Classifications

• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
  • H01M10/00—Secondary cells; Manufacture thereof
  • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
  • H01M10/4285—Testing apparatus
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
  • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
  • G01R31/385—Arrangements for measuring battery or accumulator variables
  • G01R31/3865—Arrangements for measuring battery or accumulator variables related to manufacture, e.g. testing after manufacture
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
  • H01M10/00—Secondary cells; Manufacture thereof
  • H01M10/04—Construction or manufacture in general
  • H01M10/0404—Machines for assembling batteries
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
  • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
  • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
  • Y02E60/10—Energy storage using batteries

Definitions

• the present invention relates to a testing device having the features of the preamble of claim 1 and a corresponding method having the features of the preamble of claim 15.
• Energy cells or energy storage cells are used for galvanic accumulators, for example in motor vehicles, other land vehicles, ships and airplanes, in which a considerable amount of energy has to be stored so that it can be called up over longer periods of time.
• energy cells have a structure made up of a large number of segments stacked to form a stack, referred to below as cell stack. These segments are formed by mono cells, for example.
• Monocells are each alternating anode sheets and cathode sheets, also known as electrodes, separated from each other by separator sheets.
• a monocell thus typically has the layer sequence: separator-electrode (for example anode)-separator-electrode (for example cathode).
• the segments are precut in the manufacturing process and then placed on top of one another to form the cell stacks in the predetermined order and connected to one another, for example by lamination.
• Devices for producing battery cells are known, for example, from WO 2016/041713 A1 and DE 10 2017 216 213 A1.
• segments are damaged during the manufacturing process.
• segments in the form of mono cells for example, it can happen that the separator is damaged during production. If a mono cell with a damaged separator is used to form the cell stack, this can adversely affect the functionality and service life of the cell stack.
• Energy cells can also be fuel cells or solar cells, for example, segments of which can also be damaged during production.
• test processes must be carried out taking into account the production output and the conveying speed of today's production systems. It is therefore known in principle from the prior art to provide test devices that travel with the segments in the production process and test the segments alternately. For this purpose, the test device actively contacts so-called conductor lugs, which are part of the electrodes of the segments. With such test methods, however, the performance of the machine is limited due to the discontinuous movements. Furthermore can the segments are damaged when contacting the arrester lugs.
• the object of the present application is to provide an improved testing device for testing segments and a corresponding method.
• a testing device for testing segments that are suitable for forming a cell stack for the energy cell manufacturing industry is proposed, with a conveyor device having a plurality of receiving sections for receiving and transporting one segment each, with the receiving sections being activated by a movement of the conveyor device can be moved relative to a stationary part of the testing device, with the receiving sections each comprising at least two contact surfaces for electrical and/or signaling contacting of a segment received in the respective receiving section, with at least two of the contact surfaces in each case one of the receiving sections by means of a switching matrix with at least one Measuring device can be connected.
• the segments positioned in the receiving sections can be transported by means of the conveyor device, it being possible for the segments to be checked during the transport process by means of the contact surfaces. If the recording section comprises at least two contact surfaces, at least one separator can be measured.
• the receiving sections each include at least three contact surfaces, more preferably exactly three contact surfaces.
• the switching matrix is preferably set up to connect the at least two or three contact surfaces of one of the receiving sections differently, so that measurements can be carried out using the at least one measuring device in a predetermined electrical circuit or in different electrical circuits.
• the switching matrix within the meaning of this application preferably comprises at least one input channel and a number of output channels which can be connected to one another in predefined configurations. Furthermore, the switching matrix can be set up to connect two or more output channels to one another.
• the respective at least two contact areas of the receiving sections By connecting the respective at least two contact areas of the receiving sections to the output channels of the switching matrix, these can be connected to the at least one measuring device that is connected to the at least one output channel. In principle, it is also possible to connect the at least one measuring device to the switching matrix via two or more input channels.
• All contact surfaces of the receiving sections are preferably connected to the switching matrix on the output channel side. More preferably, all measuring devices are also connected to the switching matrix on the input channel side. It goes without saying that the matrix can in principle include further input channels and/or further output channels which are not connected to the at least one measuring device or the contact surfaces. For example, further input channels can be provided via which a voltage source is connected to the switching matrix.
• At least two of the at least three contact surfaces of a receiving section can preferably be connected to the measuring device at the same time. It is thus possible, for example, on the basis of measuring an impedance, an ohmic resistance or the electrical capacitance between two of the at least three contact areas, to draw conclusions about the system state of the respective segment.
• the ohmic resistance can be measured with direct current or as the reciprocal of the real part of the complex admittance with an alternating voltage, for example with a frequency of 1 kHz, 10 kHz or 1000 kHz.
• the capacitance can also be measured with AC voltage.
• a breakdown measurement can be used, for example, to detect foreign bodies whose diameter or extension is less than the layer thickness of the separator. If, for example, the segment to be tested is formed by a monocell as described above, the electrical resistance between two electrodes can decrease if the separator arranged between these electrodes is damaged.
• the at least three, preferably exactly three, contact surfaces per receiving section mean that a so-called 3-port measurement of the segment arranged in the receiving section can be carried out.
• This is accompanied by the advantage that the two separators of a mono cell can be tested separately and/or together.
• the separator of the segment arranged between the first and second electrode can be tested, but also the outer separator, which is only contacted by an electrode of an adjacent segment when the cell stack is formed.
• the corresponding measurements can be carried out by intelligently connecting the contact surfaces to the at least one measuring device.
• the advantage associated with the at least three contact surfaces per receiving section is that extremely careful electrical contacting of the segment is made possible. By connecting two of the three contact surfaces accordingly, different measurements can be carried out without having to remove the segment from the exceptional cut. By avoiding the transfer of the segment to be tested to a further receiving section or to a further testing device, a particularly product-friendly measurement of the segment can be carried out.
• the extremely sensitive conductor lugs of the electrodes which have already been mentioned at the outset, do not have to be contacted multiple times.
• the conveying device is preferably formed by a rotatably mounted drum, on the radially outer lateral surface of which the receiving sections are arranged.
• the conveyor is then formed by a test drum.
• the receiving sections are firmly connected to the drum, so they can only be released with the help of a tool, or the receiving sections themselves form the drum.
• a plurality of measuring devices are preferably provided, with the switching matrix being set up to electrically and/or signal-connect one or more of the contact surfaces of one of the receiving sections to different measuring devices.
• the segments can thus be connected to different measuring devices without being removed from the respective receiving section, which allows the measurement of different parameters in a particularly product-friendly manner. It is also possible, for example, for segments that are stored in different receiving sections to be checked in parallel.
• the receiving sections each comprise a first and a second contact area for electrical and/or signaling contacting of two electrodes of an inserted segment, and a third contact area for electrical and/or signaling contacting of one of the separators of the inserted segment is provided.
• Each of the receiving sections preferably has contact surfaces arranged in this way. This arrangement of the contact surfaces within a receiving section advantageously allows the separators of a monocell to be tested separately from one another, without the monocell having to be removed from the receiving section of the conveying device.
• the third contact area thus serves as a temporary electrode assigned to the testing device, by means of which an external separator of the segment can be tested.
• the third contact surface preferably forms at the same time a transport support for the respective segment or at least part of the transport pad.
• the areal extension of the third contact area corresponds to the area of the electrodes of the respective segment without their collector lugs; the areal extension of the third contact surface preferably deviates from the areal extension of the electrodes by less than 50%, more preferably less than 25%, in particular less than 10%.
• the transport support thus simultaneously assumes both the function of transporting a segment and the function of the electrical or signaling connection of a separator of the transported segment. If, for example, a segment in the form of a monocell is transported in the receiving section, the segment to be tested preferably rests with one of its separators on the transport support of the respective receiving section. The two electrodes of the segment are then contacted by the first and the second contact area by means of the mentioned collector tabs, which protrude beyond the base area of the separators.
• a pure transport support can also be provided instead of the third contact surface.
• the pure transport support preferably consists of an insulating material in order to reduce, for example, stray capacitances when measuring using the first and second contact surfaces.
• the disclosed content of this application should also explicitly include the proposed device together with one segment or several segments, for example in the form of monocells, which is/are mounted in the receiving sections.
• the switching matrix is preferably set up to close the first and the second contact area simultaneously with the same measuring device interconnect to connect the first and the third contact surface to the same measuring device at the same time; and/or to connect the second and the third contact surface to the same measuring device at the same time. If, for example, a segment in the form of a monocell is stored in one of the mounting sections for the purpose of testing, then the three contact surfaces of a mounting section contact the inserted segment as follows:
• the segment rests with a first separator on the third contact surface; a first electrode adjacent to the first separator, for example in the form of an anode, is in contact with the first contact surface; a second electrode separated from the first electrode by a second separator, for example in the form of a cathode, is connected to the second contact surface.
• the second separator arranged between them can be tested.
• the separator arranged on the outside of the segment can be tested.
• the first and the second separator can be tested at the same time.
• the first and the second separator are then arranged in a series or parallel connection between the second and the third contact area.
• the contact surfaces are arranged in an electrically insulated manner from one another within one of the receiving sections.
• the contact surfaces are preferably also electrically insulated from the rest of the conveyor device.
• the contact surfaces can also be electrically insulated from one another by the conveying device being at least partially made of an electrically non-conductive material.
• the switching matrix is preferably set up to connect the at least three contact surfaces of one of the receiving sections differently, so that measurements can be carried out using the at least one measuring device in different electrical circuits.
• the switching configuration can be different. In this way, a variety of measurements can be performed on the segment while it is being transported on the conveyor. For example, two or more contact surfaces of a receiving section can also be short-circuited with one another.
• the switching matrix is preferably set up to connect one or more of the contact surfaces of one of the receiving sections to a voltage source and/or to ground. With these types of wiring, further switching configurations can be made possible, so that the possibilities of the measurement can be expanded.
• the switching matrix preferably includes a plurality of relays for interconnecting the contact surfaces and/or for connecting one or more of the contact surfaces to one or more measuring devices.
• the relays can be controlled or regulated, for example, by means of a control unit. Due to the large number of switching combinations, it has proven to be advantageous to operate the switching matrix with relays.
• the switching matrix and thus also the relays can, for example, be based on the position of the conveyor device relative to the stationary part of the testing device. Of course, alternatively or additionally, further input parameters can be used to control or regulate the switching matrix or the relay.
• the switching to ground of one or more contact surfaces and/or the connection to a voltage source is preferably carried out by means of the relays.
• relays are passive, galvanically isolated switching and the minimally invasive behavior with regard to the change in the measuring section. Furthermore, relays are able to conduct direct current and alternating current; Switching transistors are only able to do this to a limited extent. Furthermore, switching transistors have a considerable influence on the measurement path.
• the switching matrix is preferably part of the conveying device. In this way, the interconnection at the conveyor can take place efficiently.
• the at least one measuring device is preferably set up to measure an electrical capacitance and/or an ohmic resistance and/or to carry out a breakdown measurement.
• Measuring devices or measuring methods for measuring the ohmic resistance Status or the electrical capacity are well known and provide reliable measurement results.
• the at least one measuring device is preferably part of the stationary part of the testing device.
• the at least one measuring device does not have to be moved with the conveyor. This is particularly advantageous when the testing device includes multiple measuring devices.
• the measuring devices can also be advantageously connected to the contact surfaces of different receiving sections, so that a smaller number of measuring devices is required. In principle, however, it is also possible to integrate one or more of the measuring devices in the conveying device.
• the electrical and/or signaling connection of the conveyor device to the stationary part be made by means of a sliding contact device.
• a sliding contact device has proven to be advantageous in order to connect the moving, for example rotating, conveyor device electrically and/or with signals to the stationary part of the testing device.
• the receiving sections each have openings that can be subjected to a negative pressure to hold the segments.
• the segments in particular the collector tabs, can be held particularly gently by means of a vacuum, because grippers and/or clamps, which could damage the collector tabs, can be dispensed with.
• the openings can the transport support, for example in the form of the third contact surface, and/or be provided on at least one of the other contact surfaces.
• the openings can be formed, for example, by retaining bores or by the pores of an air-permeable material.
• the object mentioned at the outset is also achieved by a method for testing segments that are intended to form a cell stack for the energy cell-producing industry, the segments being tested by the testing device as described above, with the segments to be tested each being in one of the receiving sections be positioned.
• the segments are preferably tested while the segments are being transported, ie while the conveying device is moving relative to the stationary part of the testing device.
• the detection of a damaged or qualitatively inferior segment results in this being ejected from the manufacturing process.
• This can be done, for example, by the testing device itself or, alternatively, by a separate device, for example in the form of an ejection drum.
• FIG. 1 shows the arrangement of the testing device in a system for forming cell stacks
• FIG. 2 shows a conveyor device in the form of a test drum
• FIG. 3 shows a receiving section with a segment arranged thereon in a first cross section orthogonal to the axis of rotation
• FIG. 4 shows a receiving section with a segment arranged thereon in a second cross section parallel to the axis of rotation
• Fig. 7 shows a schematic circuitry of a test drum
• FIG. 11 shows an equivalent circuit diagram of a mono cell in a third
• Figure 1 shows a system 100 for forming cell stacks, comprising a manufacturing device 17 for forming segments 2, a testing device 1 for testing the segments 2 and a plurality of cell stacking devices 18.
• the production device 17 of this exemplary embodiment is set up to produce segments 2 in the form of monocells.
• the monocells have four layers, with the following four layers following one another: a separator 21, a first electrode 22 in the form of an anode, a second separator 23 and a second electrode 24 in the form of a cathode.
• these layers are placed one on top of the other and connected to one another by lamination, so that a four-layer continuous web 26 is formed.
• This continuous web 26 is cut orthogonally to the longitudinal direction into sections of equal length by means of a cutting device 27, so that segments 2 of equal length are formed.
• the segments 2 supplied to the test device 1 are so-called dry segments 2, which are therefore not filled with an electrolyte liquid.
• the cut segments 2 are tested by means of the testing device 1 following the manufacturing device 17 in the manufacturing process.
• the testing device 1 is followed by a plurality of cell stacking devices 18 which are each set up to stack the segments 2 to form cell stacks.
• cell stacking devices 18 are provided, with which the cell stacks can be formed in parallel.
• the testing device 1 is used to detect faulty or damaged segments 2 so that they are not used to form the cell stack with the cell stacking devices 18 .
• defective segments 2 are used, meaning all segments 2 that do not meet the specified quality requirements.
• the testing device 1 itself is not set up to eject faulty segments 2 from the production process. In this embodiment, this is done by an ejection drum 25, which ejects the faulty segments into a reject reservoir, not shown.
• the test device 1 comprises a conveyor device 3 in the form of a test drum mounted so as to be rotatable about an axis of rotation 14 .
• a transport drum 20 is provided between the conveyor device 3 and the ejection device 25 .
• the direction of rotation of the drums is indicated by arrows 28, only two of which with are provided with the corresponding reference number.
• FIG. 2 shows the conveying device 3 in the form of a test drum which is mounted such that it can rotate about the axis of rotation 14 .
• the conveying device 3 has a plurality of, for example between 3 and 19, further for example between 10 and 16, receiving sections 4a, 4b, 4c on a radially outer lateral surface 19, which are each set up for receiving and transporting a segment 2.
• the conveying device 3 shown here comprises exactly twelve of the receiving sections 4.
• the conveying device 3 rotates relative to a stationary part 5 of the testing device 1, which is shown schematically in FIG.
• the receiving sections 4a, 4b, 4c visible here can be subjected to a negative pressure, so that the segments 2 are held on the receiving sections 4a, 4b, 4c by the effect of the negative pressure. In this way, the segments 2 can also be picked up and released in a manner that is gentle on the product.
• Each of the receiving sections 4a, 4b, 4c has a first contact surface 6, a second contact surface 7 and a third contact surface 8, these being electrically insulated from one another and from the rest of the conveyor device 3.
• the receiving section 4b is covered with a segment 2, so that the third contact surface 8 of the receiving section 4b is covered by the segment 2.
• a first electrode 22 makes contact with the first contact surface 6 by means of its conductor tab 11 .
• a second electrode 24 makes contact with the second contact surface 7 by means of its conductor tab 12 .
• FIG. 3 shows a sectional illustration of a segment 2 arranged on the conveyor device 3, the section being arranged in a plane orthogonal to the axis of rotation 14 (cf. FIG. 2) of the conveyor device 3.
• the receiving section 4b from FIG. 2 is shown.
• the receiving section 4b includes the third contact surface 8, which is electrically isolated from the rest of the receiving section 4b and thus also from the rest of the conveying device 3 by means of an insulator 16.
• the segment 2 rests with the first separator 21 on the third contact surface 8, which at the same time forms a suitable transport support for the segment 2.
• the two-dimensional extent of the third contact surface 8 coincides with the base surface of the first and second electrodes 22 and 24 without taking into account the conductor lugs 11 , 12 (not shown here).
• the third contact surface 8 together with the first electrode 22 arranged above the first separator 21 can form an electrode pair which is suitable for testing the first separator 21 arranged between them.
• the first electrode 22 is then contacted via the first contact area 6, as shown in FIG.
• FIG. 3 shows that the first electrode 22 is followed by the second separator 23 and the second electrode 24 .
• the first electrode 22 and the second electrode 24 thus form an electrode pair which is suitable for testing the second separator 23 arranged between them.
• FIG. 4 shows a further sectional representation of the segment 2 arranged on the conveyor device 3, the section being arranged in a plane parallel to the axis of rotation 14 (cf. FIG. 2) of the conveyor device 3.
• the first electrode 22 makes contact with the first contact surface 6 by means of its conductor tab 11 .
• the second electrode 24 makes contact with the second contact surface 7 by means of its conductor tab 12 .
• the contact surfaces 6, 7 have a correspondingly adapted height in the radial direction; the height in the radial direction of the contact surface 6 is therefore less than the height of the contact surface 7.
• the switching matrix 9 includes a plurality of relays 29a, 29b, 29c, which are set up to connect the lines 33 to input lines 34.
• FIG. 5 only the three relays 29a, 29b and 29c are shown as representative of a large number of relays.
• the input lines 34 rotating along with the conveyor device 3 are transferred electrically and/or in terms of signals to the stationary part 5.
• the stationary part 5 includes four measuring devices 10a, 10b, 10c, 10d, each of which is connected electrically and/or in terms of signals to the sliding contact device 13 by a pair of lines 35.
• each of the measuring devices 10a, 10b, 10c, 10d can be connected to the contact surfaces 6, 7, 8 (cf. FIG. 2) of the various receiving sections 4a, 4b, . . . 4I to be connected.
• a voltage supply 36 which emanates from the control unit 30, which in turn comprises a voltage source, has not yet been taken into account in this consideration.
• the power supply 36 is looped through to the switching matrix 9 by means of a sliding contact device 13 . In this way, certain contact surfaces 6, 7, 8 can be subjected to voltage in order to carry out measurements.
• a data transmission line 37 which also emanates from the control unit 30, has not yet been taken into account in the foregoing consideration.
• the data transmission line 37 is connected to the switching matrix 9 via the sliding contact device 13, so that the relays 29a, 29b, 29c can be controlled by means of the control signals transmitted in this way from the control unit 30 to the switching matrix 9.
• the relays 29a, 29b, 29c are set up to interconnect the connections of the switching matrix 9 on the receiving sections 4a, 4b, .
• a further line 38 which is used for grounding or for switching one or more contact surfaces 6, 7, 8 to ground, was left out of consideration in the preceding consideration.
• This line 38 is also connected to the switching matrix 9 via the sliding contact device 13 .
• the measuring devices 10a, 10b, 10c, 10d are also connected to the control unit 30 by means of a line 39. Measuring devices 10a, 10b, 10c, 10d, for example, can be controlled by means of this line. Furthermore, the values determined by the measuring devices 10a, 10b, 10c, 10d can also be stored in a data memory of the control unit 30. If, for example, a faulty segment 2 is detected by one of the measuring devices 10a, 10b, 10c, 10d, the control unit 30 can Signal are output to the ejection drum 25 shown in Figure 1, so that the corresponding segment 2 can be ejected from the manufacturing process.
• FIG. 6 shows a schematic representation of a sliding contact device 13 which includes a stator 40 and a rotor 41 .
• the stator 40 is connected to two pairs of lines 35, which are connected to the measuring devices 10a and 10b (cf. FIG. 5), only as an example.
• the corresponding input lines 34 for the switching matrix 9 are assigned to the rotor 41 .
• In the interior of the sliding contact device 13 there are several slip rings--not visible in this representation--which can be contacted or are in contact with sliding brushes, which are also not visible. Electrical and/or signaling lines can thus be connected separately between the stator 40 and the rotor 41 .
• FIG. 7 shows a schematic of a switching network of the test device 1.
• Four measuring devices 10a, 10b, 10c, 10d are shown here, with the network basically being expandable to include further measuring devices.
• each measuring device 10, 10b, 10c, 10d can basically be connected to each receiving section 4a to 4e by means of the switching matrix 9.
• the switching matrix 9 For the sake of clarity, only five of the twelve receiving sections 4a, . . . , 4I are shown here.
• the receiving sections 4a, . . . , 4e are each occupied by a segment 2.
• a detailed view of the contact surfaces 6, 7, 8 of the first receiving section 4a and the ability to connect them by means of the switches 42, . . . , 47 is shown on the right.
• the switches 42 Depending on the switching position of switches 42, ... , 47, the con- contact surfaces 6, 7, 8 are interconnected with one another and/or with one of the measuring devices 10a, 10b, 10c, 10d and/or in some other way. In principle, it is also possible to connect one or more of the receiving sections 4a, . . . The recording sections 4a, . . .
• FIG. 8 shows an equivalent diagram 32 of the segment 2 stored in the receiving section 4b; See FIG is also maintained in the circuit diagrams of Figures 9 to 13.
• the equivalent diagram 32 in FIG. 8 includes series resistances R S , A , R S ,K and R S ,T which describe the line and contact resistances at the anode A, cathode K and the transport support T formed by the third contact surface 8 . Furthermore, a resistor R P ,AK, which represents the insulation resistance between the anode A and cathode K, and a resistor R P .AT, which represents the insulation resistance between the anode A and the transport support T, are provided. The resistances R p AK and R P ,AT thus characterize the electrical conductivity of the separators 21 and 23. Furthermore, the capacitors C A K , C A T represent the ode A and the cathode K and between the anode A and the transport support T.
• the equivalent circuit diagram 32 in FIG. 8 is used as the basis for the circuit configurations explained in FIGS.
• the measuring device 10a which is set up to measure an ohmic resistance, is used as an example; however, in principle any other measuring devices can also be used.
• a contact surface 6, 7, 8 is connected to ground, then in this exemplary embodiment this is done by connecting the corresponding contact surface 6, 7 or 8 to the ground line or the ground point of the circuit. In principle, however, other options for switching to ground are also conceivable, for example by connecting to the drum of the conveying device 3 if this is grounded. If it is mentioned below that a contact surface 6, 7, 8 is not connected, then the corresponding contact surface 6, 7 or 8 is electrically isolated from the electrical lines of the rest of the switching network.
• FIG. 9 shows a first switching configuration which is used to test the second separator 23 (cf. FIG. 3).
• the measuring device 10a is connected to the first and second contact surfaces 6, 7, and thus to the anode A and the cathode K.
• the contact surface 8, ie the transport support T, is not connected and is therefore not shown.
• FIG. 10 shows a second switching configuration, which is also used to test the second separator 23 (cf. FIG. 3).
• the meter 10a is connected to the first and second contact surface 6, 7, and thus with the anode A and the cathode K, connected.
• the contact surface 8, ie the transport support T, is connected to ground.
• FIG. 11 shows a third switching configuration which is used to test the first separator 21 (cf. FIG. 3).
• the measuring device 10a is connected to the first contact surface 6 and above it also to the anode A and to the third contact surface 8, ie to the transport support T.
• the second contact surface 7, on which the cathode K is present, is not connected and is therefore not shown.
• FIG. 12 shows a fourth switching configuration, which is also used to test the first separator 21 (cf. FIG. 3).
• the measuring device 10a is connected to the first contact surface 6 and above it also to the anode A and to the third contact surface 8, ie the transport support T.
• the second contact area 7, on which the cathode K is present, is connected to ground.
• FIG. 13 shows a fifth switching configuration with which the separators 21 and 23 can be tested together.
• the measuring device 10a is connected to the first contact surface 6 and above it to the anode A by means of a first measuring connection 48 . Furthermore, the measuring device 10a is connected to the second contact area 7 and the third contact area 8 by means of a second measuring connection 49 . In this fifth switching configuration, the two separators 21 and 23 are connected in parallel to the measuring device 10a.
• FIG. 14 shows a sixth switching configuration with which the separators 21 and 23 can also be tested together.
• the measuring device 10a is connected to the second contact surface 7 and also to the cathode K and to the third contact surface 8, ie the Transport support T, interconnected.
• the first contact surface 6, on which the anode A is in contact, is not connected and is therefore not shown.
• the two separators 21 and 23 are connected in series to the measuring device 10a.
• FIGS. 9 to 14 allow suitable measuring bridges to be formed, by means of which the state of the segment located in the receiving section 4 (cf. FIGS. 2, 3, 4 and 5) can be reliably determined leaves.

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• General Chemical & Material Sciences (AREA)
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• General Physics & Mathematics (AREA)
• Testing Of Individual Semiconductor Devices (AREA)
• Measurement Of Resistance Or Impedance (AREA)
• Fuel Cell (AREA)
• Secondary Cells (AREA)

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• 2022
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