EP2813827A4 - Procédé et dispositif de mesure de luminosité et technologie d'ajustement de la qualité d'une image les utilisant - Google Patents

Procédé et dispositif de mesure de luminosité et technologie d'ajustement de la qualité d'une image les utilisant

Info

Publication number
EP2813827A4
EP2813827A4 EP13791891.8A EP13791891A EP2813827A4 EP 2813827 A4 EP2813827 A4 EP 2813827A4 EP 13791891 A EP13791891 A EP 13791891A EP 2813827 A4 EP2813827 A4 EP 2813827A4
Authority
EP
European Patent Office
Prior art keywords
brightness measurement
image quality
same
quality adjustment
adjustment technology
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP13791891.8A
Other languages
German (de)
English (en)
Other versions
EP2813827B1 (fr
EP2813827A1 (fr
Inventor
Hiroshi Murase
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IIX Inc
Original Assignee
IIX Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IIX Inc filed Critical IIX Inc
Publication of EP2813827A1 publication Critical patent/EP2813827A1/fr
Publication of EP2813827A4 publication Critical patent/EP2813827A4/fr
Application granted granted Critical
Publication of EP2813827B1 publication Critical patent/EP2813827B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0439—Pixel structures
    • G09G2300/0452—Details of colour pixel setup, e.g. pixel composed of a red, a blue and two green components
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0233—Improving the luminance or brightness uniformity across the screen
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0242—Compensation of deficiencies in the appearance of colours
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/06—Adjustment of display parameters
    • G09G2320/0693—Calibration of display systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
EP13791891.8A 2013-04-08 2013-04-08 Procédé et dispositif de mesure de luminosité et technologie d'ajustement de la qualité d'une image les utilisant Active EP2813827B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2013/060659 WO2014167641A1 (fr) 2013-04-08 2013-04-08 Procédé et dispositif de mesure de luminosité et technologie d'ajustement de la qualité d'une image les utilisant

Publications (3)

Publication Number Publication Date
EP2813827A1 EP2813827A1 (fr) 2014-12-17
EP2813827A4 true EP2813827A4 (fr) 2015-11-11
EP2813827B1 EP2813827B1 (fr) 2019-07-24

Family

ID=51177902

Family Applications (1)

Application Number Title Priority Date Filing Date
EP13791891.8A Active EP2813827B1 (fr) 2013-04-08 2013-04-08 Procédé et dispositif de mesure de luminosité et technologie d'ajustement de la qualité d'une image les utilisant

Country Status (5)

Country Link
US (1) US8786712B1 (fr)
EP (1) EP2813827B1 (fr)
JP (1) JP5952811B2 (fr)
CN (1) CN105051506B (fr)
WO (1) WO2014167641A1 (fr)

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* Cited by examiner, † Cited by third party
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KR102119881B1 (ko) * 2013-11-22 2020-06-08 삼성디스플레이 주식회사 휘도 보정 시스템 및 방법
EP3424276A1 (fr) * 2016-03-02 2019-01-09 Philips Lighting Holding B.V. Procédé de détermination de contribution et d'orientation de sources lumineuses au niveau d'un point de mesure prédéterminé
CN108447432B (zh) * 2017-02-16 2021-09-03 联咏科技股份有限公司 显示系统、电子装置及其显示调整方法
US11025899B2 (en) * 2017-08-11 2021-06-01 Ignis Innovation Inc. Optical correction systems and methods for correcting non-uniformity of emissive display devices
CN108735144A (zh) * 2018-05-24 2018-11-02 长春希达电子技术有限公司 一种led显示屏非逐点采集校正方法
CN111854935B (zh) * 2020-09-24 2021-01-22 歌尔股份有限公司 投影系统照度测量方法、设备及可读存储介质
CN112985767B (zh) * 2021-02-06 2022-01-25 深圳精智达技术股份有限公司 一种显示面板的像素亮度拍摄的方法及相关装置
CN114063328A (zh) * 2021-11-17 2022-02-18 乐金显示光电科技(中国)有限公司 液晶面板显示异常分析方法及分析系统
WO2023108546A1 (fr) * 2021-12-16 2023-06-22 Jade Bird Display (Shanghai) Company Groupe de motifs partiels prédéfinis, procédés de décomposition d'un motif de réseau de micro-del objectif et procédés de détection de défaut de pixel

Citations (4)

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Publication number Priority date Publication date Assignee Title
US5650844A (en) * 1994-07-14 1997-07-22 Advantest Corporation LCD panel image quality inspection system and LCD image presampling method
US5793221A (en) * 1995-05-19 1998-08-11 Advantest Corp. LCD panel test apparatus having means for correcting data difference among test apparatuses
JP2009156704A (ja) * 2007-12-26 2009-07-16 Toshiba Corp 表示パネルの輝度測定装置および輝度測定方法並びに表示装置
WO2011151866A1 (fr) * 2010-06-04 2011-12-08 パナソニック株式会社 Procédé de mesure de la luminosité d'un écran d'affichage électroluminescent

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US6407786B1 (en) * 1999-06-09 2002-06-18 Sharp Kabushiki Kaisha Liquid crystal display device and method for fabricating the same
US7179512B2 (en) * 2002-05-14 2007-02-20 Fujitsu Limited Liquid crystal display and manufacturing method of same
JP4290022B2 (ja) * 2004-01-23 2009-07-01 キヤノン株式会社 撮像装置及び画像調整方法
JP2006234414A (ja) * 2005-02-22 2006-09-07 Seiko Epson Corp 画像表示装置の検査方法、その検査装置、その検査プログラム、および、記録媒体
JP4438696B2 (ja) * 2005-06-15 2010-03-24 セイコーエプソン株式会社 画像表示装置及び方法
CN102298228B (zh) * 2006-01-26 2014-04-23 夏普株式会社 液晶显示装置的制造方法和液晶显示装置
JP4934621B2 (ja) * 2008-03-26 2012-05-16 株式会社ナナオ 補正方法、表示装置及びコンピュータプログラム
JP4681033B2 (ja) * 2008-07-31 2011-05-11 株式会社イクス 画像補正データ生成システム、画像データ生成方法及び画像補正回路
JP4528850B2 (ja) * 2008-08-26 2010-08-25 シャープ株式会社 欠陥検出装置、欠陥検出方法、欠陥検出プログラム、及び該プログラムを記録したコンピュータ読み取り可能な記録媒体
JP2010203889A (ja) 2009-03-03 2010-09-16 Casio Computer Co Ltd 表示パネルの輝度測定方法及び表示パネルの輝度測定装置
CN101593480A (zh) * 2009-04-13 2009-12-02 深圳华映显示科技有限公司 显示面板的检查方法
JPWO2010146732A1 (ja) * 2009-06-18 2012-11-29 シャープ株式会社 表示パネルの欠陥検査方法および欠陥検査装置
JP2011196685A (ja) * 2010-03-17 2011-10-06 Sharp Corp 欠陥検出装置、欠陥修復装置、表示パネル、表示装置、欠陥検出方法、プログラム
CN102445269B (zh) * 2010-10-15 2015-05-20 鸿富锦精密工业（深圳）有限公司 光照强度检测系统及方法
CN102025952B (zh) * 2010-11-19 2012-07-18 广东威创视讯科技股份有限公司 一种显示装置亮度校正方法及其系统

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5650844A (en) * 1994-07-14 1997-07-22 Advantest Corporation LCD panel image quality inspection system and LCD image presampling method
US5793221A (en) * 1995-05-19 1998-08-11 Advantest Corp. LCD panel test apparatus having means for correcting data difference among test apparatuses
JP2009156704A (ja) * 2007-12-26 2009-07-16 Toshiba Corp 表示パネルの輝度測定装置および輝度測定方法並びに表示装置
WO2011151866A1 (fr) * 2010-06-04 2011-12-08 パナソニック株式会社 Procédé de mesure de la luminosité d'un écran d'affichage électroluminescent
US20130088589A1 (en) * 2010-06-04 2013-04-11 Panasonic Corporation Method for measuring luminance of light-emitting display panel

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2014167641A1 *

Also Published As

Publication number Publication date
JP5952811B2 (ja) 2016-07-13
CN105051506A (zh) 2015-11-11
WO2014167641A1 (fr) 2014-10-16
US8786712B1 (en) 2014-07-22
EP2813827B1 (fr) 2019-07-24
EP2813827A1 (fr) 2014-12-17
JPWO2014167641A1 (ja) 2017-02-16
CN105051506B (zh) 2017-06-23

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