EP4182709A1 - Dispositif et procédé de détermination de l'intensité de charge d'une décharge partielle - Google Patents
Dispositif et procédé de détermination de l'intensité de charge d'une décharge partielleInfo
- Publication number
- EP4182709A1 EP4182709A1 EP21743042.0A EP21743042A EP4182709A1 EP 4182709 A1 EP4182709 A1 EP 4182709A1 EP 21743042 A EP21743042 A EP 21743042A EP 4182709 A1 EP4182709 A1 EP 4182709A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- partial discharge
- pulse
- measurement data
- pulse width
- charge strength
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 14
- 238000005259 measurement Methods 0.000 claims abstract description 97
- 239000004020 conductor Substances 0.000 claims abstract description 40
- 238000011156 evaluation Methods 0.000 claims abstract description 33
- 230000003287 optical effect Effects 0.000 claims description 51
- 238000001514 detection method Methods 0.000 claims description 35
- 239000000835 fiber Substances 0.000 claims description 13
- 239000013308 plastic optical fiber Substances 0.000 claims description 13
- 229920001109 fluorescent polymer Polymers 0.000 claims description 10
- 239000013307 optical fiber Substances 0.000 description 8
- 238000009413 insulation Methods 0.000 description 7
- 238000012544 monitoring process Methods 0.000 description 7
- 238000013459 approach Methods 0.000 description 4
- 229920001971 elastomer Polymers 0.000 description 4
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- 238000013139 quantization Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
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- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000005236 sound signal Effects 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
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- 230000008054 signal transmission Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
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- 229920002379 silicone rubber Polymers 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
Definitions
- the document EP 2 472 689 A2 discloses a high-voltage fitting in which a fiber-optic sensor mechanically coupled to a field control part is set up to detect a mechanical deformation of an insulation.
- the document WO 2020/069697 A1 describes how vibration or sound signals recorded by means of fiber optic sensors can be used to determine a short circuit with the occurrence of an arc.
- vibration or sound signals measured using fiber optic sensors can be used to determine an operating state for electrical equipment.
- the object of the invention is to provide an improved device and a method for determining a charge strength of a partial discharge, with which a determination a charge strength of a partial discharge is made possible with less effort, in particular with lower demands on the hardware used for the determination.
- Setting up the optical waveguide and the light detection device for coupling and forwarding or for receiving light includes, in particular, arranging the optical waveguide and the light detection device in relation to one another and setting them up for an arrangement and alignment with the conductor such that this occurs in the event of a partial discharge
- Light is coupled into the optical waveguide, forwarded to the light detection device is tet and is received by this with decoupling from the optical waveguide.
- the light detection device can have two photomultipliers and be set up to generate the measurement data only when both photomultipliers simultaneously detect a measurement signal.
- the light detection device can have two light-sensitive elements of a different type, for example avalanche diodes, and can be set up to generate the measurement data only when both light-sensitive elements record a measurement signal at the same time. The statements made in connection with a configuration with two multi-pixel photon counters apply accordingly to such configurations.
- the measuring device can be set up to generate measurement data with a sampling frequency of more than 10 MHz from the measurement signal.
- the measuring device can be set up to generate measurement data with a frequency of at least 192 MHz from the measurement signal. For example, for a pulse width in the range of 80 ns at a clock frequency of 192 MHz, quantization in 16 stages, corresponding to a 4-bit converter, can be provided. Provision can be made for generating measurement data with a frequency of more than 192 MHz from the measurement signal. For example, the pulse width can be quantized in 128 or 255 steps.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Testing Relating To Insulation (AREA)
Abstract
L'invention concerne un dispositif permettant de déterminer une intensité de charge d'une décharge partielle, comprenant un dispositif de mesure et un dispositif d'évaluation (4). Le dispositif de mesure est configuré pour détecter un signal de mesure qui indique une courbe d'impulsion d'une variable de mesure, ladite courbe d'impulsion étant provoquée par une décharge partielle dans un conducteur (1), et pour générer des données de mesure indiquant le signal de mesure. Le dispositif d'évaluation (4) est configuré pour recevoir les données de mesure provenant du dispositif de mesure, pour déterminer une largeur d'impulsion de la courbe d'impulsion sur la base des données de mesure, et pour déterminer une intensité de charge de la décharge partielle sur la base de la largeur d'impulsion de la courbe d'impulsion. L'invention concerne également un procédé permettant de déterminer une intensité de charge d'une décharge partielle.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102020119012.3A DE102020119012B4 (de) | 2020-07-17 | 2020-07-17 | Vorrichtung und Verfahren zum Bestimmen einer Ladungsstärke einer Teilentladung |
| PCT/DE2021/100609 WO2022012720A1 (fr) | 2020-07-17 | 2021-07-12 | Dispositif et procédé de détermination de l'intensité de charge d'une décharge partielle |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP4182709A1 true EP4182709A1 (fr) | 2023-05-24 |
Family
ID=76971588
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP21743042.0A Pending EP4182709A1 (fr) | 2020-07-17 | 2021-07-12 | Dispositif et procédé de détermination de l'intensité de charge d'une décharge partielle |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP4182709A1 (fr) |
| DE (1) | DE102020119012B4 (fr) |
| WO (1) | WO2022012720A1 (fr) |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3245397B2 (ja) | 1998-11-04 | 2002-01-15 | 東京電力株式会社 | 部分放電測定方法 |
| JP5078276B2 (ja) * | 2006-04-21 | 2012-11-21 | 三菱電機株式会社 | 診断用信号処理装置 |
| DE102010061606B4 (de) | 2010-12-28 | 2018-12-27 | Bundesanstalt für Materialforschung und -Prüfung (BAM) | Hochspannungsgarnitur und Verfahren zur Detektion von Teilentladungen in Hochspannungsgarnituren |
| GB201116088D0 (en) * | 2011-09-16 | 2011-11-02 | High Voltage Partial Discharge Ltd | Method and apparatus for measuring partial discharge |
| JP5854468B2 (ja) * | 2012-01-25 | 2016-02-09 | 国立大学法人九州工業大学 | 非接触放電評価方法及び装置 |
| DE102013104155B4 (de) | 2013-04-24 | 2015-09-10 | Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Für Wirtschaft Und Energie, Dieser Vertreten Durch Den Präsidenten Der Bundesanstalt Für Materialforschung Und -Prüfung (Bam) | Hochspannungseinrichtung mit einem faseroptischen Sensor und Verfahren zum Prüfen einer Isolierung einer derartigen Hochspannungseinrichtung |
| JP6160284B2 (ja) * | 2013-06-17 | 2017-07-12 | 日立金属株式会社 | 絶縁寿命推定方法および絶縁寿命推定装置 |
| JP2015175613A (ja) | 2014-03-13 | 2015-10-05 | 日立金属株式会社 | 電線の評価方法及び電線の評価装置 |
| DE102015101608B4 (de) | 2015-02-04 | 2021-01-07 | Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Für Wirtschaft Und Energie, Dieser Vertreten Durch Den Präsidenten Der Bundesanstalt Für Materialforschung Und -Prüfung (Bam) | Verfahren zur Signalweiterleitung, Vorrichtung mit einer optischen Faser und Detektionssystem |
| DE102015004437A1 (de) | 2015-04-02 | 2016-10-06 | BAM Bundesanstalt für Materialforschung und -prüfung | Fluoreszierendes Siloxanelastomer, Verfahren zu dessen Herstellung und die Verwendung |
| DE102015107479A1 (de) | 2015-05-12 | 2016-11-17 | Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Für Wirtschaft Und Energie, Dieser Vertreten Durch Den Präsidenten Der Bundesanstalt Für Materialforschung Und -Prüfung (Bam) | Hochspannungskabelgarnitur und Verfahren zum Herstellen einer Hochspannungskabelgarnitur |
| DE102016108122B3 (de) | 2016-05-02 | 2017-07-13 | Hochschule Für Technik Und Wirtschaft Berlin | Kabelanordnung, Kabel und Verfahren |
| DE102018104953B4 (de) | 2018-03-05 | 2022-05-19 | Hochschule Für Technik Und Wirtschaft Berlin | Messvorrichtung und Verfahren zum Bestimmen einer physikalischen Messgröße |
| DE102018124210A1 (de) | 2018-10-01 | 2020-04-02 | Hochschule Für Technik Und Wirtschaft Berlin | Verfahren zum Bestimmen eines Betriebszustands für ein elektrisches Betriebsmittel mit einem Schalterelement |
| DE102018124218A1 (de) | 2018-10-01 | 2020-04-02 | Hochschule Für Technik Und Wirtschaft Berlin | Verfahren zum Bestimmen eines Kurzschlusses mit Auftreten eines Lichtbogens an einem elektrischen Leiter |
-
2020
- 2020-07-17 DE DE102020119012.3A patent/DE102020119012B4/de active Active
-
2021
- 2021-07-12 EP EP21743042.0A patent/EP4182709A1/fr active Pending
- 2021-07-12 WO PCT/DE2021/100609 patent/WO2022012720A1/fr unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022012720A1 (fr) | 2022-01-20 |
| DE102020119012B4 (de) | 2022-05-19 |
| DE102020119012A1 (de) | 2022-01-20 |
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