EP2452181A1 - Verfahren und vorrichtung zur inspektion von oberflächen - Google Patents
Verfahren und vorrichtung zur inspektion von oberflächenInfo
- Publication number
- EP2452181A1 EP2452181A1 EP10797349A EP10797349A EP2452181A1 EP 2452181 A1 EP2452181 A1 EP 2452181A1 EP 10797349 A EP10797349 A EP 10797349A EP 10797349 A EP10797349 A EP 10797349A EP 2452181 A1 EP2452181 A1 EP 2452181A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- accordance
- illuminating device
- image
- regard
- defects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/204—Structure thereof, e.g. crystal structure
- G01N33/2045—Defects
Definitions
- Fig. 1 discloses a principal set up of one embodiment in accordance with the present invention, seen from above,
- Fig. 3 discloses a second embodiment of the invention, comprising an arrangement that illuminates more than one side of the object to be inspected
- Fig. 4 discloses a third embodiment of the invention, similar to that of Fig. 3, but with one helix shaped, non discrete illuminator.
- an illuminating device ID comprising two illuminators arranged along an axis inclined with respect to the objects axis of movement.
- a main advantage with the set up shown here is that all the illuminators may be activated simultaneously and continuously due to the arrangement of illuminators along an inclined axis with respect to the axis of the objects movement.
- the image digitization device preferably an area scan camera
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20092602A NO336577B1 (no) | 2009-07-08 | 2009-07-08 | Fremgangsmåte og apparatur for inspeksjon av overflater |
PCT/NO2010/000264 WO2011005110A1 (en) | 2009-07-08 | 2010-07-02 | Method and apparatus for inspection of surfaces |
Publications (2)
Publication Number | Publication Date |
---|---|
EP2452181A1 true EP2452181A1 (de) | 2012-05-16 |
EP2452181A4 EP2452181A4 (de) | 2012-12-19 |
Family
ID=43429375
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP10797349A Withdrawn EP2452181A4 (de) | 2009-07-08 | 2010-07-02 | Verfahren und vorrichtung zur inspektion von oberflächen |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP2452181A4 (de) |
NO (1) | NO336577B1 (de) |
WO (1) | WO2011005110A1 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102636492B (zh) * | 2012-04-18 | 2013-10-23 | 湖南大学 | 钢轨表面缺陷高速视觉在线检测设备 |
US9833962B2 (en) | 2014-02-26 | 2017-12-05 | Toyota Motor Engineering & Manufacturing Norh America, Inc. | Systems and methods for controlling manufacturing processes |
JP6278274B2 (ja) * | 2014-11-28 | 2018-02-14 | 日立金属株式会社 | 平角エナメル線の外観検査方法および平角エナメル線の外観検査装置 |
CN113533368B (zh) * | 2021-05-24 | 2022-10-21 | 国网河北省电力有限公司衡水供电分公司 | 电杆裂纹检测装置、控制方法及控制终端 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3729248A (en) * | 1970-06-26 | 1973-04-24 | Cit Alcatel | Optical scanning assembly with helical-shaped rotating reflector |
GB1541214A (en) * | 1974-12-11 | 1979-02-28 | Atomic Energy Authority Uk | Optical apparatus |
JPS59197840A (ja) * | 1983-04-25 | 1984-11-09 | Fujitsu Autom Kk | 高速移動連続紙の欠陥自動検出装置 |
US6327374B1 (en) * | 1999-02-18 | 2001-12-04 | Thermo Radiometrie Oy | Arrangement and method for inspection of surface quality |
US7474416B2 (en) * | 2004-10-21 | 2009-01-06 | Pixargus Gmbh | System and method for measuring an object and monitoring the surface of an object |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1407409A (en) * | 1971-10-27 | 1975-09-24 | Ferranti Ltd | Detection of blemishes in a surface |
DE69703487T2 (de) * | 1997-08-22 | 2001-06-13 | Fraunhofer Ges Forschung | Verfahren und Vorrichtung zur automatischen Prüfung bewegter Oberflächen |
-
2009
- 2009-07-08 NO NO20092602A patent/NO336577B1/no not_active IP Right Cessation
-
2010
- 2010-07-02 WO PCT/NO2010/000264 patent/WO2011005110A1/en active Application Filing
- 2010-07-02 EP EP10797349A patent/EP2452181A4/de not_active Withdrawn
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3729248A (en) * | 1970-06-26 | 1973-04-24 | Cit Alcatel | Optical scanning assembly with helical-shaped rotating reflector |
GB1541214A (en) * | 1974-12-11 | 1979-02-28 | Atomic Energy Authority Uk | Optical apparatus |
JPS59197840A (ja) * | 1983-04-25 | 1984-11-09 | Fujitsu Autom Kk | 高速移動連続紙の欠陥自動検出装置 |
US6327374B1 (en) * | 1999-02-18 | 2001-12-04 | Thermo Radiometrie Oy | Arrangement and method for inspection of surface quality |
US7474416B2 (en) * | 2004-10-21 | 2009-01-06 | Pixargus Gmbh | System and method for measuring an object and monitoring the surface of an object |
Non-Patent Citations (1)
Title |
---|
See also references of WO2011005110A1 * |
Also Published As
Publication number | Publication date |
---|---|
NO20092602A1 (no) | 2011-01-10 |
NO336577B1 (no) | 2015-09-28 |
EP2452181A4 (de) | 2012-12-19 |
WO2011005110A1 (en) | 2011-01-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20120208 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR |
|
DAX | Request for extension of the european patent (deleted) | ||
A4 | Supplementary search report drawn up and despatched |
Effective date: 20121116 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: G01N 21/892 20060101AFI20121112BHEP Ipc: G01N 33/20 20060101ALI20121112BHEP Ipc: G01N 21/88 20060101ALI20121112BHEP Ipc: G01N 21/952 20060101ALI20121112BHEP Ipc: G01N 21/89 20060101ALI20121112BHEP |
|
RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: SAPA AS |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: EXAMINATION IS IN PROGRESS |
|
17Q | First examination report despatched |
Effective date: 20180518 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20180929 |