EP3407054A4 - Vorrichtung zur bearbeitung von rissinformationen, verfahren zur bearbeitung von rissinformationen und programm zur bearbeitung von rissinformationen - Google Patents

Vorrichtung zur bearbeitung von rissinformationen, verfahren zur bearbeitung von rissinformationen und programm zur bearbeitung von rissinformationen Download PDF

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Publication number
EP3407054A4
EP3407054A4 EP17741247.5A EP17741247A EP3407054A4 EP 3407054 A4 EP3407054 A4 EP 3407054A4 EP 17741247 A EP17741247 A EP 17741247A EP 3407054 A4 EP3407054 A4 EP 3407054A4
Authority
EP
European Patent Office
Prior art keywords
information editing
crack information
program
crack
editing device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP17741247.5A
Other languages
English (en)
French (fr)
Other versions
EP3407054A1 (de
Inventor
Mikihiko Karube
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Publication of EP3407054A1 publication Critical patent/EP3407054A1/de
Publication of EP3407054A4 publication Critical patent/EP3407054A4/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20092—Interactive image processing based on input by user
    • G06T2207/20096—Interactive definition of curve of interest
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30132—Masonry; Concrete
EP17741247.5A 2016-01-22 2017-01-10 Vorrichtung zur bearbeitung von rissinformationen, verfahren zur bearbeitung von rissinformationen und programm zur bearbeitung von rissinformationen Pending EP3407054A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016010709 2016-01-22
PCT/JP2017/000502 WO2017126367A1 (ja) 2016-01-22 2017-01-10 ひび割れ情報編集装置、ひび割れ情報編集方法およびひび割れ情報編集プログラム

Publications (2)

Publication Number Publication Date
EP3407054A1 EP3407054A1 (de) 2018-11-28
EP3407054A4 true EP3407054A4 (de) 2019-01-02

Family

ID=59361559

Family Applications (1)

Application Number Title Priority Date Filing Date
EP17741247.5A Pending EP3407054A4 (de) 2016-01-22 2017-01-10 Vorrichtung zur bearbeitung von rissinformationen, verfahren zur bearbeitung von rissinformationen und programm zur bearbeitung von rissinformationen

Country Status (5)

Country Link
US (1) US10776910B2 (de)
EP (1) EP3407054A4 (de)
JP (1) JP6576473B2 (de)
CN (1) CN108474748B (de)
WO (1) WO2017126367A1 (de)

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JP6833356B2 (ja) * 2016-06-16 2021-02-24 キヤノン株式会社 情報処理装置、情報処理方法及びプログラム
JP7058585B2 (ja) 2017-12-25 2022-04-22 キヤノン株式会社 画像処理装置およびその制御方法
WO2019130827A1 (ja) 2017-12-25 2019-07-04 キヤノン株式会社 画像処理装置およびその制御方法
CN108876780B (zh) * 2018-06-26 2020-11-10 陕西师范大学 一种复杂背景下桥梁裂缝图像裂缝检测方法
JP7391504B2 (ja) * 2018-11-30 2023-12-05 キヤノン株式会社 情報処理装置、情報処理方法及びプログラム
JP7429648B2 (ja) 2018-12-13 2024-02-08 富士フイルム株式会社 損傷図作成支援装置、損傷図作成支援方法、損傷図作成支援プログラム及び損傷図作成支援システム
JP7225810B2 (ja) 2019-01-11 2023-02-21 富士通株式会社 ひび線抽出装置、ひび線抽出方法、及び、ひび線抽出プログラム
JP7344692B2 (ja) * 2019-07-22 2023-09-14 キヤノン株式会社 情報処理装置及び情報処理方法及びプログラム
EP4006842A4 (de) * 2019-07-23 2022-09-07 FUJIFILM Corporation Vorrichtung, verfahren und programm zur beurteilung von rissen
CN110807216B (zh) * 2019-09-26 2022-12-06 杭州鲁尔物联科技有限公司 一种基于图像的桥梁bim模型裂纹可视化的创建方法
WO2021200675A1 (ja) * 2020-04-01 2021-10-07 富士フイルム株式会社 ３次元表示装置、３次元表示方法、及びプログラム
CN115443407A (zh) 2020-05-07 2022-12-06 富士胶片株式会社 损伤评价装置、方法及程序

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JP2002174601A (ja) 2000-12-05 2002-06-21 Matsushita Electric Ind Co Ltd 壁面損傷検出方法及び装置
JP4588901B2 (ja) * 2001-03-02 2010-12-01 株式会社竹中工務店 コンクリートの欠陥検査方法およびコンクリートの欠陥検査装置
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CN104063368B (zh) * 2010-12-01 2018-09-04 百度在线网络技术（北京）有限公司 在线编辑时引文标记展示方法与装置
JP6029870B2 (ja) * 2012-06-27 2016-11-24 公益財団法人鉄道総合技術研究所 コンクリート表面の変状検出方法及び装置
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US9279773B2 (en) * 2014-07-18 2016-03-08 Process Metrix Crack detection and measurement in a metallurgical vessels
JP2016050887A (ja) * 2014-09-01 2016-04-11 関西工事測量株式会社 クラック計測システム
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WO2017014288A1 (ja) * 2015-07-21 2017-01-26 株式会社東芝 ひび割れ解析装置、ひび割れ解析方法及びひび割れ解析プログラム

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ARENA ALESSIO ET AL: "A new computational approach to cracks quantification from 2D image analysis: Application to micro-cracks description in rocks", COMPUTERS AND GEOSCIENCES, vol. 66, 28 January 2014 (2014-01-28), pages 106 - 120, XP028836416, ISSN: 0098-3004, DOI: 10.1016/J.CAGEO.2014.01.007 *

Also Published As

Publication number Publication date
US20180300874A1 (en) 2018-10-18
JP6576473B2 (ja) 2019-09-18
US10776910B2 (en) 2020-09-15
CN108474748A (zh) 2018-08-31
JPWO2017126367A1 (ja) 2018-10-11
CN108474748B (zh) 2021-12-28
EP3407054A1 (de) 2018-11-28
WO2017126367A1 (ja) 2017-07-27

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