JPS57108742A - Interference refractometer - Google Patents

Interference refractometer

Info

Publication number
JPS57108742A
JPS57108742A JP18683380A JP18683380A JPS57108742A JP S57108742 A JPS57108742 A JP S57108742A JP 18683380 A JP18683380 A JP 18683380A JP 18683380 A JP18683380 A JP 18683380A JP S57108742 A JPS57108742 A JP S57108742A
Authority
JP
Japan
Prior art keywords
sample
light flux
constant
modulation
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18683380A
Other languages
Japanese (ja)
Other versions
JPH0145573B2 (en
Inventor
Sunao Miyazaki
Miyuki Shigehisa
Tsutomu Ichimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jasco Corp
Original Assignee
Japan Spectroscopic Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Spectroscopic Co Ltd filed Critical Japan Spectroscopic Co Ltd
Priority to JP18683380A priority Critical patent/JPS57108742A/en
Publication of JPS57108742A publication Critical patent/JPS57108742A/en
Publication of JPH0145573B2 publication Critical patent/JPH0145573B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To improve the response velocity and to utilize for the detection of high-speed liquid chromatography, by modulating the length of one light passage of interference light flux in a constant frequency and taking out a frequency component corresponding to the refractive index of sample including in an output signal sent from a detector in accordance with said modulation. CONSTITUTION:A compensating cell 5 and a sample cell 6 are arranged in each light flux of a reference light flux 3 and a sample light flux 4 and also, a compensating board 10 and a modulation element 11 are arranged in the rear of these cells and then, the length of a light passage of the flux 4 is modulated to a constant f Hz frequency by the element 11. Now, the board 10 is adjusted so that the phase difference between both light flux becomes 1/2 wavelength when the modulation amplitude is at zero in the standard condition not putting in the sample and a signal of a f Hz component is amplified while always keeping only two f Hz components of output of a detector 9 constant. Then, the amplified signal is rectified by a synchronous rectifier circuit 16 and its amplitude is taken out as voltage and the refractive index of the sample is indicated by a recorder 17 based on said voltage.
JP18683380A 1980-12-26 1980-12-26 Interference refractometer Granted JPS57108742A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18683380A JPS57108742A (en) 1980-12-26 1980-12-26 Interference refractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18683380A JPS57108742A (en) 1980-12-26 1980-12-26 Interference refractometer

Publications (2)

Publication Number Publication Date
JPS57108742A true JPS57108742A (en) 1982-07-06
JPH0145573B2 JPH0145573B2 (en) 1989-10-04

Family

ID=16195411

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18683380A Granted JPS57108742A (en) 1980-12-26 1980-12-26 Interference refractometer

Country Status (1)

Country Link
JP (1) JPS57108742A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2697336A1 (en) * 1992-10-28 1994-04-29 Inst Francais Du Petrole Method and device for differential measurement of refractive indices and associated use.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2697336A1 (en) * 1992-10-28 1994-04-29 Inst Francais Du Petrole Method and device for differential measurement of refractive indices and associated use.
WO1994010552A1 (en) * 1992-10-28 1994-05-11 Institut Français Du Petrole Process and device for the differential measurement of refraction indexes and use thereof

Also Published As

Publication number Publication date
JPH0145573B2 (en) 1989-10-04

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