EP3892072A1 - Kontaktstelle für einen elektrischen kontakt - Google Patents
Kontaktstelle für einen elektrischen kontaktInfo
- Publication number
- EP3892072A1 EP3892072A1 EP19818010.1A EP19818010A EP3892072A1 EP 3892072 A1 EP3892072 A1 EP 3892072A1 EP 19818010 A EP19818010 A EP 19818010A EP 3892072 A1 EP3892072 A1 EP 3892072A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- layer
- plasma
- cover layer
- contact point
- plasma polymer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229920000642 polymer Polymers 0.000 claims abstract description 69
- 239000000758 substrate Substances 0.000 claims abstract description 65
- 229910052751 metal Inorganic materials 0.000 claims abstract description 41
- 239000002184 metal Substances 0.000 claims abstract description 41
- 239000000463 material Substances 0.000 claims abstract description 27
- 239000000203 mixture Substances 0.000 claims abstract description 18
- 239000002131 composite material Substances 0.000 claims abstract description 15
- 239000010410 layer Substances 0.000 claims description 248
- 238000000034 method Methods 0.000 claims description 36
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 30
- 229910052709 silver Inorganic materials 0.000 claims description 25
- 239000004332 silver Substances 0.000 claims description 24
- 239000010949 copper Substances 0.000 claims description 18
- 239000002245 particle Substances 0.000 claims description 17
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 16
- 239000002923 metal particle Substances 0.000 claims description 16
- 239000002243 precursor Substances 0.000 claims description 14
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 13
- 229910052802 copper Inorganic materials 0.000 claims description 13
- 238000000151 deposition Methods 0.000 claims description 12
- 238000004519 manufacturing process Methods 0.000 claims description 12
- 238000005245 sintering Methods 0.000 claims description 12
- 239000002105 nanoparticle Substances 0.000 claims description 11
- 229910052759 nickel Inorganic materials 0.000 claims description 8
- 229910052799 carbon Inorganic materials 0.000 claims description 7
- 229910052757 nitrogen Inorganic materials 0.000 claims description 7
- 229910052760 oxygen Inorganic materials 0.000 claims description 7
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 claims description 6
- 230000001603 reducing effect Effects 0.000 claims description 5
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 4
- 239000010931 gold Substances 0.000 claims description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 4
- FOIXSVOLVBLSDH-UHFFFAOYSA-N Silver ion Chemical compound [Ag+] FOIXSVOLVBLSDH-UHFFFAOYSA-N 0.000 claims description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 3
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 claims description 3
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 239000013047 polymeric layer Substances 0.000 claims description 3
- 229910052718 tin Inorganic materials 0.000 claims description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 claims description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 2
- 150000001336 alkenes Chemical class 0.000 claims description 2
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 235000010290 biphenyl Nutrition 0.000 claims description 2
- 150000004074 biphenyls Chemical class 0.000 claims description 2
- 229910052804 chromium Inorganic materials 0.000 claims description 2
- 239000011651 chromium Substances 0.000 claims description 2
- 229910017052 cobalt Inorganic materials 0.000 claims description 2
- 239000010941 cobalt Substances 0.000 claims description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 2
- 125000000623 heterocyclic group Chemical group 0.000 claims description 2
- 229910052744 lithium Inorganic materials 0.000 claims description 2
- 229910052750 molybdenum Inorganic materials 0.000 claims description 2
- 239000011733 molybdenum Substances 0.000 claims description 2
- 229910052763 palladium Inorganic materials 0.000 claims description 2
- 229910052697 platinum Inorganic materials 0.000 claims description 2
- 239000011135 tin Substances 0.000 claims description 2
- 238000000137 annealing Methods 0.000 claims 1
- 238000004140 cleaning Methods 0.000 claims 1
- -1 cyclopentanol aromatic hydrocarbons alkynes Chemical class 0.000 claims 1
- 210000002381 plasma Anatomy 0.000 description 100
- 239000000976 ink Substances 0.000 description 17
- 239000012071 phase Substances 0.000 description 16
- 230000008569 process Effects 0.000 description 16
- 238000000576 coating method Methods 0.000 description 13
- 230000032683 aging Effects 0.000 description 11
- 125000004429 atom Chemical group 0.000 description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- 239000011248 coating agent Substances 0.000 description 10
- 239000000470 constituent Substances 0.000 description 10
- 230000008021 deposition Effects 0.000 description 10
- 229910000679 solder Inorganic materials 0.000 description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 9
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 8
- 230000015572 biosynthetic process Effects 0.000 description 8
- 230000000694 effects Effects 0.000 description 7
- 239000007789 gas Substances 0.000 description 7
- 229910052739 hydrogen Inorganic materials 0.000 description 7
- 239000001257 hydrogen Substances 0.000 description 7
- 238000005259 measurement Methods 0.000 description 7
- 238000007639 printing Methods 0.000 description 7
- 230000007704 transition Effects 0.000 description 7
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 6
- 150000002739 metals Chemical class 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 239000008367 deionised water Substances 0.000 description 5
- 229910021641 deionized water Inorganic materials 0.000 description 5
- 239000007788 liquid Substances 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- 239000006185 dispersion Substances 0.000 description 4
- 210000004905 finger nail Anatomy 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000002198 surface plasmon resonance spectroscopy Methods 0.000 description 4
- 238000005137 deposition process Methods 0.000 description 3
- 239000002270 dispersing agent Substances 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 239000013528 metallic particle Substances 0.000 description 3
- 239000000376 reactant Substances 0.000 description 3
- 238000011282 treatment Methods 0.000 description 3
- 238000003466 welding Methods 0.000 description 3
- 241000446313 Lamella Species 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 150000002430 hydrocarbons Chemical class 0.000 description 2
- 238000007641 inkjet printing Methods 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 239000002798 polar solvent Substances 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 230000008646 thermal stress Effects 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 1
- NRTJGTSOTDBPDE-UHFFFAOYSA-N [dimethyl(methylsilyloxy)silyl]oxy-dimethyl-trimethylsilyloxysilane Chemical compound C[SiH2]O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)C NRTJGTSOTDBPDE-UHFFFAOYSA-N 0.000 description 1
- ZDQGUEHIMBQNFU-UHFFFAOYSA-N [dimethyl(silyloxy)silyl]oxy-dimethyl-silyloxysilane Chemical compound [SiH3]O[Si](C)(C)O[Si](C)(C)O[SiH3] ZDQGUEHIMBQNFU-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 239000002318 adhesion promoter Substances 0.000 description 1
- 239000002156 adsorbate Substances 0.000 description 1
- 150000001345 alkine derivatives Chemical class 0.000 description 1
- 150000001412 amines Chemical group 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 238000010923 batch production Methods 0.000 description 1
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000005234 chemical deposition Methods 0.000 description 1
- 229910052729 chemical element Inorganic materials 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- XCIXKGXIYUWCLL-UHFFFAOYSA-N cyclopentanol Chemical compound OC1CCCC1 XCIXKGXIYUWCLL-UHFFFAOYSA-N 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 239000002612 dispersion medium Substances 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 238000000572 ellipsometry Methods 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 238000010574 gas phase reaction Methods 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000010849 ion bombardment Methods 0.000 description 1
- 238000013532 laser treatment Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000002609 medium Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910052756 noble gas Inorganic materials 0.000 description 1
- 150000002835 noble gases Chemical class 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000007649 pad printing Methods 0.000 description 1
- 239000011236 particulate material Substances 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000005554 pickling Methods 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 239000003495 polar organic solvent Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000002028 premature Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 150000003254 radicals Chemical group 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000002040 relaxant effect Effects 0.000 description 1
- 238000004626 scanning electron microscopy Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 125000005372 silanol group Chemical group 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 238000006557 surface reaction Methods 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 238000005496 tempering Methods 0.000 description 1
- CZDYPVPMEAXLPK-UHFFFAOYSA-N tetramethylsilane Chemical compound C[Si](C)(C)C CZDYPVPMEAXLPK-UHFFFAOYSA-N 0.000 description 1
- 238000004627 transmission electron microscopy Methods 0.000 description 1
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/244—Finish plating of conductors, especially of copper conductors, e.g. for pads or lands
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/60—Deposition of organic layers from vapour phase
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D5/00—Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures
- B05D5/12—Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures to obtain a coating with specific electrical properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/14—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials to metal, e.g. car bodies
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0227—Pretreatment of the material to be coated by cleaning or etching
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/245—Reinforcing conductive patterns made by printing techniques or by other techniques for applying conductive pastes, inks or powders; Reinforcing other conductive patterns by such techniques
- H05K3/247—Finish coating of conductors by using conductive pastes, inks or powders
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D2202/00—Metallic substrate
- B05D2202/40—Metallic substrate based on other transition elements
- B05D2202/45—Metallic substrate based on other transition elements based on Cu
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D2350/00—Pretreatment of the substrate
- B05D2350/30—Change of the surface
- B05D2350/33—Roughening
- B05D2350/35—Roughening by chemical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D2490/00—Intermixed layers
- B05D2490/50—Intermixed layers compositions varying with a gradient perpendicular to the surface
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/50—Multilayers
- B05D7/52—Two layers
- B05D7/54—No clear coat specified
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/09—Treatments involving charged particles
- H05K2203/095—Plasma, e.g. for treating a substrate to improve adhesion with a conductor or for cleaning holes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/11—Treatments characterised by their effect, e.g. heating, cooling, roughening
- H05K2203/1131—Sintering, i.e. fusing of metal particles to achieve or improve electrical conductivity
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
- H05K3/1241—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by ink-jet printing or drawing by dispensing
- H05K3/125—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by ink-jet printing or drawing by dispensing by ink-jet printing
Definitions
- the invention relates to a contact point for an electrical contact, consisting of or comprising a composite, comprising a metal substrate and arranged on the substrate, a plasma polymer layer and a metallic cover layer.
- a contact point for an electrical contact consisting of or comprising a composite, comprising a metal substrate and arranged on the substrate, a plasma polymer layer and a metallic cover layer.
- the invention further relates to the use of a combination of a plasma polymer layer and a mixed layer for connecting a metal substrate to a metallic cover layer and to a method for producing a corresponding contact point.
- a typical method for providing these coatings on a substrate, often copper or copper-based alloys, is bath-based electrodeposition.
- the coating is transferred to an electrically conductive component.
- solder joints To prepare solder joints, they are often coated with a solder, often tin-based, by applying a solder paste using a solder mask and is heated. Both the flux in the solder paste and the solder resist can have a negative impact on the aging resistance of the component / product. Furthermore, the solders often contain lead and are therefore harmful to the environment. Lead-free solders, on the other hand, often have changed mechanical properties, eg poorer fatigue behavior due to aging.
- Ag and Au coated lead frames are typically used to prepare bond points for wire bonding.
- a method comprising a combination of PVD and CVD (DE 102009048397 A1) is known.
- the coating of Cu lead frames from the liquid phase is also known.
- a method is also known which is based on a plasma-activated gas phase layer deposition in low pressure (DE 19748240A1).
- PVD particles or layers
- the disadvantage here is that work has to be carried out at low pressure (batch process / restricted component size).
- the formation of mixed crystals is prevented.
- the mixed crystals have poorer electrical conductivity. If mixed crystals are formed by interdiffusion (caused by thermal stress), the resistance in this intermediate layer increases, which leads to a further thermal stress when subjected to high current. This self-reinforcing effect can then lead to the failure of the electrical component.
- the present invention was based on the task of specifying a contact point, the production of which is possible in a resource-efficient manner, which can be produced without the use of baths and which represents an alternative for coupling different metal layers through a nickel layer.
- This contact point should preferably also be designed to be mechanically stable and not have a deteriorated resistance behavior compared to a large number of methods in the prior art.
- a contact point for an electrical contact consisting of or comprising a composite comprising a metal substrate and on the A plasma-polymer layer and a metallic cover layer are arranged on the substrate, a mixed layer being present between the metallic cover layer and the plasma polymer layer, which has a gradient with regard to its material composition from the composition of the plasma polymer layer to the composition of the cover layer.
- a “contact point for an electrical contact” is to be understood as a point which is set up so that it is connected to a wire, a flat contact or another suitable means, for example a spring, which enables a contact pressure is connected that a current flow through the contact point is possible. This preferably includes that the location is set up in such a way that the electrical contact has been or can be produced via wire bonding, soldering and / or welding.
- a “contact point for an electrical contact” is small when viewed vertically from above (vertically over the largest area of the contact point), in particular ⁇ 2000 mm 2, preferably ⁇ 1500 mm 2 , particularly preferably ⁇ 1000 mm 2 and am most preferably ⁇ 500 mm 2 .
- a metal substrate in the sense of the present invention can be a large-area substrate, but it is also possible that it is a point-like, small-area application of a metal defined by the geometry of the contact point.
- a plasma polymer layer is a layer that is formed from a plasma polymer.
- the metallic cover layer can preferably serve as the basis for the following processes:
- Mixed layer which must be present according to the invention, is an indication of the application method to be selected.
- a “metallic cover layer” in the sense of the present invention is a layer whose properties, such as conductivity, are essentially determined by the content of metals. It is preferred that a metallic cover layer in the sense of the present invention consists of> 90% by weight, more preferably> 95% by weight, of metals.
- the adhesion between the substrate and the cover layer by means of a plasma polymer layer works particularly well when the layer deposited by a plasma process from a precursor at the time when the cover layer is applied to its surface has not yet reached the plasma polymeric state.
- suitable deposition conditions see also below
- a plasma oligomeric state within the meaning of this text is present if a drop of water applied to the layer within ten minutes has the thickness of the (plasma polymer chemical deposition) applied by means of PECVD (plasma enhanced chemical vapor deposition). ren / plasma oligomer) layer reduced by> 2 nanometers. If in doubt, try this at room temperature and with deionized water. The change in layer thickness is measured by means of reflectometry or preferably ellipsometry. From the point at which a layer removal of ⁇ 2 nanometers per ten minutes takes place under the aforementioned conditions, the (plasma polymer) coating is no longer considered a plasma oligomer, but a finished plasma polymer.
- the coating to be used according to the invention succeeds if the time and / or the temperature between the application of the coating by means of plasma coating processes (preferred is atmospheric pressure plasma) and the subsequent application of the cover layer material is so low that a plasma oligomer is still on the surface of the later plasma polymer layer applied by means of PECVD is present.
- This makes it possible for the plasma oligomer to mix with the material for the cover layer. This results in a mixed layer of material of the cover layer and of material which would have become part of the plasma polymer layer if the application of the cover layer had been waited for too long and / or at too high temperatures.
- the mixed layer is formed from parts of the plasma polymer layer (plasma oligomers) which has not yet been completely formed and parts of the cover layer material. It is also possible - and often desirable - that the plasma oligomers react with the components of the cover layer in the mixed layer.
- a mixed layer in the sense of the present text always consists of a mixture of the upper components of a previously deposited plasma polymer layer and the components of the top layer directly deposited or applied thereon.
- the mixed layer is a transition zone which is formed from constituents which are still present in the plasma oligomeric state on the surface of the deposited plasma polymer layer and constituents of the subsequently applied top layer. No separate layer application / layer deposition process is thus used to create the mixed layer / transition zone, nor are the parameters of a deposition process varied for the formation of this layer, for example in order to produce a gradient layer.
- a mixed layer in the sense of this invention is thus created by mixing plasma oligomeric constituents on the surface of the plasma polymeric layer with constituents of the cover layer subsequently applied when the constituents are applied or the precursor components of the top layer.
- Cover layers which are applied in the liquid state or in the gaseous state are of course particularly suitable, the liquid state being preferred in particular.
- the boundary between the plasma polymer layer and the mixed layer is determined by means of TEM on lamella cuts across the composite. The same applies to the boundary between the mixed layer and the top layer.
- the limit should be set at the point at which at least one component of the plasma polymer layer or the top layer deviates by> 5 atomic% measured by TEM.
- the concentration course of the individual elements in the mixed layer will change from the concentration in the plasma polymer layer in each case within a gradient to the concentration of the cover layer. This change will regularly result in a constant increase or decrease in the respective element content.
- the boundary layer between cover layer and transition layer or plasma polymer layer and transition layer begins where for the first time a chemical element is present which is not present in the plasma polymer layer or cover layer.
- the cover layer undertakes the determination of the concentration profiles of the individual elements in a meaningful way: for example, it is possible for the cover layer to be formed from a dispersion layer, in particular a suspension layer or an emulsion layer.
- the person skilled in the art often speaks of metallic inks, that is to say nanoscopic or microscopic metal particles which are suspended in a dispersion medium, often a polar organic solvent.
- the mixed layer can consist of several phases. Of course, the person skilled in the art will take into account the typical lateral extent of the corresponding phases when determining the concentration.
- the person skilled in the art considers a TEM section with a width of at least five times the size of the material inhomogeneities caused by the cover layer. It is particularly preferred that individual metal particles are completely enveloped in the plasma polymer in the mixed layer, the plasma polymer forms the continuous phase and the metal particles form the dispersed phase. In a further area of the mixed layer, the plasma polymer phase, preferably with embedded metal particles, is preferably present as the dispersed phase. Here the metallic phase forms the continuous phase, if necessary after sintering.
- the “size of the material inhomogeneities” means the longest diameter of the respective inhomogeneity, determined by means of transmission electron microscopy.
- the person skilled in the art will consider a width of> 6 micrometers for the lamella cut.
- This width relates to the x-axis of the TEM observation volume, while the y-axis is perpendicular to the substrate surface and the distance along the y-axis must of course be long enough to allow the composition of the plasma polymer layer and the top layer as the respective reference layers to determine.
- the x-axis in this picture corresponds to the penetration depth of the selected TEM measurement method, and is preferably pm 5 micrometers.
- the inventors of the present invention have surprisingly found that the use of plasma oligomers achieves very good adhesion via the mixed layer to be used according to the invention, surprisingly also to metallic cover layers without impairing the electrical conductivity and / or the aging resistance of the resulting composite. In many cases, the resistance to aging is even improved or even made possible.
- a gas phase deposition is used, as can be used for the coating of semi-finished products of different materials.
- the deposited coating has a high chemical reactivity immediately after the deposition, if the deposition conditions are selected appropriately, and is not yet completely cross-linked (plasma oligomer).
- oligomeric constituents are extracted from the layer or oligomeric constituents of the layer are dissolved in water or possibly another solvent. In extreme cases, the layer can even be completely removed from the substrate.
- the deposition conditions of the plasma polymer layer must be chosen with regard to the gas phase reactions of the precursors which occur, so that excessive fragmentation is avoided, since otherwise layer formation from plasma oligomers is no longer possible and / or the fragments are so reactive that they react with one another too quickly and not provide a practically usable plasma oligomer, but rather the layer is already present completely or to an excessive extent as a plasma polymer.
- a plasma nozzle as described in DE102006038780A1 is preferably used.
- the layer composition also plays a role; precursors are preferably used which form layers consisting of carbon, hydrogen, oxygen, nitrogen and / or silicon. Precursors which contain carbon and hydrogen and which contain oxygen and / or nitrogen or which consist of these elements are particularly preferably used. Particularly preferred precursors are selected from the group consisting of acetylene, toluene, cyclopentanol, aromatic hydrocarbons, alkynes, alkenes, heterocycles and biphenyls. In general, preference is given to hydrocarbon compounds which have at least a vapor pressure of> 100 mbar, preferably> 500 mbar, particularly preferably> 1 bar at 100 ° C.
- silicon-containing precursors preferably those selected from the group consisting of HDMSO, tetramethylsilane, octamethyltetrasiloxane, tetramethyltetrasiloxane, tetraethoxysilane. It is preferred that silicon-containing precursors are not the only precursors, but only an admixture to hydrocarbon precursors.
- the substrate temperature during the deposition of the plasma polymer (PECVD deposited) layer is also important for the formation of a plasma oligomer, as is desired for the present invention: If this layer is too high or if it becomes too high during the deposition process, there is a risk of that the resulting plasma oligomer reacts immediately or too quickly and is therefore no longer available for the production of the layer composite according to the invention.
- the choice of substrate also plays a role in the generation of the plasma oligomers: substrates with good thermal conductivity properties or a good heat capacity are particularly suitable for the formation of the plasma oligomers, since the properties mentioned make it easier to avoid a substrate temperature that is too high.
- the competing reaction of the plasma oligomer with other reactants from the gas phase or on the substrate surface in the process according to the invention must also be checked and, if necessary, prevented.
- Adsorbate films of reactants and solvents such as water can lead to an undesirable reaction on the substrate surface.
- concentration of such reactants in the gas phase eg via the level of the air humidity
- the person skilled in the art applies the cover layer in time so that a plasma oligomer is still present.
- this can be determined using a drop test, which means that a plasma oligomer is present for the duration of this text as long as a drop of the dispersant removes a layer thickness of two nanometers within ten minutes when wetted. If in doubt, the specialist uses deionized water for this drop test.
- the application of the cover layer is also important for the formation of the composite according to the invention: the cover layer must be applied in a state that the cover layer material can be mixed with the plasma oligomers to form the mixture layer.
- the cover layer is deposited in liquid form and / or as a vapor deposition.
- the material for the cover layer is preferably solvent-based, particularly preferably at least part of the dispersant being a polar solvent.
- Preferred solvents are ethers such as triethylene glycol monomethyl ether
- the adhesion promoter area consisting of a plasma polymer layer and a mixed layer can be used for economical surface functionalization, whereby both surface and local treatment of the surface to be coated are possible.
- the plasma polymer layer specifically to the contact point for the electrical contact; this can be done in case of doubt suitable masks or targeted deposition take place.
- the plasma polymer layer can reliably ensure the physical decoupling of the metallic cover layer and the metallic substrate despite the existing mixed layer, so that the formation of mixed crystals is prevented.
- the resistance to the conventional nickel layer used in the prior art does not change negatively either.
- the top layer is preferably applied in the form of a metal-containing ink, in the context of the present invention a metal-containing ink being a dispersion of metal particles, preferably silver metal particles, in a dispersant.
- a particle-containing ink is ideally printable by suitable printers. It is particularly preferred that the particles in the particle-containing ink are nanoparticles.
- a particle in the sense of the present invention is a solid particle which consists of a substance or mixture of substances, preferably consisting of one or more metals, and which is surrounded by a continuous phase.
- the continuous phase can be solid, liquid or gaseous.
- a nanoparticle in the sense of the present invention is a particle in which the expansion of the particle is ⁇ 500 nm at least in one spatial direction.
- the nanoparticles preferably have dimensions of ⁇ 500 nm in all 3 spatial directions, more preferably ⁇ 100 nm, measured by means of scanning electron microscopy.
- a contact point according to the invention is preferred, wherein the metal substrate and / or the metallic cover layer comprise or consist of metal, selected from the group consisting of gold, silver and copper, tin, nickel, palladium, platinum, cobalt, molybdenum, chromium, Lithium and aluminum. Of course, alloys of these metals are also preferred in many cases.
- the cover layer comprises metal particles, it being further preferred that these metal particles are sintered. If the cover layer comprises metal particles, such particles can also be found in the mixed layer. The effects according to the invention, low contact resistance and good separation of the metals from the metal substrate and the cover layer can thus be achieved particularly well. It is preferred that the metallic particles are sintered. This leads to an additional adhesive strength of the metallic cover layer on the composite.
- a contact point according to the invention is preferred, the plasma polymer layer consisting of> 90 atom%, preferably> 95 atom%, more preferably> 97 atom% of C, O and N, measured by means of XPS and based on the total number the Ato me measurable with XPS.
- a contact point according to the invention is particularly preferred, the plasma-polymer layer having an O / C ratio of ⁇ 0.4, preferably ⁇ 0.2, more preferably ⁇ 0.1, based on the atoms measured by means of XPS and / or where the plasma-polymer layer is an N / C ratio ⁇ 0.3, preferably ⁇ 0.2, more preferably ⁇ 0.1, measured by means of XPS and based on the total number of atoms measurable with XPS.
- the plasma polymer layer is an aCH layer or at least one aCH-like layer, it being found that in some cases a certain minimum proportion of oxygen and / or nitrogen has an advantageous effect.
- This can be related to the formation of surface layers on the metal substrate (for example substoichiometric CuO layers), although this is not intended to be a binding theory.
- the plasma polymer layer has an O / C ratio> 0.05, preferably> 0.1 and more preferably> 0.2, based on the atoms measured by XPS and / or that the plasma polymer layer has an N / C ratio of> 0.05, preferably> 0.1, more preferably> 0.2, preferably measured on the atoms by means of XPS.
- a contact point according to the invention is particularly preferred in the present invention, the cover layer comprising silver metal particles and a concentration gradient of silver particles being present in the mixed layer.
- Silver metal particles have proven to be a particularly suitable material for the metallic cover layer.
- a contact point according to the invention is preferred, the plasma polymer layer and the mixed layer jointly having a thickness of 200 nm to 50 pm, preferably 1 gm to 20 pm, more preferably 3 pm to 10 pm.
- the resistance behavior of the contact point according to the invention is particularly good, at the same time there is good adhesive strength.
- a contact point according to the invention is preferred, wherein the plasma polymer layer consists of> 90 atom%, preferably> 95 atom%, more preferably> 97 atom% of C, measured by means of XPS and based on the total number of those measurable with XPS Atoms.
- Part of the invention is also the use of a combination of a plasma polymer layer (also, or in particular in the preferred forms) as defined above and a mixed layer (also in particular in the preferred forms) as defined above for connecting a metal substrate and a metallic cover layer, wherein preferably the metal substrate and the metallic cover layer are each configured as defined above in one of the preferred forms.
- Part of the invention is also a method for producing a contact point according to the invention, comprising the steps: a) providing a metal substrate, b) depositing a plasma polymer layer on the metal substrate, c) providing material for the metallic cover layer and d) applying the material for the Cover layer on the plasma polymer layer, so that a mixed layer as defined above is formed.
- the cover layer is formed from particles, sintering of the metal cover layer may be preferred.
- the method according to the invention is to be carried out in such a way that the material for the cover layer is applied at a point in time at which the plasma polymer layer is still in the oligomeric state. Please refer to the explanations above.
- a method according to the invention is preferred, wherein the substrate surface is cleaned and / or depassivated before step a).
- the metal substrate preferably a copper substrate, of z. B. Production-related contamination and oxide layers are exempt. According to the prior art, it would be e.g. B. possible, the metal substrate surfaces wet-chemical by pickling, z. B. in 95% sulfuric acid.
- a pretreatment of the metallic substrate material with a bath-free method such as. B. a laser treatment, a flame treatment with the reducing part of the flame or an atmospheric pressure plasma treatment with preferably reducing gases (such as forming gas).
- the metallic cover layer is applied to the plasma polymer layer (preferably in the form of an aCH-like layer) in the form of a solution or ink or paste containing metal particles, preferably with nanoparticles, the application preferably using a spray method, Knife application, roller application or a printing process.
- ink jet printing, pad printing or screen printing is particularly preferred.
- Nano- or microparticulate pastes with viscosities of> 1 Pa * s are preferably used to apply the metallic cover layer.
- Printable pastes preferably consist of a screen print carrier (vehicle), additives and the particulate metal, here in particular in the form of highly conductive materials, very particularly preferably silver.
- the particulate material is in powder form and is homogeneously dispersed in the screen print carrier. Particle sizes are usually in the range from ⁇ 10 pm to the nanoparticulate range.
- the composition of the paste is optimized for printing thin, highly conductive layers.
- particle-containing inks have viscosities of ⁇ 1 Pa * s.
- the inks preferably comprise metal particles, particularly preferably nanoparticles.
- a particularly preferred version of an ink containing nanoparticles is the printable silver ink DGP 40LT-15C from ANP. It is a nanoparticulate dispersion that has a concentration of 35% by weight of silver nanoparticles. The size of the individual particles is in the range ⁇ 50 nm. The specific resistance of the sintered silver layer is approximately 11 pOhm / cm.
- This ink is optimized for inkjet printing and is particularly suitable for the production of the metallic top layer.
- the metallic cover layer (and possibly also the entire composite) is annealed, preferably sintered, in the metallic cover layer following the application.
- Particularly preferred variants of sintering are photonic sintering, e.g. B.
- Sintering is preferably carried out in an inert environment, more preferably in a reducing environment, in order to prevent premature oxidation of the substrate material and / or top layer.
- Inert environments can produce noble gases or inert gases such as nitrogen.
- Milieu with a reducing effect typically contains hydrogen or can form hydrogen during treatment. Tempering and / or sintering can achieve particularly good layer adhesion and / or conductivity and / or aging resistance.
- the preferred sintering of the preferred ANP DGP 40LT-15C ink takes place at 120 ° C - 150 ° C for 30 - 60 min in a drying oven.
- photonic sintering is also suitable, which is based on the principle of the photothermal effect.
- the absorption of light by a nanoparticulate metal generates heat.
- the entirety of the electrons can be understood as a plasma, the collective excitation of an electron cloud being referred to as a plasmon.
- the surface plasmon resonance is the resonance vibration of the free, negatively charged electrons of the nanoparticles.
- SPR Surface plasmon resonance
- the latter effect corresponds to the heat diffusion from the metallic particle to the environment.
- the surface plasmon resonance depends on the size and shape of the nanoparticle, as well as on the dielectric properties of the metal or, in the case of dispersions, the liquid carrier medium.
- part of the invention also includes composites of metal substrate and plasma polymer layer, metallic cover layer and mixed layer arranged between the metallic cover layer and the plasma polymer layer, as defined above, which are produced or can be produced by the method according to the invention.
- preferred substrate material is copper (Cu), often with a small oxide layer on its surface.
- this oxide layer belongs to the metal substrate layer.
- a carbon-containing (and optionally also oxygen-containing) layer in plasma polymer form is preferably present on the copper layer.
- Their layer thickness is typically a few 10 nm (see above).
- the first layer of silver nanoparticles is embedded in the plasma polymer layer in the form of a transition layer (mixed layer).
- the silver particles are present in the form of a metallic cover layer, these being preferably loosely or densely sintered, depending on the sintering process.
- the contact resistance is ⁇ 0.5 mOhm, preferably ⁇ 0.4 mOhm.
- Example 1 (not according to the invention) Measurement of the contact resistance according to the prior art
- the measurement is carried out using a 4-point measurement at a SUSS MircoTec measuring station.
- the measuring device for the 4-wire measurement is a Keithley 2001 multimeter.
- a known electrical current flows through the resistor via two of the lines.
- the voltage drop across the resistor is tapped with high impedance via two further lines and measured with a voltage measuring device; the resistance to be measured is then calculated according to Ohm's law.
- Two measuring tips are placed on the substrate and the other two on the top layer - or the plasma polymer layer.
- a sample produced according to the state of the art (Cu substrate; alloy Cu-HCP Cu content: 99.95%) was used as the measurement object. This was pickled, electroplated with a nickel layer of 1 pm and a silver layer of 4 gm. The resulting contact resistance was 0.4 + - 0.1 mOhm.
- Example 2 Establishing a contact point
- a copper substrate (alloy Cu-HCP Cu content: 99.95%) was pickled in 95% sulfuric acid at room temperature for 10 minutes and then rinsed thoroughly with deionized water. After drying, the substrate was coated using atmospheric pressure plasma.
- a plasma system from Plasmatreat consisting of a generator FG 5001, a nozzle PFW10 and a transformer HTR 12 and a nozzle head analogous to DE 10 2014 219 979 A1 was used.
- Nitrogen (29 l / min) was used as the process gas, acetylene (1 l / min) as the precursor, which was fed directly into the nozzle head (afterglow area). 60 m / min with a line spacing of 2 mm was selected as the coating speed.
- Distance to the substrate to be coated from the nozzle outlet 6mm
- PCT Plasma Cycle Time, where a Value of 100% is defined so that the plasma pulse duration is selected as the maximum for the generator type used).
- the printing system was a Dimatix DMP-2831 inkjet printer. This has individually refillable print cartridges with 1.5 ml maximum content and 16 pressure nozzles. The printing process takes place at a distance of 1 mm from the substrate heated to 35 ° C. The drop spacing is 40 pm.
- the coated substrate was annealed in a forced air oven at 150 ° C. for 30 minutes.
- the resulting contact resistance was 0.4 + - 0.1 mOhm.
- the silver layer could be removed from the substrate using a fingernail.
- the copper substrate from Example 2 was pickled for 10 minutes in 95% sulfuric acid at room temperature and then rinsed thoroughly with deionized water.
- the substrate was coated using atmospheric pressure plasma as in Example 2.
- Example 2 The metallic cover layer was then applied as in Example 2. After application of the silver nano ink, the coated substrate was sintered in an oven at 250 ° C. under hydrogen for 30 minutes.
- the resulting contact resistance was 0.4 + - 0.1 mOhm.
- Example 4 Production of a contact point
- a composite produced according to Example 3 is treated as follows:
- the silver layer could not be removed from the substrate using a fingernail.
- Example 5 Production of a contact point (not according to the invention)
- the copper substrate from Example 2 was pickled in 95% sulfuric acid at room temperature for 10 minutes and then rinsed thoroughly with deionized water. A silver layer was applied to this freshly pickled Cu substrate every 30 minutes. The ANP DGP 40LT-15C nanosilver ink was used for this.
- the printing system is a DMP-2831 inkjet printer from Dimatix. This has individually refillable print cartridges with 1.5 ml maximum content and 16 pressure nozzles. The printing process takes place at a distance of 1 mm from the substrate heated to 35 ° C. The drop spacing is 40 ⁇ m.
- the substrate coated in this way was sintered in an oven at 250 ° C. under hydrogen for 30 min.
- the resulting contact resistance was 0.4 + - 0.1 mOhm.
- the silver layer could not be removed from the substrate using a fingernail.
- Example 6 Characterization of the layer structure before aging
- TEM lamellae were produced from the samples from examples 2, 3, 4 by means of Fast Ion Bombardment (FIB). These TEM lamellae were analyzed using TEM / EDX. Both the silver layer and the copper substrate appear dense and homogeneous at a distance of 1 pm from the material transition zone (mixed layer).
- FIB Fast Ion Bombardment
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Abstract
Description
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DE102018131228.8A DE102018131228A1 (de) | 2018-12-06 | 2018-12-06 | Kontaktstelle für einen elektrischen Kontakt |
PCT/EP2019/084007 WO2020115287A1 (de) | 2018-12-06 | 2019-12-06 | Kontaktstelle für einen elektrischen kontakt |
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DE2847620C2 (de) * | 1978-11-02 | 1984-10-18 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung zur Herstellung von elektrischen Bauelementen, insbesondere Schichtkondensatoren |
DE2848480C2 (de) * | 1978-11-08 | 1984-11-08 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung zum Aufbringen von Schichten auf Träger unter Vakuum |
JPS56163127A (en) * | 1980-05-21 | 1981-12-15 | Japan Synthetic Rubber Co Ltd | Treatment of polymer |
DD270147A1 (de) * | 1988-03-14 | 1989-07-19 | Leuna Werke Veb | Kapazitiver feuchtefuehler zum nachweis kleinster wassermengen in organischen loesungen |
DE19748240C2 (de) | 1997-10-31 | 2001-05-23 | Fraunhofer Ges Forschung | Verfahren zur korrosionsfesten Beschichtung von Metallsubstraten mittels Plasmapolymerisation und dessen Anwendung |
DE19917717C2 (de) * | 1999-04-20 | 2002-10-17 | Joerg Mueller | Kapazitiver Feuchtesensor |
DE102006038780A1 (de) | 2006-08-18 | 2008-02-21 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zum Herstellen einer Beschichtung |
DE102009048397A1 (de) | 2009-10-06 | 2011-04-07 | Plasmatreat Gmbh | Atmosphärendruckplasmaverfahren zur Herstellung oberflächenmodifizierter Partikel und von Beschichtungen |
DE102013216282B4 (de) * | 2013-08-16 | 2020-10-01 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Elektrisches Bauteil mit einer elektrisch zu kontaktierenden Stelle sowie Verfahren zur Vorbereitung eines elektrischen Bauteils für einen Lötprozess und Verwendung einer entsprechenden Matrix |
DE102014219979A1 (de) | 2014-10-01 | 2016-04-07 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verbund aus Substrat, plasmapolymerer Schicht, Mischschicht und Deckschicht |
-
2018
- 2018-12-06 DE DE102018131228.8A patent/DE102018131228A1/de active Pending
-
2019
- 2019-12-06 WO PCT/EP2019/084007 patent/WO2020115287A1/de unknown
- 2019-12-06 EP EP19818010.1A patent/EP3892072A1/de active Pending
Also Published As
Publication number | Publication date |
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DE102018131228A1 (de) | 2020-06-10 |
WO2020115287A1 (de) | 2020-06-11 |
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