EP2052276A1 - Sonde d'oscilloscope - Google Patents

Sonde d'oscilloscope

Info

Publication number
EP2052276A1
EP2052276A1 EP07765098A EP07765098A EP2052276A1 EP 2052276 A1 EP2052276 A1 EP 2052276A1 EP 07765098 A EP07765098 A EP 07765098A EP 07765098 A EP07765098 A EP 07765098A EP 2052276 A1 EP2052276 A1 EP 2052276A1
Authority
EP
European Patent Office
Prior art keywords
amplifier
oscilloscope
input
probe according
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP07765098A
Other languages
German (de)
English (en)
Inventor
Martin Peschke
Alexander Schild
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohde and Schwarz GmbH and Co KG
Original Assignee
Rohde and Schwarz GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohde and Schwarz GmbH and Co KG filed Critical Rohde and Schwarz GmbH and Co KG
Publication of EP2052276A1 publication Critical patent/EP2052276A1/fr
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06766—Input circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Definitions

  • the invention relates to a probe for an oscilloscope according to the preamble of the main claim.
  • the high-impedance measuring tip of the signal to be measured is connected to an amplifier serving as an impedance converter whose output has a characteristic impedance of usually 50 ohms.
  • the measurement signal is fed from the output of this amplifier via a high-frequency cable to the input of the oscilloscope, which terminates the cable with its characteristic impedance of, for example, 50 ohms, so as to avoid reflections.
  • Such amplifiers usually have a so-called DC offset error, i. an input voltage of 0 volts does not exactly correspond to an output voltage of 0 volts.
  • Amplifiers usually also still gain errors, i. E. 1 volt change of the input voltage generated at a desired voltage gain of z. For example, one not exactly 1 volt change in the output voltage.
  • Amplifier consisting of a high-frequency path for high frequencies and a low-frequency path for low frequencies and DC voltages.
  • the amplifier in the low frequency path is on Operational amplifier with the lowest possible offset.
  • the high-frequency path for high frequencies of, for example, more than 10 MHz consists of a three-stage emitter follower with npn-type transistors and is designed as an AC-coupled amplifier with a separating capacitor arranged between the measuring tip and the amplifier input.
  • Measured value evaluation considered accordingly. This can be done fully automatically by an automatic remote control of the arranged at the input of the amplifier switching device from the oscilloscope.
  • This switching device sets the input of the probe to ground potential or to a defined DC voltage. This allows the oscilloscope to directly measure offset and gain errors. Since in modern oscilloscopes, the evaluation and graphical representation of the measured values is usually digital, this is
  • Gain error eliminates the annoying manual calibration for the user prior to the initial measurement and after each temperature change.
  • automated processes such Temperature-dependent measurements are made without a user having to perform the calibrations.
  • a particular advantage of the invention is that not only the offset error or amplification error of the amplifier used in the probe can be determined and taken into account in the later measurement, but also the offset or gain error of subsequent amplifier stages in the oscilloscope itself Thus, a total offset or a total gain error can be determined and taken into account, starting from the measuring tip until the display of a measured value in the oscilloscope.
  • the amplifier can have a very simple structure, since no offset-compensating measures must be taken. Such an amplifier has improved input capacitance, input resistance, bandwidth, and frequency response characteristics.
  • impedance-converting amplifier simple in construction DC-coupled amplifier, which is constructed either of bipolar transistors in emitter follower circuit and / or field effect transistors in the source follower circuit and possibly diodes or resistors and their successive Verstarkungsetti are dimensioned and coordinated so that the resulting offset DC voltage is a minimum.
  • DC-coupled amplifier which is constructed either of bipolar transistors in emitter follower circuit and / or field effect transistors in the source follower circuit and possibly diodes or resistors and their successive Verstarkungsetti are dimensioned and coordinated so that the resulting offset DC voltage is a minimum.
  • Fig. 1 a mass-related invention
  • DC coupled amplifier constructed of bipolar transistors and / or field effect transistors or diodes and resistors.
  • Fig. 1 shows a probe 21 with a measuring tip 22, which via a multi-core cable 23 with the actual
  • Oscilloscope 24 is connected.
  • the measured value tapped off via the measuring tip 22 is preferably fed via an input divider 25 to the input V 1n of an amplifier 26 serving as an impedance converter which has the high-ohmic measured signal at its output V 0 Ut with a characteristic impedance of, for example, 50 ohms via the cable 23 to the oscilloscope 24 feeds.
  • the measurement signal is processed digitally and displayed on a screen.
  • the amplifier 26 is shown in the illustrated
  • Embodiment of three field effect transistors in the source follower circuit is constructed for example in HEMT or JFET technology whose bias current through the FET Current sources is set so that the gate-source voltage of each stage is approximately equal to zero.
  • an electronic switching device 27 is provided, which is remotely controllable via control lines of the cable 23 from the oscilloscope 24 from.
  • This switching device 27 consists of three field effect transistor switches 28, 29, 30. With the FET switch 28 closed and open switches 29, 30, the input V 1n of the amplifier 26 is the signal to be measured
  • Measuring tip 22 is supplied, with open switch 28 and 30, the input V 1n via the closed switch 29 ground potential M is supplied and open switches 28 and 29 and closed switch 30, the input V 1n from a reference frequency source 31 is a constant
  • the switch 29 thus serves to measure the offset error of the amplifier 26 in the oscilloscope 24.
  • the gain error of the amplifier 26 in the oscilloscope 24 can be measured. These measurements can be performed at any time.
  • An additional measuring device is superfluous, since these measurements can be performed directly by the oscilloscope 24, which is present anyway. It is also conceivable to supply several different reference voltages to the input of the amplifier via additional switches. If only one measurement of the offset error is desired, the additional reference frequency switch 30 may be omitted and only the switch 29 may be provided.
  • the inventive principle is not only suitable for mass-related probes, but according to FIG. 7 also for differential probes with two stylus tips 32, 33 and a differential amplifier 36.
  • the two inputs 34, 35 are short-circuited directly via a switching device 37, or both inputs 34, 35 are individually connected to ground and positive and negative reference voltages are applied.
  • the switching device 27 can be arranged in the arrangement of a divider 25 before this, so that an offset or a Verstarkungscons the divider 25 is measured with.
  • the output transistor is again of the npn type.
  • the base-emitter voltage of the transistors 1, 2 and 4 is in the example + 0.8V, that of the transistor 3 -0.8V. This results in an offset DC voltage of about OV.
  • the source current is selected such that the gate-source Voltage U gs is 0 volts.
  • This is z. B. by the use of paired field effect transistors as current sources S possible whose gate-source voltage is set to 0 volts. Even with this circuit according to FIG. 3, an offset of almost 0 volts is thus achieved between input and output.
  • Fig. 4 shows a DC-coupled amplifier consisting of a p-channel type MOSFET transistor 8 having a gate-source voltage of about 1.6 volts, followed by two emitter-follower bipolar npn transistors 9 and 10, which together have a base-emitter voltage of -1.6 volts.
  • a DC-coupled amplifier consisting of a p-channel type MOSFET transistor 8 having a gate-source voltage of about 1.6 volts, followed by two emitter-follower bipolar npn transistors 9 and 10, which together have a base-emitter voltage of -1.6 volts.
  • an offset of almost 0 volts is achieved.
  • a JFET field-effect transistor 11 with two bipolar transistors 12 and 13 is connected together in each case of different conductivity type, here too the sum results in an offset of almost 0 volts.
  • Fig. 6 finally shows the combination of bipolar transistors 14 to 16 of the same (npn) conductivity type with three diodes 17.
  • an input divider 5 can still be arranged in the probe, which is connected between the measuring tip and the amplifier input V in .
  • Switching device may be provided either before or after the input divider in this case. All elements of the probe according to the invention such as amplifiers, switching device for offset measurement, input dividers and the like can be constructed as a hybrid on a substrate.
  • the divider can thus be constructed, for example, in thin-film or thick-film technology, the amplifier as a bipolar IC. It is also conceivable to construct the input divider with the amplifier and the offset measurement circuit on a monolithically integrated chip.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

La présente invention concerne une sonde (21) pour un oscilloscope (24) comprenant un amplificateur à transistors à plusieurs étages (26) qui sert de transformateur d'impédance et dont la sortie est reliée à l'oscilloscope (24). Selon cette invention, un dispositif de commutation électronique (27) pouvant être commandé à distance par le biais de l'oscilloscope (24) est associé à l'entrée (V<SUB>in</SUB>) de l'amplificateur (26). Ce dispositif de commutation électronique permet d'appliquer au choix un potentiel de masse ou une tension de référence à l'entrée (V<SUB>in</SUB>) de l'amplificateur, au lieu de la tension de mesure de la pointe de mesure (22), de manière à pouvoir mesurer dans l'oscilloscope (24) le décalage de tension continue lorsque l'entrée (V<SUB>in</SUB>) de l'amplificateur est raccordée à la masse et l'erreur de gain lorsque la tension de référence est appliquée et de manière à pouvoir en tenir compte de façon correspondante lors de l'évaluation de la tension de mesure dans l'oscilloscope.
EP07765098A 2006-08-14 2007-07-05 Sonde d'oscilloscope Ceased EP2052276A1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102006038026 2006-08-14
DE102006052745A DE102006052745A1 (de) 2006-08-14 2006-11-08 Oszilloskop-Tastkopf
PCT/EP2007/005980 WO2008019731A1 (fr) 2006-08-14 2007-07-05 Sonde d'oscilloscope

Publications (1)

Publication Number Publication Date
EP2052276A1 true EP2052276A1 (fr) 2009-04-29

Family

ID=38800935

Family Applications (1)

Application Number Title Priority Date Filing Date
EP07765098A Ceased EP2052276A1 (fr) 2006-08-14 2007-07-05 Sonde d'oscilloscope

Country Status (4)

Country Link
US (1) US8581611B2 (fr)
EP (1) EP2052276A1 (fr)
DE (1) DE102006052745A1 (fr)
WO (1) WO2008019731A1 (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006052720A1 (de) * 2006-08-14 2008-02-21 Rohde & Schwarz Gmbh & Co. Kg Oszilloskop-Tastkopf
DE202012002391U1 (de) * 2012-03-08 2013-06-10 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Vorrichtung zur Messung elektronischer Bauteile
WO2014144785A1 (fr) 2013-03-15 2014-09-18 The Regents Of The University Of California Stimulation électrique transcutanée multi-site de la moelle épinière pour faciliter le déplacement
CA2925754C (fr) 2013-09-27 2023-02-21 The Regents Of The University Of California Implication des circuits de la moelle epiniere cervicale pour recreer un controle volitif de la fonction manuelle chez des sujets tetraplegiques
CN103983933B (zh) * 2014-05-08 2017-09-19 工业和信息化部电子第五研究所 板级射频电流探头频率标定方法及系统和装置
DE102015100744B4 (de) 2015-01-20 2019-09-05 Atmos Medizintechnik Gmbh & Co. Kg Wundverband und Verwendung eines Wundverbands
US11097122B2 (en) 2015-11-04 2021-08-24 The Regents Of The University Of California Magnetic stimulation of the spinal cord to restore control of bladder and/or bowel
WO2018148844A1 (fr) 2017-02-17 2018-08-23 The University Of British Columbia Appareil et procédés de maintien des fonctions physiologiques
US10416203B2 (en) * 2017-03-31 2019-09-17 Rohde & Schwarz Gmbh & Co. Kg Test and measurement system, differential logic probe, single ended logic probe and method for operating a test and measurement system
US12434068B2 (en) 2017-05-23 2025-10-07 The Regents Of The University Of California Accessing spinal networks to address sexual dysfunction
DE20168827T1 (de) 2017-06-30 2021-01-21 Gtx Medical B.V. System zur neuromodulierung
US10908183B2 (en) * 2017-11-06 2021-02-02 National Instruments Corporation Active probe powered through driven coax cable
US12357828B2 (en) 2017-12-05 2025-07-15 Ecole Polytechnique Federale De Lausanne (Epfl) System for planning and/or providing neuromodulation
US11992684B2 (en) 2017-12-05 2024-05-28 Ecole Polytechnique Federale De Lausanne (Epfl) System for planning and/or providing neuromodulation
US12478777B2 (en) 2018-08-23 2025-11-25 The Regents Of The University Of California Non-invasive spinal cord stimulation for nerve root palsy, cauda equina syndrome, and restoration of upper extremity function
EP3653256B1 (fr) 2018-11-13 2022-03-30 ONWARD Medical N.V. Système de commande pour la reconstruction et/ou la restauration des mouvements d'un patient
EP3695878B1 (fr) 2019-02-12 2023-04-19 ONWARD Medical N.V. Système de neuromodulation
EP3972683A4 (fr) 2019-05-22 2023-11-08 The Regents Of The University Of California Neuromodulateur électrique transcutané de moelle épinière et ses utilisations
EP3824948A1 (fr) 2019-11-19 2021-05-26 ONWARD Medical B.V. Système de planification et/ou de commande pour un système de neuromodulation
DE19211738T1 (de) 2019-11-27 2021-09-09 Onward Medical B.V. Neuromodulationssystem
EP3827871A1 (fr) 2019-11-27 2021-06-02 ONWARD Medical B.V. Système de neuromodulation
US12623080B2 (en) 2023-06-21 2026-05-12 Onward Medical N.V. Neuromodulation system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4743844A (en) * 1986-12-19 1988-05-10 Tektronix, Inc. Self-adjusting oscilloscope

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JPS5753145A (en) * 1980-09-16 1982-03-30 Sony Tektronix Corp Calibrator for analogue-digital converter
US4758779A (en) * 1986-04-07 1988-07-19 Tektronix, Inc. Probe body for an electrical measurement system
GB2264788B (en) * 1992-02-11 1996-06-05 Armex Electronics Ltd A Wideband switchable gain active probe
US5384532A (en) * 1992-07-01 1995-01-24 Hewlett-Packard Company Bipolar test probe
JP3382560B2 (ja) * 1999-06-03 2003-03-04 安藤電気株式会社 電気光学サンプリングプローバ及び測定方法
US6870359B1 (en) * 2001-12-14 2005-03-22 Le Croy Corporation Self-calibrating electrical test probe
US20060061348A1 (en) * 2004-09-20 2006-03-23 Cannon James E High frequency oscilloscope probe with unitized probe tips
US7504841B2 (en) * 2005-05-17 2009-03-17 Analog Devices, Inc. High-impedance attenuator
CN102298130A (zh) * 2010-06-24 2011-12-28 鸿富锦精密工业（深圳）有限公司 示波器探头校验装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4743844A (en) * 1986-12-19 1988-05-10 Tektronix, Inc. Self-adjusting oscilloscope

Also Published As

Publication number Publication date
US8581611B2 (en) 2013-11-12
DE102006052745A9 (de) 2008-06-05
DE102006052745A1 (de) 2008-02-21
US20110006793A1 (en) 2011-01-13
WO2008019731A1 (fr) 2008-02-21

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