ES3076166T3 - Interface unit - Google Patents
Interface unitInfo
- Publication number
- ES3076166T3 ES3076166T3 ES19860396T ES19860396T ES3076166T3 ES 3076166 T3 ES3076166 T3 ES 3076166T3 ES 19860396 T ES19860396 T ES 19860396T ES 19860396 T ES19860396 T ES 19860396T ES 3076166 T3 ES3076166 T3 ES 3076166T3
- Authority
- ES
- Spain
- Prior art keywords
- interface unit
- interface
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
- H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR20180108208 | 2018-09-11 | ||
| KR20180114885 | 2018-09-27 | ||
| KR1020190110755A KR102790955B1 (ko) | 2018-09-27 | 2019-09-06 | 레이저 탈착-코로나-dart-ms 시스템 및 이에 사용되는 광학 유닛들을 지지하기 위한 부재 |
| KR1020190111487A KR102577694B1 (ko) | 2018-09-11 | 2019-09-09 | 검출 감도 향상을 위한 레이저 탈착-dart-ms 시스템 및 이에 사용되는 인터페이스 유닛 |
| KR1020190112165A KR102762853B1 (ko) | 2019-09-10 | 2019-09-10 | 인터페이스 유닛 |
| PCT/KR2019/011778 WO2020055133A1 (ko) | 2018-09-11 | 2019-09-11 | 인터페이스 유닛 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES3076166T3 true ES3076166T3 (en) | 2026-08-12 |
Family
ID=73337619
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES19860396T Active ES3076166T3 (en) | 2018-09-11 | 2019-09-11 | Interface unit |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11488816B2 (es) |
| EP (1) | EP3852129B1 (es) |
| JP (1) | JP7294620B2 (es) |
| CN (1) | CN111954917B (es) |
| ES (1) | ES3076166T3 (es) |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2731512B2 (ja) * | 1994-10-07 | 1998-03-25 | 株式会社日立製作所 | プラズマ質量分析計 |
| KR19990041082U (ko) | 1998-05-13 | 1999-12-15 | 구자홍 | 레이저 가공기의 레이저 가공부 지지장치 |
| US20070164209A1 (en) | 2002-05-31 | 2007-07-19 | Balogh Michael P | High speed combination multi-mode ionization source for mass spectrometers |
| US7388195B2 (en) * | 2004-09-30 | 2008-06-17 | Charles Stark Draper Laboratory, Inc. | Apparatus and systems for processing samples for analysis via ion mobility spectrometry |
| US7262841B2 (en) * | 2005-03-17 | 2007-08-28 | Agilent Technologies, Inc. | Laser alignment for ion source |
| JP4866098B2 (ja) | 2006-02-21 | 2012-02-01 | 大学共同利用機関法人自然科学研究機構 | 質量分析装置 |
| US7642510B2 (en) | 2006-08-22 | 2010-01-05 | E.I. Du Pont De Nemours And Company | Ion source for a mass spectrometer |
| US7723676B2 (en) | 2007-12-18 | 2010-05-25 | Science & Engineering Services, Inc. | Method and apparatus for ion fragmentation in mass spectrometry |
| CN101520432B (zh) * | 2008-02-28 | 2013-04-24 | 岛津分析技术研发(上海)有限公司 | 用于质谱仪的解吸电离装置 |
| US8207494B2 (en) * | 2008-05-01 | 2012-06-26 | Indiana University Research And Technology Corporation | Laser ablation flowing atmospheric-pressure afterglow for ambient mass spectrometry |
| JP2010014539A (ja) | 2008-07-03 | 2010-01-21 | Tokyo Metropolitan Univ | 液体試料イオン化法、質量分析法及びそれらの装置 |
| JP2010271219A (ja) * | 2009-05-22 | 2010-12-02 | Fujifilm Corp | 質量分析装置、及びそれを用いた質量分析方法 |
| JP5521177B2 (ja) | 2010-04-28 | 2014-06-11 | 株式会社島津製作所 | 質量分析装置 |
| KR20150134373A (ko) | 2013-03-22 | 2015-12-01 | 에테하 취리히 | 레이저 어블레이션 셀 |
| JP6253893B2 (ja) | 2013-04-16 | 2017-12-27 | 株式会社 資生堂 | 質量分析方法、イオン生成装置及び質量分析システム |
| RU2637795C2 (ru) * | 2013-04-17 | 2017-12-07 | Флуидигм Кэнада Инк. | Анализ образцов для масс-цитометрии |
| MX359727B (es) | 2013-07-19 | 2018-10-08 | Smiths Detection Inc | Entrada de espectrómetro de masas con flujo promedio reducido. |
| EP3018695A4 (en) | 2013-08-02 | 2016-07-20 | Shimadzu Corp | IONIZATION DEVICE AND MASS SPECTROMETRY DEVICE |
| CN103698385B (zh) * | 2013-12-06 | 2015-09-23 | 宁波检验检疫科学技术研究院 | 一种固体样品的直接分析装置 |
| JP5787457B1 (ja) * | 2014-02-04 | 2015-09-30 | 株式会社バイオクロマト | 質量分析装置用連結デバイス |
| JP6107978B2 (ja) | 2014-02-10 | 2017-04-05 | 株式会社島津製作所 | 質量分析装置及び質量分析方法 |
| WO2015140491A1 (en) * | 2014-03-18 | 2015-09-24 | Micromass Uk Limited | Liquid extraction matrix assisted laser desorption ionisation ion source |
| CN105021718B (zh) | 2014-04-28 | 2017-06-30 | 南京工业大学 | 一种液相色谱与敞开式离子化质谱在线联用接口和检测方法 |
| DE102014226039A1 (de) | 2014-12-16 | 2016-06-16 | Carl Zeiss Smt Gmbh | Ionisierungseinrichtung und Massenspektrometer damit |
| CN110706996B (zh) | 2015-03-06 | 2023-08-11 | 英国质谱公司 | 用于改进电离的碰撞表面 |
| EP3570315B1 (en) | 2015-03-06 | 2024-01-31 | Micromass UK Limited | Rapid evaporative ionisation mass spectrometry ("reims") and desorption electrospray ionisation mass spectrometry ("desi-ms") analysis of biopsy samples |
| KR101748525B1 (ko) | 2016-02-02 | 2017-06-16 | 주식회사 엘지화학 | 질량 분석 이미징에 의해 시료 표면의 물질 분포를 분석하는 방법 및 시스템 |
| KR101787579B1 (ko) | 2016-03-31 | 2017-10-19 | 주식회사 아스타 | 근적외선 형광을 이용한 질량 분석 장치 및 방법 |
| KR101845733B1 (ko) | 2016-04-22 | 2018-04-05 | 주식회사 아스타 | 레이저의 빔 크기 및 강도 조절이 가능한 질량 분석 장치 및 질량 분석용 시료에 레이저를 조사하는 방법 |
| EP3240014A1 (en) * | 2016-04-29 | 2017-11-01 | ETH Zurich | Laser ablation cell |
| WO2018154463A1 (en) | 2017-02-22 | 2018-08-30 | Basf Corporation | Exhaust gas treatment catalyst for abatement of nitrogen oxides |
| KR102375568B1 (ko) | 2017-03-24 | 2022-03-16 | 도레이첨단소재 주식회사 | 2가 양이온에 대한 선택적 제거능을 가지는 코팅 조성물 및 이를 이용한 분리막 |
| KR102171076B1 (ko) | 2018-03-21 | 2020-10-28 | 삼성에스디아이 주식회사 | 유기 광전자 소자용 조성물, 유기 광전자 소자 및 표시 장치 |
| KR102532321B1 (ko) | 2018-03-23 | 2023-05-15 | 현대자동차주식회사 | 무단변속기 차량의 풀리 제어방법 |
| KR102143093B1 (ko) | 2018-10-12 | 2020-08-10 | (주) 세종이엠씨 | 전자파 공급장치 |
-
2019
- 2019-09-11 US US17/049,105 patent/US11488816B2/en active Active
- 2019-09-11 CN CN201980024368.2A patent/CN111954917B/zh active Active
- 2019-09-11 EP EP19860396.1A patent/EP3852129B1/en active Active
- 2019-09-11 JP JP2020552313A patent/JP7294620B2/ja active Active
- 2019-09-11 ES ES19860396T patent/ES3076166T3/es active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP3852129A1 (en) | 2021-07-21 |
| JP7294620B2 (ja) | 2023-06-20 |
| US20210233758A1 (en) | 2021-07-29 |
| JP2021517964A (ja) | 2021-07-29 |
| US11488816B2 (en) | 2022-11-01 |
| EP3852129B1 (en) | 2026-04-22 |
| CN111954917A (zh) | 2020-11-17 |
| EP3852129A4 (en) | 2021-10-27 |
| CN111954917B (zh) | 2023-11-07 |