EP2396814A2 - Method for producing a connection between a semiconductor component and semiconductor module resistant to high temperatures and temperature changes by means of a temperature impinging process - Google Patents

Method for producing a connection between a semiconductor component and semiconductor module resistant to high temperatures and temperature changes by means of a temperature impinging process

Info

Publication number
EP2396814A2
EP2396814A2 EP10710533A EP10710533A EP2396814A2 EP 2396814 A2 EP2396814 A2 EP 2396814A2 EP 10710533 A EP10710533 A EP 10710533A EP 10710533 A EP10710533 A EP 10710533A EP 2396814 A2 EP2396814 A2 EP 2396814A2
Authority
EP
European Patent Office
Prior art keywords
temperature
connection
sintering
semiconductor
suspension
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP10710533A
Other languages
German (de)
French (fr)
Inventor
Mathias Kock
Ronald Eisele
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Danfoss Silicon Power GmbH
Original Assignee
Danfoss Silicon Power GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Danfoss Silicon Power GmbH filed Critical Danfoss Silicon Power GmbH
Publication of EP2396814A2 publication Critical patent/EP2396814A2/en
Ceased legal-status Critical Current

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    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L24/33Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
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Definitions

  • the invention relates to a method for creating a high-temperature and temperature-resistant connection of a module semiconductor and a semiconductor device with a temperature-applying method.
  • a complex step in the production of sintered compounds as described for example in DE 10 2006 033 073 B3 of the Applicant, are in the actual sintering (the so-called final sintering) required pressures of more than 30 MPa, by a special apparatus have to be applied for a few seconds to a few minutes.
  • the invention is based on the finding that by selecting a suitable metal powder suspension by activating this, either by local, low pressure of for example 5 MPa or by heating to z. B. 25O 0 C, the sintering process can be initiated so far that a transport-resistant fixation for processing by further manufacturing steps takes place.
  • an electrical component with metallic contact surfaces with either a silver or a gold surface by materially joined to a substrate material in several stages of production, without a critical sintering pressure is applied.
  • circuit substrate can be used as a substrate material, such as.
  • a substrate material such as.
  • organic printed circuit boards PCB, ceramic circuit boards, DCB, metal core circuit boards, IMS or conductor leadframes, stamped grid, hybrid ceramic circuit carrier, etc.
  • the electrotechnical component can be an inexhaustible Halbeiterbauelement or a gemoldetes, d. H. be cased semiconductor device.
  • Electrical contact terminals SMD-B auimplantation or the like can also be connected to each other with the cohesive joining method according to the invention.
  • connection tact-fast ie when heated for a few seconds.
  • Fixing and sintering are separate processes. The fixing takes place predominantly by a clawing in the surface of the joining partners or the silver joining layers.
  • the subsequent sintering is carried out without pressure in a heating furnace at temperatures between 170 ° C to 300 ° C, so it may be easily inserted in a transport line for components.
  • the atmosphere for certain metal suspension layers can optionally be adjusted with an inert or reactive gas. Nitrogen is suitable as the inert gas, for example, and forming gas or inert gas saturated with formic acid can be used as the reactive gas.
  • FIG. 1 shows a metallized device placed over a precoated and dried metal suspension layer.
  • FIG. 3 shows the elements of FIG. 2 after an unpressurised temperature control step, which ensures preferably complete volume sintering, FIG.
  • FIG. 4 shows a lower and further metallized component on a previously applied and dried metal suspension layer as in Fig. 1,
  • FIG. 6 shows the elements of FIG. 5, wherein the contact tab with the other elements is fixed by low pressure
  • FIG. 7 shows the elements of FIG. 6 after a pressure-free tempering step, which ensures a preferably complete volume sintering of all fixed contact positions
  • a substrate material or a chip backside, or in a preferred embodiment on both surfaces to be joined, is applied in a uniform layer thickness by means of a layer containing silver particles, preferably with a stencil printer. This is done selectively at the points where the device is to be placed or, if applied to the chip, a full surface.
  • Other application techniques, in particular spraying, are conceivable.
  • diving or spin-on of a silver particle solution would cause problems with layer-wide variance.
  • the layer After application, the layer is dried and freed from the volatile organic compounds. Temperatures of up to 150 0 C support the process to ensure high clock rates. The dried layer produced thereby has a large porosity and a large roughness.
  • the electrotechnical component is brought to a predetermined position by a component gripping and depositing device and unilateral or bilateral silver layers applied to the components are pressed together by the force applied during the application and clawed together. This is a short 0.1 to 3 second placement process, with the required force only enough to reshape the rough surface and claw each other.
  • the bracket by Verkrallen does not have to meet the requirements for later use but only be so strong that during the process of locomotion in the manufacture of the components no longer slip.
  • the two-dimensional clawing of the rough dried metal layer in a silver or gold surface provides for easy adhesion.
  • a snowball sticks to a cement wall, or even snow, when a snowball is formed.
  • the adhesion can be improved again by increasing the temperature up to, for example, 150 ° C. In the example "snow" this would be equivalent to a wet snow.
  • Step 4 In a fourth step, the component thus fixed is finally subjected to a subsequent heat process without further pressure, wherein a diffusion of the silver atoms into the interface of the joining partner and vice versa takes place, so that the desired high temperature and temperature change resistant, for motor vehicle applications also stable connection over many years.
  • FIG. 1 shows a pre-metallized component which is precoated with an example of about 50 micrometers and at a temperature of about 50 micrometers. temperature of less than 140 ° C for a few minutes (preferably 1-3 minutes) dried metal suspension layer is placed. A suitable pre-compaction of the layer in order to store it better, and to avoid abrasion, may have already taken place on the layer before the component is fixed.
  • a layer produced in the same or a similar way - even in order to use it as similar to a pre-metallization - may also have already been sintered. It is sufficient if a layer still consists only of dried, non-sintered paste / suspension.
  • a pressure of 1-10 MPa, preferably 2-6 MPa, and herein more preferably for a second less than 5 MPa can be exercised.
  • Fig. 3 shows the elements of FIG . 2 after a non-pressurized tempering, at paste-dependent temperatures of typically more than 230 0 C, which ensures a preferably complete volume sintering. Reactive process gases can accelerate sintering.
  • Figs. 4 to 7 show, as representative of many possible elements, a contact tab is fixed by low pressure with the assembly in the same way.
  • the erfmdungshacke method for creating a high-temperature and tempe- ratur pizzafesten connection of a module semiconductor and a semiconductor device with a temperaturbeetzier waveden method in which a metal powder suspension is applied to the areas of the individual semiconductor devices to be joined later, the suspension layer with outgassing of the volatile constituents and dried to form a porous layer, then precompressed the porous layer, without a complete, the Sus- pensionstik penetrating sintering takes place, wherein to obtain a solid electrically and thermally well-conductive compound of a semiconductor device on a connection partner from the group: substrate, further semiconductor or circuit carrier, the compound is a sintered compound produced without pressing pressure by increasing the temperature, which consists of a dried metal powder suspension consists, in a Vorverdichtungsuze with the connection partner has undergone a first transport-resistant contact with the connection partner, and was solidified under temperature Ausausung unpressurized in a preferred embodiment can be extended daurch that more than one side of
  • the atmosphere in a sealed chamber
  • the atmosphere may be enriched with an inert or reactive gas during heating.
  • the inert gas may preferably contain nitrogen as a main component.
  • the reactive gas proposed is one with a predominant constituent of forming gas.

Abstract

The invention relates to a method for producing a connection between a semiconductor component and semiconductor module resistant to high temperatures and temperature changes by means of a temperature impinging process, wherein a metal powder suspension is applied to the areas of the semiconductor module to be connected later; the suspension layer is dried, outgassing the volatile components and generating a porous layer; the porous layer is pre-sealed without complete sintering taking place throughout the suspension layer; and, in order to obtain a solid electrically and thermally conductive connection of a semiconductor module to a connection partner from the group of: substrate, further semiconductor or interconnect device, the connection is a sintered connection generated without compression by increasing the temperature and made of a dried metal powder suspension that has undergone a first transport-safe contact with the connection partner in a pre-compression step and has been solidified at zero pressure using temperature sintering.

Description

Verfahren zur Schaffung einer hochtemperatur- und temperaturwechselfesten Method for creating a high temperature and temperature change resistant
Verbindung eines Baugruppen-Halbleiters und eines Halbleiterbausteins mit einem temperaturbeaufschlagenden VerfahrenConnecting a module semiconductor and a semiconductor device with a temperature-applying method
Die Erfindung betrifft ein Verfahren zur Schaffung einer hochtemperatur- und temperaturwechselfesten Verbindung eines Baugruppen-Halbleiters und eines Halbleiterbausteins mit einem temperaturbeaufschlagenden Verfahren.The invention relates to a method for creating a high-temperature and temperature-resistant connection of a module semiconductor and a semiconductor device with a temperature-applying method.
Stand der TechnikState of the art
Die zunehmende Nachfrage nach Leistungselektronik, insbesondere für Kraftfalir- zeuge (Hybridfahrzeuge) steigert die Stückzahlen, in denen Leistungshalbleiter- Baugruppen hergestellt werden, erheblich. Um mit den Kosten, die bei der Kfz- Produktion naturgemäß möglichst gering gehalten werden müssen, Schritt zu halten, werden die Herstellungsverfahren dauernd optimiert.The increasing demand for power electronics, in particular for power tools (hybrid vehicles), considerably increases the numbers of units in which power semiconductor assemblies are manufactured. In order to keep pace with the costs that naturally have to be minimized in motor vehicle production, the manufacturing processes are constantly being optimized.
Ein aufwendiger Schritt bei der Herstellung von Sinterverbindungen, wie sie beispielsweise in der DE 10 2006 033 073 B3 der Anmelderin beschrieben werden, sind dabei die bei der eigentlichen Sinterung (der sogenannten Endsinterung) benötigten Drücke von mehr als 30 MPa, die durch eine spezielle Apparatur für einige Sekunden bis zu einigen Minuten aufgebracht werden müssen.A complex step in the production of sintered compounds, as described for example in DE 10 2006 033 073 B3 of the Applicant, are in the actual sintering (the so-called final sintering) required pressures of more than 30 MPa, by a special apparatus have to be applied for a few seconds to a few minutes.
Andererseits ist aus dieser genannten Schrift bereits bekannt, dass sich eine sägefeste getrocknete Metallpulversuspension nach einem Trocknungs- und Erwärmungsschritt nach dem Aufbringen schon geringen Druckes derart vorverdichtet, dass sie „sägefähig" ist. Weiter ist aus bekannten Lötverfahren bekannt, dass eine geeignete Temperierung des Werkstückes ein Aufschmelzen auf dem Werkstück angeordneten Lotmaterials zur Herstellung einer innigen Lotverbindung ermöglicht.On the other hand, it is already known from this cited document that a saw-proof dried metal powder suspension is pre-compacted after a drying and heating step after the application of even low pressure such that it is "capable of being sawed". Furthermore, it is known from known soldering methods that a suitable temperature control of the workpiece allows a melting on the workpiece arranged soldering material for producing an intimate solder joint.
Der Erfindung liegt nun die Erkenntnis zugrunde, dass durch Wahl einer geeigneten Metallpulversuspension durch Aktivierung dieser, entweder durch lokalen, geringen Druck von beispielsweise 5 MPa oder durch Erhitzen auf z. B. 25O0C der Sinter- vorgang soweit veranlasst werden kann, dass eine transportfeste Fixierung für die Bearbeitung durch weitere Fertigungsschritte erfolgt.The invention is based on the finding that by selecting a suitable metal powder suspension by activating this, either by local, low pressure of for example 5 MPa or by heating to z. B. 25O 0 C, the sintering process can be initiated so far that a transport-resistant fixation for processing by further manufacturing steps takes place.
Dabei wird ein elektrotechnisches Bauelement mit metallischen Kontaktflächen entweder mit einer Silber- oder einer Goldoberfläche durch stoffschlüssiges Fügen auf ein Substratmaterial in mehreren Fertigungsstufen verbunden, ohne dass ein kritischer Sinterdruck anzuwenden ist.In this case, an electrical component with metallic contact surfaces with either a silver or a gold surface by materially joined to a substrate material in several stages of production, without a critical sintering pressure is applied.
Dies ermöglicht es, das erfindungsgemäße Verfahren ohne eine aufwendige Press- Station durchzuführen, so dass die Taktraten erheblich vergrößert werden können und dennoch Baugruppen mit Sinterverbindung erzeugt werden können.This makes it possible to carry out the method according to the invention without an expensive press station, so that the clock rates can be increased considerably and yet modules with sintered connection can be produced.
Dabei werden als Substratmaterial Schaltungsträger Verwendung finden können, wie z. B. organische Leiterplatten (PCB, keramische Leiterplatten, DCB, Metallkern-Leiterplatten, IMS oder Leiter-Leadframes, Stanzgitter, keramische Hybrid- Schaltungsträger usw.). Das elektrotechnische Bauelement kann dabei ein ungenaustes Halbeiterbauelement oder ein auch ein gemoldetes, d. h. gehäustes Halbleiterbauelement sein. Elektrische Kontaktanschlüsse SMD-B auelemente oder dergleichen können ebenfalls mit dem erfindungsgemäßen stoffschlüssigen Fügeverfahren miteinander verbunden werden.In this case, circuit substrate can be used as a substrate material, such as. As organic printed circuit boards (PCB, ceramic circuit boards, DCB, metal core circuit boards, IMS or conductor leadframes, stamped grid, hybrid ceramic circuit carrier, etc.). The electrotechnical component can be an inexhaustible Halbeiterbauelement or a gemoldetes, d. H. be cased semiconductor device. Electrical contact terminals SMD-B auelemente or the like can also be connected to each other with the cohesive joining method according to the invention.
Der Unterschied zum sogenannten Niedertemperatur-Sintern, bei dem durch gleichzeitiges quasi isostatisches Pressen mit Drücken von 20 bis 30 MPa und gleichzeitigem Erhitzen der Fügepartner auf ca. 22O0C eine Verbindung erzeugt wird besteht darin, dass nun mit deutlich geringeren Drücken eine Verbindung taktschnell, d. h. bei einer Erhitzung für wenige Sekunden ermöglicht wird.The difference to the so-called low-temperature sintering, in which by simultaneous quasi-isostatic pressing with pressures of 20 to 30 MPa and simultaneous heating of the joining partners to about 22O 0 C is a connection is that now with significantly lower pressures a connection tact-fast, ie when heated for a few seconds.
Dabei bleiben gleichzeitig die folgenden Nachteile des Standes der Technik vermieden: Durch die bisherige gleichzeitige Anwendung von hohem Druck und Temperatur- Steigerung werden statische und dynamische Spannungen in Werkstoffen der Fügepartner induziert, die, beispielsweise bei ungehäusten Silizium-Halbleiterbauelementen und keramischen Leiterplatten dazu führen konnten, dass diese sehr spröden Werkstoffe Risse bildeten.At the same time, the following disadvantages of the prior art are avoided: Due to the previous simultaneous application of high pressure and temperature increase, static and dynamic stresses in materials of the joining partners are induced, which, for example in the case of unhoused silicon semiconductor components and ceramic printed circuit boards, could lead to these very brittle materials cracking.
Dabei wurde die natürliche Sprödigkeit dieser Werkstoffe durch die typischen Bearbeitungsmethoden gefordert. Den Siliziumchips wurde durch Sägen an den Sägekanten bereits initiale Mikrorisse zugefügt (das sog. Chipping). Den keramischen Leiterplatten wurde durch das Brechen, das einem lediglich Ritzen durch Laser nachfolgte, bereits ebenso eine partielle Vorschädigung gegeben.The natural brittleness of these materials was demanded by the typical processing methods. Initial microcracks were added to the silicon chips by sawing on the saw edges (so-called chipping). The ceramic circuit boards were already given a partial pre-damage by breaking, which was followed by laser scribing.
Erst bei den nachfolgenden Hochdruckbehandlungen wurde beim klassischen Niedertemperatursintern ein störendes Risswachstum bis hin zur Zerstörung des Bauelementes beobachtet. Für einige nicht planare Bauelemente ist das Niedertemperatursintern wegen der Bauteilesprödheit und schwieriger dreidimensionaler Formgebungen (z. B. SMD-Widerstände und SMD-Kondensatoren) direkt zerstörend und daher steht dem Sintern dieser Anwendungsbereiche bisher nicht offen.It was not until the subsequent high-pressure treatments that a disturbing crack growth up to the destruction of the component was observed in classical low-temperature sintering. For some non-planar devices, low-temperature sintering is directly destructive because of component brittleness and difficult three-dimensional shapes (eg, SMD resistors and SMD capacitors), and so sintering has not hitherto been open to these applications.
Durch das erfindungsgemäße Vorgehen ergeben sich nun drei Vorteile gegenüber dem Stand der Technik:The procedure according to the invention now yields three advantages over the prior art:
• Das Platzieren und Fixieren des elektronischen Bauelementes geschieht durch geringe Kräfte, die gerade geeignet sind, das Bauteil am gewünschten Ort auf dem Schaltungsträger zu halten.• The placement and fixing of the electronic component is done by low forces that are just suitable to keep the component at the desired location on the circuit board.
• Das Fixieren und das Sintern sind dabei getrennte Vorgänge. Das Fixieren erfolgt überwiegend durch eine Verkrallung in der Oberfläche der Fügepartner bzw. der Silber-Fügeschichten.• Fixing and sintering are separate processes. The fixing takes place predominantly by a clawing in the surface of the joining partners or the silver joining layers.
• Das nachfolgende Sintern erfolgt drucklos in einem Wärmeofen bei Temperaturen zwischen 170°C bis 300°C, kann also ggf. in einer Transportstraße für Bauelemente einfach eingefügt werden. • Zur Förderung der Sinterqualität kann die Atmosphäre für bestimmte Metallsuspensionsschichten optional mit einem inerten oder reaktiven Gas eingestellt werden. Als inertes Gas eignet sich z.B. Stickstoff und als reaktives Gas kann Formiergas oder mit- Ameisensäure gesättigtes Inertgas eingesetzt werden.• The subsequent sintering is carried out without pressure in a heating furnace at temperatures between 170 ° C to 300 ° C, so it may be easily inserted in a transport line for components. • To promote sintering quality, the atmosphere for certain metal suspension layers can optionally be adjusted with an inert or reactive gas. Nitrogen is suitable as the inert gas, for example, and forming gas or inert gas saturated with formic acid can be used as the reactive gas.
Dabei muss man sich das Verkrallen bei der Fixierung vorstellen wie das Ineinan- derverkrallen von Schneekristallen beim Rollen von Schneemannkugeln. Durch die raue Oberfläche und die Möglichkeit der Verdichtung ergibt sich die Verkrallung, ohne dass die Schichtdicke wesentlich abnimmt.One has to imagine the locking in the fixation like the interlocking of snow crystals when rolling snowman balls. Due to the rough surface and the possibility of compaction results in the claw, without the layer thickness decreases significantly.
Weitere Vorteile und Merkmale der Erfindung ergeben sich aus nachfolgender Beschreibung eines bevorzugten Ausführungsbeispiels anhand einer beigefügten Zeichnung. Dabei zeigt :Further advantages and features of the invention will become apparent from the following description of a preferred embodiment with reference to an accompanying drawing. Showing:
Fig. 1 ein metallisiertes Bauelement, das über einer vorbeschichteten und getrockneten Metallsuspensionsschicht platziert ist,FIG. 1 shows a metallized device placed over a precoated and dried metal suspension layer. FIG.
Fig. 2 die Elemente der Fig. 1, die durch geringen Druck miteinander fixiert sindFig. 2, the elements of Fig. 1, which are fixed together by low pressure
Fig. 3 die Elemente der Fig. 2 nach einem drucklosen Temperierschritt, der für eine bevorzugt vollständige Volumensinterung sorgt,3 shows the elements of FIG. 2 after an unpressurised temperature control step, which ensures preferably complete volume sintering, FIG.
Fig. 4 ein unter- und weiter noch oberseitig metallisiertes Bauelement über einer zuvor aufgetragenen und getrockneten Metallsuspensionsschicht wie in Fig. 1,4 shows a lower and further metallized component on a previously applied and dried metal suspension layer as in Fig. 1,
Fig. 5 die Elemente der Fig. 4, die durch geringen Druck miteinander fixiert sind und eine darüber - noch separat angeordnete - Kontaktlasche,5, the elements of FIG. 4, which are fixed together by low pressure and an over - yet separately arranged - contact tab,
Fig. 6 die Elemente der Fig. 5, wobei durch geringen Druck auch die Kontakt- lasche mit den anderen Elementen fixiert ist, und Fig. 7 die Elemente der Fig. 6 nach einem drucklosen Temperierschritt, der für eine bevorzugt vollständige Volumensinterung aller fixierten Kontaktpositionen sorgtFIG. 6 shows the elements of FIG. 5, wherein the contact tab with the other elements is fixed by low pressure, and FIG. 7 shows the elements of FIG. 6 after a pressure-free tempering step, which ensures a preferably complete volume sintering of all fixed contact positions
Schritt 1:Step 1:
Ein Substratmaterial bzw. eine Chip Rückseite, oder in einer bevorzugten Ausführungsform auf beide zu fügende Oberflächen, wird durch bevorzugt mit einem Schablonendrucker eine Silberpartikel enthaltenen Schicht in gleichmässiger Schichtdicke aufgebracht. Dieses geschieht selektiv an den Stellen, an denen das Bauelement platziert werden soll bzw., wenn auf den Chip aufgebracht wird, voll- flächig. Andere Aufbringungstechniken, insbesondere das Sprühen, sind denkbar. Ein Tauchen oder Spin-on einer Silberpartikellösung dagegen würde Probleme mit einer schichtdicken Varianz mit sich bringen.A substrate material or a chip backside, or in a preferred embodiment on both surfaces to be joined, is applied in a uniform layer thickness by means of a layer containing silver particles, preferably with a stencil printer. This is done selectively at the points where the device is to be placed or, if applied to the chip, a full surface. Other application techniques, in particular spraying, are conceivable. On the other hand, diving or spin-on of a silver particle solution would cause problems with layer-wide variance.
Schritt 2:Step 2:
Nach dem Auftrag wird die Schicht getrocknet und so von den flüchtigen organischen Bestandteilen befreit. Dabei unterstützen Temperaturen von bis zu 1500C den Prozess, um hohe Taktraten zu gewährleisten. Die hierdurch erzeugte getrocknete Schicht weist eine große Porosität und eine große Rauhigkeit auf.After application, the layer is dried and freed from the volatile organic compounds. Temperatures of up to 150 0 C support the process to ensure high clock rates. The dried layer produced thereby has a large porosity and a large roughness.
Würde auf diesen Schritt verzichtet werden und sogenanntes „Nassaufbringen" erfolgen, wäre zu befürchten, dass die dann noch mobilen Silberpartikel in der Lösungsmittelsuspension beim Ausgasen sich noch bewegen würden und sich Kanäle zum Austrag des Lösungsmittels in der Schicht bilden würden. Diese Kanäle wären als Beginn von Mikrorissen äußerst unerwünscht. Daher ist das vollständige Trocknen der Schicht ein wesentlicher Bestandteil des Verfahrens unabhängig davon, ob die Metallsuspensionen mit thermisch sich aktivierenden Bestandteilen versehen sind oder nicht. Bevorzugt jedoch werden derartige Zusammensetzungen gewählt, die bei einer Trocknungstemperatur von 150°C noch nicht zusätzliche exothermi- sche Energie lokal freisetzen, sondern dies erst bei der wesentlich höheren Temperatur von beispielsweise 25O0C tun, weil sie erst durch diese hohen Temperaturen aktiviert werden. In Abstimmung auf die gewählte Zusammensetzung der Metallpulversuspension kann die Trocknungstemperatur zur Beschleunigung des Prozesses so hoch gewählt sein, dass eine vorzeitige (noch) Versinterung unterbleibt.If this step were to be dispensed with and so-called "wet application" carried out, it would be feared that the still mobile silver particles would still move in the solvent suspension during outgassing and channels would form to discharge the solvent in the layer Thus, complete drying of the layer is an integral part of the process, whether or not the metal suspensions are provided with thermally activating constituents, but preferably such compositions are chosen which do not yet exist at a drying temperature of 150 ° C locally release additional exothermic energy, but do so only at the much higher temperature of for example 25O 0 C, because they are activated only by these high temperatures. In agreement with the selected composition of the metal powder suspension, the drying temperature can be chosen so high for accelerating the process that premature (nor) sintering is omitted.
Schritt 3:Step 3:
Das elektrotechnische Bauelement wird von einer Bauelement Greif- und Absetzvorrichtung an die vorbestimmte Position gebracht und einseitige oder beidseitige Silberschichten, die auf die Bauteile aufgebracht werden, werden durch die beim Auftrag erfolgende Kraftaufbringung ineinander gedrückt und miteinander verkrallt. Dies ist ein kurzer 0,1 bis 3 Sekunden dauernder Platzierprozess, wobei die erforderliche Kraft nur so groß ist, dass die raue Oberfläche umgeformt wird und sich gegenseitig verkrallt. Die Halterung durch Verkrallen muss dabei nicht den Anforderungen für späteren Einsatz genügen sondern lediglich nur so stark sein, dass während des Fortbewegungsprozesses in der Herstellung die Bauelemente nicht mehr verrutschen.The electrotechnical component is brought to a predetermined position by a component gripping and depositing device and unilateral or bilateral silver layers applied to the components are pressed together by the force applied during the application and clawed together. This is a short 0.1 to 3 second placement process, with the required force only enough to reshape the rough surface and claw each other. The bracket by Verkrallen does not have to meet the requirements for later use but only be so strong that during the process of locomotion in the manufacture of the components no longer slip.
Wie zuvor schon am Beispiel von Schnee illustriert, ist durch die zweidimensionale Verkrallung der rauen getrockneten Metallschicht in einer Silber- oder Goldoberfläche eine einfache Haftung vorgesehen. In gleicher Weise haftet ein Schneeball an einer Zementwand oder eben der Schnee in sich, wenn ein Schneeball geformt wird.As already illustrated by the example of snow, the two-dimensional clawing of the rough dried metal layer in a silver or gold surface provides for easy adhesion. Similarly, a snowball sticks to a cement wall, or even snow, when a snowball is formed.
Falls an dieser Stelle die Haftung nicht bei Raumtemperatur ausreichend ist, kann durch eine Erhöhung der Temperatur wieder bis auf beispielsweise 150°C die Haftung verbessert werden. Dies wäre im Beispiel „Schnee" einem feuchten Schnee gleichzusetzen.If the adhesion is not sufficient at room temperature at this point, the adhesion can be improved again by increasing the temperature up to, for example, 150 ° C. In the example "snow" this would be equivalent to a wet snow.
Schritt 4: hi einem vierten Schritt wird das so fixierte Bauelement schließlich einem nachfolgenden Wärmeprozess ohne weiteren Druck ausgesetzt, wobei eine Diffusion der Silberatome in die Grenzfläche des Fügepartners und umgekehrt stattfindet, so dass sich die erwünschte hochtemperatur- und temperaturwechselfeste, für Kraftfahr- zeuganwendungen auch über viele Jahre stabile Verbindung ergibt.Step 4: In a fourth step, the component thus fixed is finally subjected to a subsequent heat process without further pressure, wherein a diffusion of the silver atoms into the interface of the joining partner and vice versa takes place, so that the desired high temperature and temperature change resistant, for motor vehicle applications also stable connection over many years.
In Fig. 1 ist ein mit üblichen Verfahren vor-metallisiertes Bauelement dargestellt, das über einer z.B. mit ca. 50 Mikrometer vorbeschichteten und bei einer Tempera- tur von weniger als 140°C für wenige Minuten (bevorzugt 1-3 min) getrockneten Metallsuspensionsschicht platziert ist. Ein geeignete Vorverdichtung der Schicht, um diese besser lagern zu können, und Abrieb zu vermeiden, kann vor dem Fixieren des Bauelementes schon an der Schicht erfolgt sein.FIG. 1 shows a pre-metallized component which is precoated with an example of about 50 micrometers and at a temperature of about 50 micrometers. temperature of less than 140 ° C for a few minutes (preferably 1-3 minutes) dried metal suspension layer is placed. A suitable pre-compaction of the layer in order to store it better, and to avoid abrasion, may have already taken place on the layer before the component is fixed.
Weiter kann in einer Variante an einem der Verbindungspartner eine auf gleiche oder ähnliche Weise erzeugte Schicht - nur um diese als gleichartig zur einer Vormetallisierung zu verwenden - auch schon ausgesintert sein. Es reicht, wenn eine Schicht noch aus lediglich getrockneter, nicht versinterter Paste/Suspension besteht.Furthermore, in a variant on one of the connection partners, a layer produced in the same or a similar way - even in order to use it as similar to a pre-metallization - may also have already been sintered. It is sufficient if a layer still consists only of dried, non-sintered paste / suspension.
Dann werden die Elemente (siehe Fig. 2), durch geringen Druck miteinander fixiert sind. Dabei kann ein Druck von 1 - 10 MPa, bevorzugt 2 - 6MPa und hierin weiter bevorzugt für eine Sekunde mit weniger als 5 MPa ausgeübt werden.Then the elements (see Fig. 2) are fixed together by low pressure. In this case, a pressure of 1-10 MPa, preferably 2-6 MPa, and herein more preferably for a second less than 5 MPa can be exercised.
Fig. 3 zeigt die Elemente der Fig.. 2 nach einem drucklosen Temperierschritt, bei pastenabhängigen Temperaturen von typischerweise mehr als 2300C, der für eine bevorzugt vollständige Volumensinterung sorgt. Reaktive Prozessgase können eine Versinterung beschleunigen.Fig. 3 shows the elements of FIG . 2 after a non-pressurized tempering, at paste-dependent temperatures of typically more than 230 0 C, which ensures a preferably complete volume sintering. Reactive process gases can accelerate sintering.
Fig. 4 bis 7 zeigen, wie stellvertretend für viele mögliche Elemente, eine Kontaktlasche durch geringen Druck mit der Baugruppe auf gleiche Weise fixiert wird.Figs. 4 to 7 show, as representative of many possible elements, a contact tab is fixed by low pressure with the assembly in the same way.
hi sehr vorteilhafter Weise wird durch geringen Druck auf die Kontaktlasche diese bereits transportfest mit den anderen Elementen fixiert, und kann schließlich mit einem dracklosen Temperierschritt, der für eine bevorzugt vollständige Volumensinterung aller fixierten Kontaktpositionen (z.B. auch vieler Kontaktlaschen) sorgt, die erwünschte hochtemperatur- und temperaturwechselfeste, über viele Jahre stabile Verbindung erhalten (Fig. 7).hi very advantageous manner is fixed by low pressure on the contact strap this already transportable with the other elements, and finally with a dracklosen tempering, which ensures a preferred complete volume sintering of all fixed contact positions (eg, many contact tabs), the desired high-temperature and temperature change resistant, stable over many years compound obtained (Fig. 7).
Das erfmdungsgemäße Verfahren zur Schaffung einer hochtemperatur- und tempe- raturwechselfesten Verbindung eines Baugruppen-Halbleiters und eines Halbleiterbausteins mit einem temperaturbeaufschlagenden Verfahren, bei dem auf die Bereiche der später zu verbindenden einzelnen Halbleiter-Bausteine eine Metallpulversuspension aufgebracht wird, die Suspensionsschicht unter Ausgasen der flüchtigen Bestandteile und unter Erzeugung einer porösen Schicht getrocknet wird, anschließend die poröse Schicht vorverdichtet wird, ohne dass eine vollständige, die Sus- pensionsschicht durchdringende Versinterung stattfindet, wobei zur Erlangung einer festen elektrisch und thermisch gut leitenden Verbindung eines Halbleiter-Bausteins auf einem Verbindungspartner aus der Gruppe : Substrat, weiterem Halbleiter oder Schaltungsträger, die Verbindung eine ohne Pressdruck durch Temperaturerhöhung erzeugte Sinterverbindung ist, die aus einer getrockneten Metallpulversuspension besteht, die in einem Vorverdichtungsschritt mit dem Verbindungspartner einen ersten transportfesten Kontakt mit dem Verbindungspartner erfahren hat, und drucklos unter Temperaturaussinterung verfestigt wurde kann in einer bevorzugten Ausführungsform daurch erweitert werden, dass mehr als eine Seite eines Verbindungspartners mit Metallsuspensionsauftrag versehen wird.The erfmdungsgemäße method for creating a high-temperature and tempe- raturwechselfesten connection of a module semiconductor and a semiconductor device with a temperaturbeaufschlagenden method in which a metal powder suspension is applied to the areas of the individual semiconductor devices to be joined later, the suspension layer with outgassing of the volatile constituents and dried to form a porous layer, then precompressed the porous layer, without a complete, the Sus- pensionsschicht penetrating sintering takes place, wherein to obtain a solid electrically and thermally well-conductive compound of a semiconductor device on a connection partner from the group: substrate, further semiconductor or circuit carrier, the compound is a sintered compound produced without pressing pressure by increasing the temperature, which consists of a dried metal powder suspension consists, in a Vorverdichtungsschritt with the connection partner has undergone a first transport-resistant contact with the connection partner, and was solidified under temperature Ausausung unpressurized in a preferred embodiment can be extended daurch that more than one side of a connection partner is provided with metal suspension order.
Weiter kann zur Förderung der Sinterqualität die Atmosphäre (in einer abgeschlossenen Kammer) während der Erhitzung mit einem inerten oder reaktiven Gas angereichert werden. Das inerte Gas kann bevorzugt Stickstoff als Hauptbestandteil enthalten. Als reaktives Gas wird ein solches mit einem überwiegenden Bestandteil von Formiergas vorgeschlagen. Further, to promote sintering quality, the atmosphere (in a sealed chamber) may be enriched with an inert or reactive gas during heating. The inert gas may preferably contain nitrogen as a main component. The reactive gas proposed is one with a predominant constituent of forming gas.

Claims

Patentansprüche claims
1. Verfahren zur Schaffung einer hochtemperatur- und temperaturwech- selfesten Verbindung eines Baugruppen-Halbleiters und eines Halbleiterbausteins mit einem temperaturbeaufschlagenden Verfahren, bei demAnspruch [en] 1. A method for providing a high-temperature and temperature-changeable connection of an assembly semiconductor and a semiconductor component with a temperature-influencing method, in which
auf die Bereiche der später zu verbindenden einzelnen Halbleiter-Bausteine eine Metallpulversuspension aufgebracht wird,a metal powder suspension is applied to the regions of the individual semiconductor components to be connected later,
die Suspensionsschicht unter Ausgasen der flüchtigen Bestandteile und unter Erzeugung einer porösen Schicht getrocknet wird,the suspension layer is dried with outgassing of the volatiles and to form a porous layer,
die poröse Schicht vorverdichtet wird, ohne dass eine vollständige, die Suspensionsschicht durchdringende Versinterung stattfindet,the porous layer is precompressed without a complete, the suspension layer penetrating sintering takes place,
dadurch gekennzeichnet, dasscharacterized in that
zur Erlangung einer festen elektrisch und thermisch gut leitenden Verbindung eines Halbleiter-Bausteins auf einem Verbindungspartner aus der Gruppe : Substrat, weiterem Halbleiter oder Schaltungsträger, die Verbindung eine ohne Pressdruck durch Temperaturerhöhung erzeugte Sinterverbindung ist, die aus einer getrockneten Metallpulversuspension bestellt, die in einem Vorverdichtungsschritt mit dem Verbindungspartner einen ersten transportfesten Kontakt mit dem Verbindungspartner erfahren hat, und drucklos unter Temperaturaussinterung verfestigt wurde.for obtaining a solid electrically and thermally well-conductive connection of a semiconductor component on a connection partner from the group: substrate, further semiconductor or circuit carrier, the compound is a sintered compound produced by pressing without increasing temperature by pressure increase, which ordered from a dried metal powder suspension, in a Vorverdichtungsschritt with the connection partner has undergone a first transport-resistant contact with the connection partner, and was solidified under pressure Ausausausung temperature.
2. Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass mehr als eine Seite eines Verbindungspartners mit Metallsuspensionsauftrag versehen werden.2. The method according to claim 1, characterized in that more than one side of a connection partner are provided with metal suspension order.
3. Verfahren nach Anspruch 1 oder 2, dadurch gekennzeichnet, dass zur Förderung der Sinterqualität die Atmosphäre mit einem inerten oder reaktiven Gas angereichert ist. 3. The method according to claim 1 or 2, characterized in that to promote the sintering quality, the atmosphere is enriched with an inert or reactive gas.
4. Verfahren nach einem der vorangehenden Ansprüche, dadurch gekennzeichnet, dass zur Förderung der Sinterqualität die Temperaturaussinterung unter Stickstoff stattfindet.4. The method according to any one of the preceding claims, characterized in that takes place for promoting the quality of sintering Temperaturaussinterung under nitrogen.
5. Verfahren nach einem der vorangehenden Ansprüche, dadurch gekennzeichnet, dass zur Förderung der Sinterqualität die Trocknung unter Formiergas stattfindet. 5. The method according to any one of the preceding claims, characterized in that takes place to promote the quality of sintering drying under Formiergas.
EP10710533A 2009-02-13 2010-02-04 Method for producing a connection between a semiconductor component and semiconductor module resistant to high temperatures and temperature changes by means of a temperature impinging process Ceased EP2396814A2 (en)

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PCT/DE2010/000127 WO2010091660A2 (en) 2009-02-13 2010-02-04 Method for producing a connection between a semiconductor component and semiconductor module resistant to high temperatures and temperature changes by means of a temperature impinging process

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Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011114558A1 (en) * 2011-09-30 2013-04-04 Osram Opto Semiconductors Gmbh Component and method for producing this device
DE102012207652A1 (en) 2012-05-08 2013-11-14 Robert Bosch Gmbh Two-stage process for joining a semiconductor to a substrate with silver-based compound material
US8835299B2 (en) 2012-08-29 2014-09-16 Infineon Technologies Ag Pre-sintered semiconductor die structure
JP5664625B2 (en) 2012-10-09 2015-02-04 三菱マテリアル株式会社 Semiconductor device, ceramic circuit board, and semiconductor device manufacturing method
JP2015115481A (en) * 2013-12-12 2015-06-22 株式会社東芝 Semiconductor component and method of manufacturing semiconductor component
DE102014104272A1 (en) * 2014-03-26 2015-10-01 Heraeus Deutschland GmbH & Co. KG Carrier and clip each for a semiconductor element, method of manufacture, use and sintering paste
DE102014206606A1 (en) * 2014-04-04 2015-10-08 Siemens Aktiengesellschaft Method for mounting an electrical component on a substrate
DE102014114096A1 (en) 2014-09-29 2016-03-31 Danfoss Silicon Power Gmbh Sintering tool for the lower punch of a sintering device
DE102014114097B4 (en) 2014-09-29 2017-06-01 Danfoss Silicon Power Gmbh Sintering tool and method for sintering an electronic assembly
DE102014114093B4 (en) * 2014-09-29 2017-03-23 Danfoss Silicon Power Gmbh Method for low-temperature pressure sintering
DE102015210061A1 (en) * 2015-06-01 2016-12-01 Siemens Aktiengesellschaft Method for electrical contacting of a component and component module
DE102016108000B3 (en) * 2016-04-29 2016-12-15 Danfoss Silicon Power Gmbh Method for materially connecting a first component of a power semiconductor module to a second component of a power semiconductor module
TWI655693B (en) * 2017-02-28 2019-04-01 日商京瓷股份有限公司 Manufacturing method of semiconductor device
DE102017113153B4 (en) * 2017-06-14 2022-06-15 Infineon Technologies Ag Electronic device with chip with sintered surface material
WO2019208071A1 (en) * 2018-04-27 2019-10-31 日東電工株式会社 Manufacturing method for semiconductor device
JP7143156B2 (en) 2018-04-27 2022-09-28 日東電工株式会社 Semiconductor device manufacturing method
FR3121278A1 (en) * 2021-03-26 2022-09-30 Safran Electronics & Defense Method for assembling an electronic component to a substrate by pressing
DE102021116053A1 (en) 2021-06-22 2022-12-22 Danfoss Silicon Power Gmbh Electrical conductor, electronic assembly with an electrical conductor and method for manufacturing an electronic assembly with an electrical conductor
DE102021121625B3 (en) * 2021-08-20 2022-11-03 Danfoss Silicon Power Gmbh Method for producing an electronic assembly having at least one active electronic component and at least one passive component
EP4224521A1 (en) 2022-02-07 2023-08-09 Siemens Aktiengesellschaft Semiconductor device comprising a semiconductor element with a contacting element produced by thermal spraying, and a method of producing the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006352080A (en) * 2005-05-16 2006-12-28 Fuji Electric Holdings Co Ltd Semiconductor device and its manufacturing method

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6077178A (en) * 1983-09-30 1985-05-01 株式会社東芝 Ceramic bonded body and manufacture
IN168174B (en) 1986-04-22 1991-02-16 Siemens Ag
EP0275433B1 (en) * 1986-12-22 1992-04-01 Siemens Aktiengesellschaft Method for mounting electronic components on a substrate, foil to carry out the method and method to produce the foil
JPS6412404A (en) * 1987-07-06 1989-01-17 Hitachi Ltd Conductor material
US4902648A (en) * 1988-01-05 1990-02-20 Agency Of Industrial Science And Technology Process for producing a thermoelectric module
US6069380A (en) * 1997-07-25 2000-05-30 Regents Of The University Of Minnesota Single-electron floating-gate MOS memory
US6930451B2 (en) * 2001-01-16 2005-08-16 Samsung Sdi Co., Ltd. Plasma display and manufacturing method thereof
US7296727B2 (en) * 2001-06-27 2007-11-20 Matsushita Electric Industrial Co., Ltd. Apparatus and method for mounting electronic components
EP1280196A1 (en) * 2001-07-18 2003-01-29 Abb Research Ltd. Process for bonding electronic devices to substrates
JP2006511098A (en) * 2002-10-11 2006-03-30 チエン−ミン・ソン Carbonaceous heat spreader and related methods
WO2004049402A2 (en) * 2002-11-22 2004-06-10 Saint-Gobain Ceramics & Plastics, Inc. Zirconia toughened alumina esd safe ceramic composition, component, and methods for making same
US20050127134A1 (en) 2003-09-15 2005-06-16 Guo-Quan Lu Nano-metal composite made by deposition from colloidal suspensions
JP2007527102A (en) 2004-02-18 2007-09-20 バージニア テック インテレクチュアル プロパティーズ インコーポレーテッド Nanoscale metal pastes for interconnection and methods of use
JP2006202586A (en) * 2005-01-20 2006-08-03 Nissan Motor Co Ltd Bonding method and bonding structure
JP4638382B2 (en) * 2006-06-05 2011-02-23 田中貴金属工業株式会社 Joining method
JP2008010703A (en) * 2006-06-30 2008-01-17 Fuji Electric Holdings Co Ltd Method for bonding between components of semiconductor device
DE102006033073B3 (en) 2006-07-14 2008-02-14 Danfoss Silicon Power Gmbh A method of providing a heat and impact resistant connection of the package semiconductor and semiconductor device configured for pressure sintering
JP2008153470A (en) * 2006-12-18 2008-07-03 Renesas Technology Corp Semiconductor apparatus and manufacturing method of semiconductor apparatus
JP5151150B2 (en) * 2006-12-28 2013-02-27 株式会社日立製作所 Composition for forming conductive sintered layer, and method for forming conductive film and bonding method using the same
WO2008081758A1 (en) * 2006-12-28 2008-07-10 Tokuyama Corporation Process for producing metallized aluminum nitride substrate
JP4872663B2 (en) * 2006-12-28 2012-02-08 株式会社日立製作所 Joining material and joining method
JP4873160B2 (en) * 2007-02-08 2012-02-08 トヨタ自動車株式会社 Joining method
US8555491B2 (en) 2007-07-19 2013-10-15 Alpha Metals, Inc. Methods of attaching a die to a substrate
DE102007035788A1 (en) * 2007-07-31 2009-02-05 Robert Bosch Gmbh Wafer joining process, wafer assembly and chip

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006352080A (en) * 2005-05-16 2006-12-28 Fuji Electric Holdings Co Ltd Semiconductor device and its manufacturing method

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
BAI J G ET AL: "Processing and Characterization of Nanosilver Pastes for Die-Attaching SiC Devices", IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, IEEE, PISCATAWAY, NY, US, vol. 30, no. 4, October 2007 (2007-10-01), pages 241 - 245, XP011192995, ISSN: 1521-334X, DOI: 10.1109/TEPM.2007.906508 *
See also references of WO2010091660A2 *
SVEN KLAKA: "Eine Niedertemperatur-Verbindungstechnik zum Aufbau von Leistungshalbleitermodulen", 1997, CUVILLIER VERLAG, GÖTTINGEN, DEUTSCHLAND, ISBN: 978-3-89588-771-0, article "Kapitel 3: Der Verbindungsmechanismus", pages: 9 - 41, XP001526263 *
SVEN KLAKA: "Eine Niedertemperatur-Verbindungstechnik zum Aufbau von Leistungshalbleitermodulen", 1997, CUVILLIER VERLAG, GÖTTINGEN, DEUTSCHLAND, ISBN: 978-3-89588-771-0, article "Kapitel 5: Aufbau von Leistungsmodulen", pages: 83 - 105, XP001526265 *

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