ES2058766T3 - Dispositivo de observacion para examinar opticamente una superficie a lo largo de una linea. - Google Patents

Dispositivo de observacion para examinar opticamente una superficie a lo largo de una linea.

Info

Publication number
ES2058766T3
ES2058766T3 ES90203396T ES90203396T ES2058766T3 ES 2058766 T3 ES2058766 T3 ES 2058766T3 ES 90203396 T ES90203396 T ES 90203396T ES 90203396 T ES90203396 T ES 90203396T ES 2058766 T3 ES2058766 T3 ES 2058766T3
Authority
ES
Spain
Prior art keywords
line
surface along
observation device
optical
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES90203396T
Other languages
English (en)
Inventor
Amstel Willem Dirk Van
Joseph Louis Horijon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of ES2058766T3 publication Critical patent/ES2058766T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G02B27/0031—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration for scanning purposes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/50—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
    • H10P72/57—Mask-wafer alignment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N2021/8905—Directional selective optics, e.g. slits, spatial filters
    • G01N2021/8907—Cylindrical optics

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Lenses (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Light Guides In General And Applications Therefor (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Noodles (AREA)
  • Epoxy Compounds (AREA)
  • Facsimile Scanning Arrangements (AREA)

Abstract

UN DISPOSITIVO DE EXPLORACION OPTICA COMPRENDE UN SISTEMA OPTICO PARA OBTENER LA IMAGEN DE UNA PARTE DE LA SUPERFICIE (10) QUE SE EXPLORA EN EL SISTEMA DE DETECCION (22-25; 122-125). EL SISTEMA OPTICO COMPRENDE UN SISTEMA DE OBJETIVO (43) Y DOS LENTES CILINDRICAS (41, 42) Y/O DOS SISTEMAS DE ESPEJOS CILINDRICOS (141A, 141B, 142A, 142B). EN LA DIRECCION EN LA QUE LAS LENTES CILINDRICAS (41, 42) TIENE SU POTENCIA OPTICA, EL SISTEMA DE OBJETIVO (43) FUNCIONA COMO UNA LENTE DE IMAGEN PARA QUE UNA IMAGEN ESPECIAL E INTENSIVA DE LUZ DE LA SUPERFICIE SE FORME EN EL SISTEMA DE DETECCION (22, 25). DEBIDO A LA GRAN ABERTURA NUMERICA CONSEGUIDA, LA IMAGEN PUEDE SER TAMBIEN OBSERVADA TRIDIMENSIONALMENTE PARA QUE LA INFORMACION DEL PERFIL DE LA SUPERFICIE PUEDA SER OBTENIDA POR MEDIO DEL DISPOSITIVO DE EXPLORACION.
ES90203396T 1990-01-16 1990-12-18 Dispositivo de observacion para examinar opticamente una superficie a lo largo de una linea. Expired - Lifetime ES2058766T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL9000100 1990-01-16

Publications (1)

Publication Number Publication Date
ES2058766T3 true ES2058766T3 (es) 1994-11-01

Family

ID=19856420

Family Applications (1)

Application Number Title Priority Date Filing Date
ES90203396T Expired - Lifetime ES2058766T3 (es) 1990-01-16 1990-12-18 Dispositivo de observacion para examinar opticamente una superficie a lo largo de una linea.

Country Status (11)

Country Link
US (1) US5170037A (es)
EP (1) EP0437883B1 (es)
JP (1) JP2995238B2 (es)
KR (1) KR0170783B1 (es)
AT (1) ATE108029T1 (es)
CA (1) CA2034017C (es)
DE (1) DE69010318T2 (es)
DK (1) DK0437883T3 (es)
ES (1) ES2058766T3 (es)
FI (1) FI104297B1 (es)
IL (1) IL96947A (es)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5512760A (en) * 1993-05-06 1996-04-30 U.S. Philips Corporation Optical height detector with coaxial irradiation and image axes and plural detectors spaced along the image axis
DE19528519A1 (de) * 1995-08-03 1997-02-06 Tzn Forschung & Entwicklung Vorrichtung zur Detektion streifenförmiger Oberflächenfehler
DE19714221A1 (de) * 1997-04-07 1998-10-08 Zeiss Carl Fa Konfokales Mikroskop mit einem motorischen Scanningtisch
WO2003023455A1 (en) * 2001-09-13 2003-03-20 Anzpac Systems Limited Method and apparatus for article inspection
US8441694B2 (en) * 2003-09-30 2013-05-14 Hewlett-Packard Development Company, L.P. Method and an apparatus for adjusting a scanning target area of an image reproduction device
DE102005061834B4 (de) 2005-12-23 2007-11-08 Ioss Intelligente Optische Sensoren & Systeme Gmbh Vorrichtung und Verfahren zum optischen Prüfen einer Oberfläche
KR100816078B1 (ko) * 2006-06-19 2008-03-24 광운대학교 산학협력단 공간영상 투영장치 및 그 방법
US7895009B2 (en) * 2007-11-07 2011-02-22 Amfit, Inc. Impression foam digital scanner
CN111536949A (zh) * 2020-06-04 2020-08-14 马鞍山芯乔科技有限公司 多面镜旋转取像装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH539892A (de) * 1971-03-22 1973-07-31 Zellweger Uster Ag Abtastvorrichtung für optisch erkennbare Zeichen
US3995110A (en) * 1973-12-20 1976-11-30 Xerox Corporation Flying spot scanner with plural lens correction
DE2550814C3 (de) * 1975-11-12 1979-08-09 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Zeilentastvorrichtung für Materialbahnen zur Fehlstellenermittlung
DE2827705C3 (de) * 1978-06-23 1981-07-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Gerät zur Feststellung von Fehlern an Bahnmaterial
DE3431540A1 (de) * 1984-07-02 1986-03-06 Elektro Optik Gmbh & Co Kg Verfahren zur korrektur der sphaerischen aberration und des astigmatismus eines ausmittigen lichtbuendels in einer spiegeloptik
US4872757A (en) * 1988-04-20 1989-10-10 Ball Corporation Optical convex surface profiling and gauging apparatus and method therefor

Also Published As

Publication number Publication date
EP0437883B1 (en) 1994-06-29
FI104297B (fi) 1999-12-15
US5170037A (en) 1992-12-08
DE69010318D1 (de) 1994-08-04
FI910150A0 (fi) 1991-01-11
CA2034017C (en) 2001-08-21
DK0437883T3 (da) 1994-10-03
KR0170783B1 (ko) 1999-05-01
FI910150A7 (fi) 1991-07-17
DE69010318T2 (de) 1995-01-26
FI104297B1 (fi) 1999-12-15
JPH04212120A (ja) 1992-08-03
IL96947A0 (en) 1992-03-29
EP0437883A1 (en) 1991-07-24
ATE108029T1 (de) 1994-07-15
CA2034017A1 (en) 1991-07-17
IL96947A (en) 1993-07-08
JP2995238B2 (ja) 1999-12-27

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