EP2335266A1 - Tube hyperfrequences avec dispositif d'extraction d'ions produits dans le tube - Google Patents
Tube hyperfrequences avec dispositif d'extraction d'ions produits dans le tubeInfo
- Publication number
- EP2335266A1 EP2335266A1 EP09814103A EP09814103A EP2335266A1 EP 2335266 A1 EP2335266 A1 EP 2335266A1 EP 09814103 A EP09814103 A EP 09814103A EP 09814103 A EP09814103 A EP 09814103A EP 2335266 A1 EP2335266 A1 EP 2335266A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- electron
- tube
- electrode
- potential
- cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000002500 ions Chemical class 0.000 title claims abstract description 54
- 238000010894 electron beam technology Methods 0.000 claims abstract description 29
- 238000000605 extraction Methods 0.000 claims description 11
- 230000035939 shock Effects 0.000 claims description 3
- 230000005684 electric field Effects 0.000 claims description 2
- 230000003116 impacting effect Effects 0.000 abstract 1
- 238000010926 purge Methods 0.000 description 5
- 230000004888 barrier function Effects 0.000 description 3
- 230000003628 erosive effect Effects 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000000284 extract Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 1
- 230000005686 electrostatic field Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J25/00—Transit-time tubes, e.g. klystrons, travelling-wave tubes, magnetrons
- H01J25/34—Travelling-wave tubes; Tubes in which a travelling wave is simulated at spaced gaps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J23/00—Details of transit-time tubes of the types covered by group H01J25/00
- H01J23/02—Electrodes; Magnetic control means; Screens
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J23/00—Details of transit-time tubes of the types covered by group H01J25/00
- H01J23/34—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J25/00—Transit-time tubes, e.g. klystrons, travelling-wave tubes, magnetrons
- H01J25/02—Tubes with electron stream modulated in velocity or density in a modulator zone and thereafter giving up energy in an inducing zone, the zones being associated with one or more resonators
- H01J25/10—Klystrons, i.e. tubes having two or more resonators, without reflection of the electron stream, and in which the stream is modulated mainly by velocity in the zone of the input resonator
Definitions
- the invention relates to microwave tubes with linear electron beam and in particular a device for extracting positive ions produced in the tube.
- Microwave linear beam tubes such as traveling wave tubes of the acronym TOP or klystrons essentially comprise an electron gun having a cathode providing a cylindrical electron beam in a vacuum cylindrical envelope of a microwave structure of the tube.
- a collector at one end of the microwave structure, collects the electrons from the beam at the outlet of the cylindrical envelope.
- the electrons at the output of the cathode are focused in the form of a linear beam in the vacuum cylindrical envelope by means of a magnetic field.
- This magnetic field can be created either by permanent magnets or by coils around the vacuum cylindrical envelope.
- the microwave structure is the element of the tube where an interaction between the electron beam and an electromagnetic wave occurs which can be applied to a radio frequency (RF) input of the tube in the case of amplifier tubes, or created in the tube in the case of tubes operating in microwave oscillators. More precisely, the electron beam transfers part of its kinetic energy to the electromagnetic wave in the microwave structure.
- RF radio frequency
- the microwave structure comprises resonant cavities and sliding tubes in the case of a klystron and a helix or coupled cavities in the case of a TOP.
- Figure 1 shows an axial portion of a TOP propeller amplifier of the state of the art.
- the TOP of FIG. 1 comprises a microwave structure 10 having, along a longitudinal axis ZZ 'of the tube, a vacuum envelope 12 containing a helix 14 traversed along this axis ZZ' by a cylindrical beam 16 of electrons propagating from the cathode towards the anode of the tube.
- the direction of propagation of the beam is represented by the arrows F in FIG.
- the microwave structure 10 comprises, in known manner, permanent magnets separated by magnetic spacers (not shown in the figure) to provide a field of confinement (or focusing) of the beam 16 in the axis ZZ 'of the envelope under empty.
- An RF input provides an RF connection of the TOP propeller with for example an external RF source.
- the gas molecules passing through the electron beam impacted by electrons of said beam produce positive ions which move slowly, for example, on the cathode side of the tube (not shown in FIG. 1). .
- the ionic barrier is an electrode placed after the cathode and brought to a positive potential to repel or reflect positive ions from the beam.
- the disadvantage of the ionic barrier is that it aggravates the ionic relaxation described above disturbing even more strongly the RF signal in the tube. In fact, the positive ions can no longer escape through the cathode and spend more time in the electron beam.
- an electron tube comprising:
- a microwave structure having a vacuum envelope comprising two ends, the microwave structure being under a reference potential (M),
- an electron gun comprising a cathode for supplying an electron beam, along an axis ZZ ', at one end of the vacuum envelope,
- an electron collector for collecting electrons from the beam at the other end of the vacuum envelope
- the electron tube comprises, between the cathode and the microwave structure, a device for extracting positive ions comprising at least one electrode e2 brought to a negative potential with respect to the reference potential to extract positive ions from the vacuum envelope, these positive ions being produced by the shock of the electrons of the electron beam with molecules of residual gas in the envelope under empty.
- the device for extracting positive ions comprises another electrode e1 forming with the electrode e2 a pair of electrodes e1, e2, the electrodes of the pair facing each other on either side of the electron beam, the other electrode e1 of the pair being brought to the reference potential, the electrode e2 being brought to the negative potential (Vp) with respect to the reference potential to create an electric ion extraction field between the two electrodes.
- the facing electrodes have plane surfaces parallel to a plane passing through the axis ZZ 'creating a passage for the electron beam.
- each electrode e1, e2 of the pair has a cylindrical half-plate shape, the two electrodes being symmetrical on either side of the axis ZZ '.
- the plane surfaces parallel to the plane passing through the axis ZZ ' are separated by a distance De on either side of this axis ZZ' to let the electron beam of the tube pass.
- the electron tube has other devices for extracting positive ions along the electron beam in the vacuum envelope.
- the reference potential is the mass potential of the tube.
- the negative potential of the other electrode e2 is typically 100 volts below the electrical weight of the tube.
- a main objective of the invention is to produce microwave tubes suppressing the ionic relaxation phenomenon by evacuation of positive ions from the tube.
- Another goal is to protect the cathode from the tube against impacts by the positive ions.
- Another object of the invention is to postpone the impacts by the ions extracted from the tube on a predetermined surface chosen by the designer of the tube.
- FIG. 1 already described, shows an axial portion of a TOP propeller amplifier of the state of the art
- FIG. 2 represents a schematic diagram of a microwave tube according to the invention comprising a device for extracting positive ions and
- FIG. 3 shows an axial view of the extraction device of the tube of Figure 2 according to the invention.
- FIG. 2 represents a schematic diagram of a microwave tube according to the invention comprising a device for extracting positive ions.
- the microwave tube is a traveling wave tube or TOP propeller.
- the microwave tube of FIG. 2 comprises a microwave structure 30 along a longitudinal axis ZZ 'containing a vacuum cylindrical envelope 32 having two ends.
- An electron gun 34 comprising a cathode 36 under a negative high voltage potential HT relative to a mass M of the tube (reference potential) provides a cylindrical electron beam 38 at high speed along the axis ZZ 'at one of the ends of the cylindrical envelope under vacuum.
- the tube comprises a collector 40 for collecting the electrons at the output of the microwave structure 30, at the other end of the vacuum cylindrical envelope.
- the vacuum cylindrical envelope 32 comprises a helix 42 along the axis ZZ 'acting as a waveguide.
- the TOP is an RF amplifier comprising an RF input 50 connected to one of the ends of the helix, on the side of the cathode 34, and an RF output 52 connected to the other end. of the propeller on the side of the manifold 40.
- the hyperfrequency structure 30 of the TOP comprises, around the axis ZZ ', coils 60 providing a magnetic confinement field (or focusing) of the electron beam 38 along the axis ZZ'.
- the device for extracting positive ions from the microwave tube of FIG. 2 comprises a pair Pe of electrodes (ionic purge) between the cathode 36 and an end of the microwave structure 30, on the side of the cathode 36.
- the positive ion extraction device comprises a first electrode e1 connected to the mass M of the tube and according to a main characteristic of the invention, a second electrode e2 connected to a potential Vp negative with respect to the mass of the tube.
- This negative potential Vp is also designated by ion purge potential.
- the ionic purge potential Vp applied to the second electrode e2 is typically 100 volts below the electrical mass M of the tube, but this voltage Vp can be of significantly different value depending on the spacing chosen between the electrodes of the device. positive ion extraction.
- the positive ions In arriving near the pair Pe of electrodes e1, e2 are extracted from the beam 38 laterally.
- the ions In in the electron beam 38 take a radial velocity which extracts them from the beam towards the second electrode e2, also designated by ion purge electrode, and moves them away from the axis ZZ '.
- the In ions, in this configuration according to the invention, are projected onto a surface of the tube chosen by the designer of the tube thus avoiding their projection on the cathode 36 and consequently suppressing the erosion of the cathode (sputtering).
- Figure 3 shows an axial view of the extraction device of the tube of Figure 2 according to the invention.
- FIG. 3 shows the pair Pe of electrodes e1, e2 in the plane Pr perpendicular to the axis ZZ 'of the hyperfrequency structure of the TOP of FIG. 2.
- Each electrode e1, e2 of the pair Pe has a cylindrical half-plate shape, the two electrodes e1, e2 being symmetrical on either side of the axis ZZ 'of the vacuum envelope, each having a rectilinear edge.
- b1, b2 in the form of a flat surface. The flat surfaces of the rectilinear edges of the cylindrical half-plates are parallel and separated by a distance on either side of this axis ZZ 'to let the electron beam of the tube pass.
- the electrode e1 is connected to the mass of the tube and the electrode e2 (or ionic extractor) is connected to a source Ep supplying the negative potential Vp with respect to this mass M
- the positive ions in the electron beam passing between the two half-plates e1, e2 are attracted to the negative potential Vp when they arrive near the electrode e2 (or the ion extractor).
- the negative ions extracted from the electron beam 38 pass through the half-plate e2 and are conducted by the electrical connection 62 connecting the half-plate e2 to the source Ep of negative potential Vp to an ion projection surface determined by the designer. tube (surface not shown in Figure 3).
- the non-axisymmetric shape of the pair Pe of electrodes makes it possible to generate between the edges b1, b2 of the two electrodes e1, e2 a static electric field Ech whose component perpendicular to the axis of the beam of electrons is non-zero.
- the positive ions of the beam take a radial velocity which extracts them from the beam and moves them away from the axis ZZ 'of the tube.
- the positive ions are projected onto the projection surface chosen by the designer and on which the sputtering does not endanger the operation of the tube.
- the electrostatic field produced by the electrodes e1, e2 is too weak to significantly influence the electron trajectories of the electron beam of the tube, only the trajectories of the positive ions are deflected.
- the positive ion extraction device evacuates the positive ions of the beam, significantly reducing the ionic relaxation problem and makes it possible to choose the impact surface of the ions, which avoids a erosion of the sensitive surfaces of the tube, and in particular that of the cathode, endangering the operation of the tube
- the vacuum envelope may comprise several ionic purges, or several pairs of positive ion extraction electrodes along the path of the electron beam, or along the 'ZZ axis', to more effectively eliminate the influence of positive ions in the microwave tube.
- TOP described is not limiting and the invention can be applied to other types of electronic tubes, forms of vacuum envelopes and electron beams.
- the electron beam may be of rectangular section.
- the invention applies to electronic tubes comprising either a hot cathode or a cold cathode.
- the axis ZZ ' is, in other electron tubes, the output axis of electrons that can propagate subsequently in other directions in microwave structures of different shapes depending on the application.
Landscapes
- Electron Sources, Ion Sources (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0805154A FR2936354B1 (fr) | 2008-09-19 | 2008-09-19 | Tube hyperfrequences avec dispositif d'extraction d'ions produits dans le tube |
PCT/EP2009/060856 WO2010031655A1 (fr) | 2008-09-19 | 2009-08-24 | Tube hyperfrequences avec dispositif d'extraction d'ions produits dans le tube |
Publications (2)
Publication Number | Publication Date |
---|---|
EP2335266A1 true EP2335266A1 (fr) | 2011-06-22 |
EP2335266B1 EP2335266B1 (fr) | 2012-03-14 |
Family
ID=40510463
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP09814103A Active EP2335266B1 (fr) | 2008-09-19 | 2009-08-24 | Tube hyperfrequences avec dispositif d'extraction d'ions produits dans le tube |
Country Status (5)
Country | Link |
---|---|
US (1) | US8823263B2 (fr) |
EP (1) | EP2335266B1 (fr) |
AT (1) | ATE549739T1 (fr) |
FR (1) | FR2936354B1 (fr) |
WO (1) | WO2010031655A1 (fr) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10490381B2 (en) * | 2013-09-04 | 2019-11-26 | Qmast Llc | Sheet beam klystron (SBK) amplifiers with wrap-on solenoid for stable operation |
JP5835822B1 (ja) * | 2014-06-30 | 2015-12-24 | Necネットワーク・センサ株式会社 | 高周波回路システム |
CN105590819A (zh) * | 2016-03-11 | 2016-05-18 | 中国工程物理研究院应用电子学研究所 | 一种全腔提取相对论磁控管的混合励磁系统 |
WO2018151253A1 (fr) * | 2017-02-20 | 2018-08-23 | Necネットワーク・センサ株式会社 | Tube électronique hyperfréquence, dégazeur, dispositif d'amplification hyperfréquence et source d'alimentation |
JP7092470B2 (ja) * | 2017-07-24 | 2022-06-28 | Necネットワーク・センサ株式会社 | 電子銃 |
CN114512384B (zh) * | 2022-01-24 | 2023-04-28 | 电子科技大学 | 一种基于圆波导的外挂式冷阴极放大器 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2963605A (en) * | 1954-11-04 | 1960-12-06 | Varian Associates | Ion draining structures |
WO1982001101A1 (fr) * | 1980-09-22 | 1982-04-01 | Yamamoto K | Magnetron |
JP3156763B2 (ja) * | 1997-08-12 | 2001-04-16 | 日本電気株式会社 | 冷陰極搭載電子管の電極電圧印加方法および装置 |
JP2005116355A (ja) * | 2003-10-08 | 2005-04-28 | Nec Microwave Inc | マイクロ波管システム及びマイクロ波管 |
-
2008
- 2008-09-19 FR FR0805154A patent/FR2936354B1/fr not_active Expired - Fee Related
-
2009
- 2009-08-24 US US13/120,069 patent/US8823263B2/en not_active Expired - Fee Related
- 2009-08-24 AT AT09814103T patent/ATE549739T1/de active
- 2009-08-24 EP EP09814103A patent/EP2335266B1/fr active Active
- 2009-08-24 WO PCT/EP2009/060856 patent/WO2010031655A1/fr active Application Filing
Non-Patent Citations (1)
Title |
---|
See references of WO2010031655A1 * |
Also Published As
Publication number | Publication date |
---|---|
WO2010031655A1 (fr) | 2010-03-25 |
US20110266951A1 (en) | 2011-11-03 |
EP2335266B1 (fr) | 2012-03-14 |
FR2936354A1 (fr) | 2010-03-26 |
US8823263B2 (en) | 2014-09-02 |
FR2936354B1 (fr) | 2012-09-21 |
ATE549739T1 (de) | 2012-03-15 |
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