EP3635468A4 - Kalibrierung einer objektivlinse eines rasterelektronenmikroskops - Google Patents
Kalibrierung einer objektivlinse eines rasterelektronenmikroskops Download PDFInfo
- Publication number
- EP3635468A4 EP3635468A4 EP18823715.0A EP18823715A EP3635468A4 EP 3635468 A4 EP3635468 A4 EP 3635468A4 EP 18823715 A EP18823715 A EP 18823715A EP 3635468 A4 EP3635468 A4 EP 3635468A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- objective lens
- electron microscope
- scanning electron
- microscope objective
- lens calibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/02—Objectives
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/62—Optical apparatus specially adapted for adjusting optical elements during the assembly of optical systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/64—Imaging systems using optical elements for stabilisation of the lateral and angular position of the image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/045—Combinations of networks
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/08—Learning methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/10—Lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
- H01J37/1471—Arrangements for directing or deflecting the discharge along a desired path for centering, aligning or positioning of ray or beam
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical or photographic arrangements associated with the tube
- H01J37/222—Image processing arrangements associated with the tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical or photographic arrangements associated with the tube
- H01J37/226—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/3002—Details
- H01J37/3007—Electron or ion-optical systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/15—Means for deflecting or directing discharge
- H01J2237/1501—Beam alignment means or procedures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/282—Determination of microscope properties
- H01J2237/2826—Calibration
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0105—Tin [Sn]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Biophysics (AREA)
- General Health & Medical Sciences (AREA)
- Biomedical Technology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Computational Linguistics (AREA)
- Data Mining & Analysis (AREA)
- Evolutionary Computation (AREA)
- Artificial Intelligence (AREA)
- Molecular Biology (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Software Systems (AREA)
- Health & Medical Sciences (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762526804P | 2017-06-29 | 2017-06-29 | |
US15/672,797 US10790114B2 (en) | 2017-06-29 | 2017-08-09 | Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages |
PCT/US2018/040166 WO2019006225A1 (en) | 2017-06-29 | 2018-06-29 | SCANNING ELECTRONIC MICROSCOPE LENS CALIBRATION |
Publications (2)
Publication Number | Publication Date |
---|---|
EP3635468A1 EP3635468A1 (de) | 2020-04-15 |
EP3635468A4 true EP3635468A4 (de) | 2021-03-10 |
Family
ID=64734421
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP18823715.0A Pending EP3635468A4 (de) | 2017-06-29 | 2018-06-29 | Kalibrierung einer objektivlinse eines rasterelektronenmikroskops |
Country Status (9)
Country | Link |
---|---|
US (1) | US10790114B2 (de) |
EP (1) | EP3635468A4 (de) |
JP (1) | JP7030856B2 (de) |
KR (1) | KR102363558B1 (de) |
CN (1) | CN110770624B (de) |
IL (1) | IL271541B (de) |
SG (1) | SG11201912704YA (de) |
TW (1) | TWI772449B (de) |
WO (1) | WO2019006225A1 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3951832A1 (de) * | 2020-08-03 | 2022-02-09 | FEI Company | Verfahren zur ausrichtung einer ladungsteilchenstrahlvorrichtung |
US20230345115A1 (en) * | 2020-09-21 | 2023-10-26 | Molecular Devices, Llc | Method and system of developing an imaging configuration to optimize performance of a microscopy system |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0969350A (ja) * | 1995-08-31 | 1997-03-11 | Hitachi Ltd | 走査電子顕微鏡の光軸合わせ装置 |
US20050006598A1 (en) * | 2001-10-10 | 2005-01-13 | Asher Pearl | Method and device for aligning a charged particle beam column |
US20070284542A1 (en) * | 2006-03-08 | 2007-12-13 | Takeshi Ogashiwa | Charged particle beam apparatus and method for charged particle beam adjustment |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5627373A (en) * | 1996-06-17 | 1997-05-06 | Hewlett-Packard Company | Automatic electron beam alignment and astigmatism correction in scanning electron microscope |
KR100191347B1 (ko) * | 1996-08-09 | 1999-06-15 | 윤종용 | 반도체 공정의 주사전자현미경 관리용 미세선폭 관리시료 |
US6066849A (en) * | 1997-01-16 | 2000-05-23 | Kla Tencor | Scanning electron beam microscope |
US6744268B2 (en) * | 1998-08-27 | 2004-06-01 | The Micromanipulator Company, Inc. | High resolution analytical probe station |
US6198299B1 (en) * | 1998-08-27 | 2001-03-06 | The Micromanipulator Company, Inc. | High Resolution analytical probe station |
JP3802716B2 (ja) * | 1999-09-17 | 2006-07-26 | 株式会社日立製作所 | 試料の検査方法及びその装置 |
WO2003032351A2 (en) * | 2001-10-10 | 2003-04-17 | Applied Materials Isreal Limited | Method and device for aligning a charged particle beam column |
JP4737968B2 (ja) * | 2004-10-13 | 2011-08-03 | 株式会社東芝 | 補正装置、補正方法、補正プログラム及び半導体装置の製造方法 |
NL1029847C2 (nl) * | 2005-09-01 | 2007-03-05 | Fei Co | Werkwijze voor het bepalen van lensfouten in een deeltjes-optisch apparaat. |
JP4920268B2 (ja) * | 2006-02-23 | 2012-04-18 | 株式会社日立ハイテクノロジーズ | 半導体プロセスモニタ方法およびそのシステム |
JP4928987B2 (ja) * | 2006-03-08 | 2012-05-09 | 株式会社日立ハイテクノロジーズ | 荷電粒子線調整方法及び荷電粒子線装置 |
JP5241353B2 (ja) | 2007-07-31 | 2013-07-17 | 株式会社日立ハイテクノロジーズ | 走査型電子顕微鏡の調整方法、及び走査電子顕微鏡 |
US8080790B2 (en) | 2008-03-05 | 2011-12-20 | Hitachi High-Technologies Corporation | Scanning electron microscope |
JP5715873B2 (ja) * | 2011-04-20 | 2015-05-13 | 株式会社日立ハイテクノロジーズ | 欠陥分類方法及び欠陥分類システム |
JP5401521B2 (ja) * | 2011-09-05 | 2014-01-29 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
WO2013122022A1 (ja) * | 2012-02-14 | 2013-08-22 | 株式会社 日立ハイテクノロジーズ | 画像評価装置及びパターン形状評価装置 |
US8969827B2 (en) * | 2012-07-09 | 2015-03-03 | Materials Analysis Technology (Us) Corp. | Specimen preparation for transmission electron microscopy |
US9098891B2 (en) * | 2013-04-08 | 2015-08-04 | Kla-Tencor Corp. | Adaptive sampling for semiconductor inspection recipe creation, defect review, and metrology |
KR102352023B1 (ko) * | 2014-06-25 | 2022-01-14 | 디씨지 시스템스 인코포레이티드 | 반도체 웨이퍼 상에서 인-라인 나노프로빙을 수행하기 위한 시스템 및 반도체에서 디바이스들의 전기적 테스팅을 수행하는 방법 |
CN107300629B (zh) * | 2017-07-31 | 2019-07-09 | 清华大学 | 扫描探针标定方法 |
-
2017
- 2017-08-09 US US15/672,797 patent/US10790114B2/en active Active
-
2018
- 2018-06-28 TW TW107122259A patent/TWI772449B/zh active
- 2018-06-29 KR KR1020207002661A patent/KR102363558B1/ko active IP Right Grant
- 2018-06-29 WO PCT/US2018/040166 patent/WO2019006225A1/en unknown
- 2018-06-29 CN CN201880039286.0A patent/CN110770624B/zh active Active
- 2018-06-29 JP JP2019571335A patent/JP7030856B2/ja active Active
- 2018-06-29 SG SG11201912704YA patent/SG11201912704YA/en unknown
- 2018-06-29 EP EP18823715.0A patent/EP3635468A4/de active Pending
-
2019
- 2019-12-18 IL IL271541A patent/IL271541B/en unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0969350A (ja) * | 1995-08-31 | 1997-03-11 | Hitachi Ltd | 走査電子顕微鏡の光軸合わせ装置 |
US20050006598A1 (en) * | 2001-10-10 | 2005-01-13 | Asher Pearl | Method and device for aligning a charged particle beam column |
US20070284542A1 (en) * | 2006-03-08 | 2007-12-13 | Takeshi Ogashiwa | Charged particle beam apparatus and method for charged particle beam adjustment |
Non-Patent Citations (3)
Title |
---|
CARSON K R ET AL: "An improved standard specimen for aligment of electron microscopes", JOURNAL OF SCIENTIFIC INSTRUMENTS, INSTITUTE OF PHYSICS. LONDON, GB, vol. 44, no. 12, 1 December 1967 (1967-12-01), pages 1036 - 1037, XP002377750 * |
MARIA RUDNAYA: "Automated Focusing and Astigmatism Correction in Electron Microsopy; PhD Thesis, Eindhoven University of Technology", 1 September 2011 (2011-09-01), XP055026402, ISBN: 978-9-03-862610-9, Retrieved from the Internet <URL:http://alexandria.tue.nl/extra2/716361.pdf> [retrieved on 20120507] * |
See also references of WO2019006225A1 * |
Also Published As
Publication number | Publication date |
---|---|
US10790114B2 (en) | 2020-09-29 |
TWI772449B (zh) | 2022-08-01 |
WO2019006225A1 (en) | 2019-01-03 |
CN110770624A (zh) | 2020-02-07 |
TW201907436A (zh) | 2019-02-16 |
KR102363558B1 (ko) | 2022-02-17 |
JP2020526872A (ja) | 2020-08-31 |
SG11201912704YA (en) | 2020-01-30 |
CN110770624B (zh) | 2021-10-08 |
KR20200014444A (ko) | 2020-02-10 |
JP7030856B2 (ja) | 2022-03-07 |
US20190004298A1 (en) | 2019-01-03 |
IL271541A (en) | 2020-02-27 |
EP3635468A1 (de) | 2020-04-15 |
IL271541B (en) | 2022-04-01 |
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Legal Events
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STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
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PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
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17P | Request for examination filed |
Effective date: 20200110 |
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AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
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RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: WANG, JIANWEI Inventor name: HONJO, ICHIRO Inventor name: HA, THANH Inventor name: SEARS, CHRISTOPHER Inventor name: YANG, HEDONG Inventor name: XU, HUINA |
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REG | Reference to a national code |
Ref country code: DE Ref legal event code: R079 Free format text: PREVIOUS MAIN CLASS: G02B0021020000 Ipc: H01J0037147000 |
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A4 | Supplementary search report drawn up and despatched |
Effective date: 20210210 |
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RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01J 37/28 20060101ALN20210204BHEP Ipc: G06N 3/08 20060101ALN20210204BHEP Ipc: H01J 37/22 20060101ALI20210204BHEP Ipc: G06N 3/04 20060101ALN20210204BHEP Ipc: H01J 37/10 20060101ALN20210204BHEP Ipc: H01J 37/147 20060101AFI20210204BHEP |
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P01 | Opt-out of the competence of the unified patent court (upc) registered |
Effective date: 20230526 |