ES2117721T3 - Procedimiento y dispositivo de medicion diferencial de indices de refraccion y utilizacion asociada. - Google Patents
Procedimiento y dispositivo de medicion diferencial de indices de refraccion y utilizacion asociada.Info
- Publication number
- ES2117721T3 ES2117721T3 ES93924117T ES93924117T ES2117721T3 ES 2117721 T3 ES2117721 T3 ES 2117721T3 ES 93924117 T ES93924117 T ES 93924117T ES 93924117 T ES93924117 T ES 93924117T ES 2117721 T3 ES2117721 T3 ES 2117721T3
- Authority
- ES
- Spain
- Prior art keywords
- procedure
- differential measurement
- refraction indices
- associated use
- interference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/46—Systems using spatial filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/74—Optical detectors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
LA INVENCION SE REFIERE A LA MEDICION DE LA DIFERENCIA ENTRE INDICES DE REFRACCION DE DOS MEDIOS, CADA UNO ATRAVESADO POR UN HAZ LUMINOSO, SIENDO DICHOS HACES SUSCEPTIBLES DE GENERAR UNA FIGURA DE INTERFERENCIA CONSTITUIDA POR FRANJAS DE LA CUAL SE MIDE EL DESPLAZAMIENTO. SEGUN LA INVENCION, SE UTILIZA UN UNICO MEDIO PARA DETECTAR EL DESPLAZAMIENTO DE LAS FRANJAS DE LA FIGURA DE INTERFERENCIA, SE REALIZA UNA MODULACION DE FASE SOBRE AL MENOS UNO DE LOS HACES Y SE CONTROLA LA MODULACION CON EL FIN DE OBTENER UN DESLIZAMIENTO DE LAS FRANJAS DE LA FIGURA DE INTERFERENCIA.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9212946A FR2697336B1 (fr) | 1992-10-28 | 1992-10-28 | Procédé et dispositif de mesure différentielle d'indices de réfraction et utilisation associée. |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2117721T3 true ES2117721T3 (es) | 1998-08-16 |
Family
ID=9434984
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES93924117T Expired - Lifetime ES2117721T3 (es) | 1992-10-28 | 1993-10-27 | Procedimiento y dispositivo de medicion diferencial de indices de refraccion y utilizacion asociada. |
Country Status (10)
Country | Link |
---|---|
US (1) | US5483344A (es) |
EP (1) | EP0619016B1 (es) |
JP (1) | JP3679409B2 (es) |
KR (1) | KR100302687B1 (es) |
AT (1) | ATE164942T1 (es) |
CA (1) | CA2126245C (es) |
DE (1) | DE69317874T2 (es) |
ES (1) | ES2117721T3 (es) |
FR (1) | FR2697336B1 (es) |
WO (1) | WO1994010552A1 (es) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9614363D0 (en) * | 1996-07-09 | 1996-09-04 | Council Cent Lab Res Councils | Optical pulse autocorrelator |
US6128080A (en) * | 1997-06-06 | 2000-10-03 | Wyatt Technology Corporation | Extended range interferometric refractometer |
FR2774172B1 (fr) * | 1998-01-28 | 2000-02-25 | Inst Francais Du Petrole | Methode et dispositif de mesure interferentielle de dephasage entre deux faisceaux lumineux issus d'une meme source polarisee, appliques a la refractometrie |
US7009750B1 (en) | 2002-10-25 | 2006-03-07 | Eclipse Energy Systems, Inc. | Apparatus and methods for modulating refractive index |
US7027138B2 (en) * | 2004-01-29 | 2006-04-11 | Wyatt Technology Corporation | Enhanced sensitivity differential refractometer incorporating a photodetector array |
DE102005041584B4 (de) * | 2005-09-01 | 2007-08-16 | Universität Karlsruhe (Th) | Differentielles Messverfahren zur Bestimmung von Konzentrationsunterschieden zur Übersättigungsbestimmung |
US8982355B2 (en) * | 2010-12-09 | 2015-03-17 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Smart optical material characterization system and method |
US9546915B2 (en) * | 2011-10-12 | 2017-01-17 | Baker Hughes Incorporated | Enhancing functionality of reflectometry based systems using parallel mixing operations |
CN103776801B (zh) * | 2012-10-17 | 2016-12-21 | 成都光明光电股份有限公司 | 光学元件折射率的检测方法及其检测装置 |
CN113959950B (zh) * | 2021-10-28 | 2024-04-12 | 绍兴泊盛科技有限公司 | 一种基于光流控芯片检测液体折射率的检测装置 |
CN114199521B (zh) * | 2021-11-30 | 2023-09-08 | 宁波法里奥光学科技发展有限公司 | 光学镜片参数测量装置及方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH428260A (de) * | 1965-09-03 | 1967-01-15 | Siemens Ag Albis | Einrichtung zur Bestimmung des relativen Brechungsindexes von lichtdurchlässigen Stoffen in bezug auf ein Medium mit bekanntem Brechungsindex |
US3680963A (en) * | 1970-09-04 | 1972-08-01 | Hercules Inc | Apparatus for measuring changes in the optical refractive index of fluids |
FR2254996A5 (en) * | 1973-12-18 | 1975-07-11 | Minisini Pierre | Method of measuring small phenomena - involves comparing beam modified by phenomenon with reference |
DE2518197A1 (de) * | 1975-04-24 | 1976-11-04 | Guenter Dipl Phys Dr Smeets | Schnelle phasennachfuehrung fuer laser-interferometer |
US4289403A (en) * | 1977-03-04 | 1981-09-15 | Isco, Inc. | Optical phase modulation instruments |
JPS57108742A (en) * | 1980-12-26 | 1982-07-06 | Japan Spectroscopic Co | Interference refractometer |
JPS58160848A (ja) * | 1982-03-19 | 1983-09-24 | Kokusai Denshin Denwa Co Ltd <Kdd> | 光干渉計 |
US4571082A (en) * | 1982-05-18 | 1986-02-18 | Downs Michael J | Apparatus and method for measuring refractive index |
GB8415670D0 (en) * | 1984-06-20 | 1984-07-25 | Penlon Ltd | Gas analysis apparatus |
FR2596526B1 (fr) * | 1986-03-26 | 1989-06-09 | Couillard Francois | Detecteur refractometrique pour chromatographe en phase liquide |
FR2638847B1 (fr) * | 1988-11-04 | 1990-12-14 | Commissariat Energie Atomique | Dispositif optique integre pour la mesure d'indice de refraction d'un fluide |
US5168325A (en) * | 1990-02-28 | 1992-12-01 | Board Of Control Of Michigan Technological University | Interferometric measurement of glucose by refractive index determination |
-
1992
- 1992-10-28 FR FR9212946A patent/FR2697336B1/fr not_active Expired - Fee Related
-
1993
- 1993-10-27 KR KR1019940702211A patent/KR100302687B1/ko not_active IP Right Cessation
- 1993-10-27 WO PCT/FR1993/001054 patent/WO1994010552A1/fr active IP Right Grant
- 1993-10-27 US US08/256,206 patent/US5483344A/en not_active Expired - Lifetime
- 1993-10-27 EP EP93924117A patent/EP0619016B1/fr not_active Expired - Lifetime
- 1993-10-27 AT AT93924117T patent/ATE164942T1/de not_active IP Right Cessation
- 1993-10-27 ES ES93924117T patent/ES2117721T3/es not_active Expired - Lifetime
- 1993-10-27 JP JP51077194A patent/JP3679409B2/ja not_active Expired - Fee Related
- 1993-10-27 DE DE69317874T patent/DE69317874T2/de not_active Expired - Fee Related
- 1993-10-27 CA CA002126245A patent/CA2126245C/fr not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2697336B1 (fr) | 1994-12-16 |
KR100302687B1 (ko) | 2001-12-01 |
KR950700533A (ko) | 1995-01-16 |
FR2697336A1 (fr) | 1994-04-29 |
WO1994010552A1 (fr) | 1994-05-11 |
DE69317874T2 (de) | 1998-07-30 |
EP0619016A1 (fr) | 1994-10-12 |
ATE164942T1 (de) | 1998-04-15 |
JP3679409B2 (ja) | 2005-08-03 |
JPH07503324A (ja) | 1995-04-06 |
CA2126245C (fr) | 2005-06-21 |
EP0619016B1 (fr) | 1998-04-08 |
US5483344A (en) | 1996-01-09 |
DE69317874D1 (de) | 1998-05-14 |
CA2126245A1 (fr) | 1994-05-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG2A | Definitive protection |
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