EP2452181A1 - Procédé et appareil pour inspection de surfaces - Google Patents

Procédé et appareil pour inspection de surfaces

Info

Publication number
EP2452181A1
EP2452181A1 EP10797349A EP10797349A EP2452181A1 EP 2452181 A1 EP2452181 A1 EP 2452181A1 EP 10797349 A EP10797349 A EP 10797349A EP 10797349 A EP10797349 A EP 10797349A EP 2452181 A1 EP2452181 A1 EP 2452181A1
Authority
EP
European Patent Office
Prior art keywords
accordance
illuminating device
image
regard
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP10797349A
Other languages
German (de)
English (en)
Other versions
EP2452181A4 (fr
Inventor
Lars Henriksen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hydro Extruded Solutions AS
Original Assignee
Norsk Hydro ASA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Norsk Hydro ASA filed Critical Norsk Hydro ASA
Publication of EP2452181A1 publication Critical patent/EP2452181A1/fr
Publication of EP2452181A4 publication Critical patent/EP2452181A4/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects

Abstract

L'invention porte sur un procédé et un appareil pour l'inspection d'au moins une surface d'un objet (2) ayant une forme allongée dans une direction (X), dans lequel un dispositif d'éclairage (ID), qui peut comprendre au moins deux organes d'éclairage (1a, 1b) ou un réseau de lumière non discret, est agencé au voisinage de l'objet. Au moins un dispositif de numérisation d'image (20) est agencé pour capturer des images de ladite surface. Le dispositif d'éclairage est en outre aligné par rapport à la direction (X), éclairant de cette façon une partie de la surface dudit objet (2) à un certain angle (α, α') dans une condition de champ sombre et/ou de champ clair, ce par quoi des défauts dans ladite surface peuvent être visualisés et imagés. En particulier, des défauts en 3D, des lignes de pression, des indentations, des rayures, etc. dans des produits extrudés, peuvent être détectés. Une unité de traitement d'image peut comparer les données capturées avec des données de seuil stockées pour une inspection de la qualité et une évaluation de la qualité. Si une mise au rebut est nécessaire, un manipulateur peut être commandé conformément à cela et enlever les objets mis au rebut. L'objet et/ou l'appareil peut être agencé pour un déplacement le long de la direction (X).
EP10797349A 2009-07-08 2010-07-02 Procédé et appareil pour inspection de surfaces Withdrawn EP2452181A4 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NO20092602A NO336577B1 (no) 2009-07-08 2009-07-08 Fremgangsmåte og apparatur for inspeksjon av overflater
PCT/NO2010/000264 WO2011005110A1 (fr) 2009-07-08 2010-07-02 Procédé et appareil pour inspection de surfaces

Publications (2)

Publication Number Publication Date
EP2452181A1 true EP2452181A1 (fr) 2012-05-16
EP2452181A4 EP2452181A4 (fr) 2012-12-19

Family

ID=43429375

Family Applications (1)

Application Number Title Priority Date Filing Date
EP10797349A Withdrawn EP2452181A4 (fr) 2009-07-08 2010-07-02 Procédé et appareil pour inspection de surfaces

Country Status (3)

Country Link
EP (1) EP2452181A4 (fr)
NO (1) NO336577B1 (fr)
WO (1) WO2011005110A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102636492B (zh) * 2012-04-18 2013-10-23 湖南大学 钢轨表面缺陷高速视觉在线检测设备
US9833962B2 (en) 2014-02-26 2017-12-05 Toyota Motor Engineering & Manufacturing Norh America, Inc. Systems and methods for controlling manufacturing processes
JP6278274B2 (ja) * 2014-11-28 2018-02-14 日立金属株式会社 平角エナメル線の外観検査方法および平角エナメル線の外観検査装置
CN113533368B (zh) * 2021-05-24 2022-10-21 国网河北省电力有限公司衡水供电分公司 电杆裂纹检测装置、控制方法及控制终端

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3729248A (en) * 1970-06-26 1973-04-24 Cit Alcatel Optical scanning assembly with helical-shaped rotating reflector
GB1541214A (en) * 1974-12-11 1979-02-28 Atomic Energy Authority Uk Optical apparatus
JPS59197840A (ja) * 1983-04-25 1984-11-09 Fujitsu Autom Kk 高速移動連続紙の欠陥自動検出装置
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
US7474416B2 (en) * 2004-10-21 2009-01-06 Pixargus Gmbh System and method for measuring an object and monitoring the surface of an object

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1407409A (en) * 1971-10-27 1975-09-24 Ferranti Ltd Detection of blemishes in a surface
DE69703487T2 (de) * 1997-08-22 2001-06-13 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur automatischen Prüfung bewegter Oberflächen

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3729248A (en) * 1970-06-26 1973-04-24 Cit Alcatel Optical scanning assembly with helical-shaped rotating reflector
GB1541214A (en) * 1974-12-11 1979-02-28 Atomic Energy Authority Uk Optical apparatus
JPS59197840A (ja) * 1983-04-25 1984-11-09 Fujitsu Autom Kk 高速移動連続紙の欠陥自動検出装置
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
US7474416B2 (en) * 2004-10-21 2009-01-06 Pixargus Gmbh System and method for measuring an object and monitoring the surface of an object

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2011005110A1 *

Also Published As

Publication number Publication date
NO20092602A1 (no) 2011-01-10
NO336577B1 (no) 2015-09-28
EP2452181A4 (fr) 2012-12-19
WO2011005110A1 (fr) 2011-01-13

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