11-08 1984-05-16 Fujitsu Ltd アバランシフオトダイオード
US4568959A (en) * 1983-06-02 1986-02-04 International Business Machines Corporation Photomultiplier
US4620214A (en) * 1983-12-02 1986-10-28 California Institute Of Technology Multiple quantum-well infrared detector
GB8417303D0 (en) * 1984-07-06 1984-08-08 Secr Defence Infra-red detector
FR2583577B1 (fr) * 1985-06-18 1987-08-07 Thomson Csf Procede de realisation d'un dispositif photodetecteur semi-conducteur a avalanche et dispositif ainsi realise
FR2612334B1 (fr) * 1986-12-12 1989-04-21 Thomson Csf Dispositif de multiplication de porteurs de charge par un phenomene d'avalanche et son application aux photodetecteurs, aux photocathodes, et aux visionneurs infrarouges
US6534783B1 (en) * 1989-12-27 2003-03-18 Raytheon Company Stacked multiple quantum well superlattice infrared detector
US6369436B1 (en) * 2000-05-22 2002-04-09 Boris Gilman Semiconductor wavelength demultiplexer
US8279411B2 (en) * 2008-08-27 2012-10-02 The Boeing Company Systems and methods for reducing crosstalk in an avalanche photodiode detector array
US9395182B1 (en) 2011-03-03 2016-07-19 The Boeing Company Methods and systems for reducing crosstalk in avalanche photodiode detector arrays
DE102017011643B4 (de) * 2017-12-15 2020-05-14 Azur Space Solar Power Gmbh Optische Spannungsquelle

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3982261A (en) * 1972-09-22 1976-09-21 Varian Associates Epitaxial indium-gallium-arsenide phosphide layer on lattice-matched indium-phosphide substrate and devices
US4206002A (en) * 1976-10-19 1980-06-03 University Of Pittsburgh Graded band gap multi-junction solar energy cell
US4103312A (en) * 1977-06-09 1978-07-25 International Business Machines Corporation Semiconductor memory devices
US4110778A (en) * 1977-06-21 1978-08-29 The United States Of America As Represented By The Secretary Of The Air Force Narrow-band inverted homo-heterojunction avalanche photodiode
FR2399740A1 (fr) * 1977-08-02 1979-03-02 Thomson Csf Diode a avalanche a hetero-jonction, et oscillateur en mode dit " a temps de transit " utilisant une telle diode
US4127862A (en) * 1977-09-06 1978-11-28 Bell Telephone Laboratories, Incorporated Integrated optical detectors
FR2408915A1 (fr) * 1977-11-10 1979-06-08 Thomson Csf Photodiode a heterojonction, fonctionnant en avalanche sous une faible tension de polarisation
US4179702A (en) * 1978-03-09 1979-12-18 Research Triangle Institute Cascade solar cells
US4163237A (en) * 1978-04-24 1979-07-31 Bell Telephone Laboratories, Incorporated High mobility multilayered heterojunction devices employing modulated doping
US4203124A (en) * 1978-10-06 1980-05-13 Bell Telephone Laboratories, Incorporated Low noise multistage avalanche photodetector
US4213138A (en) * 1978-12-14 1980-07-15 Bell Telephone Laboratories, Incorporated Demultiplexing photodetector

Also Published As

Publication number Publication date
US4250516A (en) 1981-02-10
EP0023723A2 (en) 1981-02-11
JPS56500990A (es) 1981-07-16
ES494006A0 (es) 1981-04-16
EP0023723A3 (en) 1982-03-31
WO1981000488A1 (en) 1981-02-19

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