EP4189456A1 - Verfahren und lichtmikroskop mit einer vielzahl von arrays von photonenzählenden detektorelementen - Google Patents
Verfahren und lichtmikroskop mit einer vielzahl von arrays von photonenzählenden detektorelementenInfo
- Publication number
- EP4189456A1 EP4189456A1 EP20754654.0A EP20754654A EP4189456A1 EP 4189456 A1 EP4189456 A1 EP 4189456A1 EP 20754654 A EP20754654 A EP 20754654A EP 4189456 A1 EP4189456 A1 EP 4189456A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- sensor arrays
- light
- photon
- specimen
- light beams
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4413—Type
- G01J2001/442—Single-photon detection or photon counting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/446—Photodiode
- G01J2001/4466—Avalanche
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/448—Array [CCD]
Definitions
- the sensor arrays are usually arranged perpendicular to the optical axis of the detection light beams
- the sensor arrays may also be tiltably mounted.
- a printed circuit board (PCB) on which all sensor arrays are arranged may be supported such that it can be tilted relative to the optical axis of the detection light beams.
- all sensor arrays can be jointly tilted.
- the sensor arrays may be tilted depending on differences between detection light beams, e.g., in case that axial positions of detection light beams differ from each other.
- Detection light beams may also have different intensities in which case it may be useful to vary the light spot size on the sensor arrays by tilting the sensor arrays.
- a controller may be configured to instruct the adjustment device to perform the tilting depending on measured signals from the photon-counting detector elements and/or depending on how the light source is controlled.
- the adjustment may also comprise performing a relative rotation between the sensor arrays and the detection light beams.
- a rotation axis is parallel to the optical axis of the detection light beams.
- the sensor arrays may be jointly rotated (i.e. , by rotating a common component such as a PCB on which all sensor arrays are arranged).
- an image rotator such as an image rotation prism may be arranged in the beam path of the detection light beams and may be adjusted to avoid a rotational mismatch between the arrangement of sensor arrays and the light spots on the sensor arrays.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/EP2020/071248 WO2022022807A1 (en) | 2020-07-28 | 2020-07-28 | Method and light microscope with a plurality of arrays of photon-counting detector elements |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP4189456A1 true EP4189456A1 (de) | 2023-06-07 |
Family
ID=72050811
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP20754654.0A Pending EP4189456A1 (de) | 2020-07-28 | 2020-07-28 | Verfahren und lichtmikroskop mit einer vielzahl von arrays von photonenzählenden detektorelementen |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20230288687A1 (de) |
| EP (1) | EP4189456A1 (de) |
| JP (1) | JP2023540435A (de) |
| CN (1) | CN116710828A (de) |
| WO (1) | WO2022022807A1 (de) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117420670A (zh) * | 2023-12-19 | 2024-01-19 | 振电(苏州)医疗科技有限公司 | 红外共聚焦成像系统 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4962134B2 (ja) * | 2007-05-17 | 2012-06-27 | オムロン株式会社 | 計測装置 |
| DE102013019347A1 (de) * | 2013-08-15 | 2015-02-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| US9546962B2 (en) * | 2014-02-12 | 2017-01-17 | Kla-Tencor Corporation | Multi-spot scanning collection optics |
| DE102014002328B4 (de) | 2014-02-12 | 2021-08-05 | Carl Zeiss Microscopy Gmbh | Multifokales Fluoreszenzrastermikroskop |
| DE102014017003A1 (de) | 2014-11-12 | 2016-05-12 | Carl Zeiss Ag | Scaneinrichtung zur 3D-Positionierung von Laserspots |
| LU92664B1 (de) * | 2015-02-24 | 2016-08-25 | Leica Microsystems | Vorrichtung und verfahren zum detektieren von licht |
| DE102016119727A1 (de) | 2016-10-17 | 2018-04-19 | Carl Zeiss Microscopy Gmbh | Vorrichtung zur Strahlmanipulation für ein Scanning-Mikroskop und Mikroskop |
| DE102016119730A1 (de) | 2016-10-17 | 2018-04-19 | Carl Zeiss Microscopy Gmbh | Optikgruppe für Detektionslicht für ein Mikroskop, Verfahren zur Mikroskopie und Mikroskop |
-
2020
- 2020-07-28 EP EP20754654.0A patent/EP4189456A1/de active Pending
- 2020-07-28 JP JP2023505838A patent/JP2023540435A/ja active Pending
- 2020-07-28 US US18/007,081 patent/US20230288687A1/en active Pending
- 2020-07-28 WO PCT/EP2020/071248 patent/WO2022022807A1/en active Application Filing
- 2020-07-28 CN CN202080105090.4A patent/CN116710828A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CN116710828A (zh) | 2023-09-05 |
| JP2023540435A (ja) | 2023-09-25 |
| WO2022022807A1 (en) | 2022-02-03 |
| US20230288687A1 (en) | 2023-09-14 |
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Legal Events
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| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
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| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
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| STAA | Information on the status of an ep patent application or granted ep patent |
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| 17P | Request for examination filed |
Effective date: 20230131 |
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| AK | Designated contracting states |
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