EP2279545A1 - Kontakteinheit und verfahren zur herstellung einer kontakteinheit - Google Patents
Kontakteinheit und verfahren zur herstellung einer kontakteinheitInfo
- Publication number
- EP2279545A1 EP2279545A1 EP09749565A EP09749565A EP2279545A1 EP 2279545 A1 EP2279545 A1 EP 2279545A1 EP 09749565 A EP09749565 A EP 09749565A EP 09749565 A EP09749565 A EP 09749565A EP 2279545 A1 EP2279545 A1 EP 2279545A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- layer
- tin
- contact unit
- duplex
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 15
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 88
- 229910000679 solder Inorganic materials 0.000 claims abstract description 20
- 238000000034 method Methods 0.000 claims description 33
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 22
- 229910052759 nickel Inorganic materials 0.000 claims description 11
- 238000009499 grossing Methods 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims description 2
- 239000006259 organic additive Substances 0.000 claims description 2
- 238000005491 wire drawing Methods 0.000 claims 1
- 239000002184 metal Substances 0.000 abstract description 3
- 229910052751 metal Inorganic materials 0.000 abstract description 3
- 239000010410 layer Substances 0.000 description 120
- 238000005476 soldering Methods 0.000 description 27
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000011161 development Methods 0.000 description 4
- 230000018109 developmental process Effects 0.000 description 4
- 239000011247 coating layer Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 230000003746 surface roughness Effects 0.000 description 3
- 238000004581 coalescence Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000010943 off-gassing Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005246 galvanizing Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000009732 tufting Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
- H01R4/02—Soldered or welded connections
- H01R4/029—Welded connections
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/02—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for soldered or welded connections
- H01R43/0256—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for soldered or welded connections for soldering or welding connectors to a printed circuit board
Definitions
- the present invention relates to a contact unit and in particular a soldering pin, and a method for producing a contact unit or a soldering pin, wherein the body of the contact unit is surrounded by a tin layer.
- soldering pins with which a solder joint to a conductor or a printed circuit board is possible.
- a soldering pin with a body known, wherein the body has a metallic core of copper and a metal core surrounding tin layer.
- soldering pins can be used as solderable connector pins.
- a disadvantage of the known method is the production cost, which also increases the unit cost.
- One possible solution would be to make the contact pins via another manufacturing method in which the contact pin is not exposed to such high temperatures.
- temperatures of up to about 265 degrees Celsius also occur in the soldering processes for contact-safe fastening of the contact pins on, for example, a printed circuit board in modern soldering processes such as a reflow soldering process, the contact pins are exposed to high temperatures even at a different manufacturing process at the latest when equipping so that when soldering the contact pin with a
- Circuit board such high temperatures may occur that a dewetting of the tin layer of the contact pin occurs.
- Whiskers can in particular arise in assemblies that have been processed with lead-free tin solders.
- Tin whiskers or generally whiskers are thin or needle-shaped single crystals of a few micrometers in diameter and up to several hundred micrometers in length, which can grow out of galvanically or pyrolytically deposited layers. If whiskers break off, for example, due to vibrations or other mechanical stresses, they can cause short circuits on printed circuit boards, on electrical connections or, for example, between electrical or electronic components.
- whiskers or needle-like outgrowths from soldering spots generally burn again at low current intensities of, for example, 10 mA, the current that has flowed may have already led to component damage or malfunction.
- whiskers can only develop after years of operation and that their formation can often be poorly predicted.
- the contact unit according to the invention is embodied in particular as a soldering pin and comprises a body which has a metallic core and a tin layer surrounding or surrounding the metallic core.
- the tin layer is formed as a duplex layer and comprises a radially inner layer of matte tin and a radially outer layer of bright tin.
- the contact unit according to the invention has many advantages.
- a considerable advantage of the contact unit according to the invention is the use of the duplex layer provided around the metallic core. This will ensure that in depth the as a duplex layer executed tin layer provides the matte tin for a uniform wetting of the solder pin or the contact unit even at high soldering temperatures, while surrounding the inner layer of matte tin surrounding radially outer layer of glossy tin leads to a smooth and a mechanically compatible surface. Since the outer surface of bright tin usually serves for mechanical contacting, the contact unit according to the invention has a considerable advantage, since good mechanical compatibility and good contactability are provided.
- the inner layer support made of matte tin preferably has little or no organic components which, when the contact unit is soldered, can lead to outgassing and thus to blistering on the body of the contact unit.
- the radially outer layer of high-gloss tin has, on the other hand, only such a layer thickness on a regular basis that there is no bubble when the contact unit is being heated up.
- duplex layer according to the invention can significantly reduce or even completely prevent harmful whisker formation.
- whiskers are known to arise, especially on glossy tin layers and here the duplex layer has an outer glossy tin layer.
- the whisker formation is largely avoided by the structure according to the invention with an inner matte tin layer and an outer glossy tin layer.
- Pure matt tin layers have the disadvantage of an increased expenditure of force when plugging in and unplugging plugs compared with the duplex layer according to the invention, since there the surface roughness is higher. In addition, the visual surface quality of matt tin layers is lower.
- the invention provides a contact unit, which has both convincing mechanical properties as well good electrical and a pleasing surface quality allowed.
- Microcracks (microvoid) and the resultant possible adhesion of such microcraters ("MVC" or "microvoid coalescence”).
- MVC microcracks
- microvoid coalescence An adhesion of such microcraters can lead to functional limitations. With the duplex layer according to the invention such defects and perforations are avoided in a very satisfactory manner, so that the reliability and possible service life of the contact unit according to the invention increases.
- the thickness of the layer of matte tin is between about 50 and 85 or 90% of the radial layer thickness of the tin layer.
- the thickness of the layer of matte tin is between about 2/3 and 4/5 of the radial layer thickness of the tin layer.
- the thickness of the layer of bright tin is preferably between about 15 and 50% of the radial layer thickness of the tin layer.
- the radial layer thickness of the coating layer of bright tin is between about 1/5 and 1/3 of the radial layer thickness of the tin layer.
- a duplex layer with about 2/3 layer thickness of matt tin and about 1/3 layer thickness of bright tin satisfies the desired mechanical and electrical properties.
- the duplex layer is destroyed neither in the thermal ripping process for producing a contact unit according to the invention nor in a reflow soldering process, for example.
- Such a contact unit according to the invention also meets high demands.
- a layer thickness of the entire duplex layer is between about 2 and 10 microns.
- the thickness of the matte film layer is about 2 to 4 microns, and in particularly preferred embodiments may be about 2.5 microns.
- the radially outer layer deposit of bright tin preferably has a layer thickness of about 1 to 2 micrometers and, in particularly preferred embodiments, may be about 1.5 micrometers so that a total radial layer thickness of the tin layer of between about 3 and 5 micrometers results.
- the core is surrounded by an intermediate layer which contains nickel or consists of nickel.
- an intermediate layer is in particular applied directly to the core, to which in turn the duplex layer of matt tin and bright tin is applied.
- the coating is preferably carried out successively in galvanic processes.
- the nickel layer can be very thin. Layer thicknesses between 0.5 and 5 ⁇ m are preferred. In particular, the layer thickness of the duplex layer including the intermediate layer of nickel or a nickel-containing material is less than about 10 microns.
- the body comprises at least one penpoint tip, which is designed in particular approximately tapered and which is also surrounded by the duplex layer.
- the penpoint tip is at least substantially and in particular completely surrounded by the duplex layer in order to ensure a good mechanical contactability and a good solderability of the contact pin.
- the body is manufactured in a thermal ripping process, wherein at least at one end results in particular a tapered pen tip.
- the production of the contact unit by means of a thermal breaking process is very advantageous because the thermal Tear process is easy to perform, as well as quick and easy.
- the invention ensures that, despite the temperatures which occur, the duplex layer is also retained on the pen tip, so that a separate secondary coating of the outer surface of the body obtained by a thermal tearing process is not necessary.
- the core is polygonal, rounded or round in a cross section.
- the body consists of a portion of a wire whip that is portioned galvanically with the duplex layer and which is subdivided into defined lengths.
- the coating layer of bright tin can identify organic additives for smoothing the surface.
- the glossy tin layer preferably has a typical grain size of about 0.5 to 1.0 microns, while the matte tin employed may have a grain size of typically about 3.0 microns.
- the outermost grain size of the matte tin employed may have a grain size of typically about 3.0 microns.
- Glossy tin surface achieves the desired mechanical property of the solder pin or the contact unit, while providing for the solderability of the layer of matte tin.
- the inventive method is used to produce a contact unit and in particular for producing a soldering pin and is carried out using a Drahtschzeugs, which is initially provided with a radially inner layer of matte tin and an adjoining radially outer layer layer of bright tin. Before the application of the layer of matte tin can still be applied an intermediate layer of, for example, nickel. In one subsequent thermal rupture process, a portioned piece of the duplex layered wire whip is severed to form a soldering peg whose body is surrounded by the duplex layer.
- the method according to the invention also has many advantages.
- a significant advantage is that the manufacture is simplified and subsequent galvanic coating of the outer surface of the solder pin can be omitted, since the applied duplex layer remains present even at the usual temperatures of a reflow soldering process on the entire or almost the entire surface of the body, whereby good mechanical and electrical properties are achieved.
- the thickness of the layer of matte tin and the thickness of the layer of glossy tin are matched to one another in such a way that the pen nib is essentially surrounded by the duplex layer after the thermal ripping process. This will cause a harmful blistering is avoided.
- a wire whip is inserted and a portioned piece of wire is separated by the wire is held at the intended location by means of jaws and the wire is heated at the nip in particular by means of a power-induced integrated in the jaws heating element, whereupon through the application of train a defined body is separated.
- the wire is heated by an electric current pulse and softened. It has surprisingly been found that in the subsequent tearing process, the duplex layer is completely or almost completely preserved.
- Bubbles and dewaxing of the surfaces are regularly reliably avoided, so that homogeneous and reproducible Conditions are present at the pen tip and the other surface of the contact pin.
- Figure 1 is a schematic sectional side view of an electrical soldering pin according to the invention.
- Figure 2 shows the pen tip of the solder pin according to Fig. 1 in an enlarged view.
- solder pin 2 electrical contact unit 1 an inventive and designed as a solder pin 2 electrical contact unit 1 is shown schematically.
- the soldering pin 2 shown in FIG. 1 has a body 3 which comprises a metallic core 4.
- the metallic core 4 may for example be designed as a wire and have a round, triangular or polygonal cross-section.
- the wire whip 14 has been galvanically coated with a tin layer 5.
- the tin layer 5 is designed as a duplex layer 6, which has a radially inner
- Layer support 7 and a radially outer layer support 8 comprises.
- the radially inner layer support 7 is a matte tin layer, which has a greater surface roughness than the radially outer layer support 8, which consists of a bright tin layer.
- the bright tin layer 8 has good mechanical and electrical properties due to the significantly lower surface roughness.
- the body 3 is clamped targeted and at the later pen tip 13, the core 4 and it are the layer supports 7 and 8, thermally heated in particular by a current pulse so that at
- the penpoint tip 13 is shown enlarged. It can clearly be seen that the layer thickness 9 of the radially inner layer support 7 is significantly greater than the layer thickness 11 of the radially outer layer support 8, wherein the ratio of the layer support 8 to the thickness of the layer support 7 here in the embodiment about 1: 2.
- a thin intermediate layer 12 may be provided, which may for example consist of nickel and serves as the basis for the duplex layer 6.
- the layer thickness of the intermediate layer 12 made of nickel or a nickel-containing material is about 2.4 microns, while the layer thickness of the layer layer 7 of matte tin about 3.2 microns and the layer thickness of the layer layer 8 of bright tin is about 1.65.
- the duplex layer 6 is completely present on the surface 15 of the body 3 as far as the pen tip 13, so that good soldering conditions and mechanical properties of the soldering pin 2 can be ensured.
- the invention provides a simple production method with which soldering pegs 2 can be produced which have good mechanical and electrical properties and with which reliable soldering is possible
- the contact units 1 have a high optical characteristic
- Needle-like extensions and similar defects, such as, in particular, the growth of whiskers can also be substantially or even completely avoided, although a smooth and electrically good contact surface is provided with an outer glossy tin layer.
Landscapes
- Manufacturing Of Electrical Connectors (AREA)
- Connections Effected By Soldering, Adhesion, Or Permanent Deformation (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Electroplating Methods And Accessories (AREA)
- Contacts (AREA)
Abstract
Description
Claims
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102008024164A DE102008024164B3 (de) | 2008-05-19 | 2008-05-19 | Kontakteinheit und Verfahren zur Herstellung einer Kontakteinheit |
DE102008048613 | 2008-09-23 | ||
PCT/EP2009/003365 WO2009141075A1 (de) | 2008-05-19 | 2009-05-12 | Kontakteinheit und verfahren zur herstellung einer kontakteinheit |
Publications (2)
Publication Number | Publication Date |
---|---|
EP2279545A1 true EP2279545A1 (de) | 2011-02-02 |
EP2279545B1 EP2279545B1 (de) | 2012-11-07 |
Family
ID=40940245
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP09749565A Active EP2279545B1 (de) | 2008-05-19 | 2009-05-12 | Kontakteinheit und verfahren zur herstellung einer kontakteinheit |
Country Status (6)
Country | Link |
---|---|
US (1) | US8487183B2 (de) |
EP (1) | EP2279545B1 (de) |
CN (1) | CN101953031B (de) |
DK (1) | DK2279545T3 (de) |
ES (1) | ES2404104T3 (de) |
WO (1) | WO2009141075A1 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102011077915A1 (de) | 2011-06-21 | 2012-12-27 | Robert Bosch Gmbh | Einpresspin für eine elektrische Einpressverbindung zwischen einer elektronischen Komponente und einer Substratplatte |
DE102012202623A1 (de) * | 2012-02-21 | 2013-08-22 | Elringklinger Ag | Zellverbinder |
US8864536B2 (en) * | 2012-05-03 | 2014-10-21 | International Business Machines Corporation | Implementing hybrid molded solder-embedded pin contacts and connectors |
EP2808873A1 (de) * | 2013-05-28 | 2014-12-03 | Nexans | Elektrisch leitfähiger Draht und Verfahren zu seiner Herstellung |
CN103367942B (zh) * | 2013-06-27 | 2016-05-25 | 信义汽车玻璃(深圳)有限公司 | 一种连接线及其制备方法 |
DE202015008773U1 (de) | 2015-12-22 | 2016-01-28 | Continental Automotive Gmbh | Steckkontakt mit organischer Beschichtung und Leiterplattenanordnung |
US20190273341A1 (en) * | 2018-03-01 | 2019-09-05 | Dell Products L.P. | High Speed Connector |
JP6876025B2 (ja) * | 2018-10-22 | 2021-05-26 | 矢崎総業株式会社 | 端子金具 |
CN113008888A (zh) * | 2021-02-23 | 2021-06-22 | 苏州维信电子有限公司 | 一种用于fpc电镀纯锡回流焊的预检测方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3260580A (en) * | 1962-11-19 | 1966-07-12 | American Can Co | Tin plate having a tin-nickel-iron alloy layer and method of making the same |
US3331912A (en) * | 1965-09-17 | 1967-07-18 | Component with standoff and method of making same | |
US3853382A (en) * | 1972-04-28 | 1974-12-10 | Burndy Corp | High pressure electrical contacts |
DE3420514C2 (de) * | 1984-06-01 | 1986-04-17 | Feindrahtwerk Adolf Edelhoff GmbH & Co, 5860 Iserlohn | Verfahren zur Herstellung verzinnter Drähte |
US5427677A (en) * | 1994-02-18 | 1995-06-27 | Learonal, Inc. | Flux for reflowing tinplate |
WO1999006612A1 (en) * | 1997-07-30 | 1999-02-11 | The Whitaker Corporation | Two layer solderable tin coating |
DE19802580A1 (de) | 1998-01-23 | 1999-08-05 | Siemens Ag | Elektrischer Schaltungsträger |
JP3538747B2 (ja) * | 1998-01-27 | 2004-06-14 | 住友電装株式会社 | 端子金具 |
US6136460A (en) * | 1998-04-03 | 2000-10-24 | Olin Corporation | Tin coatings incorporating selected elemental additions to reduce discoloration |
JP4010432B2 (ja) * | 1999-01-29 | 2007-11-21 | ローム株式会社 | 電子部品におけるワイヤボンディング方法及びその装置 |
TW521896U (en) | 2000-01-03 | 2003-02-21 | Molex Inc | Connector |
US20020187364A1 (en) | 2001-03-16 | 2002-12-12 | Shipley Company, L.L.C. | Tin plating |
KR20070006747A (ko) | 2004-01-21 | 2007-01-11 | 엔쏜 인코포레이티드 | 전자부품의 주석 표면에서 납땜성의 보존과 휘스커 증식의억제 방법 |
JP4292122B2 (ja) | 2004-07-30 | 2009-07-08 | タイコエレクトロニクスアンプ株式会社 | 電気コネクタ |
-
2009
- 2009-05-12 US US12/808,853 patent/US8487183B2/en active Active
- 2009-05-12 DK DK09749565.9T patent/DK2279545T3/da active
- 2009-05-12 EP EP09749565A patent/EP2279545B1/de active Active
- 2009-05-12 WO PCT/EP2009/003365 patent/WO2009141075A1/de active Application Filing
- 2009-05-12 CN CN2009801060331A patent/CN101953031B/zh active Active
- 2009-05-12 ES ES09749565T patent/ES2404104T3/es active Active
Non-Patent Citations (1)
Title |
---|
See references of WO2009141075A1 * |
Also Published As
Publication number | Publication date |
---|---|
WO2009141075A8 (de) | 2010-09-30 |
CN101953031A (zh) | 2011-01-19 |
WO2009141075A1 (de) | 2009-11-26 |
CN101953031B (zh) | 2013-12-25 |
ES2404104T3 (es) | 2013-05-23 |
US20100314157A1 (en) | 2010-12-16 |
US8487183B2 (en) | 2013-07-16 |
EP2279545B1 (de) | 2012-11-07 |
DK2279545T3 (da) | 2013-02-11 |
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