EP3599619A1 - Cible de production de rayons x, émetteur de rayons x et procédé de production de rayons x - Google Patents

Cible de production de rayons x, émetteur de rayons x et procédé de production de rayons x Download PDF

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Publication number
EP3599619A1
EP3599619A1 EP18185506.5A EP18185506A EP3599619A1 EP 3599619 A1 EP3599619 A1 EP 3599619A1 EP 18185506 A EP18185506 A EP 18185506A EP 3599619 A1 EP3599619 A1 EP 3599619A1
Authority
EP
European Patent Office
Prior art keywords
target
layer
metallic element
particle stream
layer structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP18185506.5A
Other languages
German (de)
English (en)
Inventor
Marvin Möller
Benno Cyliax
Martin Koschmieder
Sven Müller
Stefan Willing
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Healthineers AG
Original Assignee
Siemens Healthcare GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Healthcare GmbH filed Critical Siemens Healthcare GmbH
Priority to EP18185506.5A priority Critical patent/EP3599619A1/fr
Priority to US16/519,245 priority patent/US10886096B2/en
Priority to CN201910676447.3A priority patent/CN110783160B/zh
Publication of EP3599619A1 publication Critical patent/EP3599619A1/fr
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/081—Target material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/088—Laminated targets, e.g. plurality of emitting layers of unique or differing materials

Definitions

  • the invention relates to a target for generating X-rays by exposure to a particle stream containing charged particles, in particular electrons.
  • the invention further relates to an X-ray emitter having a particle source emitting a particle stream and an acceleration device, in particular an acceleration device comprising a plurality of coupled cavity resonators, which is designed to generate a particle stream directed at the target.
  • the invention further relates to a method for generating X-rays by applying a charged particle stream, in particular electrons, to the target stream.
  • x-ray emitters in particular high-energy x-ray emitters, to provide x-rays in the MeV range, in medical and in non-medical applications.
  • X-ray radiation or brake radiation is generated in a known manner by applying a particle stream of accelerated and charged particles, usually electrons, to a target. The particles are slowed down so that they emit part of their kinetic energy as photons or X-rays.
  • Linear accelerators are used in particular to accelerate the charged particles or electrons.
  • a medical application for X-rays generated in this way relates to radiation therapy.
  • Another, technical field of application concerns non-destructive Material testing or the screening of objects, in particular as part of an imaging security check or as part of an imaging inspection of freight.
  • screening systems are known in which linear accelerators are used to generate photons in the MeV range.
  • the X-ray radiation attenuated when the object is irradiated is detected by an X-ray detector in a spatially resolved manner.
  • This object is achieved by a target for generating x-rays according to claim 1, a linear accelerator according to claim 6 and a method for generating x-rays according to claim 11.
  • a target for generating X-ray radiation by exposure to a particle stream containing charged particles, in particular electrons, has at least two metallic layers Layer structure.
  • a target surface which can be acted upon by the particle stream is formed by a first layer of the layer structure, which consists of a material comprising a first metallic element.
  • a second layer of the layer structure consists of a material comprising a second metallic element. The atomic number of the first metallic element is smaller than the atomic number of the second metallic element.
  • the invention is based on the knowledge that the interaction of the accelerated particles, in particular electrons, with the atoms in the material of the target with a given acceleration of the particles, that is to say with a given acceleration voltage, significantly influences the emission of photons or X-ray quanta inside and outside the useful radiation field.
  • the interaction between the particle stream and the material of the target determines the proportion and the energy of the backscattered particles. It has now been shown that these backscattered particles (also: secondary electrons) are responsible for a significant proportion of the leakage and scattered radiation outside the useful radiation field, since these are braked at other points in one of the surrounding materials and thus for the emission of electromagnetic radiation, especially X-rays.
  • the essence of the invention is to reduce the energy of the backscattered particles by a targeted arrangement of different materials in the target. As a result, a substantial reduction in mass can then be achieved by reducing the shielding, in particular against the beam direction of the incident particle stream.
  • the target according to the invention is constructed in such a way that the proportion of backscattered particles or electrodes is reduced compared to the known approach with a comparable useful radiation field.
  • the interaction of the accelerated particles with different materials For metallic elements with a large atomic number (also: atomic number, atom number, proton number) this interaction is generally stronger than with metallic elements with a lower atomic number. This means that both the deflection of the particles as a function of the penetration depth and the yield of X-rays generated differ.
  • the target would thus have to be designed in such a way that the target surface to which the particle stream is applied or which can be applied consists of a material which comprises elements with the greatest possible atomic number.
  • the design of the target is characterized by the fact that a material with a smaller atomic number is upstream from the point of view of the incident particle stream.
  • the target surface that can be acted upon is formed by the first layer, the material of which has metallic elements with a smaller atomic number.
  • the second layer in particular immediately adjacent to the first layer, accordingly comprises metallic elements with a larger atomic number.
  • the layer structure of the target comprises at least two layers.
  • the target is formed by a layer structure with exactly two layers.
  • the atomic number of the first metallic element is less than 36 and the atomic number of the second metallic element is more than 36.
  • the first metallic element is, for example, a metal of the third or fourth period, such as copper (Cu).
  • the second metallic element is, for example, a fifth or sixth period metal, such as tungsten (W).
  • the difference between the atomic number of the second metallic element and the atomic number of the first metallic element is at least 18.
  • the first and second material is a metal or a metal alloy.
  • the first and / or second material is a homogeneous metal, this can in particular be formed by the first and / or second metallic element. If the first and / or second material is a metal alloy, the first and / or second metallic element is accordingly a component of the metal alloy.
  • the first metallic element is copper and the second metallic element is tungsten.
  • the first layer can in particular consist of a metal alloy containing copper.
  • the second layer can in particular consist of a metal alloy containing tungsten.
  • the first layer can essentially consist of elemental copper and the first layer essentially of elementary tungsten. The term “essentially” is to be understood in such a way that impurities due to foreign metals and / or oxidation are also included.
  • a layer thickness of the first layer is in the range between 0.3 to 0.7 times the range of electrons in the material from which the first layer is formed.
  • a layer thickness of the second layer is accordingly likewise preferably in the range between 0.3 and 0.7 times the range of electrons in the material from which the second layer is formed.
  • the layer thickness of the first layer is thus chosen in particular as a function of the average particle energy of the particle stream acting on the target such that at least a substantial proportion of the incident particles penetrate the first layer. In other words, the mean penetration depth of the incident particles is greater than the layer thickness of the first layer.
  • the average particle energy is particularly in the range of MeV.
  • the transition from the at least one first layer to the at least one second layer does not necessarily have to run abruptly; rather, one embodiment can provide that the material composition of the target changes continuously from the first to the second layer.
  • Generative manufacturing methods such as sintering, selective laser melting or 3D printing are particularly suitable for producing such targets with a varying material composition.
  • An x-ray emitter with a particle source emitting a particle stream and an acceleration device, in particular an acceleration device of a linear accelerator comprising a plurality of coupled cavity resonators, is designed to generate a particle stream directed at a target, in particular at the above-mentioned target.
  • the target has a layer structure comprising at least two metallic layers, the target surface which can be acted upon by the particle stream being formed by the first layer of the layer structure, which consists of the material comprising the first metallic element.
  • the second layer of the layer structure is formed from the material comprising the second metallic element, the atomic number of the first metallic element being smaller is the atomic number of the second metallic element.
  • the particle stream acting on the target surface is aligned along a beam axis which is essentially perpendicular to the at least two layers of the layer structure.
  • the first and second layers are in particular directly adjacent to one another and, for example, run plane-parallel to one another.
  • the acceleration device is designed to accelerate the particles in the particle stream to an average particle energy in the range of MeV, in particular in the range of more than 1MeV and less than 20MeV.
  • the target is applied in particular in such a way that the radiation of the X-ray or brake radiation largely takes place in the direction of the incident particle stream, that is to say after the target has been irradiated at least in sections.
  • the target can also be referred to as a transmission target.
  • the mean particle energy is to be selected accordingly as a function of the layer thicknesses of at least the first and second layers.
  • the target for radiating X-rays is arranged in a solid angle range of less than 60 ° around the beam axis, preferably of about 35 ° around the beam axis, in particular in the direction, that is, in an imaginary extension of the particle stream acting on the target surface.
  • the useful radiation field and the incident particle stream are arranged on opposite sides of the target.
  • a method for generating X-ray radiation by applying a charged particle, in particular electrons, to a target, in particular the already described target, is characterized in that the target has a layer structure comprising at least two metallic layers.
  • the target surface acted upon by the particle stream is formed by the first layer of the layer structure.
  • the first layer consists of the material comprising the first metallic element and the second layer of the layer structure consists of the material comprising the second metallic element.
  • the atomic number of the first metallic element is smaller than the atomic number of the second metallic element.
  • the advantages of the method using a target designed and aligned in this way result directly from the previous description with reference to the corresponding device.
  • the yield of X-radiation per incident particle changes.
  • the proportion of the X-radiation emitted in the direction of the beam axis that is to say in the forward direction of the particle stream, is changed in relation to the particles scattered in the reverse direction.
  • the proportion of particles scattered in the backward direction can be or electrons, in particular compared to known methods.
  • the particle stream acting on the target surface is aligned along a beam axis which is essentially perpendicular to the at least two layers of the layer structure.
  • the second layer can in particular form a side of the target facing away from the particle stream.
  • the target for radiating X-rays is arranged in a solid angle range of less than 60 ° around the beam axis, preferably of about 35 ° around the beam axis, in particular in the direction of the particle stream acting on the target surface.
  • the useful radiation field and the incident particle stream are arranged on opposite sides of the target.
  • the particles in the particle stream are accelerated to an average particle energy in the range of MeV, in particular in the range of more than 1MeV and less than 20MeV, with the aid of an acceleration device, in particular with the aid of an acceleration device of a linear accelerator comprising several coupled cavity resonators.
  • a particle stream is preferably generated with which brake or X-ray radiation can be generated in a spectral range which is suitable for screening massive containers, such as in particular the freight containers, freight containers or railroad cars commonly used in goods traffic.
  • the x-ray radiation generated, in particular brake radiation is provided for the non-destructive testing of materials, for the imaging inspection of freight and / or for medical radiation therapy.
  • Figure 1 shows the basic structure of an X-ray emitter 10 with a target 11, which is acted upon by a particularly pulsed particle stream of charged particles e, in order to generate X-ray or brake radiation ⁇ .
  • the pulse or pulsed particle stream e of charged particles - in the present
  • electrons can be generated by means of the linear accelerator 1, which comprises a particle source 2, for example an electron gun, and an acceleration device 3, for example an accelerator tube with a plurality of coupled cavity resonators 4, in particular for generating electromagnetic traveling waves.
  • the linear accelerator 1 which comprises a particle source 2, for example an electron gun, and an acceleration device 3, for example an accelerator tube with a plurality of coupled cavity resonators 4, in particular for generating electromagnetic traveling waves.
  • a power supply 5 supplies the accelerating device 3 with a high-frequency power in order to generate a high-frequency alternating field for accelerating the particle flow within the coupled cavity resonators 4, which alternating field is injected or injected into the accelerating device by the particle source 2 at predetermined times.
  • the supply of high-frequency power can in particular periodically, i. H. in the form of high-frequency pulses supplied by the acceleration device 3.
  • a controller or control device 6 is connected both to the particle source 2 and to the energy supply 5 and is designed to synchronize the coupling or "shooting in” of the particle stream into the acceleration device 3 with respect to the periodically supplied high-frequency power.
  • the particle stream e is directed parallel to the beam axis A at the target 11.
  • the useful beam field N for the generated x-ray radiation ⁇ is essentially limited to a conical solid angle region around the beam axis A, the opening angle ⁇ between the conical surface enclosing the solid angle region and the beam axis A being 60 ° or less.
  • the target 11 has a layer structure S which is shown in detail in Figure 2 is shown.
  • the target 11 is formed by two essentially homogeneous layers S1, S2.
  • the material of the first layer S1 comprises a first metallic element of a relatively low atomic number Z.
  • the first layer S1 is made of copper in the non-limiting embodiment.
  • the first layer S1 is formed from a metal alloy containing copper (Cu).
  • the material of the second layer S2 comprises a second metallic element of relatively large atomic number Z.
  • the second layer S2 is formed from tungsten (W) in the non-limiting embodiment.
  • the second layer S2 is formed from a metal alloy containing tungsten.
  • a target surface T acted upon by the incident particle stream e is formed by the first layer S1 with lighter constituents of low atomic number Z.
  • the second layer S2 is oriented in the direction of the opposite exit side for x-radiation y.
  • the design of the target 11 in accordance with the exemplary embodiment shown is thus characterized in that, from the point of view of the incident particle or electron beam, the first layer S1 made of a material with a smaller atomic number Z precedes the second layer S2 made of a material with the larger atomic number Z , As a result, the yield of X-ray brake radiation per particle or electron is initially somewhat reduced, but the proportion of backscattered particles or secondary electrons e2 is minimized to a much greater extent.
  • a target whose acted target surface is formed by tungsten serves as a comparative example.
  • the curves relating to the exemplary embodiment according to the invention are drawn through and those of the comparative example are shown in dashed lines.
  • Figure 3 illustrates the X-ray brake spectrum of the emitted X-rays ⁇ of the exemplary embodiment and the comparative example.
  • the energy of the emitted photons or X-ray quanta is shown in MeV on the X axis.
  • the average energy of the emitted spectra is recorded on the X axis as marker X1.
  • the number of photons of the corresponding energy is shown on the left Y-axis, while the sum product of the respective spectrum is scaled as dose equivalent D with a further marker X2 on the right Y-axis.
  • the X-ray brake spectra emitted in the exemplary embodiment and the comparative example correspond to one another with regard to their mean energy (X1) and dose equivalent (X2).
  • X1 and dose equivalent (X2) approximately 1.4 times as many accelerated particles were required for this than in the variant according to the comparative example.
  • the simulation of the exemplary embodiment is therefore based on a particle stream e which is increased 1.4 times.
  • Figure 4 illustrates the energy fluence of the photons (Y-axis) as a function of the angle (X-axis) of the X-rays ⁇ emitted in the forward direction, ie in the direction of the incident particle stream e.
  • An angle of 0 ° corresponds to a trajectory parallel to the beam axis A. It can be seen that the photon distribution over the angle in the comparative example is directed somewhat more forward than in the exemplary embodiment, ie the emitted x-ray radiation ⁇ is somewhat stronger on the region close to the axis around the beam axis A focused.
  • Figure 5 illustrates the backward scattered spectrum of the exemplary embodiment in comparison to the comparative example.
  • the energy of the backscattered particles or secondary electrons e2 is shown in MeV on the X axis.
  • the mean energy of the scattering spectra is on the X axis as marker X3, X4 listed.
  • the number of backscattered particles (electrons) of the corresponding energy is shown on the left Y-axis, while the sum product of the respective spectrum is shown as dose equivalent D with further markers X5, X6 on the right Y-axis.
  • Both the average energy X3 and the number of backscattered electrons or the dose equivalent X5 in the variant according to the exemplary embodiment are significantly lower than the corresponding values X4, X6 of the comparative example. If one compares the backscattered particles or electrons weighted with their respective energy (see dose equivalent), there is a difference of about a factor of 3.
  • An angle 0 ° corresponds to a trajectory antiparallel to the beam axis A, that is to say a trajectory which is directed in the opposite direction to the incident particle stream e. It can be seen that in the exemplary embodiment as a whole significantly fewer particles are scattered back in the exemplary embodiment than in the comparative example.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Particle Accelerators (AREA)
  • X-Ray Techniques (AREA)
  • Radiation-Therapy Devices (AREA)
EP18185506.5A 2018-07-25 2018-07-25 Cible de production de rayons x, émetteur de rayons x et procédé de production de rayons x Pending EP3599619A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP18185506.5A EP3599619A1 (fr) 2018-07-25 2018-07-25 Cible de production de rayons x, émetteur de rayons x et procédé de production de rayons x
US16/519,245 US10886096B2 (en) 2018-07-25 2019-07-23 Target for generating X-ray radiation, X-ray emitter and method for generating X-ray radiation
CN201910676447.3A CN110783160B (zh) 2018-07-25 2019-07-25 产生x射线辐射的靶，x射线发射器和产生x射线辐射的方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP18185506.5A EP3599619A1 (fr) 2018-07-25 2018-07-25 Cible de production de rayons x, émetteur de rayons x et procédé de production de rayons x

Publications (1)

Publication Number Publication Date
EP3599619A1 true EP3599619A1 (fr) 2020-01-29

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EP18185506.5A Pending EP3599619A1 (fr) 2018-07-25 2018-07-25 Cible de production de rayons x, émetteur de rayons x et procédé de production de rayons x

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US (1) US10886096B2 (fr)
EP (1) EP3599619A1 (fr)
CN (1) CN110783160B (fr)

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Publication number Priority date Publication date Assignee Title
CN111403073B (zh) * 2020-03-19 2023-01-03 哈尔滨工程大学 一种基于电子加速器的多用途终端
CN115472329B (zh) * 2022-09-30 2023-05-05 深圳技术大学 一种辐照装置及透明靶制备方法

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US20200035439A1 (en) 2020-01-30
CN110783160B (zh) 2022-10-04
CN110783160A (zh) 2020-02-11
US10886096B2 (en) 2021-01-05

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