ES2414955T3 - Procedimiento y dispositivo para la medición de la distancia por medio de sensores capacitivos o inductivos - Google Patents
Procedimiento y dispositivo para la medición de la distancia por medio de sensores capacitivos o inductivos Download PDFInfo
- Publication number
- ES2414955T3 ES2414955T3 ES06776515T ES06776515T ES2414955T3 ES 2414955 T3 ES2414955 T3 ES 2414955T3 ES 06776515 T ES06776515 T ES 06776515T ES 06776515 T ES06776515 T ES 06776515T ES 2414955 T3 ES2414955 T3 ES 2414955T3
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- Spain
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- Prior art date
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Links
- 238000000034 method Methods 0.000 title claims abstract description 16
- 230000001939 inductive effect Effects 0.000 title description 6
- 230000004048 modification Effects 0.000 claims abstract description 120
- 238000012986 modification Methods 0.000 claims abstract description 120
- 230000001360 synchronised effect Effects 0.000 claims abstract description 71
- 230000033228 biological regulation Effects 0.000 claims abstract description 36
- 238000001514 detection method Methods 0.000 claims abstract description 21
- 230000001105 regulatory effect Effects 0.000 claims abstract description 17
- 230000008859 change Effects 0.000 claims abstract description 13
- 230000005540 biological transmission Effects 0.000 claims abstract 6
- 230000000052 comparative effect Effects 0.000 claims abstract 3
- 230000010363 phase shift Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 description 32
- 230000005684 electric field Effects 0.000 description 10
- 230000003321 amplification Effects 0.000 description 8
- 239000003990 capacitor Substances 0.000 description 8
- 238000003199 nucleic acid amplification method Methods 0.000 description 8
- 230000008901 benefit Effects 0.000 description 4
- 238000006073 displacement reaction Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000006698 induction Effects 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 230000004913 activation Effects 0.000 description 3
- 230000005284 excitation Effects 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000032683 aging Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar Systems Or Details Thereof (AREA)
- Optical Radar Systems And Details Thereof (AREA)
- Geophysics And Detection Of Objects (AREA)
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102005036354 | 2005-07-29 | ||
| DE102005036354 | 2005-07-29 | ||
| DE102005045993 | 2005-09-27 | ||
| DE102005045993A DE102005045993B4 (de) | 2005-07-29 | 2005-09-27 | Verfahren zur Lichtlaufzeitmessung |
| DE102005063023A DE102005063023A1 (de) | 2005-12-14 | 2005-12-14 | Anordnung zur Überwachung eines Objekts |
| DE102005063023 | 2005-12-14 | ||
| PCT/EP2006/007550 WO2007012502A1 (de) | 2005-07-29 | 2006-07-29 | Verfahren und vorrichtung zur entfernungsmessung mittels kapazitiven oder induktiven sensoren |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2414955T3 true ES2414955T3 (es) | 2013-07-23 |
Family
ID=36954749
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES06776515T Active ES2414955T3 (es) | 2005-07-29 | 2006-07-29 | Procedimiento y dispositivo para la medición de la distancia por medio de sensores capacitivos o inductivos |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20080197835A1 (enExample) |
| EP (1) | EP1910773B1 (enExample) |
| JP (1) | JP2009503471A (enExample) |
| ES (1) | ES2414955T3 (enExample) |
| PL (1) | PL1910773T3 (enExample) |
| WO (1) | WO2007012502A1 (enExample) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9817146B2 (en) * | 2005-07-29 | 2017-11-14 | Gerd Reime | Method and device for measuring distances by means of inductive sensors |
| DE102007005187B4 (de) * | 2007-01-29 | 2008-11-20 | Gerd Reime | Verfahren und Vorrichtung zur Bestimmung einer Entfernung zu einem rückstrahlenden Objekt |
| JP4321602B2 (ja) * | 2007-02-14 | 2009-08-26 | セイコーエプソン株式会社 | 文書編集支援装置、プログラムおよび記憶媒体 |
| DE102008003186A1 (de) * | 2007-10-05 | 2009-04-16 | Marantec Antriebs- Und Steuerungstechnik Gmbh & Co. Kg | Verfahren und System zur Steuerung eines Torantriebes |
| US8111582B2 (en) * | 2008-12-05 | 2012-02-07 | Bae Systems Information And Electronic Systems Integration Inc. | Projectile-detection collars and methods |
| DE102009009061A1 (de) | 2009-01-21 | 2010-07-29 | Gerd Reime | Verfahren zum induktiven Erzeugen eines elektrischen Messsignals sowie zugehörige Sensorvorrichtung |
| DE102010007620B9 (de) | 2009-02-13 | 2013-01-24 | Sick Ag | Näherungssensor |
| DE102010009576B4 (de) | 2009-02-27 | 2014-05-08 | Ifm Electronic Gmbh | Induktiver Näherungsschalter |
| DE102009049821A1 (de) * | 2009-10-19 | 2011-04-21 | Icontrols, K.S. | Vorrichtung und Verfahren zur Detektion von elektrisch leitfähigen Gegenständen |
| EP2556382A4 (en) * | 2010-04-06 | 2015-04-29 | Fmc Technologies | INDUCTIVE, PASSIVE SENSOR DEVICE |
| DE102010028719A1 (de) * | 2010-05-07 | 2011-11-10 | Robert Bosch Gmbh | Suchgerät |
| DE102010028722A1 (de) * | 2010-05-07 | 2011-11-10 | Robert Bosch Gmbh | Erfassung eines metallischen oder magnetischen Objekts |
| WO2012049205A1 (de) | 2010-10-15 | 2012-04-19 | Ifm Electronic Gmbh | Induktiver naeherungsschalter |
| DE102010042512B4 (de) | 2010-10-15 | 2025-07-24 | Ifm Electronic Gmbh | Induktiver Näherungsschalter mit verringerter Temperaturabhängigkeit |
| DE102010042511B4 (de) | 2010-10-15 | 2025-07-24 | Ifm Electronic Gmbh | Induktiver Näherungsschalter mit verringerter Temperaturabhängigkeit |
| DE102010042815A1 (de) | 2010-10-22 | 2012-04-26 | Ifm Electronic Gmbh | Induktiver Näherungsschalter |
| DE102010042816A1 (de) | 2010-10-22 | 2012-04-26 | Ifm Electronic Gmbh | Induktiver Näherungsschalter |
| DE102010043078A1 (de) * | 2010-10-28 | 2012-05-03 | Robert Bosch Gmbh | Sensorvorrichtung, insbesondere Metallsensor, mit feldkompensiertem Magnetfeldsensor |
| CN103430051B (zh) | 2011-02-02 | 2017-07-25 | 格尔德·赖梅 | 用于定位金属对象的金属探测器 |
| EP2602635B1 (de) * | 2011-12-06 | 2014-02-19 | ELMOS Semiconductor AG | Verfahren zur Vermessung einer Übertragungsstrecke mittels kompensierender Amplitudenmessung und Delta-Sigma-Methode sowie Vorrichtung zur Durchführung des Verfahrens |
| DE102011088406A1 (de) * | 2011-12-13 | 2013-06-13 | Robert Bosch Gmbh | Metallsensor |
| DE102012201849B4 (de) | 2012-02-08 | 2025-08-28 | Ifm Electronic Gmbh | Induktiver Näherungsschalter mit erhöhter Temperaturstabilität durch phasenunempfindliche Bewertung des Empfangssignals |
| EP2631674A1 (de) * | 2012-02-23 | 2013-08-28 | ELMOS Semiconductor AG | Verfahren und Sensorsystem zur Vermessung der Eigenschaften einer Übertragungsstrecke eines Messsystems zwischen Sender und Empfänger |
| CN105143914B (zh) | 2013-04-17 | 2017-09-01 | 梅查理斯系统股份有限公司 | 用于在近程区域和远程区域中光学间距测量的方法 |
| DE102019009338B4 (de) | 2019-07-23 | 2025-02-27 | Elmos Semiconductor Se | Metalllagenfreies Thermopile mit optimiertem Layout |
| DE102019119904B4 (de) | 2019-07-23 | 2024-12-19 | Elmos Semiconductor Se | Metalllagenfreies Thermopile mit optimiertem Layout |
| DE102020119245B4 (de) | 2019-07-23 | 2024-06-13 | Elmos Semiconductor Se | Halios-Vorrichtung mit metalllagenfreiem Empfänger und Kompensation mittels Phononenstrahlung eines Heizelements oder eines elektroakustischen Wandlers |
| DE102019119917B4 (de) | 2019-07-23 | 2025-02-06 | Elmos Semiconductor Se | Silizidierte Testvorrichtung und Testverfahren für metalllagenfreies Thermopaar in einer Ebene eines CMOS-Stapels |
| JP7168180B2 (ja) * | 2019-11-12 | 2022-11-09 | 日本システム開発株式会社 | 変位センサ及び変位センサシステム |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2158320B2 (de) | 1971-11-24 | 1980-04-10 | Ferdy Dr. Grenoble Mayer (Frankreich) | Vorrichtung zur berührungsfreien relativen Abstandsmessung |
| US4300097A (en) * | 1979-07-27 | 1981-11-10 | Techna, Inc. | Induction balance metal detector with ferrous and non-ferrous metal identification |
| DE2944472A1 (de) * | 1979-11-03 | 1981-05-14 | Robert Bosch Gmbh, 7000 Stuttgart | Induktive, insbesondere fuer eine brennkraftmaschine bestimmte messeinrichtung |
| US4677490A (en) | 1985-09-13 | 1987-06-30 | Rca Corporation | CCD imager output signal processing using drain output signal and wide-band sampled detected floating-element output signal |
| US4806848A (en) | 1987-03-11 | 1989-02-21 | The United States Of America As Represented By The Secretary Of The Air Force | Compressor blade clearance measurement system |
| US5136250A (en) * | 1989-04-28 | 1992-08-04 | Seagate Technology, Inc. | Capacitance height gauge |
| DE59403980D1 (de) | 1993-07-02 | 1997-10-09 | Gerd Reime | Anordnung zum messen oder erkennen einer veränderung an einem rückstrahlenden element |
| EP1078341A4 (en) | 1999-03-05 | 2010-01-06 | Tk Holdings Inc | PROXIMITY SENSOR |
| DE10022054B4 (de) | 2000-05-06 | 2006-05-24 | Leuze Electronic Gmbh & Co Kg | Optischer Distanzsensor |
| DE10025844A1 (de) | 2000-05-25 | 2001-12-06 | Adc Automotive Dist Control | Verfahren zur Bestimmung der Entfernung zwischen einem Bezugsobjekt und mindestens einem Zielobjekt |
| DE10116411A1 (de) * | 2001-04-02 | 2002-10-17 | Abb Research Ltd | Näherungssensor und Verfahren zu seinem Betrieb |
| US6803757B2 (en) * | 2001-10-02 | 2004-10-12 | Bentley Nevada, Llc | Multi-coil eddy current proximity probe system |
| ITMO20030300A1 (it) * | 2003-11-07 | 2005-05-08 | M D Micro Detectors Spa | Sensore di prossimita' induttivo, in particolare per rilevare la presenza di materiali ferrosi e non ferrosi |
-
2006
- 2006-07-29 WO PCT/EP2006/007550 patent/WO2007012502A1/de not_active Ceased
- 2006-07-29 ES ES06776515T patent/ES2414955T3/es active Active
- 2006-07-29 PL PL06776515T patent/PL1910773T3/pl unknown
- 2006-07-29 EP EP06776515A patent/EP1910773B1/de active Active
- 2006-07-29 JP JP2008523265A patent/JP2009503471A/ja active Pending
-
2008
- 2008-01-29 US US12/021,848 patent/US20080197835A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| PL1910773T3 (pl) | 2013-08-30 |
| EP1910773A1 (de) | 2008-04-16 |
| WO2007012502A9 (de) | 2008-02-28 |
| JP2009503471A (ja) | 2009-01-29 |
| EP1910773B1 (de) | 2013-03-27 |
| US20080197835A1 (en) | 2008-08-21 |
| WO2007012502A1 (de) | 2007-02-01 |
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