EP3875941A4 - Messvorrichtung - Google Patents

Messvorrichtung Download PDF

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Publication number
EP3875941A4
EP3875941A4 EP19877709.6A EP19877709A EP3875941A4 EP 3875941 A4 EP3875941 A4 EP 3875941A4 EP 19877709 A EP19877709 A EP 19877709A EP 3875941 A4 EP3875941 A4 EP 3875941A4
Authority
EP
European Patent Office
Prior art keywords
measuring device
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP19877709.6A
Other languages
English (en)
French (fr)
Other versions
EP3875941B1 (de
EP3875941A1 (de
Inventor
Yuji Masuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Publication of EP3875941A1 publication Critical patent/EP3875941A1/de
Publication of EP3875941A4 publication Critical patent/EP3875941A4/de
Application granted granted Critical
Publication of EP3875941B1 publication Critical patent/EP3875941B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N35/00069—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides whereby the sample substrate is of the bio-disk type, i.e. having the format of an optical disk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/01—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/075—Investigating concentration of particle suspensions by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N2015/0687—Investigating concentration of particle suspensions in solutions, e.g. non volatile residue
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00158—Elements containing microarrays, i.e. "biochip"

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP19877709.6A 2018-10-29 2019-10-23 Messvorrichtung Active EP3875941B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018202597 2018-10-29
PCT/JP2019/041522 WO2020090582A1 (ja) 2018-10-29 2019-10-23 計測装置

Publications (3)

Publication Number Publication Date
EP3875941A1 EP3875941A1 (de) 2021-09-08
EP3875941A4 true EP3875941A4 (de) 2022-08-17
EP3875941B1 EP3875941B1 (de) 2024-07-10

Family

ID=70464490

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19877709.6A Active EP3875941B1 (de) 2018-10-29 2019-10-23 Messvorrichtung

Country Status (5)

Country Link
US (1) US11802826B2 (de)
EP (1) EP3875941B1 (de)
JP (1) JP7066001B2 (de)
CN (1) CN112888931B (de)
WO (1) WO2020090582A1 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11255770B2 (en) * 2018-01-30 2022-02-22 Kyocera Corporation Measurement apparatus

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008209353A (ja) * 2007-02-28 2008-09-11 Denso Corp 液体性状検出方法
WO2016132222A2 (en) * 2015-02-19 2016-08-25 Premium Genetics (Uk) Ltd. Scanning infrared measurement system
WO2017221986A1 (ja) * 2016-06-22 2017-12-28 京セラ株式会社 微粒子計測器

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US4063097A (en) * 1976-09-16 1977-12-13 General Electric Company X-ray body scanner for computerized tomography comprising inner fluid container surrounded by outer fluid container
US4234539A (en) * 1979-08-23 1980-11-18 Coulter Electronics, Inc. Apparatus for monitoring chemical reactions and employing moving photometer means
US4623797A (en) * 1983-06-27 1986-11-18 Mts Vektronics Corporation Event scanning
US5727111A (en) * 1995-06-19 1998-03-10 Sony Corporation Optical pick-up and light detecting cover therefor
JP3337404B2 (ja) * 1997-09-22 2002-10-21 シャープ株式会社 感度補正機能付きほこりセンサ装置
US7423750B2 (en) * 2001-11-29 2008-09-09 Applera Corporation Configurations, systems, and methods for optical scanning with at least one first relative angular motion and at least one second angular motion or at least one linear motion
JP4033589B2 (ja) 1999-09-06 2008-01-16 隆史 伊永 分子拡散を用いた反応法およびその装置
US7294513B2 (en) * 2002-07-24 2007-11-13 Wyatt Technology Corporation Method and apparatus for characterizing solutions of small particles
US7724356B2 (en) * 2005-05-13 2010-05-25 Showa Denko K.K. Apparatus for measuring differential refractive index
DE102006043977A1 (de) * 2006-09-19 2008-03-27 Sick Ag Optoelektronische Sensoreinheit und Verfahren zum Betreiben einer optoelektronischen Sensoreinheit
JP4663614B2 (ja) * 2006-10-18 2011-04-06 株式会社日立メディアエレクトロニクス 光ピックアップおよび光学的情報記録再生装置
JP2009014702A (ja) * 2007-06-06 2009-01-22 Hitachi Ltd 微粒子検出装置及び微粒子検出方法
JP2009002830A (ja) * 2007-06-22 2009-01-08 Hitachi Omron Terminal Solutions Corp 発光量を補正可能な光センサ、それを用いた紙葉類識別装置及びその補正方法
JP2009145022A (ja) 2007-12-18 2009-07-02 Daikin Ind Ltd 調湿装置
WO2009145022A1 (ja) 2008-05-27 2009-12-03 コニカミノルタエムジー株式会社 微細流路を備えたマイクロチップ
GB2517322B (en) * 2009-05-27 2016-02-24 Silixa Ltd Apparatus for optical sensing
DE102009043524A1 (de) * 2009-09-30 2011-03-31 Siemens Healthcare Diagnostics Products Gmbh Vorrichtung für die photometrische Untersuchung von Proben
JP5567526B2 (ja) * 2010-11-12 2014-08-06 株式会社日立ハイテクノロジーズ 分析装置および分析方法
JP6239243B2 (ja) * 2013-02-08 2017-11-29 エフ．ホフマン−ラ ロシュ アーゲーＦ． Ｈｏｆｆｍａｎｎ−Ｌａ Ｒｏｃｈｅ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ 自動分析装置
JP6081830B2 (ja) * 2013-03-12 2017-02-15 新日本無線株式会社 反射型フォトセンサを用いた位置検出装置
US9140648B2 (en) * 2013-03-12 2015-09-22 Ecolab Usa Inc. Fluorometer with multiple detection channels
US10705008B2 (en) * 2013-03-15 2020-07-07 Iris International, Inc. Autofocus systems and methods for particle analysis in blood samples
JP6082329B2 (ja) * 2013-08-07 2017-02-15 倉敷紡績株式会社 濃度測定装置及び濃度測定方法
JP6620983B2 (ja) * 2015-12-28 2019-12-18 パナソニックＩｐマネジメント株式会社 粒子検出センサ
CN112041076B (zh) * 2018-04-23 2023-04-18 迈恩医疗解决方案有限公司 用于从液体介质获得测量信号的自动分析器和光学测量方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008209353A (ja) * 2007-02-28 2008-09-11 Denso Corp 液体性状検出方法
WO2016132222A2 (en) * 2015-02-19 2016-08-25 Premium Genetics (Uk) Ltd. Scanning infrared measurement system
WO2017221986A1 (ja) * 2016-06-22 2017-12-28 京セラ株式会社 微粒子計測器
EP3477284A1 (de) * 2016-06-22 2019-05-01 Kyocera Corporation Instrument zur feinpartikelmessung

Also Published As

Publication number Publication date
US11802826B2 (en) 2023-10-31
JPWO2020090582A1 (ja) 2021-09-16
EP3875941B1 (de) 2024-07-10
WO2020090582A1 (ja) 2020-05-07
US20220018751A1 (en) 2022-01-20
CN112888931A (zh) 2021-06-01
EP3875941A1 (de) 2021-09-08
JP7066001B2 (ja) 2022-05-12
CN112888931B (zh) 2024-07-23

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