EP1863057A1 - Unterbrecherschaltung und thermische sicherung - Google Patents

Unterbrecherschaltung und thermische sicherung Download PDF

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Publication number
EP1863057A1
EP1863057A1 EP05721489A EP05721489A EP1863057A1 EP 1863057 A1 EP1863057 A1 EP 1863057A1 EP 05721489 A EP05721489 A EP 05721489A EP 05721489 A EP05721489 A EP 05721489A EP 1863057 A1 EP1863057 A1 EP 1863057A1
Authority
EP
European Patent Office
Prior art keywords
bimetal
end portion
temperature measuring
heater
measuring member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP05721489A
Other languages
English (en)
French (fr)
Other versions
EP1863057A4 (de
EP1863057B1 (de
Inventor
Masatoshi Murai
Kouji Kawamura
Satoru Naito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of EP1863057A1 publication Critical patent/EP1863057A1/de
Publication of EP1863057A4 publication Critical patent/EP1863057A4/de
Application granted granted Critical
Publication of EP1863057B1 publication Critical patent/EP1863057B1/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H71/00—Details of the protective switches or relays covered by groups H01H73/00 - H01H83/00
    • H01H71/10—Operating or release mechanisms
    • H01H71/12—Automatic release mechanisms with or without manual release
    • H01H71/14—Electrothermal mechanisms
    • H01H71/16—Electrothermal mechanisms with bimetal element
    • H01H71/164—Heating elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H69/00—Apparatus or processes for the manufacture of emergency protective devices
    • H01H69/01—Apparatus or processes for the manufacture of emergency protective devices for calibrating or setting of devices to function under predetermined conditions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H11/00—Apparatus or processes specially adapted for the manufacture of electric switches
    • H01H11/0062—Testing or measuring non-electrical properties of switches, e.g. contact velocity
    • H01H2011/0068—Testing or measuring non-electrical properties of switches, e.g. contact velocity measuring the temperature of the switch or parts thereof

Definitions

  • the present invention relates to a circuit breaker including a thermal trip device where the fixed end portion of a bimetal having one end portion that is an acting end portion and another end portion that is a fixed end portion is secured in a cantilevered manner to a fixed terminal, with the acting end portion causing tripping action of a circuit breaker body when the bimetal bends as a result of being overheated by an overcurrent flowing through the fixed terminal.
  • the present invention also relates to a thermal trip device where, to a heater serving as a fixed terminal, the fixed end portion of a bimetal having one end portion that is an acting end portion and another end portion that is a fixed end portion is secured in a cantilevered manner to the heater, with the acting end portion of the bimetal bending when it is overheated as a result of electricity being supplied to the heater.
  • a thermal trip device is a device that detects an overcurrent in a circuit breaker, for example, and performs tripping of a main circuit of a circuit breaker body, the scope of its tripping characteristic when the overcurrent flows is determined by a standard such as JIS (Japanese Industrial Standard) that is the Japanese Industrial Standard, and it is necessary for products to satisfy that.
  • JIS Japanese Industrial Standard
  • variations in its tripping characteristic cannot be avoided because of product variations in the configuring parts and variations in materials.
  • a structure for adjusting the tripping characteristic is incorporated to perform adjustment/inspection of the characteristic.
  • the tripping characteristic In order to adjust/inspect the tripping characteristic, it is necessary to accurately measure the characteristic value thereof.
  • its tripping characteristic is often measured by supplying a predetermined current and measuring the amount of time (trip time) from when supply of electricity starts to until the end of tripping and the displacement amount of a bimetal. Because the bending coefficient of the bimetal is already known, the displacement amount of the bimetal can be determined by measuring the temperature of the bimetal. Consequently, the tripping characteristic can be understood by measuring the temperature of the bimetal.
  • non-contact temperature measuring methods it is common to use a radiation thermometer incorporating an infrared absorbing element.
  • a radiation thermometer incorporating an infrared absorbing element.
  • non-contact temperature measurement in a thermal trip device of a conventional circuit breaker is done by disposing a window for measurement in the heater that heats the bimetal and measuring the temperature of the bimetal with a radiation thermometer through the window from a direction forming a right angle with respect to the surface of the bimetal such that the temperature of the bimetal can be measured by a non-contact thermometer.
  • Patent Document 1 U.S. Patent No. 5,317,471 specification and drawings.
  • the present invention has been made in light of the aforementioned circumstances, and it is an object thereof to provide a circuit breaker disposed with a thermal trip device whose tripping characteristic is not affected even when a contact thermometer is used and a thermal trip device.
  • a circuit breaker pertaining to this invention is a circuit breaker including a thermal trip device where the fixed end portion of a bimetal having one end portion that is an acting end portion and another end portion that is a fixed end portion is secured in a cantilevered manner to a fixed terminal, with the acting end portion causing tripping action of a circuit breaker body when the bimetal bends as a result of being overheated by an overcurrent flowing through the fixed terminal, wherein a temperature measuring member is integrally directly coupled to a secured portion of the bimetal where the bimetal is secured to the fixed terminal in a state where the temperature measuring member is exposed from the bimetal and the fixed terminal such that a contact temperature measuring instrument can contact the temperature measuring member.
  • the temperature of the bimetal can be measured without affecting the tripping characteristic because the temperature of the bimetal can be measured by bringing the contact temperature measuring instrument into contact with the temperature measuring member and not into direct contact with the bimetal.
  • a thermal trip device pertaining to this invention is a thermal trip device where, to a heater serving as a fixed terminal, the fixed end portion of a bimetal having one end portion that is an acting end portion and another end portion that is a fixed end portion is secured in a cantilevered manner to the heater, with the acting end portion of the bimetal bending when it is overheated as a result of electricity being supplied to the heater, wherein a temperature measuring member is integrally directly coupled to a secured portion of the bimetal where the bimetal is secured to the heater in a state where the temperature measuring member is exposed from the bimetal and the heater such that a contact temperature measuring instrument can contact the temperature measuring member.
  • the temperature of the bimetal can be measured without affecting the tripping characteristic because the temperature of the bimetal can be measured by bringing the contact temperature measuring instrument into contact with the temperature measuring member and not into direct contact with the bimetal.
  • the present invention is a circuit breaker including a thermal trip device where the fixed end portion of a bimetal having one end portion that is an acting end portion and another end portion that is a fixed end portion is secured in a cantilevered manner to a fixed terminal, with the acting end portion causing tripping action of a circuit breaker body when the bimetal bends as a result of being overheated by an overcurrent flowing through the fixed terminal, wherein a temperature measuring member is integrally directly coupled to a secured portion of the bimetal where the bimetal is secured to the fixed terminal in a state where the temperature measuring member is exposed from the bimetal and the fixed terminal such that a contact temperature measuring instrument can contact the temperature measuring member.
  • the temperature of the bimetal can be measured by bringing the contact temperature measuring instrument into contact with the temperature measuring member and not into direct contact with the bimetal, consequently the temperature of the bimetal can be measured without affecting the tripping characteristic, and moreover a contact temperature measuring method is employed, so highly precise temperature measurement is possible in comparison to when a non-contact temperature measuring method using a non-contact thermometer is employed.
  • the present invention is also a thermal trip device where, to a heater serving as a fixed terminal, the fixed end portion of a bimetal having one end portion that is an acting end portion and another end portion that is a fixed end portion is secured in a cantilevered manner to the heater, with the acting end portion of the bimetal bending when it is overheated as a result of electricity being supplied to the heater, wherein a temperature measuring member is integrally directly coupled to a secured portion of the bimetal where the bimetal is secured to the heater in a state where the temperature measuring member is exposed from the bimetal and the heater such that a contact temperature measuring instrument can contact the temperature measuring member.
  • the temperature of the bimetal can be measured by bringing the contact temperature measuring instrument into contact with the temperature measuring member and not into direct contact with the bimetal, consequently the temperature of the bimetal can be measured without affecting the tripping characteristic, and moreover a contact temperature measuring method is employed, so highly precise temperature measurement is possible in comparison to when a non-contact temperature measuring method using a non-contact thermometer is employed.
  • FIG. 1 is a side view showing a mechanical component inside a case of a circuit breaker including a thermal trip device
  • FIG. 2 is an enlarged perspective view showing the thermal trip device of FIG. 1
  • FIG. 3 is an enlarged side view showing the thermal trip device of FIG. 1
  • FIG. 4 is a perspective view for describing a way of measuring the temperature of a bimetal by a contact temperature measuring instrument
  • FIG. 5 is an enlarged side view for describing bending action of the bimetal when electricity is supplied to a fixed terminal (i.e., a heater).
  • a fixed terminal i.e., a heater
  • the scope of the time from when the overcurrent starts flowing to until tripping is determined by a standard such as JIS, and the trip time of products must satisfy that scope.
  • the activation point of the tripping mechanism -- that is, the position where the bimetal 2 pushes the trip bar 3 -- varies because of the accumulation of manufacturing variations, such as production/assembly errors of each part configuring the tripping mechanism and variations in material characteristics, and variations arise in the amount of time (trip time) from when supply of electricity starts to until tripping.
  • an adjustment mechanism 6 is disposed in the distal end of the bimetal 2 or the trip bar 3 to perform adjustment/inspection work in the assembly process.
  • the tripping characteristic is often measured by supplying a predetermined current value and measuring the trip time or measuring the displacement amount of the bimetal during that time.
  • the trip time and bimetal displacement amount are greatly affected by the temperature of the work when supply of electricity starts and by the temperature of the measurement environment, so the tripping characteristic is measured in a state where the temperature is managed at a constant temperature, or the measured value must be corrected on the basis of the temperature of the work and the surrounding temperature.
  • the bending amount (displacement amount) of a bimetal is determined by the temperature and bending coefficient of the bimetal, but because the bending coefficient is already known, the displacement amount can be determined by measuring the temperature of the bimetal. Consequently, it is possible to measure the tripping characteristic by measuring the temperature of the bimetal.
  • thermometer As mentioned previously, a non-contact radiation thermometer is commonly used to measure the temperature of the bimetal. The reason is because deflection in the bimetal occurs due to the contact weight of a probe when a contact thermometer is used, the tripping characteristic changes, and accurate measurement of the tripping characteristic cannot be done.
  • a non-contact thermometer measures the temperature of an object by detecting the radiation energy amount of infrared rays radiated from the object.
  • the radiation amount of infrared rays radiated from an object differs depending on the material and surface state, and even at the same temperature the radiated infrared ray energy amount (emissivity) differs.
  • the temperature is calculated on the basis of an ideal black body (theoretical object whose emissivity is 100%), and with objects other than that, correction must be performed in accordance with each individual emissivity.
  • Emissivity is ordinarily experimentally obtained and cannot be determined per work during the mass production process because determining the emissivity of a measured object in a short amount of time is difficult. Consequently, when the emissivity of a bimetal varies, those variations become variations in temperature measurement. Moreover, because the surface of a bimetal is commonly a metallic luster surface, it is easy for infrared rays radiated from a heat source of an object in the vicinity of the bimetal, such as a heater, to be reflected by the surface of the bimetal. When that reflected light is made incident on a radiation thermometer, it becomes measurement error.
  • thermometer a contact thermometer becomes possible without affecting the bending amount of the acting end portion 21 of the bimetal 2, so temperature measurement can be stably done with high precision in comparison to a conventional non-contact thermometer.
  • a temperature distribution is present inside the bimetal 2 because it is difficult to uniformly heat the entire bimetal 2. That is, when the fixed end portion 22 of a bimetal having one end portion that is an acting end portion 21 and another end portion that is a fixed end portion 22 is secured in a cantilevered manner to a fixed terminal (i.e., a heater) 1, the temperature of the acting end portion 21 is slightly lower than the temperature of the fixed end portion 22 that is secured to the fixed terminal (i.e., the heater) 1.
  • the relationship between the temperature distribution inside the bimetal 2 and the bending amount of the acting end portion 21 of the bimetal 2 is determined beforehand by the material and size of the bimetal 2, so even when the temperature of the fixed end portion 22 is measured, the desired bending amount of the acting end portion 21 of the bimetal 2 at that temperature can be determined. Further, conversely, the standard temperature of the fixed end portion 22 when the acting end portion 21 of the bimetal 2 has reached the desired bending amount (i.e., when it has reached a bending amount that trips the circuit breaker) can also be determined.
  • the tripping characteristic of a thermal trip device is a predetermined tripping characteristic.
  • Embodiment 1 of this invention a part that reaches a temperature that is equivalent to the temperature of the fixed end portion 22 of the bimetal 22, that is, a temperature measuring member 7, is added, whereby temperature measurement of the fixed end portion 22 of the bimetal 2 becomes possible by measuring the temperature of this added temperature measuring member 7 with a contact thermometer instead of directly measuring the temperature of the fixed end portion 22 of the bimetal 2. That is, as shown in FIG. 4, the temperature of the bimetal 2 can be indirectly measured by measuring the temperature of the temperature measuring member 7 by bringing a probe 81 of a contact thermometer 8 into contact with the temperature measuring member 7.
  • the temperature measuring member 7 is integrally directly coupled to a secured portion 221 of the bimetal 2 where the bimetal 2 is secured to the fixed terminal (i.e., the heater) 1 in a state where the temperature measuring member 7 is exposed from the bimetal 2 and the fixed terminal (i.e., the heater) 1 such that the probe 81 of the contact temperature measuring instrument 8 can contact the temperature measuring member 7. That is, as is shown, the area of the entire temperature measuring member 7 is larger than the area of the portion of the temperature measuring member 7 that faces the fixed terminal (i.e., the heater) 1.
  • the temperature measuring member 7 is present between the bimetal 2 and the fixed terminal (i.e., the heater) 1 and is firmly secured to the bimetal 2 and the fixed terminal (i.e., the heater) 1 by caulking pins 9 at plural places. That is, the fixed end portion 22 of the bimetal 2, the temperature measuring member 7, and the fixed terminal (i.e., the heater) 1 are tightly integrally coupled together by the caulking pins 9 so that a coupled state that is also thermally good is maintained.
  • Inspection of the tripping characteristic is performed on just the thermal trip device shown in FIG. 2 to FIG. 5 or is performed in a state where the thermal trip device is incorporated in the circuit breaker as in FIG. 1, but in that case, when a current corresponding to a predetermined overcurrent is supplied to the fixed terminal (i.e., the heater) 1, then as shown in FIG. 5, the acting end portion 21 of the bimetal 2 bends as indicated by the one-dotted chain line and the temperature measuring member 7 also bends as indicated by the one-dotted chain line in the same direction as the acting end portion 21 of the bimetal 2.
  • the temperature measuring member 7 is formed by the same material as the bimetal 2 (i.e., when the bimetal 2 is a material where steel and copper are laminated together, the temperature measuring member 7 is also a laminate material of steel and copper) and the length of the temperature measuring member 7 is shorter than the length of the bimetal 2, the bending amount of the temperature measuring member 7 is smaller than the bending amount of the acting end portion 21 of the bimetal 2 even when the acting end portion 21 of the bimetal 2 and the temperature measuring member 7 bend as indicated by the one-dotted chain lines, so a slight gap g occurs between the distal end portion of the temperature measuring member 7 and the acting end portion 21 of the bimetal 2. Consequently, the temperature measuring member 7 does not contact and press against the acting end portion 21 of the bimetal 2 because of that bending and does not adversely affect the bending amount of the acting end portion 21 of the bimetal 2.
  • the temperature measuring member 7 When the temperature measuring member 7 is configured to bend oppositely from the one-dotted chain line in FIG. 5, it presses against the acting end portion 21 of the bimetal 2 at the time of that bending and adversely affects the bending amount of the acting end portion 21 of the bimetal 2, so attaching the temperature measuring member 7 such that it bends oppositely from the one-dotted chain line in FIG. 5 must be avoided.
  • FIG. 6 is a perspective diagram showing a thermal trip device
  • FIG. 7 is a side view showing the thermal trip device
  • FIG. 8 is an enlarged side view for describing bending action of the bimetal when electricity is supplied to the fixed terminal (i.e., the heater).
  • Embodiment 2 of this invention is a case example when the temperature measuring member 7 extends from the secured portion 221 of the bimetal 2 on the opposite side of the acting end portion 21 of the bimetal.
  • the temperature measuring member 7 extends on the opposite side of the acting end portion 21 and forms the bimetal 2 itself.
  • the temperature measuring member 7 is integrally directly coupled to the secured portion 221 of the bimetal 2 where the bimetal 2 is secured to the fixed terminal (i.e., the heater) 1 in a state where the temperature measuring member 7 is exposed from the bimetal 2 and the fixed terminal (i.e., the heater) 1 such that the contact temperature measuring instrument 8 can contact the temperature measuring member 7, and the temperature measuring member 7 extends from the secured portion 221 of the bimetal 2 on the opposite side of the acting end portion 21 of the bimetal 2.
  • the temperature of the bimetal 2 is indirectly measured by allowing the distal end of the probe 81 of the contact temperature measuring instrument 8 to abut against the undersurface of the temperature measuring member 7 and measuring the temperature of the temperature measuring member 7.
  • Embodiment 2 of this invention a current corresponding to a predetermined overcurrent is supplied to the fixed terminal (i.e., the heater) 1, so that even when the temperature measuring member 7 bends as indicated by the one-dotted chain line, a slight gap G arises between the distal end portion of the temperature measuring member 7 and the fixed terminal (i.e., the heater) 1. Consequently, force does not act on the fixed end portion 22 of the bimetal 2 as a result of the temperature measuring member 7 abutting against the fixed terminal (i.e., the heater) 1 because of that bending and does not adversely affect the bending amount of the acting end portion 21 of the bimetal 2.
  • Embodiment 3 of this invention as shown in FIG. 9, a probe insertion through hole 12a whose diameter is larger than the diameter of the probe 81 of the contact temperature measuring instrument 8 is disposed in the fixed terminal (i.e., the heater) 1, the probe 81 is inserted into this probe insertion through hole 12a such that the probe 81 does not contact the fixed terminal (i.e., the heater) 1, and the distal end of the probe 81 is allowed to abut against the undersurface of the temperature measuring member 7 to measure the temperature of the temperature measuring member 7, whereby the temperature of the bimetal 2 is indirectly measured. Even when configured in this manner, effects that are the same as those of the aforementioned Embodiment 2 of this invention are provided.
  • the probe insertion through hole 12a is disposed in an inside terminal portion 12 in the end portion on the opposite side of an outside terminal portion 11 including a connection hole 11 a of the circuit breaker.
  • Embodiment 4 of this invention has a structure where the inside terminal portion 12 extends long inside the circuit breaker body and a connection hole 12b that connects to a connection terminal (not shown) inside the circuit breaker body is disposed in a position a predetermined distance away from the probe insertion hole 12a further inside the circuit breaker body, so that connection to the connection terminal (not shown) inside the circuit breaker body can be easily performed.

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Breakers (AREA)
EP05721489A 2005-03-25 2005-03-25 Unterbrecherschaltung und thermische sicherung Expired - Fee Related EP1863057B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2005/005562 WO2006103722A1 (ja) 2005-03-25 2005-03-25 回路遮断器および熱動式引き外し装置

Publications (3)

Publication Number Publication Date
EP1863057A1 true EP1863057A1 (de) 2007-12-05
EP1863057A4 EP1863057A4 (de) 2009-10-21
EP1863057B1 EP1863057B1 (de) 2011-09-14

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EP05721489A Expired - Fee Related EP1863057B1 (de) 2005-03-25 2005-03-25 Unterbrecherschaltung und thermische sicherung

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Country Link
EP (1) EP1863057B1 (de)
JP (1) JP4399498B2 (de)
CN (1) CN101147224B (de)
WO (1) WO2006103722A1 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2472549A1 (de) * 2010-12-28 2012-07-04 LSIS Co., Ltd. Bimetallanordnung für Schutzschalter
CN103000460A (zh) * 2011-09-12 2013-03-27 三菱电机株式会社 过电流跳闸装置以及电路断路器

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5405971B2 (ja) * 2008-11-07 2014-02-05 三菱電機株式会社 回路遮断器
JP5595225B2 (ja) * 2010-10-29 2014-09-24 三菱電機株式会社 回路遮断器
CN109148230A (zh) * 2018-10-15 2019-01-04 浙江天正电气股份有限公司 一种万能式断路器

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0542641A1 (de) * 1991-11-13 1993-05-19 Schneider Electric Sa Verfahren und Vorrichtung zum Einstellen eines thermischen Bimetallauslösers
US6466424B1 (en) * 1999-12-29 2002-10-15 General Electric Company Circuit protective device with temperature sensing

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3849450B2 (ja) * 2001-04-24 2006-11-22 松下電工株式会社 回路遮断器の調整方法及び調整装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0542641A1 (de) * 1991-11-13 1993-05-19 Schneider Electric Sa Verfahren und Vorrichtung zum Einstellen eines thermischen Bimetallauslösers
US6466424B1 (en) * 1999-12-29 2002-10-15 General Electric Company Circuit protective device with temperature sensing

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2006103722A1 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2472549A1 (de) * 2010-12-28 2012-07-04 LSIS Co., Ltd. Bimetallanordnung für Schutzschalter
RU2504039C2 (ru) * 2010-12-28 2014-01-10 ЭлЭсАйЭс КО., ЛТД. Биметаллический узел для автоматического выключателя
CN103000460A (zh) * 2011-09-12 2013-03-27 三菱电机株式会社 过电流跳闸装置以及电路断路器
CN103000460B (zh) * 2011-09-12 2015-08-19 三菱电机株式会社 过电流跳闸装置以及电路断路器

Also Published As

Publication number Publication date
CN101147224A (zh) 2008-03-19
WO2006103722A1 (ja) 2006-10-05
EP1863057A4 (de) 2009-10-21
JPWO2006103722A1 (ja) 2008-09-04
CN101147224B (zh) 2010-06-16
JP4399498B2 (ja) 2010-01-13
EP1863057B1 (de) 2011-09-14

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