ES368134A1 - A procedure for the manufacture of semiconductor devices. (Machine-translation by Google Translate, not legally binding) - Google Patents

A procedure for the manufacture of semiconductor devices. (Machine-translation by Google Translate, not legally binding)

Info

Publication number
ES368134A1
ES368134A1 ES368134A ES368134A ES368134A1 ES 368134 A1 ES368134 A1 ES 368134A1 ES 368134 A ES368134 A ES 368134A ES 368134 A ES368134 A ES 368134A ES 368134 A1 ES368134 A1 ES 368134A1
Authority
ES
Spain
Prior art keywords
layer
semi
conductor
sio
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES368134A
Other languages
Spanish (es)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp filed Critical RCA Corp
Publication of ES368134A1 publication Critical patent/ES368134A1/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • H01L21/311Etching the insulating layers by chemical or physical means
    • H01L21/31105Etching inorganic layers
    • H01L21/31111Etching inorganic layers by chemical means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Weting (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

A semi-conductor device is produced by providing a substrate having a plurality of regions of semi-conductor material forming a number of semi-conductor elements, each element having at least one contact region adjacent a surface of the substrate, depositing a metallic layer on the said surface of the substrate to provide a number of terminal areas electrically coupled to corresponding semi-conductor element contact regions, depositing an insulating layer on the metallic layer and etching away portions of the insulating layer overlying the terminal areas with an etching solution which is substantially electrically non-conductive and comprises hydrofluoric acid, a buffering agent (e.g. ammonium fluoride) and an organic substance selected from alcohols and carboxylic acids. Examples of suitable organic substances are glacial acetic acid, glycol or glycerol. The insulating layer may comprise silicon dioxide and the metallic layer may comprise aluminium, nickel, copper, gold, iron, tantalum, silver, titanium or combinations of these. In a preferred embodiment, Figs. 5-9, an aluminium film 7 is evaporated on to the surface of a semi-conductor wafer comprising an N+ silicon substrate 3, an N-type silicon epitaxial layer 2 and a silicon dioxide layer 4. A further SiO 2 layer 8 is pyrolytically deposited and then covered with a layer 9 of photoresist. To remove the metal area 7 which overlies the SiO 2 layer portion 10, the layer 9 is exposed through a suitable mask and developed and subsequently the hole 11 is formed in the SiO 2 layer 8 by means of the aforementioned non-conductive buffered hydrofluoric acid etching solution. The exposed metal is then etched with a mixture of nitric and phosphoric acids. Photoresist 9 may be removed prior to the metal etching step. The portions of layer 7 in contact with the P and N+ regions are then alloyed to the semi-conductor surface by heating the wafer at 530-550 C. and thereafter a fresh SiO 2 film 12 is pyrolytically deposited. A fresh photoresist 13 is used to define apertures 14 and 15 in the SiO 2 layers 8 and 12 which layers are etched according to the invention with the non- conductive buffered hydrofluoric acid solution. Terminal leads may then be ultrasonically bonded to the aluminium pods exposed by apertures 14 and 15.
ES368134A 1968-06-10 1969-06-07 A procedure for the manufacture of semiconductor devices. (Machine-translation by Google Translate, not legally binding) Expired ES368134A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US73571968A 1968-06-10 1968-06-10

Publications (1)

Publication Number Publication Date
ES368134A1 true ES368134A1 (en) 1971-06-16

Family

ID=24956905

Family Applications (1)

Application Number Title Priority Date Filing Date
ES368134A Expired ES368134A1 (en) 1968-06-10 1969-06-07 A procedure for the manufacture of semiconductor devices. (Machine-translation by Google Translate, not legally binding)

Country Status (8)

Country Link
BR (1) BR6909609D0 (en)
DE (1) DE1929084C3 (en)
ES (1) ES368134A1 (en)
FR (1) FR2011513B1 (en)
GB (1) GB1228083A (en)
MY (1) MY7400057A (en)
NL (1) NL6908748A (en)
SE (1) SE355692B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2288138A1 (en) * 1974-10-18 1976-05-14 Radiotechnique Compelec Removal of aluminium oxide layer by etching - using a solution of fluoride in an organic solvent
US4230523A (en) * 1978-12-29 1980-10-28 International Business Machines Corporation Etchant for silicon dioxide films disposed atop silicon or metallic silicides
US4620934A (en) * 1984-04-26 1986-11-04 Allied Corporation Soluble fluorinated cycloalkane sulfonate surfactant additives for NH4
US4517106A (en) * 1984-04-26 1985-05-14 Allied Corporation Soluble surfactant additives for ammonium fluoride/hydrofluoric acid oxide etchant solutions
DE19935446A1 (en) 1999-07-28 2001-02-01 Merck Patent Gmbh Etching solution containing hydrofluoric acid
US7192860B2 (en) 2002-06-20 2007-03-20 Honeywell International Inc. Highly selective silicon oxide etching compositions
CN112099311B (en) * 2020-09-22 2024-05-21 桂林电子科技大学 Preparation method of photoetching mask based on AAO nanostructure

Also Published As

Publication number Publication date
NL6908748A (en) 1969-12-12
FR2011513A1 (en) 1970-03-06
MY7400057A (en) 1974-12-31
FR2011513B1 (en) 1973-10-19
BR6909609D0 (en) 1973-01-02
GB1228083A (en) 1971-04-15
SE355692B (en) 1973-04-30
DE1929084C3 (en) 1980-05-08
DE1929084B2 (en) 1975-01-09
DE1929084A1 (en) 1969-12-11

Similar Documents

Publication Publication Date Title
US3475234A (en) Method for making mis structures
US3932226A (en) Method of electrically interconnecting semiconductor elements
US3493820A (en) Airgap isolated semiconductor device
US3456335A (en) Contacting arrangement for solidstate components
US3237271A (en) Method of fabricating semiconductor devices
GB1203086A (en) Ohmic contact and electrical lead for semiconductor devices
US3498833A (en) Double masking technique for integrated circuit
US3616348A (en) Process for isolating semiconductor elements
US3427708A (en) Semiconductor
US3244555A (en) Semiconductor devices
US3449825A (en) Fabrication of semiconductor devices
US3341753A (en) Metallic contacts for semiconductor devices
JPS5950113B2 (en) semiconductor equipment
US3627598A (en) Nitride passivation of mesa transistors by phosphovapox lifting
ES368134A1 (en) A procedure for the manufacture of semiconductor devices. (Machine-translation by Google Translate, not legally binding)
US3590478A (en) Method of forming electrical leads for semiconductor device
US3716765A (en) Semiconductor device with protective glass sealing
US3490943A (en) Method of forming juxtaposed metal layers separated by a narrow gap on a substrate and objects manufactured by the use of such methods
US3271636A (en) Gallium arsenide semiconductor diode and method
US3513022A (en) Method of fabricating semiconductor devices
US3956820A (en) Method of manufacturing a semiconductor device having a lead bonded to a surface thereof
US3414784A (en) Electrical structural element having closely neighboring terminal contacts and method of making it
US3739239A (en) Semiconductor device and method of manufacturing the device
GB1196834A (en) Improvement of Electrode Structure in a Semiconductor Device.
US3651565A (en) Lateral transistor structure and method of making the same